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Page1/5RELIABILITYREPORTFORMAX5180BEEI+PLASTICENCAPSULATEDDEVICESAugust1,2011MAXIMINTEGRATEDPRODUCTS120SANGABRIELDR.
SUNNYVALE,CA94086ApprovedbySokhomChumQualityAssuranceReliabilityEngineerMAX5180MaximIntegratedProducts.
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Page2/5ConclusionTheMAX5180BEEI+successfullymeetsthequalityandreliabilitystandardsrequiredofallMaximproducts.
Inaddition,Maxim'scontinuousreliabilitymonitoringprogramensuresthatalloutgoingproductwillcontinuetomeetMaxim'squalityandreliabilitystandards.
TableofContentsI.
DeviceDescriptionIV.
DieInformationII.
ManufacturingInformationV.
QualityAssuranceInformationIII.
PackagingInformationVI.
ReliabilityEvaluation.
.
.
.
.
AttachmentsI.
DeviceDescriptionA.
GeneralTheMAX5180containstwo10-bit,simultaneous-update,current-outputdigital-to-analogconverters(DACs)designedforsuperiorperformanceincommunicationssystemsrequiringanalogsignalreconstructionwithlowdistortionandlow-poweroperation.
TheMAX5183providesequalspecifications,withon-chipprecisionresistorsforvoltageoutputoperation.
Thedevicesaredesignedfor10pV-sglitchoperationtominimizeunwantedspurioussignalcomponentsattheoutput.
Anon-board1.
2Vbandgapcircuitprovidesawell-regulated,low-noisereferencethatcanbedisabledforexternalreferenceoperation.
TheMAX5180/MAX5183aredesignedtoprovideahighlevelofsignalintegrityfortheleastamountofpowerdissipation.
TheDACsoperatefromasinglesupplyof2.
7Vto3.
3V.
Additionally,theseDACshavethreemodesofoperation:normal,low-powerstandby,andcompleteshutdown,whichprovidesthelowestpossiblepowerdissipationwith1A(max)shutdowncurrent.
Afastwake-uptime(0.
5s)fromstandbymodetofullDACoperationconservespowerbyactivatingtheDACsonlywhenrequired.
TheMAX5180/MAX5183arepackagedina28-pinQSOPandarespecifiedfortheextended(-40°Cto+85°C)temperaturerange.
Forlower-resolution,dual8-bitversions,refertotheMAX5186/MAX5189datasheet.
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Page3/5II.
ManufacturingInformationA.
Description/Function:Dual,10-Bit,40MHz,Current/VoltageSimultaneous-OutputDACsB.
Process:TS60C.
NumberofDeviceTransistors:D.
FabricationLocation:TaiwanE.
AssemblyLocation:Malaysia,Philippines,ThailandF.
DateofInitialProduction:October23,1999III.
PackagingInformationA.
PackageType:28-pinQSOPB.
LeadFrame:CopperC.
LeadFinish:100%matteTinD.
DieAttach:ConductiveE.
Bondwire:Au(1.
3mildia.
)F.
MoldMaterial:EpoxywithsilicafillerG.
AssemblyDiagram:#05-0401-0505H.
FlammabilityRating:ClassUL94-V0I.
ClassificationofMoistureSensitivityperJEDECstandardJ-STD-020-CLevel1J.
SingleLayerThetaJa:93°C/WK.
SingleLayerThetaJc:27°C/WL.
MultiLayerThetaJa:79.
3°C/WM.
MultiLayerThetaJc:27°C/WIV.
DieInformationA.
Dimensions:85X97milsB.
Passivation:Si3N4/SiO2(Siliconnitride/Silicondioxide)C.
Interconnect:Aluminum/Si(Si=1%)D.
BacksideMetallization:NoneE.
MinimumMetalWidth:Metal1-0.
9microns/Metal2-0.
9microns(asdrawn)F.
MinimumMetalSpacing:Metal1-0.
9microns/Metal2-0.
9microns(asdrawn)G.
BondpadDimensions:5mil.
Sq.
H.
IsolationDielectric:SiO2I.
DieSeparationMethod:WaferSawMAX5180MaximIntegratedProducts.
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Page4/5=___1_1.
83_ChisquarevalueforMTTFupperlimit)MTTF192x4340x80x2(where4340=TemperatureAccelerationfactorassuminganactivationenergyof0.
8eV)V.
QualityAssuranceInformationA.
QualityAssuranceContacts:RichardAburano(Manager,ReliabilityEngineering)DonLipps(Manager,ReliabilityEngineering)BryanPreeshl(VicePresidentofQA)B.
OutgoingInspectionLevel:0.
1%forallelectricalparametersguaranteedbytheDatasheet.
0.
1%ForallVisualDefects.
C.
ObservedOutgoingDefectRate:<50ppmD.
SamplingPlan:Mil-Std-105DVI.
ReliabilityEvaluationA.
AcceleratedLifeTestTheresultsofthebiased(static)lifetestareshowninTable1.
Usingtheseresults,theFailureRate()iscalculatedasfollows:=13.
7x10-9=13.
7F.
I.
T.
(60%confidencelevel@25°C)ThefollowingfailureraterepresentsdatacollectedfromMaxim'sreliabilitymonitorprogram.
Maximperformsquarterlylifetestmonitorsonitsprocesses.
ThisdataispublishedintheReliabilityReportfoundathttp://www.
maxim-ic.
com/qa/reliability/monitor.
CumulativemonitordatafortheTS60ProcessresultsinaFITRateof0.
5@25Cand8.
57@55C(0.
8eV,60%UCL)B.
E.
S.
D.
andLatch-UpTesting(lotK6BABQ003AD/C9951)TheDA70dietypehasbeenfoundtohaveallpinsabletowithstandaHBMtransientpulseof+/-1500VperMil-Std883Method3015.
7.
Latch-Uptestinghasshownthatthisdevicewithstandsacurrentof+/-250mA.
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Page5/5Table1ReliabilityEvaluationTestResultsMAX5180BEEI+TESTITEMTESTCONDITIONFAILUREIDENTIFICATIONSAMPLESIZENUMBEROFCOMMENTSFAILURESStaticLifeTest(Note1)Ta=135°CBiasedTime=192hrs.
DCParameters800K6BCBQ002B,D/C9947&functionalityNote1:LifeTestDatamayrepresentplasticDIPqualificationlots.