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TLP55512019-06-242019ToshibaElectronicDevices&StorageCorporationPhotocouplersIRED&PhotoICTLP555TLP555IsolatedBusDriverHighSpeedLineReceiverMicroprocessorSystemInterfacesMOSFETGateDriverTransistorInverterTheTOSHIBATLP555consistsofaninfraredemittingdiodeandintegratedhighgain,highspeedphotodetector.
Thisunitis8leadDIPpackage.
Thedetectorhasathreestateoutputstagethateliminatestheneedforpullupresistor,andbuiltinSchmitttrigger.
ThedetectorhasaSchmitttriggercircuitand3Stateoutputcircuit,soboth-directionsofsourceandsinkdrivecanbeperformed.
ThedetectorIChasaninternalshieldthatprovidesaguaranteedcommonmodetransientimmunityof1000V/μs.
TLP555isabufferlogictype.
Whenaninverterlogictypeisrequired,thereisTLP558.
Inputcurrent:IF=1.
6mA(max.
)Powersupplyvoltage:VCC=4.
5to20VSwitchingspeed:tpHL、tpLH=400ns(max.
)Commonmodetransientimmunity:±1000V/μs(Min.
)Guaranteedperformanceovertemperature:25to85°CIsolationvoltage:2500Vrms(min)UL-recognized:UL1577,FileNo.
E67349cUL-recognized:CSAComponentAcceptanceServiceNo.
5AFileNo.
E67349TruthTable(positivelogic)InputEnableOutputHHZLHZHLHLLLPinConfiguration(topview)1:N.
C.
2:Anode3:Cathode4:N.
C.
5:GND6:VE(enable)7:VO(output)8:VCCVCCGNDSHIELD12348765JEDEC―JEITA―TOSHIBA1110C4SWeight:0.
54g(typ.
)Unit:mmStartofcommercialproduction1986-07TLP55522019-06-242019ToshibaElectronicDevices&StorageCorporationSchematicNote:0.
1-μFbypasscapacitormustbeconnectedbetweenpin8andpin5.
AbsoluteMaximumRatings(Ta=25°C)CharacteristicsSymbolRatingUnitLEDInputforwardcurrentIF10mAPeaktransientinputforwardcurrent(Note1)IFPT1AInputreversevoltageVR5VInputpowerdissipation(Ta=to85°C)PD45mWDetectorOutputcurrentIO40/25mAPeakoutputcurrent(Note2)IOP80/50mAOutputvoltageVO0.
5to20VSupplyvoltageVCC0.
5to20VThreestateenablevoltageVE0.
5to20VOutputpowerdissipation(Note3)PO100mWCommonTotalpackagepowerdissipation(Note4)PT200mWOperatingtemperaturerangeTopr40to85°CStoragetemperaturerangeTstg55to125°CLeadsoldertemperature(10s)**Tsol260°CIsolationvoltage(AC60s,R.
H.
≤60%)(Note5)BVS2500VrmsNote:Usingcontinuouslyunderheavyloads(e.
g.
theapplicationofhightemperature/current/voltageandthesignificantchangeintemperature,etc.
)maycausethisproducttodecreaseinthereliabilitysignificantlyeveniftheoperatingconditions(i.
e.
operatingtemperature/current/voltage,etc.
)arewithintheabsolutemaximumratings.
PleasedesigntheappropriatereliabilityuponreviewingtheToshibaSemiconductorReliabilityHandbook("HandlingPrecautions"/"DeratingConceptandMethods")andindividualreliabilitydata(i.
e.
reliabilitytestreportandestimatedfailurerate,etc).
Note1:Pulsewidth(PW)≤1μs,300ppsNote2:PW≤5μs,Duty≤0.
025%Note3:Derate1.
8mW/°Cabove70°Cambienttemperature.
Note4:Derate3.
6mW/°Cabove70°Cambienttemperature.
Note5:Deviceconsideredatwoterminaldevice:Pins1,2,3and4shortedtogether,andpins5,6,7and8shortedtogether**:Morethan2mmfromtherootofalead.
SHIELDTLP55532019-06-242019ToshibaElectronicDevices&StorageCorporationRecommendedOperatingConditionsCharacteristicsSymbolMin.
Typ.
MaxUnitInputon-statecurrentIF(ON)2*―5mAInputoff-statevoltageVF(OFF)0―0.
8VSupplyvoltageVCC4.
5―20VEnablevoltagehighVEH2.
0―20VEnablevoltagelowVEL0―0.
8VFanout(TTLload)N――4―OperatingtemperatureTopr25―85°CNote:Recommendedoperatingconditionsaregivenasadesignguidelinetoobtainexpectedperformanceofthedevice.
Additionally,eachitemisanindependentguidelinerespectively.
Indevelopingdesignsusingthisproduct,pleaseconfirmspecifiedcharacteristicsshowninthisdocument.
*:2mAisavalueatthetimeoftakingintoconsideration20%ofIFHdegradation.
Aninputhresholdisaninitialvalueandisbelow1.
6mA.
TLP55542019-06-242019ToshibaElectronicDevices&StorageCorporationElectricalCharacteristics(Unlessotherwisespecified,Ta=25to85°C、VCC=4.
5to20V)CharacteristicsSymbolTestConditionMin.
Typ.
(*)MaxUnitInputforwardvoltageVFIF=5mA,Ta=25°C―1.
551.
7VInputforwardvoltagetemperaturecoefficientΔVF/ΔTaIF=5mA―2.
0―mV/°CInputreversecurrenIRVR=5V,Ta=25°C――10μAInputcapacitanceCTVF=0V,f=1MHz,Ta=25°C―45―pFOutputleakagecurrent(VO>VCC)IOHHIF=5mA,VCC=4.
5VVE=GNDVO=5.
5V――100μAVO=20V―2500LogiclowoutputvoltageVOLIOL=6.
4mA,VF=0.
8VVE=0.
8V―0.
40.
5VLogichighoutputvoltageVOHIOH=2.
6mA,IF=1.
6mAVE=0.
8V2.
43.
3―VLogiclowenablecurrentIELVE=0.
4V―0.
130.
32mALogichighenablecurrentIEHVE=2.
7V――20μAVE=5.
5V――100VE=20V―0.
01250LogiclowenablevoltageVEL―――0.
8VLogichighenablevoltageVEH―2.
0――VLogiclowsupplycurrentICCLVF=0V,VE=GNDVCC=5.
5V―56.
0mAVCC=20V―5.
67.
5LogichighsupplycurrentICCHIF=5mAVE=GNDVCC=5.
5V―2.
54.
5mAVCC=20V―2.
86.
0HighimpedancestateoutputcurrentIOZLIF=5mA,VE=2VVO=0.
4V―120μAIOZHVF=0V,VE=2VVO=2.
4V――20VO=5.
5V――100VO=20V―0.
01500Logiclowshortcircuitoutputcurrent(Note6)IOSLVF=0VVE=0.
8VVO=VCC=5.
5V2555―mAVO=VCC=20V4080―Logichighshortcircuitoutputcurrent(Note6)IOSHIF=5mA,VO=GNDVE=0.
8VVCC=5.
5V1025―mAVCC=20V2560―Thresholdinputcurrent(L/H)IFHVE=0.
8V,IO=2.
6mAVO>2.
4V―0.
41.
6mAThresholdinputvoltage(H/L)VFLVE=0.
8V,IO=6.
4mA,VO<0.
4V0.
8――VInputcurrenthysteresisIHYSVCC=5V,VE=GND―0.
05―mAIsolationresistanceRSVS=500V,R.
H.
≤60%,Ta=25°C(Note5)5*10101014―ΩTotalcapacitance(inputtooutput)CSVS=0V,f=1MHz,Ta=25°C(Note5)―1.
0―pF*:Alltyp.
valuesareatTa=25°C,VCC=5V,IF(ON)=3mAunlessotherwisespecified.
Note6:Durationofoutputshortcircuittimeshouldnotexceed10ms.
TLP55552019-06-242019ToshibaElectronicDevices&StorageCorporationSwitchingCharacteristics(unlessotherwisespecified,Ta=25°C、VCC=4.
5to20V)CharacteristicSymbolTestCircuitTestConditionMin.
Typ.
(*)Max.
UnitPropagationdelaytimetologichighoutputlevel(L→H)(Note7)tpLH1IF=0→3mA―235400nsPropagationdelaytimetologiclowoutputlevel(H→L)(Note7)tpHLIF=3→0mA―250400nsOutputrisetime(1090%)trIF=0→3mA,VCC=5V―3575nsOutputfalltime(9010%)tfIF=3→0mA,VCC=5V―2075nsCommonmodetransientimmunityatlogichighoutput(Note8)CMH3IF=1.
6mA,VCM=50VVO(min)=2V1000――V/μsCommonmodetransientimmunityatlogiclowoutput(Note8)CMLIF=0mA,VCM=50VVO(max)=0.
8V1000――V/μs*:Alltyp.
valuesareatTa=25°C,VCC=5Vunlessotherwisespecified.
Note7:ThetpLHpropagationdelayismeasuredfromthe50%pointontheleadingedgeoftheinputpulsetothe1.
3Vpointontheleadingedgeoftheoutputpulse.
ThetpHLpropagationdelayismeasuredfromthe50%pointonthetrailingedgeoftheinputpulsetothe1.
3Vpointonthetrailingedgeoftheoutputpulse.
Note8:CMListhemaximumrateofriseofthecommonmodevoltagethatcanbesustainedwiththeoutputvoltageinthelogiclowstate(VO≤0.
8V).
CMHisthemaximumrateoffallofthecommonmodevoltagethatcanbesustainedwiththeoutputvoltageinthelogichighstate(VO≥2.
0V).
Note9:OutputphotoICshouldbuildintheamplifierofhighsensitivityverymuch,andshouldattachbypasscapacitor0.
1uFwithasufficienthighfrequencycharacteristictotheplacewithin1cmfromapinbetweenthepin8(VCC)andthepin5(GND)asanobjectforoscillationprevention.
Whenthereisnothing,normaloperationofspeed,orON/OFFmaynotbecarriedout.
TLP55562019-06-242019ToshibaElectronicDevices&StorageCorporationTestCircuit1tpHL,tpLH,trandtfTestCircuit2tpHZ,tpZH,tpLZ,andtpZLTestCircuit3CommonModeTransientImmunityPulseGeneratorTr=tf=5nsVo=5VInputMonitoringNodeOutputVoMonitoringNodeD1toD4:1S1588CLisapproximately15pFwhichincludesprobeandstraywiringcapacitance.
InputIFOutputVoPulseGeneratorZo=5ΩTr=tf=5nsD1toD4:1S1588CLisapproximately15pFwhichincludesprobeandstraywiringcapacitance.
OutputVoOutputVoInputVEMonitoringNodePulseGeneratorZo=5ΩVoMonitorOutputVoSwitchASwitchB(Note8)TLP55572019-06-242019ToshibaElectronicDevices&StorageCorporationRESTRICTIONSONPRODUCTUSEToshibaCorporationanditssubsidiariesandaffiliatesarecollectivelyreferredtoas"TOSHIBA".
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BeforecustomersusetheProduct,createdesignsincludingtheProduct,orincorporatetheProductintotheirownapplications,customersmustalsorefertoandcomplywith(a)thelatestversionsofallrelevantTOSHIBAinformation,includingwithoutlimitation,thisdocument,thespecifications,thedatasheetsandapplicationnotesforProductandtheprecautionsandconditionssetforthinthe"TOSHIBASemiconductorReliabilityHandbook"and(b)theinstructionsfortheapplicationwithwhichtheProductwillbeusedwithorfor.
Customersaresolelyresponsibleforallaspectsoftheirownproductdesignorapplications,includingbutnotlimitedto(a)determiningtheappropriatenessoftheuseofthisProductinsuchdesignorapplications;(b)evaluatinganddeterminingtheapplicabilityofanyinformationcontainedinthisdocument,orincharts,diagrams,programs,algorithms,sampleapplicationcircuits,oranyotherreferenceddocuments;and(c)validatingalloperatingparametersforsuchdesignsandapplications.
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