检定噪音测试

中国合格评定国家认可委员会认可证书(注册号:CNASL0134)名称:上海市计量测试技术研究院(华东国家计量测试中心/中国上海测试中心)地址:上海市张衡路1500号签发日期:2009年08月21日有效期至:2012年08月20日更新日期:2012年03月22日1-1认可的检测能力范围序号检测对象项目/参数领域代码检测标准(方法)名称及编号(含年号)限制范围说明序号名称1化工类产品1粒度0244颗粒度分析-激光衍射法ISO13320-2009颗粒度分析-光子相关光谱法ISO13321:1996粒度分析激光衍射法GB/T19077.
1-2008粒度分析光子相关光谱法GB/T19627-2005样品制备-粉末在样品中的分散ISO14887:20002比表面积金属表面比表面积的测定氮吸附法GB/T13390-2008催化剂和吸附剂表面积测定法GB/T5816-1995气体吸附BET法测定固态物质比表面积GB/T19587-2004气体吸附BET法测定固态物质比表面积ISO9277:19952饮用天然矿泉水1部分项目0233饮用天然矿泉水检验方法GB/T8538-2008不测总β放射性、226镭放射性、总大肠菌群、粪链球菌、铜绿假单胞菌、产气荚膜梭菌3生活饮用水1部分项目0233生活饮用水标准检验方法感官性状和物理指标GB/T5750.
4-2006只测色度、混浊度、臭和味、肉眼可见物、pH值、总硬度、挥发酚类、阴离子合成洗涤剂、溶解性总固体2部分项目生活饮用水标准检验方法无机非金属指标GB/T5750.
5-2006只测硫酸盐、氯化物、氟化物、氰化物、硝酸盐氮3部分项目生活饮用水标准检验方法金属指标GB/T5750.
6-2006只测铁、锰、铜、锌、砷、硒、汞、镉、铬(六价)、铅、银4部分项目生活饮用水标准检验方法农药指标GB/T5750.
9-2006只测四氯化碳、滴滴涕、六六六5部分项目生活饮用水标准检验方法消毒副产物指标GB/T5750.
10-2006只测三氯甲烷6部分项目生活饮用水标准检验方法消毒剂指标GB/T5750.
11-2006只测游离余氯7部分项目生活饮用水标准检验方法微生物指标GB/T5750.
12-2006只测菌落总数4水1总有机碳0233水质分析-总有机碳和可溶有机碳测定导则ISO8245:19992部分项目分析实验室用水规格和试验方法GB/T6682-2008只测电导率吸光度5地下水1全部项目0233地下水质检验方法—电感耦等离子体原子发射光谱法测定铜、铅、锌、镉、锰、铬、镍、钴、钒、锡、铍及钛DZ/T0064.
22-1993地下水质检验方法—感耦等离子体原子发射光谱法测定锶、钡DZ/T0064.
42-19936钢铁及合金1碳0201钢铁和镍、钴合金中碳、硫、氮、氧的标准测定方法ASTME1019-2008钢铁-总碳的测定-感应炉燃烧红外吸收法ISO9556-19892硫钢铁和镍、钴合金中碳、硫、氮、氧的标准测定方法ASTME1019-2008钢铁-硫的测定-感应炉燃烧红外吸收法ISO4935-19893锰钢铁及合金锰含量的测定电位滴定或可视滴定法GB/T223.
4-2008钢铁及合金化学分析方法高碘酸钠(钾)光度法测定锰量GB/T223.
63-1988钢铁及合金锰含量的测定火焰原子吸收光谱法锰量GB/T223.
64-20084硅钢铁酸溶硅和全硅含量的测定还原型硅钼酸盐分光光度法GB/T223.
5-2008钢铁及合金化学分析方法高氯酸脱水重量法测定硅含量GB/T223.
60-19975磷钢铁及合金磷含量的测定铋磷钼蓝分光光度法和锑磷钼蓝分光光度法GB/T223.
59-20086铜0201钢铁及合金化学分析方法火焰原子吸收分光光度法测定铜量GB/T223.
53-19877铬钢铁及合金化学分析方法过硫酸铵氧化容量法测定铬量GB/T223.
11-2008钢铁及合金化学分析方法碳酸钠分离-二苯碳酰二肼光度法测定铬量GB/T223.
12-19918钒钢铁及合金化学分析方法硫酸亚铁铵滴定法测定钒含量GB/T223.
13-2000钢铁及合金化学分析方法钽试剂萃取光度法测定钒含量GB/T223.
14-20006钢铁及合金9镍0201钢铁及合金镍含量的测定丁二酮肟分光光度法GB/T223.
23-2008钢铁及合金化学分析方法丁二酮肟重量法测定镍量GB/T223.
25-199410钼钢铁及合金钼含量的测定硫氰酸盐直接光度法GB/T223.
26-200811钴钢铁及合金化学分析方法亚硝基R盐分光光度法测定钴量GB/T223.
22-1994钢铁及合金化学分析方法火焰原子吸收光谱法测定钴含量GB/T223.
65-198812铁铁粉铁含量的测定重铬酸钾滴定法GB/T223.
7-200213钛钢铁及合金化学分析方法变色酸分光光度法测定钛量GB/T223.
16-19917铜及铜合金1铜0201铜及铜合金化学分析方法第1部分:铜含量的测定GB/T5121.
1-20082磷铜及铜合金化学分析方法第2部分:磷含量的测定GB/T5121.
2-20083铅铜及铜合金化学分析方法第3部分:铅含量的测定GB/T5121.
3-20084碳、硫铜及铜合金化学分析方法第4部分:碳硫含量的测定GB/T5121.
4-20085镍铜及铜合金化学分析方法第5部分:镍含量的测定GB/T5121.
5-20086铋铜及铜合金化学分析方法第6部分:铋含量的测定GB/T5121.
6-20087砷铜及铜合金化学分析方法第7部分:砷含量的测定GB/T5121.
7-20088铁铜及铜合金化学分析方法第9部分:铁含量的测定GB/T5121.
9-20089锡0201铜及铜合金化学分析方法第10部分:锡含量的测定GB/T5121.
10-200810锌铜及铜合金化学分析方法第11部分:锌含量的测定GB/T5121.
11-200811锑铜及铜合金化学分析方法第12部分:锑含量的测定GB/T5121.
12-200812铝铜及铜合金化学分析方法第13部分:铝含量的测定GB/T5121.
13-200813锰铜及铜合金化学分析方法第14部分:锰含量的测定GB/T5121.
14-20087铜及铜合金14钴0201铜及铜合金化学分析方法第15部分:钴含量的测定GB/T5121.
15-200815铬铜及铜合金化学分析方法第16部分:铬含量的测定GB/T5121.
16-200816铍铜及铜合金化学分析方法第17部分:铍含量的测定GB/T5121.
17-200817镁铜及铜合金化学分析方法第18部分:镁含量的测定GB/T5121.
18-200818银铜及铜合金化学分析方法第19部分:银含量的测定GB/T5121.
19-200819锆铜及铜合金化学分析方法第20部分:锆含量的测定GB/T5121.
20-200820钛铜及铜合金化学分析方法第21部分:钛含量的测定GB/T5121.
21-200821镉铜及铜合金化学分析方法第22部分:镉含量的测定GB/T5121.
22-200822硅铜及铜合金化学分析方法第23部分:硅含量的测定GB/T5121.
23-20081锡0201锡铅焊料化学分析方法锡量的测定GB/T10574.
1-20032锑锡铅焊料化学分析方法锑量的测定GB/T10574.
2-20033铋锡铅焊料化学分析方法铋量的测定GB/T10574.
3-20034铁锡铅焊料化学分析方法铁量的测定GB/T10574.
4-20038锡铅焊料5砷0201锡铅焊料化学分析方法砷量的测定GB/T10574.
5-20036铜锡铅焊料化学分析方法铜量的测定GB/T10574.
6-20037银锡铅焊料化学分析方法银量的测定GB/T10574.
7-20038锌锡铅焊料化学分析方法锌量的测定GB/T10574.
8-20039铝锡铅焊料化学分析方法铝量的测定GB/T10574.
9-200310镉锡铅焊料化学分析方法镉量的测定GB/T10574.
10-200311磷锡铅焊料化学分析方法磷量的测定GB/T10574.
11-200312硫锡铅焊料化学分析方法硫量的测定GB/T10574.
12-20039铝及铝合金1铜0201铝及铝合金化学分析方法第3部分:铜含量的测定GB/T20975.
3-20082铁铝及铝合金化学分析方法第4部分:铁含量的测定、邻二氮杂菲分光光度法GB/T20975.
4-20083硅铝及铝合金化学分析方法第5部分:硅含量的测定GB/T20975.
5-20084镉铝及铝合金化学分析方法第6部分:镉含量的测定火焰原子吸收光谱法GB/T20975.
6-20085锰0201铝及铝合金化学分析方法第7部分:锰含量的测定高碘酸钾分光光度法GB/T20975.
7-20086锌铝及铝合金化学分析方法第8部分:锌含量的测定GB/T20975.
8-20087锂0201铝及铝合金化学分析方法第9部分:锂含量的测定火焰原子吸收光谱法GB/T20975.
9-20088锡铝及铝合金化学分析方法第10部分:锡含量的测定GB/T20975.
10-20089铅铝及铝合金化学分析方法第11部分:铅含量的测定火焰原子吸收光谱法GB/T20975.
11-200810钛铝及铝合金化学分析方法第12部分:钛含量的测定GB/T20975.
12-200811钒铝及铝合金化学分析方法第13部分:钒含量的测定苯甲酰苯胲分光光度法GB/T20975.
13-200812镍铝及铝合金化学分析方法第14部分:镍含量的测定GB/T20975.
14-200813硼铝及铝合金化学分析方法第15部分:硼含量的测定GB/T20975.
15-20089铝及铝合金14镁0201铝及铝合金化学分析方法第16部分:镁含量的测定GB/T20975.
16-200815锶铝及铝合金化学分析方法第17部分:锶含量的测定火焰原子吸收光谱法GB/T20975.
17-200816铬铝及铝合金化学分析方法第18部分:铬含量的测定GB/T20975.
18-200817锆铝及铝合金化学分析方法第19部分:锆含量的测定GB/T20975.
19-200818镓铝及铝合金化学分析方法第20部分:镓含量的测定丁基罗丹明B分光光度法GB/T20975.
20-200819钙铝及铝合金化学分析方法第21部分:钙含量的测定火焰原子吸收光谱法GB/T20975.
21-20089铝及铝合金20铍0201铝及铝合金化学分析方法第22部分:铍含量的测定依莱铬氰兰R分光光度法GB/T20975.
22-200821锑铝及铝合金化学分析方法第23部分:锑含量的测定碘化钾分光光度法GB/T20975.
23-200822稀土总含量铝及铝合金化学分析方法第24部分:稀土总含量的测定GB/T20975.
24-200810镁及镁合金1铝0201镁及镁合金化学分析方法铝含量的测定GB/T13748.
1-20052锰镁及镁合金化学分析方法锰含量的测定高碘酸盐分光光度法GB/T13748.
4-20053锆镁及镁合金化学分析方法锆含量的测定二甲苯酚橙分光光度法GB/T13748.
7-20054稀土含量镁及镁合金化学分析方法稀土含量的测定重量法GB/T13748.
8-20055铁镁及镁合金化学分析方法铁含量的测定邻二氮杂菲分光光度法GB/T13748.
9-20056硅镁及镁合金化学分析方法硅含量的测定钼蓝分光光度法GB/T13748.
10-20057铍镁及镁合金化学分析方法铍含量的测定依莱铬氰蓝R分光光度法GB/T13748.
11-20058铜镁及镁合金化学分析方法铜含量的测定新亚铜灵分光光度法GB/T13748.
12-20059镍镁及镁合金化学分析方法银含量的测定丁二酮肟分光光度法GB/T13748.
14-200510锌镁及镁合金化学分析方法锌含量的测定GB/T13748.
15-200511金属及合金1化学成分分析(碳、硫、硅、磷、钾、钠、钙、镁、铁、锰、铜、锌、铬、铅、镉、汞、银、锶、锂、钡、钒、钼、钴、镍、铝、硒、砷、硼、锡、锑、铋)0201冶金产品化学分析火焰原子吸收光谱法通则GB/T7728-1987冶金产品化学分析分光光度法通则GB/T7729-1987原子吸收光谱分析法通则GB/T15337-2008钢铁和镍、钴合金中碳、硫、氮、氧的标准测定方法ASTME1019-2008不测钢铁及合金、铜及铜合金、铝及铝合金、镁及镁合金、锡铅焊料2表面元素的半定量分析;价态分析通过俄歇电子能谱峰值识别元素的规程ASTME827-2008X-光电子能谱标准检测方法ASTME902-200512药用淀粉及衍生产品1砷0228淀粉和衍生产品-重金属含量的测定-AsISO11212-1:1997(E)2汞淀粉和衍生产品-重金属含量的测定-HgISO11212-2:1997(E)3铅淀粉和衍生产品-重金属含量的测定-PbISO11212-3:1997(E)4镉淀粉和衍生产品-重金属含量的测定-CdISO11212-4:1997(E)13食品1砷0227食品卫生检验方法理化部分总则GB/T5009.
1-2003食品中总砷及无机砷的测定GB/T5009.
11-2003不用前处理方法、不用原子荧光法2铅食品卫生检验方法理化部分总则GB/T5009.
1-2003食品中铅的测定GB5009.
12-2010不用前处理方法、不用原子荧光法3铜食品卫生检验方法理化部分总则GB/T5009.
1-2003食品中铜的测定GB/T5009.
13-2003不用前处理方法4镉食品卫生检验方法理化部分总则GB/T5009.
1-2003食品中镉的测定GB/T5009.
15-2003不用前处理方法、不用原子荧光法13食品5锡0227食品卫生检验方法理化部分总则GB/T5009.
1-2003食品中锡的测定GB/T5009.
16-2003不用前处理方法、不用原子荧光法6汞食品卫生检验方法理化部分总则GB/T5009.
1-2003食品中总汞及有机汞的测定GB/T5009.
17-2003不用前处理方法、不用原子荧光法、不测有机汞7六六六、滴滴涕食品卫生检验方法理化部分总则GB/T5009.
1-2003食品中六六六滴滴涕的测定GB/T5009.
19-2008不用前处理第二法(薄层色谱法)14玩具1全部项目0244玩具安全性的消费者安全规格ASTMF963-2008玩具安全-第3部分:特定元素的迁移BSEN71-3:1995玩具安全-第3部分:特定元素的迁移ISO8124-3:2010(E)国家玩具安全技术规范附录CGB6675-2003不用前处理方法15涂料与油漆1铅0215色漆盒清漆"可溶性"金属含量的测定第1部分:铅含量的测定火焰原子吸收光谱法和双硫腙分光光度法GB/T9758.
1-19882锑色漆盒清漆"可溶性"金属含量的测定第2部分:锑含量的测定火焰原子吸收光谱法和若丹明B分光光度法GB/T9758.
2-19883钡色漆盒清漆"可溶性"金属含量的测定第3部分:钡含量的测定火焰原子发射光谱法GB/T9758.
3-19884镉色漆盒清漆"可溶性"金属含量的测定第4部分:镉含量的测定火焰原子吸收光谱法和极谱法GB/T9758.
4-19885铬(六价)色漆盒清漆"可溶性"金属含量的测定第5部分:液体色漆的颜料部分或粉末状色漆中六价铬含量的测定二苯卡巴肼分光光度法GB/T9758.
5-198815涂料与油漆6铬(总)0215色漆盒清漆"可溶性"金属含量的测定第6部分:色漆的液体部分中铬总含量的测定火焰原子吸收光谱法GB/T9758.
6-19887汞色漆盒清漆"可溶性"金属含量的测定第7部分:色漆的颜料部分和水可稀释漆的液体部分的汞含量的测定火焰原子吸收光谱法GB/T9758.
7-198816滴定分析用标准溶液1浓度0244化学试剂标准滴定溶液的制备GB/T601-200217杂质测定用标准溶液1阳离子浓度0244化学试剂杂质测定用标准溶液的制备GB/T602-20022阴离子浓度18无机化工产品1滴定分析测定主含量0244化学试剂标准滴定溶液的制备GB/T601-20022熔点范围化学试剂熔点范围测定通用方法GB/T617-20063硅酸盐化学试剂硅酸盐测定通用方法GB/T9742-20084金属元素、半金属元素(钾、钠、钙、镁、铁、锰、铜、锌、铬、铅、镉、汞、银、锶、锂、钡、钒、钼、钴、镍、铝、硒、砷、硼、锡、锑、铋)化学试剂火焰原子吸收光谱法通则GB/T9723-2007原子吸收光谱分析法通则GB/T15337-20085pH值化学试剂pH值测定通则GB/T9724-20076还原高锰酸钾物质化学试剂还原高锰酸钾物质测定通则GB/T9726-20077硫酸盐化学试剂硫酸盐测定通用方法GB/T9728-20078氯化物化学试剂氯化物测定通用方法GB/T9729-20079硫化物化学试剂硫化合物测定通用方法GB/T9731-200710铵化学试剂铵测定通用方法GB/T9732-200718无机化工产品11重金属0244化学试剂重金属测定通用方法GB/T9735-200812酸度、碱度化学试剂酸度和碱度测定通用方法GB/T9736-200813水不溶物化学试剂水不溶物测定通用方法GB/T9738-200814蒸发残渣化学试剂蒸发残渣测定通用方法GB/T9740-200815灼烧残渣化学试剂灼烧残渣测定通用方法GB/T9741-200819禁用染料及应用品1芳香胺0224纺织品禁用偶氮染料的测定GB/T17592-200620金属粉末和粉末冶金制品1材料的晶体结构分析、物相定性、定量分析0302转靶多晶体X射线衍射方法通则JY/T009-199621粉、固体类1形貌尺寸0351分析型扫描电子显微镜方法通则JY/T010-199622电子电器产品中的聚合物1铅及其化合物0244电子电气产品中限用的六种物质(铅、镉、汞、六价铬、多溴联苯、多溴二苯醚)浓度的测定IEC62321-20082汞及其化合物3镉及其化合物4六价铬化合物5聚溴联苯(PBB)6聚溴二苯醚(PBDE)23电子电器产品中的金属材料1铅及其化合物0244电子电气产品中限用的六种物质(铅、镉、汞、六价铬、多溴联苯、多溴二苯醚)浓度的测定IEC62321-20082汞及其化合物3镉及其化合物4六价铬化合物24电子电器产品中的其他元器件1铅及其化合物0244电子电气产品中限用的六种物质(铅、镉、汞、六价铬、多溴联苯、多溴二苯醚)浓度的测定IEC62321-20082汞及其化合物3镉及其化合物4六价铬化合物5聚溴联苯(PBB)6聚溴二苯醚(PBDE)25危险货物分类第2类-气体1气体或气体混合物易燃性1700易燃气体危险货物危险特性检验安全规范GB19521.
3-2004气体混合物危险货物危险特性检验安全规范GB19521.
9-2004联合国《关于危险货物运输的建议书规章范本》(第十六版)ST/SG/AC.
10/1/Rev.
16(以下简称:规章范本)2.
2章联合国《关于危险货物运输的建议书试验和标准手册》(第五版)ST/SA/AC.
10/11/Rev.
5(以下简称:试验和标准手册)31章26危险货物分类第3类-易燃液体1闭杯闪点1700连续闭杯闪点测定标准方法ASTMD6450:2005用宾斯克马丁密闭试验器测定闪点的试验方法ASTMD93:2010易燃液体危险货物危险特性检验安全规范GB19521.
2-20042持续燃烧性试验和标准手册ST/SA/AC.
10/11/Rev.
532.
5试验L.
23(初)沸点化学试剂沸点测定通用方法GB/T616-20064溶剂分离易燃液体危险货物危险特性检验安全规范GB19521.
2-2004试验和标准手册ST/SA/AC.
10/11/Rev.
532.
5试验L.
15粘度(用流出时间表示)易燃液体危险货物危险特性检验安全规范GB19521.
2-2004试验和标准手册ST/SA/AC.
10/11/Rev.
532.
4.
327危险货物分类第4类-易燃固体、易于自燃的物质、遇水放出易燃气体的物质1易燃固体初步筛分判定1700易燃固体危险货物危险特性检验安全规范GB19521.
1-2004试验和标准手册ST/SA/AC.
10/11/Rev.
533.
22易燃固体危险特性判定3易燃固体适用包装类别判定4自燃固体空气接触结果自燃固体危险货物危险特性检验安全规范GB19521.
5-2004试验和标准手册ST/SA/AC.
10/11/Rev.
533.
35自燃固体烘箱加热结果6遇水放出易燃气体的物质危险特性类别判定遇水放出易燃气体危险货物危险特性检验安全规范GB19521.
4-2004试验和标准手册ST/SA/AC.
10/11/Rev.
533.
4.
1.
4试验N.
528危险货物分类第5.
1项-氧化性物质1固体氧化物危险特性1700氧化性危险货物危险特性检验安全规范GB19452-2004试验和标准手册ST/SA/AC.
10/11/Rev.
534.
4.
1试验O.
12液体氧化物危险特性氧化性危险货物危险特性检验安全规范GB19452-2004试验和标准手册ST/SA/AC.
10/11/Rev.
534.
4.
1试验O.
229危险货物分类第8类-腐蚀性物质1金属腐蚀性1700金属腐蚀性测试标准方法ASTMG31:1972(2004)腐蚀性危险货物危险特性检验安全规范GB19521.
6-2004试验和标准手册ST/SA/AC.
10/11/Rev.
537.
4试验C.
130化学品物性鉴别1熔点范围1700化学试剂熔点范围测定通用方法GB/T617-20062开杯闪点和燃点克利夫兰开口杯法测定闪点和燃点ISO2592:2000石油产品闪点和燃点测定法(克利夫兰开口杯法)GB/T3536-20083固体和液体鉴别确定物质是固体还是液体的标准测试方法ASTMD4359-1990(2006)31物质安全技术参数(MSDS)1成分/组成;危险性;理化性质;稳定性与反应活性;毒理学数据;生态学数据;运输信息1700国际航协危险品操作手册(51版)ICAO危险物品安全航空运输技术细则2009-2010年版国际海运危险货物规则(2008版)危险货物品名表GB12268-2005化学品安全数据表ISO11014:2009化学品安全技术说明书编写规定GB/T16483-200832气体1全部项目0234气体中微量氧的测定电化学法GB/T6285-20032全部项目气体中微量水分的测定第2部分:露点法GB/T5832.
2-20083全部项目气体中一氧化碳、二氧化碳和碳氢化合物的测定气相色谱法GB/T8984-20084全部项目气体中微量氢的测定气相色谱法GB/T8981-20085全部项目气体分析标准混合气体组成的测定和校验比较法GB/T10628-200833工业用氧1全部项目0234工业用氧GB/T3863-200834工业氮1全部项目0234工业氮GB/T3864-200835工业氢1全部项目0234氢气第1部分:工业氢GB/T3634.
1-200636纯氮1全部项目0234纯氮、高纯氮和超纯氮GB/T8979-200837纯氖1全部项目0234纯氖GB/T17873-199938纯氦1全部项目0234纯氦GB4844.
2-199539氪气1全部项目0234氪气GB/T5829-200640纯甲烷1全部项目0234纯甲烷HG/T3633-199941高纯氧1全部项目0234纯氧、高纯氧和超纯氧GB/T14599-200842高纯氮1全部项目0234纯氮、高纯氮和超纯氮GB/T8979-200843氩1全部项目0234氩GB/T4842-200644高纯氦1全部项目0234高纯氦GB4844.
3-199545医用氧1全部项目0234医用及航空呼吸用氧GB8982-200946航空呼吸用氧1全部项目0234医用及航空呼吸用氧GB8983-200947灯泡用氩气1全部项目0234灯泡用氩气HG/T2863-199748电子工业用气体氮1全部项目0234电子工业用气体氮GB/T16944-200949电子工业用气体氩1全部项目0234电子工业用气体氩GB/T16945-200950电子工业用气体氢1全部项目0234电子工业用气体氢GB/T16942-200951电子工业用气体氧1全部项目0234电子工业用气体氧GB/T14604-200952电子工业用气体氦1全部项目0234电子工业用气体氦GB/T16943-200953电子工业用气体氧化亚氮1全部项目0234电子工业用气体氧化亚氮GB/T14600-200954纯氢、高纯氢1全部项目0234纯氢、高纯氢GB/T7445-199555氙气1全部项目0234氙气GB/T5828-200656医用氧化亚氮1全部项目0234医用氧化亚氮HG2685-199557工业液体二氧化碳1全部项目0234工业液体二氧化碳GB/T6052-199358焊接用二氧化碳1全部项目0234焊接用二氧化碳HG/T2537-199359溶解乙炔1全部项目0234溶解乙炔GB6819-200460食品添加剂液体二氧化碳1全部项目0234食品添加剂液体二氧化碳GB10621-200661乳及乳制品1三聚氰胺0227原料乳及乳制品中三聚氰胺检测方法GB/T22388-2008原料乳中三聚氰胺快速检测-液相色谱法GB/T22400-200862饲料1三聚氰胺0227饲料中三聚氰胺的测定NY/T1327-200763精密测量的机械零件几何参数1部分项目1308形状和位置公差通则、定义、符号和图样表示法GB/T1182-2008形状和位置公差未注公差值GB/T1184-1996公差原则GB/T4249-2009形状和位置公差最大实体要求、最小实体要求和可逆要求GB/T16671-2009形状和位置公差检测规定GB/T1958-2004只测直线度、平面度、圆度、圆柱度、线轮廓度、面轮廓度、平行度、垂直度、倾斜度、同轴度、对称度、位置度、圆跳度、全跳动、线性尺寸公差64热电偶检定炉1全部项目1504热电偶检定炉温度场测试技术规范JJF1184-2007(300~1300)℃65退火炉1全部项目1504退火炉温度场检测方法JCC/E121002.
1/0-2008(300~1500)℃66箱式电阻炉1部分项目1504间接电阻炉第7部分SX系列实验用箱式炉JB/T8195.
7-2007(300~1300)℃不测空炉损失67管式电阻炉1部分项目1504间接电阻炉第8部分SK系列实验用管式炉JB/T8195.
8-2007(300~1500)℃不测空炉损失68温度校验炉1全部项目1504恒温槽技术性能测试规范JJF1030-1998(-80~650)℃69恒温槽1全部项目1504恒温槽技术性能测试规范JJF1030-1998(-80~300)℃70干燥箱1部分项目1504干燥箱技术条件JB/T5520-1991室温~300℃,不测换气量71培养箱1全部项目1504电热恒温培养箱YY0027-1990室温~50℃72远红外干燥箱1部分项目1504远红外线干燥箱JB/T8282-1999室温~300℃,不测波长及辐射系数检查与最大换气量73真空干燥箱1全部项目1504真空干燥箱JB/T9505-1999室温~300℃74压力蒸汽消毒器1全部项目1504压力蒸汽消毒检测方法JCC/G401001.
1/0-2006100℃~200℃75高温试验箱1部分项目1504高温试验箱技术条件GB/T11158-2008室温~200℃,不测风速76低温试验箱1部分项目1504低温试验箱技术条件GB/T10589-2008-75℃~室温,不测风速77盐雾试验箱1全部项目1504盐雾试验箱技术条件GB/T10587-2006室温~60℃78长霉试验箱1部分项目1504长霉试验箱技术条件GB/T10588-2006室温~100℃,(10~100)%RH,不测风速79高、低温试验箱1部分项目1504高、低温试验箱技术条件GB/T10592-2008-75℃~200℃,不测风速80湿热试验箱1部分项目1504湿热试验箱技术条件GB/T10586-2006-75℃~200℃,(10~100)%RH,不测风速81热老化试验箱1部分项目1504空气热老化试验箱JB/T7444-1994室温~200℃,不测换气量82离子风机1部分项目0426静电第5-1部分:因静电现象电子设备的防护一般要求IEC61340-5-1:2007只测静电消除时间(0~100)s,离子平衡度(0~±1000)V83磁粉探伤机1部分项目0409磁粉探伤机机械JB/T8290-1998只测交流电流(0~9000)A,直流电流(0~±6000)A84磁性货物(空运)1杂散磁场0405IATA危险品规则902ICAO危险品安全航空运输技术细则包装说明90285锂电池航空运输安全检测1全部项目0431关于危险货物运输的建议书试验和标准手册UN/ST/SG/AC.
10/11/Rev.
5/38.
3条款关于危险货物运输的建议书规章范本UN/ST/SG/AC.
10/1/Rev.
16/3.
3章188条款、230条款IATA危险货物规范ICAO危险物品安全航空运输技术细则第965~970条86交流稳压电源1部分项目0415交流输出稳定电源JB/T7397-1994只测源效应、负载效应、失真度、漂移87直流稳压稳流电源1部分项目0415低压电气直流电源设备的特性GB/T17478-2004只测源效应、负载效应、纹波、漂移88VCD视盘机1全部项目0508VCD视盘机通用规范SJ/T10730-199789声频功率放大器(有源音箱)1部分项目0438声频放大器的测量方法GB/T9001-1988只测整机频率特性、谐波失真、功率带宽、最大输出功率、信噪比、过激励、输出电压调整率、音量控制器作用范围、互调失真系数、串音衰减90收录机(语言复读机)1部分项目0438磁带录音机测量方法GB/T2018-1987不测机械噪声91平面材料屏蔽效能1全部项目0428材料屏蔽效能的测量方法SJ20524-199592环境电磁场1全部项目0427环境电磁波卫生标准GB9175-198893屏蔽房屏蔽效能1全部项目0428高性能屏蔽室屏蔽效能的测量方法GB/T12190-200694电波暗室1归一化场衰减0419无线电骚扰和抗扰度测量设备规范GB/T6113.
104-20082场均匀域电磁兼容试验和测量技术射频电磁场辐射抗扰度试验GB/T17626.
3-200695噪声源声功率级1全部项目1405声学噪声源声功率级的测定消声室和半消声室精密法GB/T6882-2008ISO3745:2003声学声压法测定噪声源声功率级混响室精密法GB/T6881.
1-2002ISO3741-1999声学声压法测定噪声源声功率级反射面上方近似自由场的工程法GB/T3767-199696声场声学特性1全部项目1405声学环境噪声的描述、测量与评价第1部分:基本参量与评价方法GB/T3222.
1-200697助听器1全部项目1406助听器电声特性的测量方法GB/T6657-198698水准仪1部分项目1309水准仪GB/T10156-2009不测透镜组成像质量的相关参数99光学经纬仪1部分项目1309光学经纬仪GB/T3161-2003不测透镜组成像质量的相关参数100电涡流式测厚仪1全部项目1303磁性和涡流式覆盖层厚度测量仪JB/T8393-1996101磁阻法测厚仪1全部项目1303磁性和涡流式覆盖层厚度测量仪JB/T8393-1996102工作测振仪1全部项目1407对振动烈度测量的要求GB/T13824-1992103电阻应变仪1全部项目1015电阻应变仪技术条件JB/T6261-1992104扭转试验机1全部项目1325试验机通用技术要求GB/T2611-2007105拉力、压力和万能试验机1全部项目1323静力单轴试验机的检验GB/T16825.
1-2008液压式万能试验机GB/T3159-2008电液伺服万能试验机GB/T16826-2008电液伺服万能试验机JB/T8612-1997机械式拉力试验机技术条件JB/T9375-1999试验机通用技术要求GB/T2611-2007106电子式万能试验机1全部项目1323电子式万能试验机GB/T16491-2008107非金属拉力、压力和万能试验机1全部项目1323橡胶塑料拉力、压力和弯曲试验机(恒速驱动)技术规范GB/T17200-2008电液式水泥压力试验机JB/T8763-2001108膜盒压力表1全部项目0337膜盒压力表JB/T9274-1999109记录式压力表、压力真空表和真空表1全部项目0337一般压力表GB/T1226-2010110轮胎压力表1全部项目0337一般压力表GB/T1226-2010111弹簧管式一般压力表、压力真空表和真空表1全部项目0337一般压力表GB/T1226-2010隔膜压力表JB/T8624-1997抗震压力表JB/T6804-2006焊接、切割类似用压力表JB/T9271-1999氨压力表JB/T9272-1999远传压力表JB/T10203-2000电接点压力表JB/T9273-1999膜片压力表JB/T5491-2005膜盒压力表JB/T9274-19992部分项目船用压力表JB/T5527-2005不测摇摆、盐雾、外壳防护、永久性发光剂112弹簧管式精密压力表、压力真空表和真空表1全部项目0337精密压力表GB/T1227-2010113压力控制器1全部项目0337压力控制器JB/T6802-2008114数字压力计1全部项目0337数字压力表JB/T7392-2006115压力变送器1部分项目0337工业过程控制系统用变送器第1部分:性能评定方法GB/T17614.
1-2008不做频率响应、阶跃响应、过程流体的温度、过程流体流经变送器的流量、清洗气体流经变送器的流量、气动变送器附加试验116压力传感器1部分项目0337压力传感器性能试验方法GB/T15478-1995不测盐雾影响、热辐射影响、低气压影响、低温低气压综合影响、高温低气压综合影响、低温低气压湿热连续综合影响、砂尘试验、噪声影响117血压计和血压表1全部项目0337血压计和血压表GB3053-1993118浮标式氧气吸入器1全部项目0337浮标式氧气吸入器YY1107-2003119膜式燃气表1全部项目1316膜式燃气表GB/T6968-1997120涡街流量计1部分项目1316涡街流量传感器JB/T9249-1999(0.
016~48)m3/h,只测气体121浮子流量计1部分项目1316玻璃转子流量计JB/T9255-1999(0.
016~48)m3/h,只测气体122冷水水表1全部项目1316IC卡冷水水表CJ/T133-2007只测DN15~DN50123氧弹热量计1部分项目1505数显热量计JB/T9514-1999只测热容量重复性、抗运输环境试验、绝缘电阻和耐电压强度试验124工作用辐射温度计1部分项目1501比色温度计JB/T9240-1999不测均匀中性吸收、环境温度、外界磁场、水冷装置工作压力125测量人体温度的红外温度计1全部项目1503红外人体表面温度快速筛选仪通用技术条件GB/T19146-2003126带转换器热电偶1部分项目1501带转换器热电偶JB/T10202-2000只测基本误差、绝缘电阻、外观127机电式交流电能表1全部项目0410交流电测量设备特殊要求第11部分:机电式有功电能表(0.
5、1和2级)GB/T17215.
311-2008交流电测量设备特殊要求第11部分:机电式有功电能表(0.
5、1和2级)IEC62053-11-2003交流电测量设备-通用要求、试验和试验条件第11部分:测量设备GB/T17215.
211-2006交流电测量设备-通用要求、试验和试验条件第11部分:测量设备IEC62052-11-2003无功电度表GB/T15282-1994128电子式电能表1全部项目0410交流电测量设备-通用要求、试验和试验条件第11部分:测量设备GB/T17215.
211-2006交流电测量设备-通用要求、试验和试验条件第11部分:测量设备IEC62052-11-2003交流电测量设备特殊要求第21部分:静止式有功电能表(1级和2级)GB/T17215.
321-2008交流电测量设备特殊要求第21部分:静止式有功电能表(1级和2级)IEC62053-21:2003交流电测量设备特殊要求第22部分:静止式有功电能表(0.
2S级和0.
5S级)GB/T17215.
322-2008交流电测量设备特殊要求第22部分:静止式有功电能表(0.
2S级和0.
5S级)IEC62053-22:2003交流电测量设备特殊要求第23部分:静止式无功电能表(2级和3级)GB/T17215.
323-2008交流电测量设备特殊要求第23部分:静止式无功电能表IEC62053-23:2003129多费率电能表1全部项目0410多费率电能表特殊要求GB/T15284-2002130多功能电能表1全部项目0410多功能电能表DL/T614-2007多功能电能表特殊要求GB/T17215.
301-2007131预付费电度表1全部项目0410预付费电度表GB/T18460.
3-2001132电流互感器1全部项目0411电流互感器GB1208-2006可测最大电压3.
6kV133电压互感器1全部项目0411电压互感器GB1207-2006可测最大电压3.
6kV134接地电阻表(接地电阻测试仪)1部分项目0403直接作用模拟指示电测量仪表及其GB/T7676.
1-1998GB/T7676.
6-1998GB/T7676.
9-1998只测外观、基本误差、额定短路电流、位置影响135绝缘电阻表(兆欧表)1部分项目0403直接作用模拟指示电测量仪表及其GB/T7676.
1-1998GB/T7676.
6-1998GB/T7676.
9-1998只测外观、基本误差、额定短路电流、位置影响、自热136电子式绝缘电阻表1全部项目0410电阻测量装置通用技术要求第一部分:电子式绝缘电阻表DL/T845.
1-2004137高绝缘电阻测量仪(高阻计)1全部项目0402高阻计JB/T5466-1991138耐电压测试仪1湿度影响0411直接作用模拟指示电测量仪表及其GB/T7676.
9-1998139LCR测试仪1全部项目0411LCR测量仪测试方法SJ/T10298-1991140声级计1部分项目1401电声学声级计第1部分:规范IEC61672-2-2002不测大气压力变化对声级计灵敏度的影响141噪声剂量计1全部项目1401噪声剂量计技术条件JB/T6824-1993142个人声暴露计1全部项目1401个人声暴露计技术要求GB/T15952-1995143倍频程和1/3倍频程滤波器(带通滤波器)1全部项目1401倍频程和分数倍频程滤波器GB/T3241-1998倍频程和1/3倍频程滤波器OIMLR130:2001144纯音听力计1全部项目1401听力计第一部分:纯音听力计GB/T7341.
1-1998145阻抗听力计1全部项目1401耳声阻抗/导纳的测量仪器GB/T15953-1995146测试电容传声器1全部项目1401工作用标准传声器规范IEC61094-4:1995用比较法对工作标准传声器声压校准法IEC61094-5:2001147电阻法和电容法谷物水分测定仪1部分项目0232电容法和电阻法粮食水分测定仪通用技术条件GB/T19878-2005不测外壳机械强度、接线柱和引出线的牢固度148电导率仪1全部项目0236实验室电导率仪JB/T9366-1999工业电导率仪JB/T6855-1993电导率仪试验方法GB/T11007-2008149实验室pH(酸度)计1全部项目0236实验室pH计GB/T11165-2005150可见分光光度计1全部项目0236可见分光光度计JB/T9324-1999151紫外-可见分光光度计1全部项目0236紫外可见分光光度计JB/T6777-1993152原子吸收分光光度计1全部项目0236原子吸收分光光度计JB/T6780-1993原子吸收分光光度计GB/T21187-2007153荧光分光光度计1全部项目0236荧光分光光度计JB/T5594-1991154紫外、可见、近红外分光光度计1全部项目0236紫外可见近红外分光光度计JB/T6778-1993155旋光仪1全部项目0236旋光仪JB/T5593-1991156旋光糖量计1全部项目0236旋光糖量计JB/T5476-1991157气相色谱仪1全部项目0236实验室气相色谱仪JB/T6244-1992158液相色谱仪1全部项目0236液相色谱仪试验方法JB/T6857-1993159覆膜电极溶解氧测定仪1全部项目0236溶解氧测定仪SC/T7006-2001160离子计1全部项目0236实验室离子计JB/T6245-1992161二氧化硫气体检测仪1全部项目0236二氧化硫分析器技术条件JB/T6240-1992162一氧化碳、二氧化碳红外线气体分析器1全部项目0236红外线气体分析器试验方法JB/T9359.
2-1999163可燃气体检测报警器1全部项目0236可燃气体探测器GB15322.
2-2003164催化燃烧式甲烷测定器1全部项目0236便携式热催化甲烷检测报警仪GB13486-2000165测汞仪1全部项目0236测汞仪技术条件JB/T5228-1991166火焰光度计1全部项目0236火焰光度计技术条件JB/T10058-2000167非色散原子荧光光度计1全部项目0236原子荧光光度计通用技术条件DZ/T0183-1997原子荧光光谱仪GB/T21191-2007168放射性活度计1全部项目1620放射性活度计GB/T10256-1997169低本底α、β测量仪1全部项目1620低本底α和/或β测量仪GB/T11682-2008170α、β和γ表面污染仪1部分项目1620α、β和α-β(β能量大于60keV)污染测量仪与监测仪GB/T5202-2008不测能量响应、报警阈、最小可探测的单位面积活度171γ放射免疫计数器1部分项目1620γ放射免疫计数器GB/T10255-1996不测能量分辨率、能量响应的非线性172环境监测用X、γ辐射热释光剂量测量装置1部分项目1620个人和环境监测用热致发光剂量测定系统IEC61066-2006只测批均匀性、重复性、线性、能量响应、角响应、供电波动稳定性、使用环境条件、贮存和运输环境条件173环境监测用X、γ辐射空气吸收剂量率仪1部分项目1620辐射防护仪器—β、X和γ辐射周围和/或定向剂量当量(率)仪和/或监测仪-便携式工作场所与天然环境测量仪和监测仪IEC60846-1-2009只测线性、重复性、能量与入射角响应、剂量当量率响应、过载特性、响应时间、零点漂移、高低温、湿度、电磁兼容特性174辐射防护用X、γ辐射剂量当量(率)仪和监测仪1部分项目1620辐射防护仪器—β、X和γ辐射周围和/或定向剂量当量(率)仪和/或监测仪-便携式工作场所与天然环境测量仪和监测仪IEC60846-1-2009辐射防护仪器—β、X和γ辐射周围和/或定向剂量当量(率)仪和/或监测仪-紧急事故辐射防护用便携式高量程β和光子剂量与剂量率仪IEC60846-2-2007只测线性、重复性、能量与入射角响应、剂量当量率响应、过载特性、响应时间、零点漂移、高低温、湿度、电磁兼容特性2部分项目直读式个人χ和γ辐射剂量当量和剂量当量率监测仪GB/T13161-2003只测相对固有误差、重复性、报警阈值误差、能量响应、入射角响应、剂量当量率响应、过载特性、响应时间、供电欠压稳定性、使用环境条件、贮存和运输环境条件175个人监测用X、γ辐射热释光剂量测量装置1部分项目1620个人和环境监测用热致发光剂量测定系统IEC61066-2006只测批均匀性、重复性、线性、能量响应、角响应、供电波动稳定性、使用环境条件、贮存和运输环境条件176X、γ辐射个人报警仪1部分项目1620辐射防护仪器—监测装置—X、γ辐射个人报警装置GB/T14323-1993只测相对固有误差、灵敏度、报警阈值误差、能量响应、入射角响应、过载特性、报警声响、供电欠压稳定性、使用环境条件、贮存和运输环境条件177治疗水平电离室剂量计1部分项目1620医用电气设备—放射治疗用电离室剂量计IEC60731-1997只测分辨力、重复性、线性、X能量响应、Xγ能量响应、漏电、零点漂移、计时器分辨力、电离室旋转、校准因子、供电波动稳定性、使用环境条件、贮存和运输环境条件178间接电阻炉1部分项目1504电热设备的试验方法间接电阻炉GB/T10066.
4-2004(300~1000)℃只测温度示值、温度均匀度、温度稳定度179机电式有功电能表1全部项目0410交流电测量设备-第1部分:通用要求、试验和试验条件-测量设备(A、B和C级)NEN-EN50470-1-2006交流电测量设备-特殊要求-第2部分:机电式有功电能表(A和B级)NEN-EN50470-2-2006180静止式有功电能表1全部项目0410交流电测量设备-第1部分:通用要求、试验和试验条件-测量设备(A、B和C级)NEN-EN50470-1-2006交流电测量设备-特殊要求-第3部分:静止式有功电能表(A和B级)NEN-EN50470-3-2006181汽车收音机1全部项目0438汽车收、放音机总技术条件SJ/T10369-1993汽车收、放、扩音机分类与基本参数SJ/T10447-1993汽车收、放、扩音机测量方法SJ/T10448-1993182汽车放音机1全部项目0438汽车收、放音机总技术条件SJ/T10369-1993汽车收、放、扩音机分类与基本参数SJ/T10447-1993汽车收、放、扩音机测量方法SJ/T10448-1993183汽车扩音机1全部项目0438声频功率放大器通用技术条件SJ/T10406-1993声频放大器测量方法GB9001-1988184激光唱机1全部项目0438激光唱机通用技术要求GB/T15860-1995185GPS接收设备1部分项目0412全球导航卫星系统(GNSS)第一部分:全球定位系统(GPS)接收设备性能标准、测试方法和要求的测试结果GB/T18214.
1-2000不测特殊干扰信号影响186太阳辐射试验箱/太阳能模拟箱1部分项目1621光电器件.
第9部分:太阳能模拟器性能要求IEC60904-9-2007只测批均匀性、重复性、光谱分布187声学家用和类似用途电器(电冰箱)1全部项目1401声学家用电器及类似用途器具噪声测试方法第1部分:通用要求GB/T4214.
1-20002部分项目家用制冷器具冷藏箱GB/T8059.
1-1995家用制冷器具冷藏冷冻箱GB/T8059.
2-1995家用制冷器具冷冻箱GB/T8059.
3-1995家用制冷器具无霜冷藏箱、无霜冷藏冷冻箱、无霜冷冻食品储藏箱和无霜食品冷冻箱GB/T8059.
4-1993只测声功率级、声压级188声学家用和类似用途电器(空调器1全部项目1401声学家用电器及类似用途器具噪声测试方法第1部分:通用要求GB/T4214.
1-20002部分项目房间空气调节器GB/T7725-2004只测落地式空调的声压级189声学家用和类似用途电器(洗衣机)1全部项目1401声学家用电器及类似用途器具噪声测试方法第1部分:通用要求GB/T4214.
1-20002部分项目家用电动洗衣机GB/T4288-2008只测声功率级、声压级190声学家用和类似用途电器(微波炉)1全部项目1401声学家用电器及类似用途器具噪声测试方法第1部分:通用要求GB/T4214.
1-2000191声学家用和类似用途电器(吸油烟机)1全部项目1401声学家用电器及类似用途器具噪声测试方法第1部分:通用要求GB/T4214.
1-20002部分项目吸油烟机GB/T17713-1999只测声功率级、声压级192声学家用和类似用途电器(电风扇)1全部项目1401声学家用电器及类似用途器具噪声测试方法第1部分:通用要求GB/T4214.
1-20002部分项目交流电风扇和调速器GB/T13380-2007只测声功率级、声压级193声学信息技术设备和通信设备1全部项目1401声学信息技术设备和通信设备空气噪声的测量GB/T18313-2001声学信息技术设备和通信设备空气噪声的测量ISO7779-1999声学通信设备发射的空气噪声ETS300753-2009声学信息技术设备和通信设备空气噪声的测量Ecma74-2008194扬声器1部分项目1401扬声器主要性能测试方法GB/T9396-1996只测纯音检听、额定阻抗、阻抗曲线、指定频带内的特性灵敏度、指定频带内的特性灵敏度级、频率响应、有效频率范围、总谐波失真195机动车用喇叭1全部项目1401汽车电喇叭的性能要求及试验方法GB15742-2001196LED1部分项目1613LED测量CIE127:2007只测光谱特性;颜色特性;总光通量;平均光强;分布光强;正反向电压,反向电流;功耗197对环境有影响的物质1全氟辛烷磺酰基化合物(PFOS/PFOA)0240水的质量全氟辛烷磺酰基化合物(PFOS)和全氟辛烷化合物(PFOA)的测定ISO25101-2009食品包装材料中全氟辛烷磺酰基化合物(PFOS)的测定高效液相色谱-串联质谱法GB/T23243-20092邻苯二甲酸酯(Phthalates)0240儿童用护理用品、刀叉和喂养工具安全要求和试验6.
3.
2邻苯二甲酸酯含量的测定EN14372:2004玩具及儿童用品-聚氯乙烯塑料中邻苯二甲酸酯增塑剂的测定GB/T22048-20083多环芳烃(PAHs)0240超声波萃取法EPA3550C:2007气相色谱-质谱法测定半挥发性有机化合物EPA8270D:20074六溴环十二烷(HBCD)0240索氏提取法法EPA3540C:1996气相色谱-质谱法测定半挥发性有机化合物EPA8270D:20075富马酸二甲酯(DMF)0240超声波萃取法EPA3550C:2007气相色谱-质谱法测定半挥发性有机化合物EPA8270D:2007197对环境有影响的物质6四溴双酚A(TBBP-A)0240索氏提取法法EPA3540C:1996气相色谱-质谱法测定半挥发性有机化合物EPA8270D:20077卤素及硫(F/Cl/Br/I/S)0240废弃物特性卤素和硫含量密闭系统氧气燃烧和测定方法EN14582-20078石棉及其化合物0240粉状化妆品及其原料中石棉测定方法(暂定)x-射线衍射法测定石棉NIOSH9000环境空气无机纤维颗粒的数值浓度的测定扫描电子显微镜检查法ISO14966:2002滑石物理检验方法GB/T15344-1994198测听室1部分项目1401声学测听方法纯音气导和骨导听阈基本测听法GB/T16403-1996声学测听方法第2部分:用纯音及窄带测试信号的声场测听GB/T16296-1996只测环境噪声199材料物理性能1全部项目0301金属材料室温拉伸试验方法GB/T228-2002焊接接头拉伸试验方法GB/T2651-2008焊缝及熔敷金属拉伸试验方法GB/T2652-2008金属材料室温压缩试验方法GB/T7314-2005焊接接头弯曲试验方法GB/T2653-2008金属管弯曲试验方法GB/T244-2008金属材料弯曲试验方法GB/T232-1999金属洛氏硬度试验第1部分:试验方法GB/T230.
1-2009金属维氏硬度试验第1部分:试验方法GB/T4340.
1-2009金属布氏硬度试验方法第1部分:试验方法GB/T231.
1-2009金属夏比缺口冲击试验方法GB/T229-2007金属管压扁试验方法GB/T246-2007金属管扩口试验方法GB/T242-2007金属薄板拉伸应变硬化指数(n值)试验方法GB/T5028-2008金属薄板塑性应变比(r值)试验方法GB/T5027-2007200建筑物室内照明与配电质量1部分项目1612、0410建筑照明设计标准GB50034-2004照明测量方法GB/T5700-2008建筑节能工程施工质量验收规范GB50411-2007只测照度,亮度,色温,色坐标,显色指数,电压,电流,功率,谐波电压,谐波电流201电子收费专用短程通信系统1部分项目0419电子收费专用短程通信第一部分:物理层GB/T20851.
1-2007电子收费专用短程通信第一部分:物理层GB/T20851.
5-2007只测频率、电平202电磁辐射防护服1部分项目0428防护服装微波辐射防护服GB/T23463-2009只测屏蔽效能203机柜1全部项目0428电子设备机械结构公制系列和英制系列的试验第三部分:机柜、机架和插箱的电磁屏蔽性能试验GB/T18663.
3-2007204冲击测量仪1*全部项目0336振动与冲击传感器第22部分:冲击比较法GB/T20485.
22-2008205工业炉窑1工作区尺寸和有效加热区1504电热设备的试验方法GB/T10066.
1-2004电热装置基本技术条件GB/T10067.
1-2003热处理炉有效加热区测定方法GB/T9452-2003加热炉热工测定SY/T6381-2008电热设备的试验方法第四部分:间接电阻炉GB/T10066.
4-2004电热装置基本技术条件第四部分:间接电阻炉GB/T10067.
4-2005台车式电阻炉完好要求和检查评定方法SJ/T31415-1994间接电阻炉第5部分:RT系列台车式炉JB/T8195.
5-2007工业炉窑保温技术通则GB/T16618-1996工业热处理电炉节能监测方法GB/T15318-1994工业炉窑节能管理与监测通则DB31/T220-1999工业炉窑热平衡测定与计算DB31/T34-1999热处理合理用电导则GB/T10201-2008只测0~30m2电流只测0A~1000A3电压只测0V~1000V4有功功率只测0kW~300kW5电能只测0kWh~300kWh6功率因数只测0~17达稳时间只测0h~10h8炉温均匀度只测0℃~1200℃9炉温稳定度只测0℃~1200℃10表面温升只测50℃~300℃11炉体外表面温度只测50℃~300℃12排烟温度只测0℃~1200℃206工业锅炉热平衡1燃料发热量1504工业锅炉热工性能试验规程GB/T10180-2003电站锅炉性能试验规程GB/T10184-1988工业燃料炉热平衡测定与计算基本规则GB/T13338-1991燃煤工业锅炉节能监测GB/T15317-2009评价企业合理用热技术导则GB/T3486-1993设备热效率计算通则GB/T2588-2000煤的工业分析方法GB/T212-2008煤的发热量测定方法GB/T213-2008只测(14000~30000)J/g2燃料消耗量只测(0~500)kg3给水温度只测(0~300)℃4给水流量只测(0~50)t/h5蒸汽温度只测(200~600)℃6蒸汽压力只测(0~40)Mpa7蒸汽流量只测(0~50)t/h8排烟温度只测(100~1200)℃9排烟处烟气成分只测(0~100)%10炉渣飞灰等重量只测(0~500)kg11炉渣飞灰含碳量只测(0~100)%12炉渣飞灰等温度只测(200~1200)℃13环境温度只测(-20~60)℃14锅炉壁面温度只测(0~300)℃15锅炉表面积尺寸只测(0-20)m16空气过剩系数只测(0~21)%17测试时间只测(0~4)h18燃料元素成分只测(0~100)%207热力管道和绝热管道1介质温度0339设备及管道绝热效果测试及评价GB/T8174-2008设备及管道绝热设计导则GB/T8175-2008设备及管道绝热层表面热损失现场测定GB/T17357-2008设备及管道绝热技术通则GB/T4272-2008只测(-30~500)℃2介质压力只测(0~2.
5)MPa3管道表面温度只测(0~200)℃4管道几何尺寸只测(0~20)m5保温层厚度只测(0~1)m6环境温度只测(-10~60)℃7风速只测(0~20)m/s208水平衡测试1流体流量0357企业水平衡测试通则GB/T12452-2008节水型企业评价导则GB/T7119-2006只测(0~8)m/s2流体温度只测(-10~60)℃3环境湿度只测(0~100)%RH4环境温度只测(-10~60)℃209风机水泵空气压缩机及其系统1风压03450346风机机组与管网系统节能监测方法GB/T15913-2009动力用空气压缩机(站)经济运行与节能监测DB31/T54-1999泵类及液体输送系统节能监测方法GB/T16666-1996三相异步电动机经济运行GB/T12497-2006用电设备电能平衡通则GB8222-2008评价企业合理用电技术导则GB/T3485-1998只测(0~2500)Pa2风温只测(0~300)℃3风速只测(0~20)m/s4环境温度只测(-10~60)℃5流体进口压力只测(-0.
1~0.
4)MPa6流体出口压力只测(0~4)MPa7流体流速只测(0~20)m/s8电流只测(0~500)A9电压只测(0~500)V210压陷式眼压计1全部项目0337压陷式眼压计YY1036-2004CHINANATIONALACCREDITATIONSERVICEFORCONFORMITYASSESSMENTAPPENDIXOFACCREDITATIONCERTIFICATE(RegistrationNo.
CNASL0134)NAME:ShanghaiInstituteofMeasurementandTestingTechnology(NationalCenterofMeasruementandTestingforEastChina/NationalCenterofTestingTechnology,Shanghai)ADDRESS:No.
1500,ZhanghengRoad,Shanghai,ChinaDateofIssue:2009-08-21DateofExpiry:2012-08-20DateofUpdate:2012-03-22APPENDIX1-1SCOPEOFACCREDITEDTESTING№TestObjectItem/ParameterCodeofFieldTitle,CodeofStandardorMethodLimitationNote№Item/Parameter1ChemicalProduct1Particlesize0244Particlesizeanalysis-LaserdiffractionmethodsISO13320-2009Particlesizeanalysis-PhotoncorrelationSpectroscopyISO13321:1996Particlesizeanalysis—LaserdiffractionmethodsGB/T19077.
1-2008Particlesizeanalysis—PhotoncorrelationspectroscopyGB/T19627-2005Samplepreparation—DispersingproceduresforpowdersinliquidsISO14887:20001ChemicalProduct2Specificsurfacearea0244Metallicpowder--Determinationofthespecificsurfacearea—MethodofnitrogenadsorptionGB/T13390-2008DeterminationofspecificsurfaceareaofcatalystandadsorbtentGB/T5816-1995DeterminationofthespecificsurfaceareaofsolidsbygasadsorptionusingtheBETmethodGB/T19587-2004DeterminationofthespecificsurfaceareaofsolidsbygasadsorptionusingtheBETmethodISO9277:19952Drinkingnaturalmineralwater1Partialitems0233MethodsforexaminationofdrinkingnaturalmineralwaterGB/T8538-2008ExceptforTotalβradiation,226Raradiation,Be,gas,Esckerichiacoli,Benzopyrene(a)3Drinkingwater1Partialitems0233examinationmethodsfordrinkingwater---OrganolepticandphysicalparametersGB/T5750.
4-2006Accreditedonlyforcolour,turbidity,ordour&taste,visibleobjects,pH,totalhardness,volatilephenol,linearalklybezenesulfonates,dissolvedsolids3Drinkingwater2Partialitems0233examinationmethodsfordrinkingwater---NonmetalparametersGB/T5750.
5-2006Accreditedonlyforsulfate,chloride,fluoride,cyanide,nitrateN3Partialitemsexaminationmethodsfordrinkingwater---MetalparametersGB/T5750.
6-2006AccreditedonlyforFe,Mn,Cu,Zu,As,Se,Hg,Cd,Cr6+,Pb,Ag4Partialitemsexaminationmethodsfordrinkingwater---PesticidesparametersGB/T5750.
9-2006AccreditedonlyforCCl4,DDT,hexachlorocyclohexane5Partialitemsexaminationmethodsfordrinkingwater---Disinfectionby-productsparametersGB/T5750.
10-2006AccreditedonlyforCHCl36Partialitemsexaminationmethodsfordrinkingwater---DisinfectantsparametersGB/T5750.
11-2006Accreditedonlyforchlorineresidual7Partialitemsexaminationmethodsfordrinkingwater---MicrobiologicalparametersGB/T5750.
12-2006Accreditedonlyforaerobicbacterialcount4Water1Totalorganiccarbon0233Waterquality--Guidelinesforthedeterminationoftotalorganiccarbon(TOC)anddissolvedorganiccarbon(DOC)ISO8245:19992Partialitems0233Waterforanalyticallaboratoryuse–SpecificationandtestmethodsGB/T6682-2008AccreditedonlyforConductivity&Absorbance5Groundwater1Allitems0233TestMethodforcopper,lead,zinc,cadmium,manganese,chromium,nickel,cobalt,vanadium,tin,beryllium,titaniumofgroundwaterusinginductivelycoupledplasmaatomicemissionspectrometersDZ/T0064.
22-1993TestMethodforstrontium、bariumofgroundwaterusinginductivelycoupledplasmaatomicemissionspectrometersDZ/T0064.
42-19936Iron,steelandalloy1C0201TestMethodsforDeterminationofCarbon,Sulfur,Nitrogen,andOxygeninSteelandIron,Nickel,andCobaltAlloysASTME1019-2008Steelandiron-Determinationoftotalcarboncontent-InfraredabsorptionmethodaftercombustioninaninductionfurnanceISO9556-19892STestMethodsforDeterminationofCarbon,Sulfur,Nitrogen,andOxygeninSteelandIron,Nickel,andCobaltAlloysASTME1019-2008Steelandiron-Determinationofsulfurcontent-InfraredabsorptionmethodaftercombustioninaninductionfurnanceISO4935-19896Iron,steelandalloy3Mn0201Allloyedstell-Determinationofmanganesecontent-PotentiometricorvisualtitrationmethodGB/T223.
4-2008Methodsforchemicalanalysisofiron,steelandalloyThesodium(potassium)periodatephotometricmethodforthedeterminationofmanganesecontentGB/T223.
63-1988Iron,steelandalloy-Determinationofmanganesecontent-FlameatomicabsorptionspectrometricmethodGB/T223.
64-20084SiSteelandiron-Determinationofacid-solublesiliconandtotalsiliconcontent-ReducedmolybdosilicatespectrophotometricmethodGB/T223.
5-2008Methodsforchemicalanalysisofiron,steelandalloy-TheperchlorateaciddehydrationgravimetricmethodforthedeterminationofsiliconcontentGB/T223.
60-19975P0201Iron,steelandalloy-Determinationofphosphoruscontent-BismuthphosphomolybdatebluespectrophotometricmethodandantimonyphosphomolybdatebluespectrophometricmethodGB/T223.
59-20086Cu0201Methodsforchemicalanalysisofiron,steelandalloyTheflameatomicabsorptionspectrophotometricmethodforthedeterminationofcoppercontentGB/T223.
53-19877CrMethodsforchemicalanalysisofiron,steelandalloyTheammoniumpersulfateoxidationvolumetricmethodforthedeterminationofchromiumcontentGB/T223.
11-2008Methodsforchemicalanalysisofiron,steelandalloySeparatedbysodiumcarbonateandsys-diphenylcarbazidephotometricmethodforthedeterminationofchromiumcontentGB/T223.
12-19916Iron,steelandalloy8V0201Methodsforchemicalanalysisofiron,steelandalloyTheammoniumferroussulfatetitrationmethodforthedeterminationofvanadiumcontentGB/T223.
13-2000Methodsforchemicalanalysisofiron,steelandalloyTheN-benzoy-N-phenylhydroxylamineextrationphotometricmethodforthedeterminationofvanadiumcontenGB/T223.
14-20009Ni0201Iron,steelandalloy-Determinationofnickelcontent-ThedimethylglyoximephotometricmethodGB/T223.
23-2008Methodsforchemicalanalysisofiron,steelandalloyThedimethylglyoximegravimetricmethodforthedeterminationofnickelcontentGB/T223.
25-199410MoIron,steelandalloy-Determinationofmolybdenumcontent-ThethiocyanatespectrophotometricmethodGB/T223.
26-20086Iron,steelandalloy11Co0201Methodsforchemicalanalysisofiron,steelandalloyThenitroso-RsaltphotometricmethodforthedeterminationofcobaltcontentGB/T223.
22-1994Methodsforchemicalanalysisofiron,steelandalloyTheflameatomicabsorptionspectrophotometricmethodforthedeterminationofcobaltcontentGB/T223.
65-198812FeIronpowderDeterminationofironcontent-PotassiumdichromatetitrationmethodGB/T223.
7-200213TiMethodsforchemicalanalysisofiron,steelandalloyThechromotropicacidphotometricmethodforthedeterminationoftitaniumcontentGB/T223.
16-19917Copperandcopperalloys1Cu0201Methodsforchemicalofcopperandcopperalloys-Part1:DeterminationofcoppercontentGB/T5121.
1-20082PMethodsforchemicalofcopperandcopperalloys-Part2:DeterminationofphosphoruscontentGB/T5121.
2-20083PbMethodsforchemicalofcopperandcopperalloys-Part3:-DeterminationofleadcontentGB/T5121.
3-20087Copperandcopperalloys4C、S0201Methodsforchemicalanalysisofcopperandcopperalloys-Part4:DeterminationofcarbonandsulfurcontentGB/T5121.
4-20085NiMethodsforchemicalanalysisofcopperandcopperalloys-Part5:DeterminationofnickelcontentGB/T5121.
5-20086BiMethodsforchemicalanalysisofcopperandcopperalloys-Part6:DeterminationofbismuthcontentGB/T5121.
6-20087AsMethodsforchemicalanalysisofcopperandcopperalloys-Part7:DeterminationofarseniccontentGB/T5121.
7-20088FeMethodsforchemicalanalysisofcopperandcopperalloys-Part9:DeterminationofironcontentGB/T5121.
9-20089Sn0201Methodsforchemicalanalysisofcopperandcopperalloys-Part10:DeterminationoftincontentGB/T5121.
10-200810ZnMethodsforchemicalanalysisofcopperandcopperalloys-Part11:DeterminationofzinccontentGB/T5121.
11-20087Copperandcopperalloys11Sb0201Methodsforchemicalanalysisofcopperandcopperalloys-Part12:DeterminationofantimonycontentGB/T5121.
12-200812AlMethodsforchemicalanalysisofcopperandcopperalloys-Part13:DeterminationofaluminiumcontentGB/T5121.
13-200813MnMethodsforchemicalanalysisofcopperandcopperalloys-Part14:DeterminationofmanganesecontentGB/T5121.
14-200814CoMethodsforchemicalanalysisofcopperandcopperalloys-Part15:DeterminationofcobaltcontentGB/T5121.
15-200815CrMethodsforchemicalanalysisofcopperandcopperalloys-Part16:DeterminationofchromiumcontentGB/T5121.
16-200816BeMethodsforchemicalanalysisofcopperandcopperalloys-Part17:DeterminationofberylliumcontentGB/T5121.
17-200817Mg0201Methodsforchemicalanalysisofcopperandcopperalloys-Part18:DeterminationofmagnesiumcontentGB/T5121.
18-20087Copperandcopperalloys18Ag0201Methodsforchemicalanalysisofcopperandcopperalloys-Part19:DeterminationofsilvercontentGB/T5121.
19-200819ZrMethodsforchemicalanalysisofcopperandcopperalloys-Part20:DeterminationofzirconiumcontentGB/T5121.
20-200820TiMethodsforchemicalanalysisofcopperandcopperalloys-Part21:DeterminationoftitaniumcontentGB/T5121.
21-200821CdMethodsforchemicalanalysisofcopperandcopperalloys-Part22:DeterminationofcadmiumcontentGB/T5121.
22-200822SiMethodsforchemicalanalysisofcopperandcopperalloys-Part23:DeterminationofsiliconcontentGB/T5121.
23-20088Tin-leadsolders1Sn0201Methodsforchemicalanalysisoftin-leadsolders-DeterminationoftincontentGB/T10574.
1-20032SbMethodsforchemicalanalysisoftin-leadsolders-DeterminationofantimonycontentGB/T10574.
2-20033Bi0201Methodsforchemicalanalysisoftin-leadsolders-DeterminationofbismuthcontentGB/T10574.
3-20038Tin-leadsolders4Fe0201Methodsforchemicalanalysisoftin-leadsolders-DeterminationofironcontentGB/T10574.
4-20035AsMethodsforchemicalanalysisoftin-leadsolders-DeterminationofarseniccontentGB/T10574.
5-20036CuMethodsforchemicalanalysisoftin-leadsolders-DeterminationofcoppercontentGB/T10574.
6-20037AgMethodsforchemicalanalysisoftin-leadsolders-DeterminationofsilvercontentGB/T10574.
7-20038ZnMethodsforchemicalanalysisoftin-leadsolders-DeterminationofzinccontentGB/T10574.
8-20039AlMethodsforchemicalanalysisoftin-leadsolders-DeterminationofaluminumcontentGB/T10574.
9-200310CdMethodsforchemicalanalysisoftin-leadsolders-DeterminationofcadmiumcontentGB/T10574.
10-20038Tin-leadsolders11P0201Methodsforchemicalanalysisoftin-leadsolders-DeterminationofphosphoruscontentGB/T10574.
11-200312SMethodsforchemicalanalysisoftin-leadsolders-DeterminationofsulfurcontentGB/T10574.
12-20039Aluminiumandaluminiumalloys1Cu0201Methodsforchemicalanalysisofaluminiumandaluminiumalloys-Part3:DeterminationofcoppercontentGB/T20975.
3-20082FeMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part4:Determinationofironcontent-OrthopenanthrolinephotometricmethodGB/T20975.
4-20083SiMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part5:DeterminationofsiliconcontentGB/T20975.
5-20084CdMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part6:Determinationofcadmiumcontent-FlameatomicabsorptionspectrometricmethodGB/T20975.
6-20085Mn0201Methodsforchemicalanalysisofaluminiumandaluminiumalloys-Part7:Determinationofmanganesecontent-PotassiumperiodatespectrophotometricmethodGB/T20975.
7-20086ZnMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part8:DeterminationofzinccontentGB/T20975.
8-20089Aluminiumandaluminiumalloys7Li0201Methodsforchemicalanalysisofaluminiumandaluminiumalloys-Part9:Determinationoflithiumcontent-FlameatomicabsorptionspectrometricmethodGB/T20975.
9-20088SnMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part10:DeterminationoftincontentGB/T20975.
10-20089PbMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part11:Determinationofleadcontent-FlameatomicabsorptionspectrometricmethodGB/T20975.
11-200810TiMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part12:DeterminationoftitaniumcontentGB/T20975.
12-200811V0201Methodsforchemicalanalysisofaluminiumandaluminiumalloys-Part13:Determinationofvanadiumcontent-N-benzoy1-NphenylhydroxylaminespectrophotometricmethodGB/T20975.
13-200812NiMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part14:DeterminationofnickelconternGB/T20975.
14-20089Aluminiumandaluminiumalloys13B0201Methodsforchemicalanalysisofaluminiumandaluminiumalloys-Part15:DeterminationofboroncontentGB/T20975.
15-200814MgMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part16:DeterminationofmagnesiumGB/T20975.
16-200815SrMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part17:Determinationofstrontiumcontert-FlameatomicabsorptionspectrometricmethodGB/T20975.
17-200816CrMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part18:DeterminationofchromiumcontentGB/T20975.
18-200817Zr0201Methodsforchemicalanalysisofaluminiumandaluminiumalloys-Part19:DeterminationofzirconiumcontentGB/T20975.
19-200818GaMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part20:Determinationofgalliumcontent-ButyrhodamineBspectrophotometricmethodGB/T20975.
20-20089Aluminiumandaluminiumalloys19Ca0201Methodsforchemicalanalysisofaluminiumandaluminiumalloys-Part21:Determinationofcalciumcontent-FlameatomicabsorptionspectrometricmethodGB/T20975.
21-200820BeMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part22:Determinationofberylliumcontent-SCRspectrophotometricmethodGB/T20975.
22-200821SbMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part23:Determinationofantimonycontent-PotassiumiodidespectrophotometricmethodGB/T20975.
23-200822TotalrareearthcontentsMethodsforchemicalanalysisofaluminiumandaluminiumalloys-Part24:DeterminationoftotalrareearthcontentsGB/T20975.
24-20081Al0201Chemicalanalysismethodsofmagnesiumandmagnesiumalloys-DeterminationofaluminumcontentGB/T13748.
1-20052MnChemicalanalysismethodsofmagnesiumandmagnesiumalloys-Determinationofmanganesecontent-PeriodatespectrophotometricmethodGB/T13748.
4-200510Magnesiumandmagnesiumalloys3Zr0201Chemicalanalysismethodsofmagnesiumandmagnesiumalloys-DeterminationofzirconiumcontentGB/T13748.
7-20054RareearthcontentChemicalanalysismethodsofmagnesiumandmagnesiumalloys-Determinationofrareearthcontent-GravimetricmethodGB/T13748.
8-20055FeChemicalanalysismethodsofmagnesiumandmagnesiumalloys-Determinationofironcontent-OrthopenanthrolinespectrophotometricmethodGB/T13748.
9-20056SiChemicalanalysismethodsofmagnesiumandmagnesiumalloys-Determinationofsiliconcontent-MolybdenumbluespectrophotometricmethodGB/T13748.
10-20057BeChemicalanalysismethodsofmagnesiumandmagnesiumalloys-Determinationofberylliumcontent-SolochromecyanineTspectrophotometricmethodGB/T13748.
11-200510Magnesiumandmagnesiumalloys8Cu0201Chemicalanalysismethodsofmagnesiumandmagnesiumalloys-Determinationoflowcoppercontent-2,9-Dimethyl-1,10-phenanthrolinespectrophotometricmethodGB/T13748.
12-20059NiChemicalanalysismethodsofmagnesiumandmagnesiumalloys-Determinationofnickelcontent-DimethylglyoximetrophotometricmethodGB/T13748.
14-200510ZnChemicalanalysismethodsofmagnesiumandmagnesiumalloys-DeterminationofzinccontentGB/T13748.
15-200511Metalandalloy1Chemicalanalysis(C、S、Mn、P、K、Na、Ca、Mg、Fe、Mn、Cu、Zn、Cr、Pb、Cd、Hg、Ag、Sr、Li、Ba、V、Mo、Co、Ni、Al、Se,、As、B、Sn、Sb、Bi)0201ChemicalanalysisofMetallurgicalproductsGeneralruleforflameatomicabsorptionspectrometricmethodsGB/T7728-1987ChemicalanalysisofMetallurgicalproductsGeneralruleforspectrophotometricmethodsGB/T7729-1987GeneralrulesforatomicabsorptionspectrometricanalysisGB/T15337-2008TestMethodsforDeterminationofCarbon,Sulfur,Nitrogen,andOxygeninSteelandIron,Nickel,andCobaltAlloysASTME1019-2008Exceptforiron,steelandalloy,copperandcopperalloys,tin-leadsolders,Aluminiumandaluminiumalloys,Magnesiumandmagnesiumalloys11Metalandalloy2Semi-quantify、conformationanalysisofsurface0201PracticeforIdentifyingElementsbythePeaksinAugerElectronSpectroscopyASTME827-2008PracticeforcheckingtheoperatingcharacteristicsofX-rayphotoelectronspectrometersASTME902-200512Heavymetalsinmedicinalstarchandderivedproduct1As0228Starchandderivedproduct-Heavymetalscontent–AsISO11212-1:1997(E)2HgStarchandderivedproduct-Heavymetalscontent–HgISO11212-2:1997(E)3PbStarchandderivedproduct-Heavymetalscontent–PbISO11212-3:1997(E)4CdStarchandderivedproduct-Heavymetalscontent–CdISO11212-4:1997(E)13Heavymetalsandpesticideresidueinfoods1As0227Methodsforfoodhygienicanalysis-PhysicalandChemicalsection-GeneralprinciplesGB/T5009.
1-2003DeterminationoftotalarsenicandinorganicarsenicinfoodsGB/T5009.
11-2003ExceptforpretreatmentExceptforatomicfluorence2PbMethodsforfoodhygienicanalysis-PhysicalandChemicalsection-GeneralprinciplesGB/T5009.
1-2003DeterminationofleadinfoodsGB5009.
12-2010ExceptforpretreatmentExceptforatomicfluorence13Heavymetalsandpesticideresidueinfoods3Cu0227Methodsforfoodhygienicanalysis-PhysicalandChemicalsection-GeneralprinciplesGB/T5009.
1-2003MethodfordeterminationofcopperinfoodsGB/T5009.
13-2003Exceptforpretreatment4CdMethodsforfoodhygienicanalysis-PhysicalandChemicalsection-GeneralprinciplesGB/T5009.
1-2003DeterminationofcadmiuminfoodsGB/T5009.
15-2003ExceptforpretreatmentExceptforatomicfluorence5SnMethodsforfoodhygienicanalysis-PhysicalandChemicalsection-GeneralprinciplesGB/T5009.
1-2003DeterminationoftininfoodsGB/T5009.
16-2003ExceptforpretreatmentExceptforatomicfluorence6HgMethodsforfoodhygienicanalysis-PhysicalandChemicalsection-GeneralprinciplesGB/T5009.
1-2003DeterminationoftotalmercuryandorganicmercuyinfoodsGB/T5009.
17-2003ExceptforpretreatmentExceptforatomicfluorenceExceptorganicmercury7BHC、DDTMethodsforfoodhygienicanalysis-PhysicalandChemicalsection-GeneralprinciplesGB/T5009.
1-2003DeterminationofBHC,DDTinfoodsGB/T5009.
19-2008ExceptforpretreatmentExceptthesecondmethod(Thinlayerchromatography)14Heavymetalsintoys1Allitems0244ConsumerSafetySpecificationforToySafetyASTMF963-2008Safetyoftoys-Part3:MigrationofcertainelementBSEN71-3:1995Safetyoftoys-Part3:MigrationofcertainelementISO8124-3:2010(E)Nationalsafetytechnicalcodefortoys-AppendixCGB6675-2003Exceptforpretreatment15Heavymetalsinpaintsandvarnishes1Pb0215Paintsandvarnishes-Determinationof"soluble"metalcontent-Part1:Determinationofleadcontent-FlameatomicabsorptionspectrometricmethodanddithizonespectrometricmethodGB/T9758.
1-19882SbPaintsandvarnishes-Determinationof"soluble"metalcontent-Part2:Determinationofantiminycontent-FlameatomicabsorptionspectrometricmethodandrhodamineBspectrometricmethodGB/T9758.
2-19883BaPaintsandvarnishes-Determinationof"soluble"metalcontent-Part3:Determinationofbariumcontent-FlameatomicemissionspectrometricmethodGB/T9758.
3-198815Heavymetalsinpaintsandvarnishes4Cd0215Paintsandvarnishes-Determinationof"soluble"metalcontent-Part4:Determinationofcadmiumcontent-FlameatomicabsorptionspectrometricmethodandpolarographicmethodGB/T9758.
4-19885Cr(VI)Paintsandvarnishes-Determinationof"soluble"metalcontent-Part5:Determinationofhexavalentchromiumcontentofthepigmentportionoftheliquidpaintorthepaintinpowderform-DiphenylcarbazidespectrometricmethodGB/T9758.
5-19886Cr(total)Paintsandvarnishes-Determinationof"soluble"metalcontent-Part6:Determinationoftotalchromiumcontentoftheliquidportionofthepaint-FlameatomicabsorptionspectrometricmethodGB/T9758.
6-19887HgPaintsandvarnishes-Determinationof"soluble"metalcontent-Part7:Determinationofmercurycontentofthepigmentportionofthepaintandoftheliquidportionofwater-dilutablepaints-FlamelessatomicabsorptionspectrometricmethodGB/T9758.
7-198816volumetricsolutions1Concentration0244ChemicalreagentPreparationofvolumetricsolutionsGB/T601-200217Stocksolutions1Concentrationofanion0244ChemicalreagentPreparationofstocksolutionsGB/T602-20022Concentrationofcation18Inorganicchemicalproducts1Determinationthemaincontentbyvolumetricmethod0244ChemicalreagentPreparationofvolumetricsolutionsGB/T601-20022MeltingrangeChemicalreagentGeneralmethodforthedeterminationofmeltingrangeGB/T617-20063SilicateChemicalreagentGeneralmethodforthedeterminationofsilicateGB/T9742-20084Metalicelementandsemi-metalicelement(K、Na、Ca、Mg、Fe、Mn、Cu、Zn、Cr、Pb、Cd、Hg、Ag、Sr、Li、Ba、V、Mo、Co、Ni、Al、Se、As、B、Sn、Sb、Bi)ChemicalreagentGeneralrulesforflameatomicabsorptionspectrometryGB/T9723-2007GeneralrulesforflameatomicabsorptionspectrometryGB/T15337-20085pHvalueChemicalreagentGeneralrulesforthedeterminationofPhGB/T9724-20076Permanganate-reducingsubstanceChemicalreagentGeneralrulesforthedeterminationofPermanganate-reducingsubstanceGB/T9726-20077SulphateChemicalreagentGeneralmethodforthedeterminationofsulphateGB/T9728-20078ChlorideChemicalreagentGeneralmethodforthedeterminationofchlorideGB/T9729-20079Sulphurcompounds0244ChemicalreagentGeneralmethodforthedeterminationofsulphurcompoundsGB/T9731-200718Inorganicchemicalproducts10Ammonium0244ChemicalreagentGeneralmethodforthedeterminationofammoniumGB/T9732-200711HeavymetaleChemicalreagentGeneralmethodforthedeterminationofheavymetaleGB/T9735-200812AcidityandalkalinityChemicalreagentGeneralmethodforthedeterminationofacidityandalkalinityGB/T9736-200813WaterinsolublematterChemicalreagentGeneralmethodforthedeterminationofwaterinsolublematterGB/T9738-200814DryresidueafterevaporationChemicalreagentGeneralmethodforthedeterminationofdryresidueafterevaporationGB/T9740-200815ResidueafterignitionChemicalreagentGeneralmethodforthedeterminationofresidueafterignitionGB/T9741-200819Forbiddendyesanditsapplicants1Aromaticamine0224TexileproductDeterminationmethodforforbiddenazodyesGB/T17592-200620Metalpowder1Crystalloid、phaseanalysis0302GeneralrulesforX-raypolycrystallinediffractometryJY/T009-199621Powder、surfaceofsolidstatermaterial1Size&length0351GeneralrulesforanalyticalscanningelectronmicroscopyJY/T010-199622Polymersofelectricalandelectronicequipment1Pb0244Electrotechnicalproducts–Determinationoflevelsofsixregulatedsubstances(lead,mercury,cadmium,hexavalentchromium,polybrominatedbiphenyls,polybrominateddiphenylethers)IEC62321-20082Hg3Cd4Cr6+5PBB6PBDE23Metalmaterialofelectricalandelectronicequipment1Pb0244Electrotechnicalproducts–Determinationoflevelsofsixregulatedsubstances(lead,mercury,cadmium,hexavalentchromium,polybrominatedbiphenyls,polybrominateddiphenylethers)IEC62321-20082Hg3Cd4Cr6+24Restofelectricalandelectronicequipment1Pb0244Electrotechnicalproducts–Determinationoflevelsofsixregulatedsubstances(lead,mercury,cadmium,hexavalentchromium,polybrominatedbiphenyls,polybrominateddiphenylethers)IEC62321-20082Hg3Cd4Cr6+5PBB6PBDE25InspectionofhazardouspropertiesforDangerousGoodsClass2(Gases)1Testofflamabilityforgases&gasmixture1700SafetycodeforinspectionofhazardouspropertiesfordangerousgoodsofflammablegasGB19521.
3-2004SafetycodeforinspectionofhazardouspropertiesfordangerousgoodsofgasmixtureGB19521.
9-2004UNRecommendationonthetransportofdangerousgoodsModelRegulations2.
2ST/SG/AC.
10/1/Rev.
16UNRecommendationonthetransportofdangerousgoodsManualoftestsandcriteriaST/SA/AC.
10/11/Rev.
53126InspectionofhazardouspropertiesforDangerousGoodsClass3(Liquid)1Flashpoint1700TestMethodforflashpointbycontinuousclosedcuptesterASTMD6450:2005TestMethodsforFlashPointbyPensky-MartensClosedCupTesterASTMD93:2010SafetycodeforinspectionofhazardouspropertiesfordangerousgoodsofflammableliquidGB19521.
2-20042BurningtestManualoftestsandcriteriaST/SA/AC.
10/11/Rev.
532.
5testL.
23initialboilingpointChemicalReagentGneeralmethodforthedeterminationofboilingpointGB/T616-200626InspectionofhazardouspropertiesforDangerousGoodsClass3(Liquid)4Solventseparation1700SafetycodeforinspectionofhazardouspropertiesfordangerousgoodsofflammableliquidGB19521.
2-2004ManualoftestsandcriteriaST/SA/AC.
10/11/Rev.
532.
5testL.
15ViscositytestSafetycodeforinspectionofhazardouspropertiesfordangerousgoodsofflammableliquidGB19521.
2-2004ManualoftestsandcriteriaST/SA/AC.
10/11/Rev.
532.
4.
327InspectionofhazardouspropertiesforDangerousGoodsClass4(flammablesolid,pyrophoricsubstancesandsubstanceswhichincontactwithwateremitflammablegases)1preliminarysieveanalysisdeterminationofflammablesolids1700SafetycodeforinspectionofhazardouspropertiesfordangerousgoodsofflammablesolidsGB19521.
1-2004ManualoftestsandcriteriaST/SA/AC.
10/11/Rev.
533.
22Testfordangerouspropertiesofflammablesolids3Determinationtestforappliancepackagingofflammablesolids4TestforpyrophoricsolidwhichincontactwithairSafetycodeforinspectionofhazardouspropertiesfordangerousgoodsofpyrophoricsolidGB19521.
5-2004ManualoftestsandcriteriaST/SA/AC.
10/11/Rev.
533.
35Testforpyrophoricsolidheatinginoven27InspectionofhazardouspropertiesforDangerousGoodsClass4(flammablesolid,pyrophoricsubstancesandsubstanceswhichincontactwithwateremitflammablegases)6Determinationtestforhazardouspropertiesfordangerousgoodsofsubstanceswhichincontactwithwateremitflammablegases1700SafetycodeforinspectionofhazardouspropertiesfordangerousgoodsofsubstanceswhichincontactwithwateremitflammablegasesGB19521.
4-2004ManualoftestsandcriteriaST/SA/AC.
10/11/Rev.
533.
4.
1.
4testN.
528Dangerousgoodsclassificationpart5.
1(oxidizabilitygoods)hazardouspropertiesfordangerousoxidizabilitygoods1Testforhazardouspropertiesforsolidoxid1700SafetycodeforinspectionofhazardouspropertiesfordangerousoxidizabilitygoodsGB19452-2004ManualoftestsandcriteriaST/SA/AC.
10/11/Rev.
534.
4.
1testO.
12TestforhazardouspropertiesforliquidoxidSafetycodeforinspectionofhazardouspropertiesfordangerousoxidizabilitygoodsGB19452-2004ModelRegulationsST/SG/AC.
10/1/Rev.
14(14th)ManualoftestsandcriteriaST/SA/AC.
10/11/Rev.
534.
4.
1testO.
229Dangerousgoodsclassification8(corrosivesubstances)hazardouspropertiestest1Matalcorrosivitytest1700TestsandcriteriaformatalcorrosivityASTMG31:1972(2004)SafetycodeforinspectionofhazardouspropertiesfordangerousgoodsofcorrosivesubstancesGB19521.
6-2004ManualoftestsandcriteriaST/SA/AC.
10/11/Rev.
537.
4testC.
130Chemicalspropertiesdetermination1Meltingpointrange1700ChemicalregentGeneralmethodforthedeterminationofmeltingrangeGB/T617-20062Firepointandopen-cupflushpointDeterminationofflashandfirepoints-ClevelandopencupmethodISO2592:2000Testforoilproductsfirepoints(Clevelandopencupmethod)GB/T3536-20083ClassifyofsolidandliquidDeterminationwhetheramaterialisaLiquidorSolidASTMD4359-1990(2006)31Matterssafetydatasheet(MSDS)1Composition,fatalness,chemicalandphysicalproperties,stabilityandreacionactivity,toxicologydata,bionomicsdata,transportinformation1700IATADangerousGoodsRegulations(51th)ICAOTechnicalInstructionsfortheSafeTransportofDangerousGoodsbyAir(2009-2010)IMOIMDGCODE2008EditionListofdangerousgoodsGB12268-2005Safetydatasheetforchemicalproduct-ContentandorderofsectionsISO11014:2009GeneralrulesforpreparationofchemicalsafetydatasheetGB/T16483-200832GAS1AllItems234DeterminationoftraceoxygeningasesElectrochemicalmethodGB/T6285-20032AllItemsDeterminationofmoistureingas-Part2:DewpointmethodGB/T5832.
2-200832GAS3AllItems234Determinationofcarbonmonoxide,carbondioxideandhydrocarboninthegases—GaschromatographicmethodGB/T8984-20084AllItemsDeterminationoftracehydrogeninthegases—GaschromatographicmethodGB/T8981-20085AllItemsGasanalysis—ComparisonmethodsfordeterminationandcheckingcompositionofcalibrationgasmixturesGB/T10628-200833IndustrialOxygen1AllItems0234IndustrialOxygenGB/T3863-200834IndustrialNitrogen1AllItems0234IndustrialNitrogenGB/T3864-200835IndustrialHydrogen1AllItems0234IndustrialHydrogenGB/T3634.
1-200636PureNitrogen1AllItems0234PureNitrogenandHighPurityNitrogenandultraPureNitrogenGB/T8979-200837PureNeon1AllItems0234PureNeonGB/T17873-199938PureHelium1AllItems0234PureHeliumGB4844.
2-199539Krypton1AllItems0234KryptonGB/T5829-200640PureMethane1AllItems0234PureMethaneHG/T3633-199941HighPurityOxygen1AllItems0234HighPurityOxygenGB/T14599-200842HighPurityNitrogen1AllItems0234PureNitrogenandHighPurityNitrogenandultraPureNitrogenGB/T8979-200843Argon1AllItems0234ArgonGB/T4842-200644HighPurityHelium1AllItems0234HighPurityHeliumGB4844.
3-199545OxygenSuppliesForMedicine1AllItems0234OxygenSuppliesForMedicineGB8982-200946BreathingOxygenSuppliesForAircraft1AllItems0234BreathingOxygenSuppliesForAircraftGB8983-200947ArgonForGlowLamp1AllItems0234ArgonForGlowLampHG/T2863-199748GasesForElectronicIndustry-Nitrogen1AllItems0234GasesForElectronicIndustry-NitrogenGB/T16944-200949GasesForElectronicIndustry-Argon1AllItems0234GasesForElectronicIndustry-ArgonGB/T16945-200950GasesForElectronicIndustry-Hydrogen1AllItems0234GasesForElectronicIndustry-HydrogenGB/T16942-200951GasesForElectronicIndustry-Oxygen1AllItems0234GasesForElectronicIndustry-OxygenGB/T14604-200952GasesForElectronicIndustry-Helium1AllItems0234GasesForElectronicIndustry-HeliumGB/T16943-200953GasesForElectronicIndustry-nitrousOxide1AllItems0234GasesForElectronicIndustry-nitrousOxideGB/T14600-200954PureHydrogen,HighPurityHydrogen1AllItems0234PureHydrogen,HighPurityHydrogenGB/T7445-199555Xenon1AllItems0234XenonGB/T5828-200656NitrousOxideSuppliesForMedicine1AllItems0234NitrousOxideSuppliesForMedicineHG2685-199557CommercialLiquidCarbonDioxide1AllItems0234CommercialLiquidCarbonDioxideGB/T6052-199358CarbonDioxideForWelding1AllItems0234CarbonDioxideForWeldingHG/T2537-199359DissolvedAcetylene1AllItems0234DissolvedAcetyleneGB6819-200460FoodAdditiveLiquidCarbonDioxide1AllItems0234FoodAdditiveLiquidCarbonDioxideGB10621-200661Milkanddairyproducts1Melamine0227DeterminationofMelamineinrawmilkanddairyproductsGB/T22388-2008RapiddeterminationofmelamineinrawmilkHighperformanceliquidchromatographymethodGB/T22400-200862Feeds1Melamine0227DeterminationofMelamineinFeedsNY/T1327-200763Mechanismpartgeometryparameterprecisionmeasurement1Partialitems1308Generalities,definitions,symbols,indicationsondrawingsGB/T1182-2008Geometricaltolerancing–GeometricaltoleranceforfeatureswithoutindividualtoleranceindicationsGB/T1184-1996TolerancingprincipleGB/T4249-2009Geometricaltolerancing-Maximummaterialrequirement,leastmaterialrequirementandreciprocityrequirementGB/T16671-2009GeometricalproductSpecifications(GPS)-Geometricaltolerance–VerificationprescriptionGB/T1958-2004Accreditedonlyforstraightness,Flatness,Roundness,Cylindricity,lineprofile,surfaceprofile,parallelism,perpendicularity,angularity,concentricity,symmetry,trueposition,cyclerunout,totalrunout,Linealdimensiontolerance64ThermocoupleCalibrationFurnaces1Allitems1504TestingSpecificationofTemperatureUniformityinThermocoupleCalibrationFurnacesJJF1184-2007(300~1300)℃65AnnealingFurnace1Allitems1504TestingMethodofTemperature-FieldTestingforAnnealingFurnaceJCC/E121002.
1/0-2008(300~1500)℃66Boxresistancefurnace1Partialitems1504Part7:resistancefurnaces(SXseriesexperimentalboxfurnaces)JB/T8195.
7-2007(300~1300)℃Exceptfortheemptyfurnaceloss67Tuberesistancefurnace1Partialitems1504Part8Indirectresistancefurnaces(SKseriesexperimentaltubefurnaces)JB/T8195.
8-2007(300~1500)℃Exceptfortheemptyfurnaceloss68TemperatureCalibrator1Allitems1504MeasurementandTestNormofThermostaticBath'sMetrologicalCharacteristicsJJF1030-1998(-80~+650)℃69ThermostaticBath1Allitems1504MeasurementandTestNormofThermostaticBath'sMetrologicalCharacteristicsJJF1030-1998(-80~+300)℃70Dryingcabinet1Partialitems1504SpecificationofthedryingcabinetJB/T5520-1991RT~300℃Exceptforexchangingair71Culturecompartment1Allitems1504GalvanothermycomstanttemperatureculturecompartmentYY0027-1990RT~50℃72Farinfrareddryingcabinet1Partialitems1504Farinfra-reddryingcabinetJB/T8282-1999RT~300℃Exceptforexchangingairandcheckingradiate'scoefficientandWavelength73Vacuumdryingchamber1Allitems1504VacuumdryingchamberJB/T9505-1999RT~300℃74Steamsterilizer1Allitems1504TestingMethodofSteamsterilizerJCC/G401001.
1/0-2006100℃~200℃75Hightemperaturetestchamber1Partialitems1504SpecificationofthehightemperaturetestchamberGB/T11158-2008RT~200℃Exceptforwindspeed76Lowtemperaturetestchamber1Partialitems1504SpecificationofthelowtemperaturetestchamberGB/T10589-2008-75℃~RTExceptforwindspeed77Salt-fogcauterizetestchamber1Allitems1504Specificationofthesalt-fogcauterizetestchamberGB/T10587-2006RT~60℃78Mildewtestchamber1Partialitems1504SpecificationofthemildewtestchamberGB/T10588-2006RT~100℃(10~100)%RHExceptforwindspeed79thehightemperatureandlowtemperaturetestchamber1Partialitems1504SpecificationofthehightemperatureandlowtemperaturetestchamberGB/T10592-2008-75℃~+200℃Exceptforwindspeed80Temperatureandhumiditytestchamber1Partialitems1504SpecificationofthehumiditytestchamberGB/T10586-2006-75℃~+200℃(10~100)%RHExceptforwindspeed81Hotairageingtestchamber1Partialitems1504SpecificationofthehotairageingtestchamberJB/T7444-1994RT~200℃Exceptforexchangingair82Ionizer1Partialitems0426ElectrostaticsPart5-1:ProtectionofelectronicdevicesfromelectrostaticphenomenaGeneralrequirementsIEC61340-5-1:2007Accreditedonlyforstaticdelaytime(0~1000)shydroniumbalance(0~±1000)V83MagneticParticleFlawDetectors1Partialitems0409MagneticParticleFlawDetectorsJB/T8290-1998AccreditedonlyforACCurrent(0~9000)ADCCurrent(0~±6000)A84Magnetizedmaterial1Magneticfieldstrength0405IATADGRPackagingInstructions902ICAOTechnicalInstructionsfortheSafeTransportofDangerousGoodsbyAir90285SafetyInspectionofLithiumCellsandbatteriesinAviationtransportation1Allitems0431TransportofdangerousgoosManualofTestsandCriteriaUN/ST/SG/AC.
10/11/Rev.
5/item38.
3TransportofdangerousgoosModelregulationsUN/ST/SG/AC.
10/1/Rev.
16chapter3.
3item188、item230IATADangerousGoodsRegulationsICAOTechnicalInstructionsfortheSafeTransportofDangerousGoods965~97086ACconstantvoltagepowersupply1Partialitems0415A.
C.
outputstabilizedpowersupplyJB/T7397-1994Accreditedonlyforsourceeffect、loadeffect、distortion、drift87DCconstantvoltage/currentpowersupply1Partialitems0415Low-voltagepowersupplydevices,d.
c.
output—PerformancecharacteristicsGB/T17478-2004Accreditedonlyforsourceeffect、loadeffect、ripple、drift88Video-CDplayer1Allitems0508GeneralspecificationforVideo-CDplayerSJ/T10730-199789AudioPowerAmplifier(powerspeaker)1Partialitems0438MethodofmeasurementonaudioamplifierGB/T9001-1988Accreditedonlyforoverallfrequencycharacteristic,harmonicdistortion,powerbandwidth,maximumpoweroutput,signal-to-noiseratio,overdriven,outputvoltage,regulation,volumecontrolleractiverange,coefficientofintermodulationdistortion,crosstalkattenuation90radiorecorder(ComputerLanguageRecorder)1Partialitems0438MethodsofmeasuringthecharacteristicsofrecordingandreproducingequipmentforsoundonmagnetictapeGB/T2018-1987Exceptfornoiseofmechanical91shieldingeffectivenessofPlanarMaterials1Allitems0428MeasuringmethodsforshieldingeffectivenessofmaterialsSJ20524-199592environmentalelectmagneticfield1Allitems0427HygienicforenvironmentalelectmagneticwavesGB9175-198893shieldingeffectivenessofshieldingenclosures1Allitems0428Measurementofshieldingeffectivenessofhigh-performanceshieldingenclosuresGB/T12190-200694Anechoicchamber1normalizedsiteattenuation0419SpecificationsforradiodisturbanceandimmunitymeasuringapparatusandmethodsGB/T6113.
104-20082FielduniformityareaElectro-magneticcompatibilityTestingandmeasurementtechniquesRadiated.
radio-frequency,electromagneticfieldimmunitytestGB/T17626.
3-200695Determinationofsoundpowerlevelsofnoisesources1Allitems1405Acoustics-Determinationofsoundpowerlevelsofnoisesources-Precisionmethodsforanechoicandsemi-anechoicroomsGB/T6882-2008ISO3745:2003Acoustics--Determinationofsoundpowerlevelsofnoisesourcesusingsoundpressure--PrecisionmethodsforreverberationroomsGB/T6881.
1-2002ISO3741-1999Acoustics-determinationofsoundpowerlevelsofnoisesourcesusingsoundpressure-EngineeringmethodinanessentiallyfreefieldoverareflectingplaneGB/T3767-199696AcousticPerformanceofAcousticFields1Allitems1405Acoustics"Description,measurementandassessmentofenvironmentalnoise"Part1BasicquantitiesandassessmentproceduresGB/T3222.
1-200697Hearingaids1Allitems1406MeasurementofElectroacousticalCharacteristicsGB/T6657-198698Levels1Partialitems1309LevelsGB/T10156-2009Exceptforthetechnicaldataofglassesgroup99Opticaltheodolite1Partialitems1309OpitcaltheodoliteGB/T3161-2003Exceptforthetechnicaldataofglassesgroup100EddyCurrentMeasuringInstrumentforCoatingThickness1Allitems1303MagneticresistanceandeddycurrentmeasuringinstrumentforcoatingthicknessJB/T8393-1996101MagneticMeasuringInstrumentforCoatingThickness1Allitems1303MagneticresistanceandeddycurrentmeasuringinstrumentforcoatingthicknessJB/T8393-1996102WorkingMeasuringVibrationInstruments1Allitems1407RequirementsforinstrumentsformeasuringvibrationseverityGB/T13824-1992103Strainmeter1Allitems1015RequirementsforresistanceStrainGaugeIndicationJB/T6261-1992104TorsionTestingMachines1Allitems1325GenerairequirementsfortestingmachinesGB/T2611-2007105UniversaiTensionandCompressionTestingMachine1Allitems1323VerificationofstaticuniaxialtestingmachinesGB/T16825.
1-2008HydranlicUniversalTestingMachineGB/T3159-2008Eiectro-HydranlicservoUniversalTestingMachineGB/T16826-2008Eiectro-HydranlicserveUniversalTestingMachinesJB/T8612-1997SpecificationsforthemechanicaltensileTestingMachinesJB/T9375-1999GeneralrequirementsfortestingmachinesGB/T2611-2007106ElectronicUniversaiTestingMachine1Allitems1323ElectronicUniversaiTestingMachineGB/T16491-2008107TensionCompressionandUniversaiTestingMachineforNon-metallic1Allitems1323Technicalspecificationfortensile,CompressionandflexuralTestingMachinesforrubberandplastics(constantrateoftraverse)GB/T17200-2008Specificationsfortheelectro-hydraulicCompressionTestingMachineforCementJB/T8763-2001108Bellowsgauge1Allitems0337BellowsgaugeJB/T9274-1999109theRecordPressureGaugePressureVacuumGaugeandVacuumGaugeforGeneralUse1Allitems0337GeneralPressuregaugeGB/T1226-2010110TirePressuregauge1Allitems0337GeneralPressuregaugeGB/T1226-2010111BourdonTubPressuregauge,Pressure-VacuumGaugeandVacuumGaugeforGeneralUse1Allitems0337GeneralPressuregaugeGB/T1226-2010MembranePressureGaugeJB/T8624-1997AseismaticPressureGaugeJB/T6804-2006PressureGaugeusedforWeldingJB/T9271-1999AmmoniaPressureGaugeJB/T9272-1999TransmissiblePressureGaugeJB/T10203-2000PressureGaugewithElectricContactJB/T9273-1999MembranePressureGaugeJB/T5491-2005CapsulePressureGaugeJB/T9274-19992PartialitemsPressureGaugeforShipUsingJB/T5527-2005ExceptforSwingSaltMist,ShellSafeguard,PerdurableIlluminant112PreciseBourdonTubPressuregauge,Pressure-VacuumGaugeandVacuumGauge1Allitems0337AccuratePressureGaugeGB/T1227-2010113pressurecontroller1Allitems0337PressureControllerJB/T6802-2008114DigitalPressureGauge1Allitems0337DigitalPressureGaugeJB/T7392-2006115pressuretransmitter1Partialitems0337TransmittersforUseinIndustrial-ProcessControlSystemsTransmitterPart1:MethodsofEvaluatingthePerformanceGB/T17614.
1-2008ExceptforFrequencyresponse,stepresponse,theprocessfluidtemperature,theprocessoffluidflowthroughthetransmitter,cleaningthegasflowthroughthetransmitter,pneumatictransmitteradditionaltests116pressuretransducer1Partialitems0337TheMethodsofthePerformancesofPressureTransmitter/SensorGB/T15478-1995ExceptforSaltMistAffect,HeatingradiationAffect,LowAtmosphereAffect,LowTemperatureandAtmosphereAffect,HighTemperatureandLowAtmosphereAffect,LowTemperature,AtmosphereandHumid-heatContinuousComprehensiveAffect,andTestingNoiseAffect117sphygmomanometer1Allitems0337SphygmomanometerGB3053-1993118BuoyTypeOxygenInhalator1Allitems0337BuoyTypeOxygenInhalatorYY1107-2003119DiaphragmGasMeters1Allitems1316DiaphragmGasMetersGB/T6968-1997120Vortexsheddingflowmeters1Allitems1316VortexsheddingflowtransducerJB/T9249-1999AccreditedonlyforGas(0.
016~48)m3/h121Floatmeters1Allitems1316GlassRotameterJB/T9255-1999AccreditedonlyforGas(0.
016~48)m3/h122ColdWaterMeter1Allitems1316IntegratedcircuitcardwatermeterCJ/T133-2007AccreditedonlyforliquidDN15~DN50123Bombcalorimeter1Partialitems1505ThedigitalbombcalorimeterJB/T9514-1999Accreditedonlyforthetestoftherepeatingofthehotcapacity,theresisttransportation,environmentaltest,theinsulateresistanceandthetestofthevoltagestrengthresistant124WorkingRadiationThermometers1Partialitems1501Two-colourThermometerJB/T9240-1999Exceptforuniformityneutralabsorption,enviromenttemperature,externalmagneticfieldandwater-cooledplantworkingpressure125Infraredearthermomenters1Allitems1503GeneralrequirementsforinfrareddevicesforinstantscreeningofhumanckintemperatureGB/T19146-2003126Thermocouplewithconverter1Partialitems1501ThermocouplewithconverterJB/T10202-2000AccreditedonlyforIntrinsicerror,Insulateresistance,Appearance127Electromechanicalmetersformeasuringalternating-current1Allitems0410Electricitymeteringequipment(a.
c.
)-Particularrequirement-Part11:Electromechanicalmeterforactiveenergy(Class0.
5、1and2)GB/T17215.
311-2008Electricitymeteringequipment(AC)-Generalrequirements,testsandtestconditions-Part11:Meteringequipments(Class0.
5、1and2)IEC62053-11-2003Electricitymeteringequipment(a.
c.
)-Generalrequirements,testsandtestconditions-Part11:MeteringequipmentGB/T17215.
211-2006Electricitymeteringequipment(a.
c.
)-Generalrequirements,testsandtestconditions-Part11:MeteringequipmentIEC62052-11:2003ReactiveenergymetersGB/T15282-1994128Electricalenergymeterswithelectronics1Allitems0410Electricitymeteringequipment(a.
c.
)-Generalrequirements,testsandtestconditions-Part11:MeteringequipmentGB/T17215.
211-2006Electricitymeteringequipment(a.
c.
)-Generalrequirements,testsandtestconditions-Part11:MeteringequipmentIEC62052-11:2003Electricitymeteringequipment(a.
c.
)—Particularrequirements—Part21:Staticmetersforactiveenergy(classes1and2)GB/T17215.
321-2008Electricitymeteringequipment(a.
c.
)—Particularrequirements—Part21:Staticmetersforactiveenergy(classes1and2)IEC62053-21:2003Electricitymeteringequipment(a.
c.
)—Particularrequirements—Part22:Staticmetersforactiveenergy(classes0.
2Sand0.
5S)GB/T17215.
322-2008Electricitymeteringequipment(a.
c.
)—Particularrequirements—Part22:Staticmetersforactiveenergy(classes0.
2Sand0.
5S)IEC62053-22:2003128Electricalenergymeterswithelectronics1Allitems410Electricitymeteringequipment(a.
c.
)—Particularrequirements—Part23:Staticmetersforreactiveenergy(classes2Sand3S)GB/T17215.
323-2008Electricitymeteringequipment(a.
c.
)—Particularrequirements—Part23:Staticmetersforreactiveenergy(classes2Sand3S)IEC62053-23:2003129Multi-rateelectricitymeters1Allitems410Particularrequirementsformulti-rateelectricitymetersGB/T15284-2002130Multi-functionelectricitymeteringequipment1Allitems0410Multi-functionelectricitymeteringequipment(a.
c.
)DL/T614-2007Particularrequirementformulti-functionelectricitymetersGB/T17215.
301-2007131Pre-paymentelectricitymeters1Allitems0410Pre-paymentelectricitymetersGB/T18460.
3-2001132CurrentTransformer1Allitems0411CurrentTransformerGB1208-2006Maxmeasuredvoltage3.
6kV133VoltageTransformer1Allitems0411VoltagetransformerGB1207-2006Maxmeasuredvoltage3.
6kV134EarthResistanceMeters1Partialitems0403DiretactingindicatinganalogueelectricalmeasuringinstrumentsandtheiraccessoriesGB/T7676.
1-1998GB/T7676.
6-1998GB/T7676.
9-1998Accreditedonlyforappearance、intrinsicerror、ratedshortcircuitcurrent、positioninfluence135Megohm-meter1Partialitems0403DiretactingindicatinganalogueelectricalmeasuringinstrumentsandtheiraccessoriesGB/T7676.
1-1998GB/T7676.
6-1998GB/T7676.
9-1998Accreditedonlyforappearance、intrinsicerror、ratedshortcircuitcurrent、positioninfluence、self-heating136ElectronicInsulatingResistanceMeters1Allitems0410GeneralspecificationsformeasuringresistanceequipmentsPart1:ElectronicinsulationresistancemetersDL/T845.
1-2004137HighInsulationResistanceMeters1Allitems0402HighInsulationResistanceMetersJB/T5466-1991138WithstandingVoltageTesters1Humidityinfluence0411DirectactingindicatinganalogueelectricalmeasuringinstrumentsandtheiraccessoriesGB/T7676.
9-1998139LCRMeter1Allitems0411TestmethodsofLCRMeasuringinstrumentsSJ/T10298-1991140SoundLevelMeter1Partialitems1401Electroacoustics-SoundLevelMeters-Part1:SpecificationsIEC61672-2-2002Exceptforradiofrequencycriteriaunderstaticpressure141noisedosemeter1Allitems1401SpecificationsfornoisedoseMeterJB/T6824-1993142personalsoundexposuremeters1Allitems1401SpecificationsforPersonalSoundExposureMetersGB/T15952-1995143OctaveBandandOne-Third-OctaveBandFilters1Allitems1401Octave-Bandandfractional-octave-bandfiltersGB/T3241-1998Octave-Bandandfractional-octave-bandfiltersOIMLR130:2001144Audiometer1Allitems1401AudiometersPart1:Pure-toneaudiometersGB/T7341.
1-1998145AuralImpedanceAudiometers1Allitems1401Instrumentsforthemeasurementofauralacousticimpedance/admittanceGB/T15953-1995146MeasuringCondenserMicrophones1Allitems1401measurementmicrophonespart4:specificationsforworkingmicrophonesIEC61094-4:1995methodsforpressurecalibrationofworkingmicrophonesbycomprisonIEC61094-5:2001147Instrumentsformeasuringthemoisturecontentofgrainwithcapacitanceandresistancemethod1Partialitems0232Capacitancetypeandresistancetypegrainmoisturetester–GeneralspecificationsGB/T19878-2005Exceptforshellmechanicalstrength,thefirmnessofconnectorsandleads148ElectrolyticConductivityMeter1Allitems0236LaboratoryconductivitymeterJB/T9366-1999IndustrialconductivitymeterJB/T6855-1993TestmethodofelectrolyticconductivityanalyzerGB/T11007-2008149LaboratorypHMeters1Allitems0236LaboratorypHMeterGB/T11165-2005150VisibleRangeSpectrophotometer1Allitems0236VisiblespectrophotometerJB/T9324-1999151UltravioletVisibleRangeSpectrophotometer1Allitems0236UltravioletVisibleRangeSpectrophotometerJB/T6777-1993152AtomicAbsorptionSpectrophotometer1Allitems0236AtomicAbsorptionSpectrophotometerJB/T6780-1993AtomicAbsorptionSpectrophotometerGB/T21187-2007153FluorescenceSpectrophotometer1Allitems0236FluorescenceSpectrophotometerJB/T5594-1991154Ultraviolet,Visible,Near-InfraredSpectrophotometer1Allitems0236Ultraviolet,Visible,Near-InfraredSpectrophotometerJB/T6778-1993155Polarimeter1Allitems0236PolarimeterJB/T5593-1991156Saccharimeter1Allitems0236SaccharimeterJB/T5476-1991157GasChromatograph1Allitems0236LaboratoryGasChromatographJB/T6244-1992158LiquidChromatographs1Allitems0236TestingMethodsforLiquidChromatographsJB/T6857-1993159FilmElectrodeDissolvedOxygenMeter1Allitems0236DissolvedOxygenMeterSC/T7006-2001160Ionometer1Allitems0236LaboratoryIonometerJB/T6245-1992161SulfurDioxideGasDetectors1Allitems0236GeneralSpecificationofSulfurDioxideAnalyzerJB/T6240-1992162CarbonmonoxideandCarbonDioxideInfraredGasAnalyzer1Allitems0236TestmethodofinfraredgasanalyzerJB/T9359.
2-1999163TheAlarmerDetectorsofCombustibleGas1Allitems0236CombustiblegasdetectorsGB15322.
2-2003164CatalysisCombustionTypeMethaneMeasuringDevice1Allitems0236PortableheatingcatalyticmethanealarmdetectorGB13486-2000165MercuryAnalyzer1Allitems0236SpecificationofMercuryAnalyzerJB/T5228-1991166FlamePhotometer1Allitems0236SpecificationofflamephotometerJB/T10058-2000167Non-disperseAtomicFluorescenceSpectrometer1Allitems0236GeneralSpecificationofAtomicFluorescenceSpectrometerDZ/T0183-1997AtomicfluorescencespectrometerGB/T21191-2007168Radioactivitymeter1Allitems1620RadioactivitymeterGB/T10256-1997169Lowbackgroundalphaand/orbetameasuringinstrument1Allitems1620Lowbackgroundalphaand/orbetameasuringinstrumentGB/T11682-2008170Alphabetaandgammasurfaceinstrument1Partialitems1620Radiationprotection-Alpha,betaandalpha/beta(betaenergy>60keV)contaminationmetersandmonitorsGB/T5202-2008Exceptforenergyresponse,thresholdalarmandminimumdetectedactivitybyarea171Gammaradioimmunoassaycounters1Partialitems1620GammaradioimmunoassaycountersGB/T10255-1996Exceptforenergydistinguishabilityandnon-linearityofenergyresponse172ThermoluminescencedosimetrysystemsusedinenvironmentalmonitoringforXandgammaradiation1Partialitems1620ThermoluminescencedosimetrysystemsforpersonalandEnvironmentalMonitoringIEC61066-2006Accreditedonlyforbanchhomogeneity,repeatability,linearity,energyresponse,isotropy,primarypowersupplyvoltage,stabilityundervariousclimaticconditions,storingundervariousclimaticconditionsvibration,dropping,impact173XandgammaradiationairKermaratemetersforenvironmentalmonitoring1Partialitems1620Radiationprotectioninstrumentation-Ambientand/ordirectionaldoseequivalent(rate)metersand/ormonitorsforbeta,Xandgammaradiation-Part1:PortableworkpalceandenvironmentalmetersandmonitorsIEC60846-1-2009AccreditedonlyforLinearity,Statisticalfluctuation,X&γradiationenergy&angleofincidence,Doseratefordosemeasurement,Overload,Responsetime,Zerodrift,Powersupplies,Ambienttemperature,Relativehumidity,Electromagneticdisturbances174XandGammaRadiationDoseEquivalent(Rate)MetersandMonitorsUsedinRadiationProtection1Partialitems1620Radiationprotectioninstrumentation-Ambientand/ordirectionaldoseequivalent(rate)metersand/ormonitorsforbeta,Xandgammaradiation-Part1:PortableworkpalceandenvironmentalmetersandmonitorsIEC60846-1-2009Radiationprotectioninstrumentation-Ambientand/ordirectionaldoseequivalent(rate)metersand/ormonitorsforbeta,Xandgammaradiation-Part2:HighrangebetaandphotondoseanddoserateprotableinstrumentsforemergencyradiationprotectionpurposesIEC60846-2-2007AccreditedonlyforLinearity,Statisticalfluctuation,X&γradiationenergy&angleofincidence,Doseratefordosemeasurement,Overload,Responsetime,Zerodrift,Powersupplies,Ambienttemperature,Relativehumidity,Electromagneticdisturbances174XandGammaRadiationDoseEquivalent(Rate)MetersandMonitorsUsedinRadiationProtection2Partialitems1620DirectreadingPersonaldoseequivalent(rate)MonitorsforXandGammaRadiationGB/T13161-2003Accreditedonlyforrelativeintrinsicerror,repeatability,alarmthresholdenergyresponse,angleofincidence,doseequivalentratedependence,overload,responsetime,powersupplyvoltage,stabilityundervariousclimaticconditions,storingundervariousclimaticconditionsvibration,dropping,impact175ThermoluminescencedosimetrysystemsusedinpersonalmonitoringforXandgammaradiation1Partialitems1620ThermoluminescencedosimetrysystemsforpersonalandEnvironmentalMonitoringIEC61066-2006Accreditedonlyforbanchhomogeneity,repeatability,linearity,energyresponse,isotropy,primarypowersupplyvoltage,stabilityundervariousclimaticconditions,effectofvibration,droppingeffect,impacteffect176PersonalWarningDevicesforXandγRadiations1Partialitems1620Radiationprotectioninstrumentation-Monitoringequipment-PersonalwarningdevicesforXandgammaradiationsGB/T14323-1993Accreditedonlyforrelativeintrinsicerror,sensitivity,alarmthresholdenergyresponse,angleofincidence,overload,alarmvolume,powersupplyvoltage,stabilityundervariousclimaticconditions,storingundervariousclimaticconditionsvibration,dropping,impact177Dosimeterswithionizationchambersasusedinradiotherapy1Partialitems1620Medicalelectricalequipment—DosimeterswithionizationchambersasusedinradiotherapyIEC60731-1997Accreditedonlyforresolution,repeatability,linearity,Xenergyresponse,X-γenergyresponse,leakage,zerodrift,timerresolution,rotation,calibrationfactor,primarypowersupplyvoltage,stabilityundervariousclimaticconditions,effectofvibration,droppingeffect,impacteffect178Indirectresistancefurnaces1Partialitems1504Testmethodsforelectroheatinstallations-IndirectresistancefurnacesPart:IndirectresistancefurnacesGB/T10066.
4-2004(300~1000)℃AccreditedonlyforIndicationErrorofTemperature、TemperatureEqualityDegreeandTemperatureStability179Electromechanicalmetersforactiveenergy1Allitems0410Electricitymeteringequipment(a.
c.
)-Part1:Generalrequirements,testsandtestconditions-Meteringequipment(classindexesA,BandC)NEN-EN50470-1-2006Electricitymeteringequipment(a.
c.
)-Part2:Particularrequirements-Electromechanicalmetersforactiveenergy(classindexesAandB)NEN-EN50470-2-2006180Staticmetersforactiveenergy1Allitems0410Electricitymeteringequipment(a.
c.
)-Part1:Generalrequirements,testsandtestconditionsMeteringequipment(classindexesA,BandC)NEN-EN50470-1-2006Electricitymeteringequipment(a.
c.
)-Part3:Particularrequirements-Staticmetersforactiveenergy(classindexesA,BandC)NEN-EN50470-3-2006181Carradio1Allitems0438GeneralspecificationforcarradiocassetteplayerSJ/T10369-1993ClassificationandbasicparameterofcarradiocassetteplayerandaudioamplifierSJ/T10447-1993MeasuringmetnodsofcarradiocassetteplayerandaudioamplifierSJ/T10448-1993182Carcassetteplayer1Allitems0438GeneralspecificationforcarradiocassetteplayerSJ/T10369-1993ClassificationandbasicparameterofcarradiocassetteplayerandaudioamplifierSJ/T10447-1993MeasuringmetnodsofcarradiocassetteplayerandaudioamplifierSJ/T10448-1993183Caraudioamplifier1Allitems0438GeneralspecificationforaudiopoweramplifiersSJ/T10406-1993MethodofmeasurementonaudioamplifierGB9001-1988184compactdiscplayer1Allitems0438GeneralspecificationforcompactdiscplayerGB/T15860-1995185GPSreceiver1Partialitems0412Globalnavigationsatellitesystem(GNSS)-part1:Globalpositioningsystem(GPS)-Receiverequipment-Performances,methodsoftestingandrequiredtestresultsGB/T18214.
1-2000Exceptfortheinfluenceofthespecialsignal186SolarIrradiancetestsystems/Solarsimulator1Partialitems1621PhotovoltaicdevicesPart9:SolarsimulatorperformancerequirementsIEC60904-9-2007Accreditedonlyforbatchhomogeneity,repeatabilitySpectralmatch187Acoustics-Householdandsimularelectricalappliances—(Freezers)1Allitems1401Acoustics-Householdandsimularelectricalappliances—Testcodefordeterminationofairborneacousticalnoise–Part1:GeneralrequirementsGB/T4214.
1-20002PartialitemsHouseholdrefrigeratingappliances–RefrigeratorGB/T8059.
1-1995Householdrefrigeratingappliances–Refrigerator--freezersGB/T8059.
2-1995Householdrefrigeratingappliances-FreezersGB/T8059.
3-1995Householdrefrigeratingappliancesfrost-freerefrigerators,frost-freerefrigerator-freezers,frost-freefrozenfoodstoragecabinetsandfrost-freefoodfreezersGB/T8059.
4-1993AccreditedonlyforSoundpowerlevels,Soundpressurelevels188Acoustics-Householdandsimularelectricalappliances—(Roomaircondition)1Allitems1401Acoustics-Householdandsimularelectricalappliances—Testcodefordeterminationofairborneacousticalnoise–Part1:GeneralrequirementsGB/T4214.
1-20002PartialitemsRoomairconditionGB/T7725-2004AccreditedonlyforSoundpressurelevelsofFloor-standingair-conditioning189Acoustics-Householdandsimularelectricalappliances—(washingmachine)1Allitems1401Acoustics-Householdandsimularelectricalappliances—Testcodefordeterminationofairborneacousticalnoise–Part1:GeneralrequirementsGB/T4214.
1-20002PartialitemsHouseholdelectricwashingmachineGB/T4288-2008AccreditedonlyforSoundpowerlevels,Soundpressurelevels190Acoustics-Householdandsimularelectricalappliances—(micro-waveoven)1Allitems1401Acoustics-Householdandsimularelectricalappliances—Testcodefordeterminationofairborneacousticalnoise–Part1:GeneralrequirementsGB/T4214.
1-2000191Acoustics-Householdandsimularelectricalappliances—(Rangehood)1Allitems1401Acoustics-Householdandsimularelectricalappliances—Testcodefordeterminationofairborneacousticalnoise–Part1:GeneralrequirementsGB/T4214.
1-20002PartialitemsRangehoodGB/T17713-1999AccreditedonlyforSoundpowerlevels,Soundpressurelevels192Acoustics-Householdandsimularelectricalappliances—(electricfans)1Allitems1401Acoustics-Householdandsimularelectricalappliances—Testcodefordeterminationofairborneacousticalnoise–Part1:GeneralrequirementsGB/T4214.
1-20002Partialitems1401A.
C.
electricfansandregulatorsGB/T13380-2007AccreditedonlyforSoundpowerlevels,Soundpressurelevels193Acoustics--Informationtechnologyandtelecommunicationsequipment1Allitems1401Acoustics--MeasurementofairbornenoiseemittedbyinformationtechnologyandtelecommunicationsequipmentGB/T18313-2001Acoustics--MeasurementofairbornenoiseemittedbyinformationtechnologyandtelecommunicationsequipmentISO7779-1999Acousticnoise.
emittedbytelecommunication.
EquipmentETS300753-2009MeasurementofAirborneNoiseEmittedbyInformationTechnologyandTelecommunicationsEquipmentEcma74-2008194Loudspeakers1Partialitems1401MethodsofmeasurementformiancharacteristicsofloudspeakersGB/T9396-1996AccreditedonlyforPuretoneTest,NominalimpedanceImpedancecaveCharacteristicSensitiveinSpecifiedFrequencyBandCharacteristicSensitiveLevel1Partialitems1401MethodsofmeasurementformiancharacteristicsofloudspeakersGB/T9396-1996inSspecifiedFrequencyBandFrequencyResponse,EffectiveFrequencyRangeTotalHarmonicDistortion195Hornformotorvehicles1Allitems1401PerformancerequirementsandtestmethodsofhornformotorvehiclesGB15742-2001196LED1Partialitems1613MEASUREMENTOFLEDSCIE127:2007AccreditedonlyforSpectruncharacteristic;colorimetriccharacteristic;Totalflux;averageintensity;spectraldistribution;ForwardVoltageand;ReverseVoltageandCurrent;ConsumedPower197Materialimpactingonenvironment1Perfluorooctanesulphonate(PFOS/PFOA)0240Waterquality—Determinationofperfluorooctanesulfonate(PFOS)andperfluorooctanoate(PFOA)ISO25101-2009Determinationofperfluorooctanesulfonates(PFOS)inthefoodpackagingmaterial-Highperformanceliquidchromatography-tandemmassspectrometryGB/T23243-20092PhthalatesChilduseandcarearticles.
Cutleryandfeedingutensils.
Safetyrequirementsandtests6.
3.
2DeterminationofphthalatecontentEN14372:2004Toysandchildren'sproducts-DeterminationofphthalateplasticizersinpolyvinylchlorideplasticGB/T22048-2008197Materialimpactingonenvironment3PolycyclicAromaticHydrocarbons(PAHs)0240UltrasonicextractionEPA3550C:2007SemivolatatileorganiccompoundsbyGaschromatography/MassSpectrometryEPA8270D:20074Hexabromocyclododecane(HBCD)SoxhletextractionEPA3540C:1996SemivolatatileorganiccompoundsbyGaschromatography/MassSpectrometryEPA8270D:20075Dimethylfumarate(DMF)UltrasonicextractionEPA3550C:2007SemivolatatileorganiccompoundsbyGaschromatography/MassSpectrometryEPA8270D:20076TetrabromobisphenolA(TBBP-A)SoxhletextractionEPA3540C:1996SemivolatatileorganiccompoundsbyGaschromatography/MassSpectrometryEPA8270D:20077Halogenandsulfur(F/Cl/Br/I/S)Characterizationofwaste—Halogenandsulfurcontent—OxygencombustioninclosedsystemsanddeterminationmethodsEN14582-2007197Materialimpactingonenvironment8Asbestos0240DeterminationofasbestosinpowderymaquillageandmaterialASBESTOS,CHRYSOTILEbyXRDNIOSH9000Ambientair-Determinationofnumericalconcentrationofinorganicfibrousparicles-ScanningelectronmicroscopymethodISO14966:2002MethodsforphysicaltestoftalcGB/T15344-1994198AudiometryRoom1PartofItems1401Acoustics—Audiometrictestmethods—BasicpuretoneairandboneconductionthresholdaudiometryGB/T16403-1996Acoustics-Audiometrictestmethods-Part2:Soundfieldaudiometrywithpuretoneandnarrow-bandtestsignalsGB/T16296-1996AccreditedonlyforBackgroundnoise199physicalproperties'testofmaterials1AllItems0301Metallicmaterials–TensiletestingatambienttemperatureGB/T228-2002TensiletestmethodonweldedjointsGB/T2651-2008TensiletestmethodsonweldanddepositedmetalGB/T2652-2008Metallicmaterials–CompressiontestingatambienttemperatureGB/T7314-2005BendtestmethodonweldedjointsGB/T2653-2008Metallicmaterials-tube–BendtestGB/T244-2008Metallicmaterials–BendtestGB/T232-1999MetallicRockwellhardnesstest–Part1:TestmethodGB/T230.
1-2009Metallicmaterials–VickershardnesstestPart1:TestmethodGB/T4340.
1-2009Metallicmaterials–BrinellhardnesstestPart1:TestmethodGB/T231.
1-2009199physicalproperties'testofmaterials1AllItems0301Metallicmaterials–CharpypendulumimpacttestmethodGB/T229-2007Metallicmaterials-tube–FlatteningtestGB/T246-2007Metallicmaterials-tube–Drift-expendingtestGB/T242-2007Metallicmaterials-Sheetandstrip–DeterminationoftensilestrainhardeningexponentGB/T5028-2008Metallicmaterials-Sheetandstrip–DeterminationofplasticstrainratioGB/T5027-2007200Thequalityofthebuildinglightingandpowerdistribution1PartofItems1612、0410StandardforlightingdesignofbuildingsGB50034-2004MeasurementmethodsforlightingGB/T5700-2008CodeforacceptanceofenergyefficientbuildingconstructionGB50411-2007Accreditedonlyforilluminance,luminance,correlatedcolortemperature,chromaticitycoordinate,colorrenderingindex,voltage,current,electricpower,harmonicvoltage,harmoniccurrent201Electronictollcollection-Dedicatedshortrangecommunicationsystem1PartofItems0419Electronictollcollection-Dedicatedshortrangecommunication-Part1:PhysicallayerGB/T20851.
1-2007Electronictollcollection-Dedicatedshortrangecommunication-Part5:TestmethodsofthemainparametersinphysicallayerGB/T20851.
5-2007AccreditedonlyforCarrierfrequency,Level202ProtectiveClothingagainstelectromagneticradiation1PartofItems0428Protectiveclothing-ProtectiveclothingagainstmicrowaveradiationGB/T23463-2009AccreditedonlyforShieldingeffectiveness203Shieldingcabinets1AllItems0428Electromagneticshieldingperformancetesforcabinets,racksandsubracksGB/T18663.
3-2007204MeasuringInstrumentforShock1*AllItems0336MethodsforthecalibrationofvibrationandshocktransducersPart22:ShockcalibrationbycomparisontoareferencetransducerGB/T20485.
22-2008205Industrialfurnaces1Distancebetweenoptimumworkingzoneandinwall1504Testmothodsforelectroheatinstallations-Part1:GeneralGB/T10066.
1-2004Basicspecificationsforelectroheatinstallations-Part1:GeneralGB/T10067.
1-2003TestingmethodforworkzoneofheattreatmentfurnaceGB/T9452-2003HeatdeterminationforheatingfurnaceSY/T6381-2008Testmethodsforelectroheatinstallations--Part4:IndirectresistancefurnacesGB/T10066.
4-2004Basicspecificationsforelectroheatinstallations--Part4:IndirectresisitancefurnacesGB/T10067.
4-2005GoodevaluationmethodandinspectionrequirementsforheatingfurnaceSJ/T31415-1994Accreditedonlyfor0~30m2CurrentAccreditedonlyfor0A~1000A3VoltageAccreditedonlyfor0V~1000V4ActivePowerAccreditedonlyfor0kW~300kW5electricenergyAccreditedonlyfor0kWh~300kWh6powerfactorAccreditedonlyfor0~17TestTimeIndirectresistancefurnaces--Part5:RTseriesbogiehearthfurnacesJB/T8195.
5-2007GerneralprinciplesforthermalinsulationtechniqueofindustrialfurnacesGB/T16618-1996MonitoringandtestingmethodforenergysavingofelectroheatfurnaceinindustrialheattreatingGB/T15318-1994EnergymanagementandmonitoringofindustrialfurnacesGeneralDB31/T220-1999IndustrialfurnaceMeasurementandcalculationofheatbalanceDB31/T34-1999RegulationsofproperusageofelectricityinheattreatmentindustryGB/T10201-2008Accreditedonlyfor0h~10h8temperatureuniformityAccreditedonlyfor0℃~1200℃9temperaturestabilityAccreditedonlyfor0℃~1200℃10surfacetemperatureriseAccreditedonlyfor50℃~300℃11surfacetemperatureAccreditedonlyfor50℃~300℃12DischargetemperatureAccreditedonlyfor0℃~1200℃206Thermalequlilibriumtestofindustrialboilers1Calorimetricvalueoffuel1504ThermalperformancetestcodeforindustrialboilersGB/T10180-2003PerformancetestcodeforutilityboilerGB/T10184-1988Basicrulesforthemeasurementandcalculationofthermalequlilbriumoffuel-firedfurnaceinindustryGB/T13338-1991MonitoringandtestingforenergysavingofcoalfiredindustrialboilersGB/T15317-2009TechnicalguidesforevaluatingtherationalityofheatusageinindustrialenterpriseGB/T3486-1993ThegeneralprinciplesforcalculationofthermalefficiencyofequipmentGB/T2588-2000ProximateanalysisofcoalGB/T212-2008DeterminationofcalorificvalueofcoalGB/T213-2008Accreditedonlyfor(14000~30000)J/g2FuelconsumptionAccreditedonlyfor(0~500)kg3FeedwatertemperatureAccreditedonlyfor(0~300)℃4FeedwaterflowAccreditedonlyfor(0~50)t/h5SteamtemperatureAccreditedonlyfor(200~600)℃6SteampressureAccreditedonlyfor(0~40)Mpa7SteamflowAccreditedonlyfor(0~50)t/h8ExhaustgastemperatureAccreditedonlyfor(100~1200)℃9CompositionofexhaustgasAccreditedonlyfor(0~100)%10CeightofslagandflyashAccreditedonlyfor(0~500)kg11CarboncontentofslagandflyashAccreditedonlyfor(0~100)%12TemperatureofslagandflyashAccreditedonlyfor(200~1200)℃13EnvironmentaltemperatureAccreditedonlyfor(-20~60)℃14SurfacetemperatureofboilerAccreditedonlyfor(0~300)℃15SurfaceareaofboilerAccreditedonlyfor(0-20)m206Thermalequlilibriumtestofindustrialboilers16Excessaircoefficient1504ThermalperformancetestcodeforindustrialboilersGB/T10180-2003PerformancetestcodeforutilityboilerGB/T10184-1988Basicrulesforthemeasurementandcalculationofthermalequlilbriumoffuel-firedfurnaceinindustryGB/T13338-1991MonitoringandtestingforenergysavingofcoalfiredindustrialboilersGB/T15317-2009TechnicalguidesforevaluatingtherationalityofheatusageinindustrialenterpriseGB/T3486-1993ThegeneralprinciplesforcalculationofthermalefficiencyofequipmentGB/T2588-2000ProximateanalysisofcoalGB/T212-2008DeterminationofcalorificvalueofcoalGB/T213-2008Accreditedonlyfor(0~21)%17TestingtimeAccreditedonlyfor(0~4)h18FompositionoffuelelementsAccreditedonlyfor(0~100)%207Heatingpipelineandpipeinsulation1Mediumtemperature0339MethodofmeasuringandevaluationthermalinsulationeffectsforequipmentsandpipesGB/T8174-2008GuideforDesignofThermalInsulationofEquipmentsandPipesGB/T8175-2008In-situMeasurementsofHeatLossinThermalInsulationofEquipmentsandPipes-HeatFlowMeterApparatusGB/T17357-2008GeneralprinciplesforthermalinsulationtechniqueofequipmentandpipesGB/T4272-2008Accreditedonlyfor(-30~500)℃2MediumpressureAccreditedonlyfor(0~2.
5)Mpa3PipesurfacetemperatureAccreditedonlyfor(0~200)℃4PipegeometrysizeAccreditedonlyfor(0~20)m5ThicknessofinsulatingAccreditedonlyfor(0~1)m6EnvironmentaltemperatureAccreditedonlyfor(-10~60)℃7WindvelocityAccreditedonlyfor(0~20)m/s208Waterbalancetest1Fluidvelocity0357ThegeneralprinciplesofwaterbalancetestinenterprisesGB/T12452-2008ThegeneralprinciplesofwaterbalancetestinenterprisesGB/T7119-2006Accreditedonlyfor(0~8)m/s2FluidtemperatureAccreditedonlyfor(-10~60)℃3HumidityAccreditedonlyfor(0~100)%RH4EnvironmentaltemperatureAccreditedonlyfor(-10~60)℃209Fanpumpsaircompressoranditssystem1AirPressure03450346Monitoringandtestingforenergysavingoffan'sunitanddistributetubesystemGB/T15913-2009PowerAirCompressor(stations)tomonitoreconomicperformanceandenergysavingDB31/T54-1999Monitoringandtestingmethodforenergysavingofmotor-pumpliquidtransportsystemGB/T16666-1996Three-phaseinductionmotorseconomicoperationGB/T12497-2006TheprinciplesforelectricitybalanceofequipmnetGB/T8222-2008TechnicalguidesforevaluatingtherationalityofelectricityusageinindustrialenterpriseGB/T3485-1998Accreditedonlyfor(0~2500)Pa2AirtemperatureOnlytest(0~300)℃3WindvelocityAccreditedonlyfor(0~20)m/s4AmbienttemperatureAccreditedonlyfor(-10~60)℃5FluidinletpressureAccreditedonlyfor(-0.
1~0.
4)MPa6FluidoutletpressureAccreditedonlyfor(0~4)MPa7FlowrateAccreditedonlyfor(0~8)m/s8CurrentAccreditedonlyfor(0~500)A9VoltageAccreditedonlyfor(0~500)V210Impressiontonometer1Allitems0337ImpressiontonometerYY1036-2004中国合格评定国家认可委员会认可证书(注册号:CNASL0134)名称:上海市计量测试技术研究院(华东国家计量测试中心/中国上海测试中心)地址:上海市张衡路1500号签发日期:2009年08月21日有效期至:2012年08月20日更新日期:2012年02月10日2-1认可的校准能力范围序号测量仪器名称校准参量领域代码规范代号(含年号)名称测量范围扩展不确定度(校准和测量能力,k=2)限制说明备注1量块长度1308JJG146-2003量块检定规程(0.
5~100)mmU=(0.
03+0.
2L)μm(L:m)二等钢制(0.
5~1000)mm(0.
5~100)mm:U=(0.
04+0.
5L)μm(L:m)三等钢制(100~1000)mm:U=(0.
1+0.
6L)μm(L:m)(0.
5~1000)mm(0.
5~100)mm:U=(0.
06+0.
6L)μm(L:m)四等钢制(100~1000)mm:U=(0.
2+0.
8L)μm(L:m)(0.
5~1000)mm(0.
5~100)mm:U=(0.
1+3L)μm(L:m)五等钢制(100~1000)mm:U=(0.
5+2L)μm(L:m)2正多面棱体角度1308JJG283-2007正多面棱体检定规程0°~360°U=0.
01″二等U=0.
18″三等U=0.
34″四等3测角仪角度1308JJG97-2001测角仪检定规程0°~360°U=1″4多齿分度台角度1308JJG472-2007多齿分度台检定规程0°~360°U=0.
04″5光学、数显分度头角度1308JJG57-1999光学、数显分度头检定规程0°~360°U=0.
5″6角度块角度1308JJG70-2004角度块检定规程0°~360°U=1.
0″0级U=1.
4″1级U=2.
4″2级7光学倾斜仪角度1308JJF1083-2002光学倾斜仪校准规范0°~360°U=6″8自准直仪角度1309JJG202-2007自准直仪检定规程0′~10′光电式:U=0.
1″目视式:U=0.
2″9平晶平面度1303JJG28-2000平晶检定规程标准平晶:φ150mmU=0.
010μm一等U=0.
020μm二等平面平晶:Φ(30~60)mmU=0.
01(m1级平面平晶:Φ(80~150)mmU=0.
02(m1级平面平晶:Φ(30~150)mmU=0.
03(m2级长平晶:210mmU=0.
01μm长平晶:310mmU=0.
03μm平行平晶:(0~100)mmU=0.
03μm平行度平行平晶:(0~100)mmU=0.
2μm10研磨面平尺平面度1303JJG740-2005研磨面平尺检定规程≤500mmU=0.
03μm11表面粗糙度比较样块(样板)粗糙度1308JJF1099-2003表面粗糙度比较样块校准规范Ra:(0.
01~25)μmUrel=3%~5%12触针式表面粗糙度测量仪粗糙度1305JJF1105-2003触针式表面粗糙度测量仪校准规范Ra:(0.
01~4.
0)μmUrel=5%13干涉显微镜长度1309JJG77-2006干涉显微镜检定规程H:(0.
1~1.
0)mmUrel=10%14光切显微镜长度1309JJF1092-2002光切显微镜校准规范H:(0.
8~80)μmUrel=10%15标准金属线纹尺长度1308JJG73-2005高等别线纹尺检定规程(0~1000)mmU=(0.
07+0.
3L)μm;(L:m)一等U=(0.
14+0.
6L)μm;(L:m)二等16标准玻璃线纹尺长度1308JJG73-2005高等别线纹尺检定规程(0~200)mmU=(0.
07+0.
4L)μm;(L:m)一等(0~200)mmU=(0.
14+1.
0L)μm;(L:m)二等17线纹比较仪长度1308JJG72-1980线纹比较仪检定规程(0~250)mmU=0.
9μm18200型万能比较仪长度1308JJG523-1988200型万能比较仪检定规程(0~200)mmU=0.
3μm19光学测角比较仪角度1308JJF1078-2002光学测角比较仪校准规范(0~60)′U=10′20跳动测量仪长度1309JJF1109-2003跳动检查仪校准规范(0~1000)mmU=2.
0μm21工具显微镜长度1309JJG56-2000工具显微镜检定规程(0~200)mmU=0.
8μm22测量显微镜长度1303JJG571-2004读数、测量显微镜检定规程(0~8)mmU=1.
5μm23读数显微镜长度1303JJG571-2004读数、测量显微镜检定规程(0~8)mmU=1.
5μm24光学计长度1309JJG45-1999光学计检定规程(-100~100)μm(0~200)mmU=0.
12μm25接触式干涉仪长度1309JJG101-2004接触式干涉仪检定规程(-10~10)μmU=0.
01μm26立式激光测长仪长度1309JJG764-1992立式激光测长仪检定规程(0~100)mmU=0.
3μm27柯氏干涉仪长度1309JJG770-1992柯氏干涉仪检定规程(0~125)mmU=0.
04μm28激光量块干涉仪长度1309JJG371-2005量块光波干涉仪(0~100)mmU=0.
3μm29数显测高仪长度1303JJG929-1998数显测高仪检定规程(0~1)mU=2.
2μm30测长仪长度1309JJF1189-2008测长仪校准规范(0~100)mmU=0.
3μm(100~300)mmU=0.
6μm(300~500)mmU=1.
0μm31测长机长度1309JJF1066-2000测长机校准规范(0~1000)mmU=3.
5μm(1000~2000)mmU=4.
5μm(2000~3000)mmU=6.
0μm32投影仪长度1309JJF1093-2002投影仪校准规范(0~1000)mmU=(1.
2+2L)μm(L:m)33圆度圆柱度测量仪圆度1309JJG429-2000圆度圆柱度测量仪检定规程≤Φ200mmUrel=2%34孔径测量仪长度1309JJG467-1986孔径测量仪试行检定规程Φ(1~50)mmU=0.
4μm35气动测量仪(含指针)长度1309JJG356-2004气动测量仪检定规程JJG466-1993气动指针式测量仪检定规程≤100mmU=0.
3μm36经纬仪角度1309JJG414-2003光学经纬仪检定规程水平方向:0°~360°U=0.
2″竖直角:±30°U=0.
4″37水准仪角度1309JJG425-2003水准仪检定规程(2~∞)m±20"U=1.
5″38全站仪长度1309JJG100-2003全站型电子速测仪检定规程JJG703-2003光电测距仪试行检定规程(0~1.
5)kmU=(1.
0+1.
0D)mm;(D—测量距离,km)基线场租用角度(0~360)U=0.
5″39坐标测量机长度1309JJF1064-2004坐标测量机校准规范100mm~50m≤1m:U=(0.
1+1L)μm(L:m)>1m:U=1.
5μm40电涡流式测厚仪长度1303JJG818-2005磁性、电涡流式履层厚度测厚仪检定规程(10~500)μmU=1.
1μm(500~1250)μmU=2.
2μm41磁阻法测厚仪长度1303JJG818-2005磁性、电涡流式履层厚度测厚仪检定规程(0~500)μmU=1.
1μm(500~1250)μmU=2.
2μm42X射线测厚仪长度1303JJG480-2007X射线测厚仪(0.
1~20)mmU=4.
0(m43(指示表)测厚仪长度1303JJG34-2008指示表(指示表和千分表)检定规程JJG379-1995大量程百分表检定规程(0~50)mm分度值0.
001mmU=2μm(0~50)mm分度值0.
01mmU=0.
01mm44γ-射线厚度计长度1303JJG935-1998γ-射线厚度计(0~30)mmU=(0.
06~1.
00)mm45超声波测厚仪长度1303JJF1126-2004超声波测厚仪校准规范(0~50)mm分度值0.
01mmU=0.
04mm(0~50)mm分度值0.
1mmU=0.
1mm46手持式激光测距仪长度1309JJG966-2001手持式激光测距仪(0~100)mU=1mm47超声波测距仪长度1309JJG928-1998超声波测距仪(0~100)mU=18mm48四轮定位仪角度1309JJF1154-2006四轮定位仪校准规范±10°U=0.
02°不测后倾角49长度基线场长度1309JJF1214-2008长度基线场校准规范(0~100)mU=0.
6mm50引伸计长度1309JJG762-2007引伸计检定规程(0~20)mm≤0.
3mm:U=3.
2μm>0.
3mm:Urel=0.
88%51引伸计标定器长度0334JJF1096-2002引伸计标定器校准规范(1~25)mmU=1.
5μm52针规、三针长度1301JJF1207-2008针规、三针校准规范φ(0.
1~25)mmU=(0.
3~0.
5)μm53塞尺长度1303JJG62-2007塞尺检定规程(0.
02~3.
00)mmU=(2~3)μm54光滑极限量规长度1301JJG343-1996光滑极限量规检定规程(0~320)mmU=(0.
5~1.
0)μm55三等标准金属线纹尺长度1308JJG71-2005三等标准金属线纹尺检定规程φ(0~1000)mmU=12μm56钢直尺长度1303JJG1-1999钢直尺检定规程(0~2000)mmU=0.
1mm57钢卷尺长度1303JJG4-1999钢卷尺检定规程(0~200)mⅠ级:U=(0.
1+0.
02L)mm(L:m)Ⅱ级:U=(0.
2+0.
02L)mm(L:m)58布卷尺长度1303JJG5-2001纤维卷尺、测绳检定规程(0~50)mU=(0.
6+0.
02L)mm(L:m)59标准钢卷尺长度1303JJG741-2005标准钢卷尺检定规程(0~100)mU=(10~45)μm60套管尺长度1303JJG473-2009套管尺检定规程(0~3000)mmU=(0.
06~0.
24)mm61指示类量具检定仪长度1303JJG201-2008指示类量具检定仪检定规程百分表检定仪:(0~25)mmU=1.
1μm千分表检定仪:(0~5)mmU=0.
2μm光栅式指示表检定仪:(0~50)mmU=1.
1μm62电感测微仪长度1309JJG396-2002电感测微仪检定规程(-1999~+1999)μm分度值0.
1μm:U=0.
1μm分度值0.
5μm:U=0.
3μm63通用卡尺长度1303JJG30-2002通用卡尺检定规程游标卡尺(0~1000)mmU=0.
01mm带表卡尺(0~300)mmU=0.
01mm数显卡尺(0~1000)mmU=0.
01mm深度游标卡尺(0~500)mmU=0.
01mm64高度卡尺长度1303JJG31-1999高度卡尺检定规程(0~1000)mmU=0.
01mm65千分尺长度1303JJG21-2008千分尺检定规程JJF1088-2002外径千分尺(测量范围500mm~3000mm)校准规范(0~3000)mmU=(1~4)μm66内径千分尺长度1309JJG22-2003内径千分尺检定规程(50~3000)mmU=(1~15)μm67测量内尺寸千分尺长度1309JJF1091-2002测量内尺寸千分尺校准规范内测千分尺(5~100)mmU=2μm孔径千分尺(6~200)mmU=(1~3)μm68深度千分尺长度1309JJG24-2003深度千分尺检定规程(0~150)mmU=(1~2)μm69杠杆千分尺、杠杆卡规长度1309JJG26-2001杠杆千分尺,杠杆卡规检定规程杠杆千分尺(0~200)mmU=(1.
3~2)μm杠杆卡规(0~1)mmU=0.
5μm70带表千分尺长度1309JJG427-2004带表千分尺检定规程(0~100)mmU=1.
4μm71指示表长度1303JJG34-2008指示表(指示表和千分表)检定规程百分表(0~10)mmU=2μm千分表(0~5)mmU=2.
0μm72杠杆表长度1303JJG35-2006杠杆表检定规程杠杆百分表(0~2)mmU=2μm杠杆千分表(0~0.
5)mmU=1.
0μm73内径表长度1303JJF1102-2003内径表校准规范内径表百分表(2~450)mmU=3μm内径千分表(10~400)mmU=2.
0μm74深度百分表长度1303JJG830-2007深度指示表检定规程(0~100)mmU=2μm75圆柱螺纹量规长度1301JJG888-1995圆柱螺纹量规检定规程螺纹环规(M4~M300)U=3.
0μm螺纹塞规(M1~M300)U=2.
0μm76电容式测微仪长度1309JJG570-2006电容式测微仪检定规程±300μmU=(0.
3~3)μm77刮板细度计长度1303JJG905-2006刮板细度计检定规程(15~500)μmU=(0.
5~2)μm78大量程百分表长度1303JJG379-2009大量程百分表检定规程(0~100)mm指针:U=7μm数显:U=0.
01mm79半径样板长度1301JJG58-1996半径样板检定规程R(1.
0~25.
0)mmU=(7~9)μm80螺纹样板长度1301JJG60-1996螺纹样板检定规程P(0.
4~6.
0)mmU=(4~6)μm81斜块式测微仪检定器长度1309JJG525-2002斜块式测微仪检定器检定规程2000μm分度值为1μm:U=0.
2μm400μm分度值为0.
2μm:U=0.
1μm200μmU=0.
02μm82机械式比较仪长度1303JJG39-2004机械式比较仪±100μmU=0.
5μm83扭簧式比较仪长度1303JJG118-1996扭簧式比较仪±100μmU=0.
3μm84木直(折)尺长度1303JJG2-1999木直(折)尺检定规程(0~1000)mmU=0.
1mm85公法线类千分尺长度1309JJG82-2010公法线类千分尺检定规程(0~200)mmU=(0.
9~2.
0)μm86标准轨距铁路轨距尺长度1303JJG219-2008标准轨距铁路轨距尺检定规程轨距:(1338~1470)mmU=0.
09mm超高:(0~150)mmU=0.
08mm87铁路支距尺长度1303JJG(铁道)186-2005铁路支距尺检定规程(100~1290)mmU=0.
08mm88平板平面度1303JJG117-2005平板检定规程(100~5000)mmU=(0.
5~7.
0)μm89平尺平面度1303JJF1097-2003平尺校准规范≤3000mmU=(0.
1~1.
3)μm90刀口尺直线度1303JJG63-2007刀口形直尺检定规程(75~500)mmU=(0.
3~1.
3)μm91电子水平仪角度1309JJG103-2005电子水平仪和合像水平仪检定规程(0~40)'U=2μm/m92合像水平仪角度1309JJG103-2005电子水平仪和合像水平仪检定规程(0~40)'U=0.
6μm/m93框式水平仪条式水平仪角度1309JJF1084-2002框式水平仪和条式水平仪校准规范(0~40)'Urel=4%94直角尺角度1303JJG7-2004直角尺检定规程圆柱角尺(100~600)mmU=0.
8μm宽座角尺(40*63~630*600)mmU=(0.
1+10L)μm(L:mm)刀口角尺(40*63~125*200)mmU=1μm线纹钢直角尺(150~500)mmU=0.
1mm95万能角度尺角度1308JJG33-2002万能角度尺检定规程(0~360)分度值为2′:U=1′分度值为5′:U=3′96正弦规角度1308JJG37-2005正弦规检定规程L=(100~200)mmU=1.
4″97方箱角度1303JJG194-2007方箱检定规程(100~500)mmU=2μm98直角尺检查仪角度1303JJF1140-2006直角尺检查仪校准规范(0~500)mmU=0.
8μm99水平仪检定器角度1303JJG191-2002水平仪检定器检定规程(0~1.
5)mm/mU=1.
8%100焊接检验尺长度1303JJG704-2005焊接检验尺检定规程(0~60)mmU=0.
03mm角度1303(0~90)U=8′101砝码质量1310JJG99-2006砝码检定规程1g~20kg(E2等级)20kg:8mg10kg:5mg5kg:2.
2mg2kg:0.
6mg1kg:0.
4mg500g:0.
1mg200g:0.
04mg100g:0.
02mg50g:0.
02mg20g:0.
018mg10g:0.
016mg5g:0.
010mg2g:0.
010mg1g:0.
006mg(1~500)g(E2等级)500g:0.
1mg200g:0.
04mg100g:0.
02mg50g:0.
02mg20g:0.
018mg10g:0.
016mg5g:0.
010mg2g:0.
010mg1g:0.
006mg(1~500)mg(E2等级)500mg:0.
0034mg200mg:0.
0024mg100mg:0.
0016mg50mg:0.
0010mg20mg:0.
0016mg10mg:0.
0012mg5mg:0.
0016mg2mg:0.
0028mg1mg:0.
0020mg102标准测力仪力值0333JJG144-2007标准测力仪检定规程(10~6000)NUrel=0.
10%(5~100)kNUrel=0.
10%(10~2000)kNUrel=0.
10%103量仪测力仪力值0333JJF1134-2005专用工作测力机校准规范(0~20)NUrel=0.
26%104工作测力仪力值0333JJG455-2000工作测力仪检定规程(0~2)MNUrel=0.
15%105测振仪加速度1407JJG676-2000工作测振仪检定规程(10~300)m/s2Urel=3.
0%速度(10~300)mm/sUrel=3.
0%振幅(0.
01~16)mmUrel=3.
0%106加速度传感器加速度1407JJG233-2008压电加速度计检定规程(10~300)m/s2Urel=1.
0%(20Hz~1000Hz)Urel=2.
0%(1000Hz~2000Hz)107速度传感器速度1407JJG134-2003磁电式速度传感器试行检定规程(10~300)mm/sUrel=3.
0%108振动位移传感器振幅1407JJG644-2003振动位移传感器检定规程(0.
01~16)mmUrel=3.
0%109数字式电动振动试验系统(电磁振动台)加速度1407JJG948-1999数字式电动振动试验系统JJG190-1997电动式振动实验台检定规程加速度:(10~1000)m/s2频率:(5~1000)HzUrel=3.
5%110机械振动台加速度1407JJG189-1997机械式振动实验台检定规程加速度:(10~1000)m/s2频率:(5Hz~150Hz)Urel=3.
5%111液压振动台加速度1407JJG638-1990液压式振动实验台检定规程加速度:(10~100)m/s2频率:(5Hz~60Hz)Urel=3.
5%112标准振动台加速度1407JJG298-2005中频标准振动台(比较法)检定规程加速度:(10~100)m/s2频率:(5Hz~3000Hz)Urel=3.
0%113测功机扭矩1325JJG653-2003测功装置检定规程(2~5000)NmUrel=0.
26%114标准扭矩计扭矩1325JJG557-1988标准扭矩计检定规程(2~5000)NmUrel=0.
13%115扭矩扳子检定仪扭矩1325JJG797-1992扭矩扳子检定仪检定规程(0.
1~5000)NmUrel=0.
42%116转矩转速测量装置扭矩1325JJG924-1996转矩转速测量装置检定规程(2~5000)NmUrel=0.
13%(500~6000)r/minUrel=0.
06%117扭矩扳子扭矩1325JJG707-2003扭矩扳子检定规程(0.
1~5000)NmUrel=0.
56%118扭转试验机扭矩1325JJG269-2006扭转试验机检定规程(2~5000)NmUrel=0.
42%119扭矩传感器扭矩1325JJG995-2005静态扭矩测量仪检定规程(2~5000)NmUrel=0.
13%120静态电阻应变仪和数据采集系统应变值1309JJG623-2005电阻应变仪检定规程(0~105)μεUrel=0.
05%121动态电阻应变仪应变值1309JJG623-2005电阻应变仪检定规程(0~105)μεUrel=0.
12%122洛氏硬度计硬度0301JJG112-2003金属洛氏硬度计检定规程(80~88)HRAU=0.
4HRA(85~95)HRBU=0.
6HRB(20~30)HRCU=0.
6HRC(35~55)HRCU=0.
5HRC(60~70)HRCU=0.
4HRC123布氏硬度计硬度0301JJG150-2005布氏硬度计检定规程225HBWUrel=1.
5%124维氏硬度计硬度0301JJG151-2006金属维氏硬度计检定规程(700~800)HV5Urel=2.
5%(175~225)HV5Urel=2.
0%(400~600)HV10Urel=2.
0%(400~600)HV30Urel=1.
5%125表面洛氏硬度计硬度0301JJG112-2003金属洛氏硬度计检定规程(70~94)HR15NU=0.
8HR15N(42~86)HR30NU=0.
8HR30N(20~77)HR45NU=0.
8HR45N(67~93)HR15TU=1.
0HR15T(29~82)HR30TU=1.
0HR30T126显微硬度计硬度0301JJG151-2006金属维氏硬度计检定规程(700~800)HV1Urel=2.
0%(700~800)HV.
0.
5Urel=3.
5%(700~800)HV.
0.
2Urel=4.
0%(400~600)HV0.
1Urel=4.
5%(175~225)HV0.
05Urel=5.
0%127标准洛氏硬度块硬度0301JJG113-2003标准金属洛氏硬度块检定规程(80~88)HRAU=0.
2HRA(85~95)HRBU=0.
4HRB(20~30)HRCU=0.
4HRC(35~55)HRCU=0.
3HRC(60~70)HRCU=0.
2HRC128标准显微维氏硬度块硬度0301JJG148-2006标准维氏硬度块检定规程(700~800)HV1Urel=1.
1%(700~800)HV0.
5Urel=1.
5%(700~800)HV0.
2Urel=2.
0%(400~600)HV0.
1Urel=2.
5%(175~225)HV0.
05Urel=3.
0%129里氏硬度计硬度0301JJG747-1999里氏硬度计检定规程(750~830)HLU=8HL(510~670)HLU=6HL130金属韦氏硬度计硬度0301JJG944-1999金属韦氏硬度计检定规程(5~18)HWU=0.
7HW131A型邵氏硬度计硬度0301JJG304-2003A型邵氏硬度计检定规程(0~100)HAU=0.
3HA132D型邵氏硬度计硬度0301JJG1039-2008D型邵氏硬度计检定规程(0~100)HDU=0.
6HD133拉力、压力万能试验机力值1326JJG139-1999拉力、压力和万能试验机检定规程(0~5)MNUrel=0.
10%134电子式万能试验机力值1326JJG475-2008电子式万能试验机检定规程(0~5)MNUrel=0.
10%135抗折试验机力值1326JJG476–2001抗折试验机检定规程(0~100)kNUrel=0.
10%136弹簧拉压试验机力值1326JJF1134-2005专用工作测力机校准规范(0~100)kNUrel=0.
10%137非金属拉力、压力和万能试验机力值1326JJG157-2008非金属拉力、压力和万能试验机检定规程(0~5)MNUrel=0.
10%138高温蠕变、持久强度试验机力值1326JJG276-2009高温蠕变、持久强度试验机检定规程(0~5)MNUrel=0.
10%139液压千斤顶力值1326JJG621-2005液压千斤顶检定规程(0~5)MNUrel=0.
10%140摆锤式冲击试验机能量0336JJG145-2007摆锤式冲击试验机检定规程(0~500)JUrel=0.
10%141玻璃量器容量1312JJG196-2006常用玻璃量器检定规程JJG20-2001标准玻璃量器检定规程JJG10-2005专用玻璃量器检定规程(1~10)mlU=0.
003ml(10~20)mlU=0.
008ml(20~100)mlU=0.
018ml(100~200)mlU=0.
04ml(200~500)mlU=0.
07ml(500~1000)mlU=0.
12ml(1000~2000)mlU=0.
18ml142饮用量器容量1312JJG558-2006饮用量器检定规程(0.
02~5)LU=(3*10-4~4*10-2)L143医用注射器容量1312JJG18-2008医用注射器检定规程(0~100)mlU=(2.
5*10-3~1)ml144移液器容量1312JJG646-2006移液器检定规程(1~10)μlU=0.
007μl(10~100)μlU=0.
03μl(100~1000)μlU=0.
07μl(1000~10000)μlU=3.
5μl145灌装机容量1312JJG687-2008液态物料定量灌装机检定规程(50~3000)mlU=(0.
8~2)ml146雨量器和雨量量筒容量1312JJG524-1988雨量器和雨量量筒检定规程(0~1000)mlU=(0.
01~0.
02)ml147金属量器容量1312JJG259-2005标准金属量器检定规程(1~2000)LUrel=2.
0*10-4(1~5000)L148立式金属罐容量1312JJG168-2005立式金属罐容量检定规程(20~100)m3Urel=3*10-3(100~700)m3Urel=2*10-3﹥700m3Urel=1*10-3149卧式金属罐容量1312JJG266-1996卧式金属罐容积检定规程(20~100)m3Urel=4*10-3150球形金属罐容量1312JJG642-2007球形金属罐容量检定规程(80~3000)m3Urel=3*10-3151一等标准酒精计密度1314JJG86-2001标准玻璃浮计检定规程q:(0~100)%q:(0.
039~0.
043)%152二等标准酒精计密度1314JJG86-2001标准玻璃浮计检定规程q:(0~100)%q:0.
08%153酒精计密度1314JJG42-2001工作玻璃浮计检定规程q:(0~100)%q:0.
2%154二等标准密度计密度1314JJG86-2001标准玻璃浮计检定规程(0.
65~2.
00)g/cm3U=(2.
3~2.
8)*10-4g/cm3155密度计密度1314JJG42-2001工作玻璃浮计检定规程(0.
65~2.
00)g/cm3U=0.
0010g/cm3156二等标准石油密度计密度1314JJG86-2001标准玻璃浮计检定规程(0.
65~1.
01)g/cm3U=5*10-4g/cm3157石油密度计密度1314JJG42-2001工作玻璃浮计检定规程(650~1100)kg/m3U=5*10-1kg/m3158海水密度计密度1314JJG42-2001工作玻璃浮计检定规程1.
000~1.
040相对密度U=1*10-4159糖量计密度1314JJG42-2001工作玻璃浮计检定规程p:(0~80)%p:0.
1%160液位计物位0337JJG971-2002液位计检定规程(0~700)mU=2mm161活塞式压力计压力1321JJG59-2007活塞式压力计检定规程(0.
04~250)MPa0.
01、0.
02级:Urel=0.
0042%0.
05级:Urel=0.
015%1620.
02级活塞式压力真空计压力1321JJG236-2009活塞式压力真空计检定规程(-0.
1~+0.
25)MPaUrel=0.
0042%1630.
05级活塞式压力真空计压力1321JJG236-2009活塞式压力真空计检定规程(-0.
1~+0.
25)MPaUrel=0.
013%164双活塞式压力真空计压力1321JJG159-2008双活塞式压力真空计检定规程(-0.
1~1)MPa0.
02级:Urel=0.
0042%0.
05级:Urel=0.
015%165补偿式微压计压力1320JJG158-1994标准补偿式微压计检定规程(-1500~+1500)PaU=0.
5Pa二等(-2500~-1500)PaU=0.
6Pa(+1500~+2500)PaU=0.
6Pa166倾斜式微压计压力1320JJG172-1994倾斜式微压计检定规程(-2000~+2000)PaUrel=0.
13%0.
5级及以下167压力变送器压力0337JJG882-2004压力变送器检定规程(-0.
1~+1500)MPaUrel=0.
015%0.
05级及以下168数字压力计压力1320JJG875-2005数字式压力计检定规程(-0.
1~+100)MPaUrel=0.
005%0.
01级及以下169血压计标准器压力1320JJG49-1999弹簧管式精密压力表和真空表检定规程(0~50)kPaUrel=0.
02%0.
16级170压力传感器压力1320JJG860-1994压力传感器(静态)检定规程(-0.
1~+1500)MPaUrel=0.
025%0.
1级及以下171数字式电子血压计压力0337JJG692-1999数字式电子血压计(静态)(0~40)kPaU=0.
4kPa172膜盒压力表压力0337JJG573-2003膜盒压力表检定规程(0~400)kPaUrel=0.
4%1.
6级及以下173记录式压力表、压力真空表和真空表压力0337JJG926-1997记录式压力表、压力真空表和真空表(-0.
1~250)MPaUrel=0.
05%0.
25级及以下174轮胎压力表压力0337JJG927-1997轮胎压力表检定规程(0~2500)kPaUrel=0.
4%1.
6级及以下175压力控制器压力0337JJG544-1997压力控制器(-0.
1~60)MPaUrel=0.
1%0.
5级及以下176血压计和血压表压力0337JJG270-2008血压计血压表检定规程(0~40)kPaU=0.
5kPa177压力表压力1320JJG49-1999弹簧管式精密压力表和真空表检定规程(-0.
1~1500)MPaUrel=0.
1%0.
1级及以下JJG52-1999弹簧管式一般压力表、压力真空表和真空表检定规程(-0.
1~1000)MPaUrel=0.
2%1级以下178浮标式氧气吸入器、减压器压力0337JJG913-1996浮标式氧气吸入器检定规程(0~25)MPaUrel=0.
8%流量(0~30)L/minUrel=1.
4%179电离真空计压力1320JJG462-2004二等标准电离真空计试行检定规程(10-3~10-1)PaUrel=3.
2%MPE:±10%JJF1062-1999电离真空计校准规范Urel=7%MPE:±50%180热传导真空计压力1320JJF1050-1996工作用热传导真空计校准规范(10-1~105)PaUrel=12%MPE:±50%181浮子流量计流量1316JJG257-2007浮子流量计检定规程(0.
016~45)m3/hUrel=0.
20%1级及以下气体182湿式气体流量计流量1316JJG633-2005气体容积式流量计检定规程(0.
016~45)m3/hUrel=0.
20%1级及以下183.
1质量流量计流量1316JJG897-1995质量流量计检定规程(0.
016~45)m3/hUrel=0.
20%只测气体183.
2科里奥利质量流量计流量1316JJG1038-2008科里奥利质量流量计检定规程(0.
016~45)m3/hUrel=0.
20%只测气体184膜式燃气表流量1316JJG577-2005膜式燃气表检定规程(0.
016~45)m3/hUrel=0.
20%185.
1速度式流量计流量1316JJG198-1994速度式流量计检定规程(0.
016~45)m3/hUrel=0.
20%只测气体185.
2涡街流量计流量1316JJG1029-2007涡街流量计检定规程(0.
016~45)m3/hUrel=0.
20%只测气体185.
3涡轮流量计流量1316JJG1037-2008涡轮流量计检定规程(0.
016~45)m3/hUrel=0.
20%只测气体185.
4超声流量计流量1316JJG1030-2007超声流量计检定规程(0.
016~45)m3/hUrel=0.
20%只测气体186流量积算仪流量1316JJG(沪)45-2000流量显示仪表检定规程(0~99999)流量工程单位Urel=0.
02%~0.
1%0.
5级及以下JJG1003-2005流量积算仪检定规程(0~99999)流量工程单位流量信号为模拟电信号(有压力、温度补偿):Urel=5*10-4.
流量信号为脉冲信号:Urel=2.
0*10-50.
2级及以下187冷水水表流量1316JJG162-2009冷水水表检定规程DN15~DN50Urel=0.
5%188氧弹热量计热量1505JJG672-2001氧弹热量计检定规程(1500~18000)J/KU=30J/K不测搅拌热试验、平衡点稳定性试验189标准铂铑10-铂热电偶温度1501JJG75-1995标准铂铑10-铂热电偶检定规程(419.
527~1084.
62)℃419.
527℃:U=0.
3℃660.
323℃:U=0.
4℃1084.
62℃:U=0.
4℃一等419.
527℃:U=0.
5℃660.
323℃:U=0.
6℃1084.
62℃:U=0.
6℃二等190标准铂铑30-铂铑6热电偶温度1501JJG167-1995标准铂铑30-铂铑6热电偶检定规程(1100~1500)℃U=2.
5℃二等191工作用贵金属热电偶温度1501JJG141-2000工作用贵金属热电偶检定规程S、R:(300~1300)℃S、R:U=(1.
3~0.
4)℃Ⅰ级、Ⅱ级B:(1100~1500)℃B:U=2.
5℃Ⅱ级、Ⅲ级192工作用廉金属热电偶温度1501JJG351-1996工作用廉金属热电偶检定规程(-80~300)℃U=(0.
5~1.
0)℃Ⅰ级、Ⅱ级(300~1100)℃U=(2.
2~1.
1)℃193标准铜-铜镍热电偶温度1501JJG115-1999标准铜-铜镍热电偶检定规程(-196~+300)℃U=(0.
2~0.
5)℃MPE:±0.
2℃194工作铜-铜镍热电偶温度1501JJG368-2000工作用铜-铜镍热电偶检定规程(-200~+300)℃U=(0.
2~0.
5)℃1级及以下195标准温度灯温度1501JJG110-2008标准钨带灯检定规程(800~1400)℃U=(3.
3~2.
8)℃(1400~2000)℃U=(2.
9~3.
6)℃(2000~2500)℃U=(3.
6~4.
4)℃196工作用光学高温计温度1501JJG68-1991工作用隐丝式光学高温计检定规程(800~1400)℃U=(8.
2~5.
6)℃1.
0级及以下(1200~2000)℃U=(9.
3~9.
8)℃(1800~3200)℃U=(35.
1~39.
4)℃197工作用辐射温度计温度1501JJG415-2001工作用辐射温度计检定规程JJG856-1994500℃以下工作用辐射温度计检定规程(-20~150)℃U=0.
7℃0.
5级及以下(50~500)℃U=0.
4℃(300~1500)℃U=(0.
7~2.
2)℃(900~2200)℃U=(2.
0~3.
9)℃(1000~3000)℃U=(2.
2~7.
8)℃198红外电子体温计温度1503JJF1107-2003测量人体温度的红外温度计校准规范(34.
0~43.
0)℃U=0.
1℃MPE:±0.
2℃或±0.
3℃199一等标准铂电阻温度计温度1501JJG160-2007标准铂电阻温度计检定规程(-189.
3442~660.
323)℃660.
323℃:U=4.
5mK;419.
527℃:U=3.
5mK;231.
928℃:U=2.
8mK;0.
01℃:U=1.
0mK;-38.
8344℃:U=2.
5mK;-189.
3442℃:U=3.
6mK一等200二等标准铂电阻温度计温度1501JJG160-2007标准铂电阻温度计检定规程(-189.
3442~419.
527)℃660.
323℃:U=7.
0mK;419.
527℃:U=5.
2mK;231.
928℃:U=3.
4mK;0.
01℃:U=2.
0mK;-38.
8344℃:U=2.
8mK;-189.
3442℃:U=4.
0mK二等201工业铂、铜热电阻温度1501JJG229-1998工业铂、铜热电阻检定规程(-200~+420)℃0℃:U=0.
1℃;100℃:U=0.
1℃A级、B级202一等标准水银温度计温度1501JJG161-1994一等标准水银温度计检定规程(-30~20)℃U=0.
02℃(0~100)℃U=0.
010℃(100~300)℃U=0.
03℃203二等标准水银温度计温度1501JJG128-2003二等标准水银温度计检定规程(-60~0)℃U=0.
03℃(0~100)℃U=0.
03℃(100~200)℃U=0.
04℃(200~300)℃U=0.
06℃204高精密温度计温度1501JJG618-1999高精密玻璃温度计检定规程(0~150)℃U=(0.
012~0.
018)℃MPE:±0.
100℃及以下205贝克曼温度计温度1501JJG114-1999贝克曼温度计检定规程(-20~+125)℃U=0.
020℃MPE:±0.
01℃及以下206工作用玻璃液体温度计温度1501JJG130-2004工作用玻璃液体温度计检定规程(-80~-60)℃U=0.
06℃(-60~0)℃U=0.
08℃(0~200)℃U=0.
07℃(200~300)℃U=0.
13℃207石油产品用玻璃液体温度计温度1501JJG50-1996石油产品用玻璃液体温度计检定规程(-80~-60)℃U=0.
06℃(-60~0)℃U=0.
08℃(0~200)℃U=0.
07℃(200~300)℃U=0.
13℃208压力式温度计温度1501JJG310-2002压力式温度计检定规程(-80~+300)℃U=1.
0℃1级及以下209双金属温度计温度1501JJG226-2001双金属温度计检定规程(-80~+300)℃U=1.
0℃1级及以下210表面温度计温度1501JJG364-1994表面温度计检定规程(50~500)℃U=2℃MPE:±1℃及以下211数字温度计温度1501JJG363-1984半导体点温计检定规程(-80~300)℃U=0.
1℃MPE:±1℃及以下(300~600)℃U=0.
7℃212半导体温度计温度1501JJG363-1984半导体点温计检定规程(-60~+300)℃U=(0.
50~0.
75)℃1级及以下213热电阻、热电偶自动测量装置温度1501JJF1098-2003热电偶、热电阻自动测量系统校准规范(-190~+1100)℃热电阻测量系统:U=(0.
05~0.
15)℃热电偶测量系统:U=(0.
7~0.
9)℃214基因扩增仪(PCR仪)温度1504JCJ/E111025.
1-2006基因扩增仪(PCR仪)校准规范(10~105)℃U=0.
13℃215温度指示控制仪温度1502JJG874-2007温度指示控制仪检定规程(-60~20)℃U=0.
10℃MPE:±0.
1℃及以下(0~100)℃U=0.
08℃(100~300)℃U=0.
20℃216温度巡回检测仪、温度曲线校准仪温度1501JJF1171-2007温度巡回检测仪校准规范(-80~-60)℃U=0.
06℃0.
2级及以下(-60~0)℃U=0.
07℃(0~300)℃U=0.
18℃JJG74-2005工业过程测量记录仪检定规程(-200~0)℃U=(0.
5~0.
02)℃(0~+1800)℃U=(0.
02~1.
4)℃217温度变送器温度1501JJF1183-2007温度变送器校准规范(-80~+300)℃U=0.
08℃带热电阻传感器的变送器,0.
5级及以下(300~1100)℃U=(2.
2~1.
3)℃热电偶:1.
0级及以下.
转换器:0.
5级及以下.
(-200~0)℃U=(0.
5~0.
02)℃0.
2级及以下(0~+1800)℃U=(0.
02~1.
4)℃218工业过程测量记录仪(自动平衡式显示仪表)温度1502JJG74-2005工业过程测量记录仪检定规程(-200~0)℃U=(0.
5~0.
02)℃0.
1级及以下(0~+1800)℃U=(0.
02~1.
4)℃219数字度指示调节仪温度1502JJG617-1996数字温度指示仪表调节仪检定规程(-200~0)℃U=(0.
5~0.
02)℃0.
1级及以下(0~+1800)℃U=(0.
02~1.
4)℃220动圈式温度指示调节仪温度1502JJG186-1997动圈式温度指示仪表、指示位式调节仪表检定规程(-200~0)℃U=(0.
5~0.
02)℃1.
0级(0~+1800)℃U=(0.
02~1.
4)℃221模拟式温度指示调节仪温度1502JJG951-2000模拟式温度指示仪表、指示位式调节仪表检定规程(-200~0)℃U=(0.
5~0.
02)℃0.
2级及以下(0~+1800)℃U=(0.
02~1.
4)℃222温度校准仪温度1502JJG617-1996数字温度指示调节仪检定规程(-200~0)℃U=(0.
5~0.
02)℃0.
1级及以下(0~+1800)℃U=(0.
02~1.
4)℃222温度校准仪温度1502JCJ/G401001.
1/0/-2006温度校准仪输出部分校准方法(-200~0)℃U=(0.
32~0.
02)℃0.
02级及以下(0~+1800)℃U=(0.
02~0.
14)℃223环境试验设备温度1504JJF1101-2003环境试验设备温度、湿度校准规范(-60~0)℃U=(0.
5~0.
13)℃(0~300)℃U=(0.
13~0.
7)℃湿度(20~100)%U=1.
3%224电能表电能0410JJG307-2006机电式交流电能表检定规程JJG596-1999电子式电能表检定规程3*(48~600)V3*(0.
1~100)A合相1.
0:Urel=0.
010%0.
5L:Urel=0.
010%0.
8C:Urel=0.
010%分相1.
0:Urel=0.
010%0.
5L:Urel=0.
010%225电能表检定装置电能0410JJG597-2005交流电能表检定装置检定规程3*(48~600)V3*(0.
1~100)A合相1.
0:Urel=0.
010%0.
5L:Urel=0.
012%0.
8C:Urel=0.
012%分相1.
0:Urel=0.
010%0.
5L:Urel=0.
013%226电量变送器电压1700JJG126-1995交流电量变换为直流电量电工测量变送器检定规程(10~500)VUrel=0.
02%电流(0.
1~100)AUrel=0.
02%功率600V100AUrel=0.
02%功率因数0.
5L-1-0.
5CUrel=0.
02%频率45Hz~60HzUrel=0.
02%相位0~360Urel=0.
02%227电量变送器检定装置交流电压1700JJG126-1995交流电量变换为直流电量电工测量变送器检定规程JJG315-1983交流电能表检定装置JJG597-2005直流数字电压表(试行)JJG598-1989直流数字电流表(60~480)VUrel=0.
015%交流电流(0.
005~120)AUrel=0.
015%有功功率480V/120AUrel=0.
015%功率因数0.
5L-1-0.
5CUrel=0.
015%相位0~360Urel=0.
015%频率(45~65)HzUrel=0.
015%直流电压直流电压:(0~10)VUrel=6*10-5直流电流直流电流:(0~20)mAUrel=6*10-5228直流电位差计电压0411JJG123-2004直流电位差计检定规程(10-2~2.
1111110)VUrel=1.
6*10-6(10-3~10-2)VUrel=2.
5*10-6(10-7~10-3)VU=0.
06μV229直流电桥电阻0402JJG125-2004直流电桥检定规程(10-3~105)ΩUrel=1.
5*10-5(R1、R2);Urel=3*10-5(*102Ω~*103Ω)Urel=1.
5*10-4(*10Ω);Urel=3*10-4(*1Ω);Urel=3*10-3(*0.
1Ω);Urel=3*10-2(*0.
01Ω)230数字直流电桥电阻0402JJG837-2003直流低电阻表检定规程10-3Ω~2*107ΩUrel=0.
02%+1字231直流测温电桥电阻0411JJG484-2007直流测温电桥(0.
0010~555.
5600)Ω测量盘*1(1~102)Ω:Urel=0.
0016%(10-1~1)Ω:Urel=0.
006%(10-2~10-1)Ω:Urel=0.
002%(10-3~10-2)Ω:Urel=0.
02%(10-3~10-2)Ω:Urel=0.
5%量程变换器Urel=0.
0010%232直流分压箱电压比0402JJG531-2003直流电阻分压箱(0~1000)VUrel=0.
002%233直流电阻器电阻0402JJG166-1993直流电阻器检定规程(10-6~105)Ω1Ω:Urel=0.
5*10-6;(10-1、10~104)Ω:Urel=1.
5*10-6;(10-3、10-2、105)Ω:Urel=3*10-6;10-4Ω:Urel=3*10-5;10-5Ω:Urel=1*10-4;10-6Ω:Urel=1*10-3JJG982-2003直流电阻箱检定规程(10-3~105)Ω*102Ω~*104Ω:Urel=1.
5*10-5;*10Ω:Urel=3*10-5;*1Ω:Urel=1.
5*10-4;*10-1Ω:Urel=1.
5*10-3;*10-2Ω~*10-3Ω:Urel=1.
5*10-2234数字多用表直流电压0410JJF(沪)1-2003数字多用表校准规范JJG315-1983直流数字电压表检定规程JJG598-1989直流数字电流表检定规程JJG724-1991直流数字欧姆表检定规程10mV~220mVU=0.
00075%*RD+0.
4μV220mV~2.
2VU=0.
0005%*RD+0.
7μV2.
2V~11VU=0.
00035%*RD+2.
5μV11V~22VU=0.
00035%*RD+4μV22V~220VU=0.
0005%*RD+40μV220V~1000VU=0.
00065%*RD+400μV直流电流10μA~220μAU=0.
004%*RD+6nA220μA~2.
2mAU=0.
0035%*RD+7nA2.
2mA~22mAU=0.
0035%*RD+40nA22mA~220mAU=0.
0045%*RD+0.
7μA220mA~2.
2AU=0.
0080%*RD+12μA2.
2A~11AU=0.
036%*RD+480μA电阻1ΩUrel=0.
0095%1.
9ΩUrel=0.
0095%10ΩUrel=0.
0023%19ΩUrel=0.
0023%100ΩUrel=0.
0010%190ΩUrel=0.
0010%1kΩUrel=0.
00085%1.
9kΩUrel=0.
00085%10kΩUrel=0.
00085%19kΩUrel=0.
00085%100kΩUrel=0.
0011%190kΩUrel=0.
0011%1MΩUrel=0.
0020%1.
9MΩUrel=0.
0021%10MΩUrel=0.
0040%19MΩUrel=0.
0050%100MΩUrel=0.
0100%234数字多用表交流电压0410JJF(沪)1-2003数字多用表校准规范JJG315-1983直流数字电压表检定规程JJG598-1989直流数字电流表检定规程JJG724-1991直流数字欧姆表检定规程(10~22)mV50Hz-20kHz:U=0.
008%*RD+4μV20kHz~50kHz:U=0.
020%*RD+4μV50kHz~100kHz:U=0.
050%*RD+5μV100kHz~300kH:U=0.
105%*RD+10μV300kHz~500kH:U=0.
14%*RD+20μV500kHz~1MHz:U=0.
27%*RD+20μV(22~220)mV50Hz~20kHz:U=0.
008%*RD+7μV20kHz~50kHz:U=0.
020%*RD+7μV50kHz~100kHz:U=0.
046%*RD+17μV100kHz~300kHz:U=0.
090%*RD+20μV300kHz~500kHz:U=0.
14%*RD+25μV500kHz~1MHz:U=0.
27%*RD+45μV(0.
22~2.
2)V50Hz~20kHz:U=0.
005%*RD+8μV20kHz~50kHz:U=0.
0075%*RD+10μV50kHz~100kHz:U=0.
011%*RD+30μV100kHz~300kHz:U=0.
042%*RD+80μV300kHz~500kHz:U=0.
10%*RD+200μV500kHz~1MHz:U=0.
17%*RD+300μV234数字多用表交流电压0410JJF(沪)1-2003数字多用表校准规范JJG315-1983直流数字电压表检定规程JJG598-1989直流数字电流表检定规程JJG724-1991直流数字欧姆表检定规程(2.
2~22)V50Hz~20kHz:U=0.
005%*RD+80μV20kHz~50kHz:U=0.
0075%*RD+100μV50kHz~100kHz:U=0.
010%*RD+200μV100kHz~300kHz:U=0.
0275%*RD+600μV300kHz~500kH:U=0.
10%*RD+2000μV500kHz~1MHz:U=0.
15%*RD+3200μV(22~220)V50Hz~20kHz:U=0.
0052%*RD+0.
6mV20kHz~50kHz:U=0.
008%*RD+1mV50kHz~100kHz:U=0.
015%*RD+2.
5mV100kHz~300kHz:U=0.
090%*RD+16mV300kHz~500kH:U=0.
44%*RD+40mV500kHz~1MHz:U=0.
80%*RD+80mV(220~1000)V50Hz~1kHz:U=0.
007%*RD+3.
5mV(10~220)μA50Hz~1kHz:U=0.
02%*RD+35nA1kHz~5kHz:U=0.
020%*RD+0.
11μA5kHz~10kHz:U=0.
11%*RD+0.
65μA(0.
22~2.
2)mA50Hz~1kHz:U=0.
02%*RD+0.
35μA234数字多用表交流电流0410JJF(沪)1-2003数字多用表校准规范JJG315-1983直流数字电压表检定规程JJG598-1989直流数字电流表检定规程JJG724-1991直流数字欧姆表检定规程(0.
22~2.
2)mA1kHz~5kHz:U=0.
020%*RD+0.
55μA5kHz~10kHz:U=0.
11%*RD+5μA(2.
2~22)mA50Hz~1kHz:U=0.
02%*RD+2.
5μA1kHz~5kHz:U=0.
020%*RD+3.
5μA5kHz~10kHz:U=0.
11%*RD+10μA(22~220)mA50Hz~1kHz:U=0.
02%*RD+2.
5μA1kHz~5kHz:U=0.
020%*RD+3.
5μA5kHz~10kHz:U=0.
11%*RD+10μA(0.
22~2.
2)A50Hz~1kHz:U=0.
026%*RD+35μA1kHz~5kHz:U=0.
045%*RD+80μA5kHz~10kHz:U=0.
70%*RD+160μA(2.
2~11)A50Hz~1kHz:U=0.
046%*RD+170μA1kHz~5kHz:U=0.
095%*RD+380μA5kHz~10kHz:U=0.
36%*RD+750μA235多功能校准源直流电压0409JJG445-1986直流标准电压源检定规程10mV~200mVU=0.
00027%*RD+0.
00005%RANGE200mV~2VU=0.
00027%*RD+0.
00002%RANGE2V~20VU=0.
00027%*RD+0.
00002%RANGE20V~200VU=0.
00040%*RD+0.
00002%RANGE200V~1000VU=0.
00040%*RD+0.
00005%RANGE235多功能校准源交流电压0409JJG410-1994精密交流电压校准源(10~200)mV1Hz~10Hz:U=0.
012%*RD+0.
0070%RANGE10Hz~40Hz:U=0.
012%*RD+0.
0020%RANGE40Hz~100Hz:U=0.
010%*RD+0.
0020%RANGE100Hz~2kHz:U=0.
010%*RD+0.
0010%RANGE2kHz~10kHz:U=0.
010%*RD+0.
0020%RANGE10kHz~30kHz:U=0.
030%*RD+0.
0040%RANGE30kHz~100kHz:U=0.
070%*RD+0.
0100%RANGE(0.
2~200)V1Hz~10Hz:U=0.
010%*RD+0.
0060%RANGE10Hz~40Hz:U=0.
010%*RD+0.
0010%RANGE40Hz~100Hz:U=0.
0080%*RD+0.
0010%RANGE100Hz~2kHz:U=0.
0060%*RD+0.
0010%RANGE2kHz~10kHz:U=0.
0080%*RD+0.
0010%RANGE10kHz~30kHz:U=0.
020%*RD+0.
0020%RANGE30kHz~100kHz:U=0.
050%*RD+0.
010%RANGE100kHz~300kH:U=0.
3%*RD+0.
1%RANGE300kHz~1MHz:U=1%*RD+1%RANGE235多功能校准源交流电压0409JJG410-1994精密交流电压校准源(200~1000)V1Hz~10Hz:U=0.
010%*RD+0.
0070%RANGE10Hz~40Hz:U=0.
010%*RD+0.
0020%RANGE40Hz~10kHz:U=0.
008%*RD+0.
0020%RANGE10kHz~30kHz:U=0.
020%*RD+0.
0040%RANGE30kHz~100kHz:U=0.
050%*RD+0.
020%RANGE电阻0409JJG410-1994精密交流电压校准源1Ω~2ΩU=0.
0010%*RD+0.
0002%RANGE2Ω~20ΩU=0.
0007%*RD+0.
00007%RANGE20Ω~200ΩU=0.
0007%*RD+0.
000025%RANGE200Ω~2kΩU=0.
0007%*RD+0.
000025%RANGE2kΩ~20kΩU=0.
0007%*RD+0.
000025%RANGE20kΩ~200kΩU=0.
0007%*RD+0.
000025%RANGE200kΩ~2MΩU=0.
0007%*RD+0.
00005%RANGE2MΩ~20MΩU=0.
0009%*RD+0.
0005%RANGE20MΩ~100MΩU=0.
0030%*RD+0.
0050%RANGE直流电流10μA~200μAU=0.
001%*RD+0.
0002%RANGE200μA~2mAU=0.
001%*RD+0.
0002%RANGE2mA~20mAU=0.
001%*RD+0.
0002%RANGE20mA~200mAU=0.
0033%*RD+0.
0004%RANGE200mA~2AU=0.
0170%*RD+0.
0008%RANGE2A~11AU=0.
0380%*RD+0.
0020%RANGE235多功能校准源交流电流0409JCJ/B041002.
1-2004多功能校准源校准规范10μA~20mA1Hz~10Hz:U=0.
025%*RD+0.
010%RANGE10Hz~10kHz:U=0.
025%*RD+0.
010%RANGE10kHz~30kHz:U=0.
060%*RD+0.
010%RANGE30kHz–100kHz:U=0.
4%*RD+0.
010%RANGE20mA~200mA1Hz~10Hz:U=0.
025%*RD+0.
010%RANGE10Hz~10kHz:U=0.
025%*RD+0.
010%RANGE10kHz~30kHz:U=0.
060%*RD+0.
010%RANGE200mA~2A10Hz~2kHz:U=0.
060%*RD+0.
010%RANGE2kHz~10kHz:U=0.
070%*RD+0.
010%RANGE2A~11A10kHz~30kHz:U=0.
3%*RD+0.
010%RANGE10Hz~2kHz:U=0.
080%*RD+0.
010%RANGE2kHz~10kHz:U=0.
25%*RD+0.
010%RANGE236测量用电流互感器比值差、相位差0411JJG313-1994测量用电流互感器检定规程(0.
1~5)A/5A比值差:U=3.
3*10-5相位差:U=3.
3*10-5rad(5~5000)A/5A比值差:U=1.
7*10-5相位差:U=1.
7*10-5rad(5~5000)A/1A比值差:U=3.
3*10-5相位差:U=3.
3*10-5rad(5~2500)A/0.
5A比值差:U=3.
3*10-5相位差:U=3.
3*10-5rad237接地电阻表接地电阻0403JJG366-2004接地电阻表检定规程(10-3~1000)ΩUrel=1.
1%238测量用电压互感器比值差、相位差0411JJG314-1994测量用电压互感器检定规程(0~1000)V/(0~222.
222)V;(0~600)V/(0~666.
666)V;比值差:U=1.
2*10-5相位差:U=1.
2*10-5rad比值差:U=1.
1*10-4相位差:U=0.
3′比值差:U=7.
0*10-5相位差:U=7.
0*10-5rad比值差:U=8.
0*10-5相位差:U=8.
0*10-5rad比值差:U=1.
6*10-4相位差:U=0.
4′239接地导通电阻测试仪电阻0410JJG984-2004接地导通电阻测试仪(0.
02~0.
5)ΩUrel=1.
3%电流(0~25)AUrel=1.
3%240高绝缘电阻测量仪(高阻计)电阻0402JJG690-2003高绝缘电阻测量仪(高阻计)检定规程1kΩ~100MΩUrel=0.
6%100MΩ~1GΩUrel=1.
2%1GΩ~10GΩUrel=2.
4%10GΩ~1TΩUrel=5.
8%241电器安全综合性能测试仪耐电压:电压0411JJG795-2004耐电压测试仪检定规程(0~20)kVAC:Urel=1.
5%(k=2.
58)DC:Urel=0.
7%(k=2.
58)耐电压:电流10μA~400mAAC:Urel=1.
5%(k=2.
58)(0~400)mADC:Urel=0.
6%(k=2.
58)241电器安全综合性能测试仪漏电流:电流0411JJG843-2007泄漏电流测量仪检定规程10μA~400mAAC:Urel=1.
1%(0~400)mADC:Urel=0.
8%漏电流:电压(10~1000)VAC:Urel=0.
9%(0~1000)VDC:Urel=0.
3%接地电阻:电阻JJG984-2004接地导通电阻测试仪检定规程(0.
02~0.
5)ΩUrel=1.
3%接地电阻:电流JJG984-2004接地导通电阻测试仪检定规程(0~25)AUrel=1.
3%绝缘电阻:电阻JJG622-1997绝缘电阻表(兆欧表)检定规程1kΩ~100MΩUrel=0.
6%100MΩ~1GΩUrel=1.
2%1GΩ~10GΩUrel=2.
4%10GΩ~1TΩUrel=5.
8%242相位表(包括相角表和功率因数表)相角0410JJG440-2008工频单相相位表检定规程JJG381-1986BX-21型低频数字相位计检定规程0°~360°或-180°~+180°U=0.
12°功率因数0~1U=0.
12°243标准电池标准电池电压0407JJG153-1996标准电池检定规程1.
0186000V~1.
0186700VU=1μV244标准电感电感0406JJG726-1991标准电感器检定规程100μH~1Hf=1kHz:Urel=0.
02%1μH~1Hf=100Hz~1kHz:Urel=1%~0.
05%245标准电容电容0404JJG183-1992标准电容器检定规程1pF~1μF1kHz:Urel=0.
001%~0.
01%500Hz~2kHz:Urel=0.
002%~0.
02%50Hz~10kHz:Urel=0.
01%~2%1μF~1F20Hz~100Hz:Urel=0.
5%~5%10kHz~1MHz:Urel=2%~0.
5%损耗1~1*10-5U=1*10-5246特斯拉计磁感应强度0405JJG242-1995特斯拉计检定规程(0.
035~2.
0)TUrel=0.
08%247磁通表磁通量0405JJG317-1983磁通表检定规程(0~10)mWbUrel=0.
5%248LCR测试仪电容0411JJG441-2008交流电桥检定规程100pF~1μF1kHz:Urel=0.
02%1pF~1μF100Hz~13MHz:Urel=5%~0.
5%电感100μH~1H1kHz:Urel=0.
02%1H~104H100Hz:Urel=0.
2%~10%1H~1μH100Hz~1kHz,:Urel=0.
2%~20%电阻100Ω~100kΩ1kHz:Urel=0.
02%0.
001Ω~100MΩ100Hz~13MHz:Urel=0.
5%~20%损耗1~10-5U=1*10-4249耐电压测试仪电压0411JJG795-2004耐电压测试仪检定规程(0~20)kVAC:Urel=1.
5%(k=2.
58)DC:Urel=0.
7%(k=2.
58)电流20μA~100mAAC:Urel=1.
5%DC:Urel=0.
6%(k=2.
58)250钳形表直流电压0410JJF(沪)1-2003数字多用表校准规范JJG124-2005电流表、电压表、功率表及电阻表检定规程10mV~1000V(45~10k)Hz:Urel=0.
1%250钳形表交流电压0410JJF(沪)1-2003数字多用表校准规范JJG124-2005电流表、电压表、功率表及电阻表检定规程10mV~1000V50Hz~10kHz:Urel=0.
2%直流电流JJF1075-2001钳形电流表校准规范10μA~20.
49AUrel=0.
2%20.
5A~1000AUrel=0.
4%交流电流JJF1075-2001钳形电流表校准规范30μA~2.
999A45Hz~1kHz:Urel=0.
2%3A~20.
49A(45~100)Hz:Urel=0.
2%20.
5A~149.
9A(45~65)Hz:Urel=0.
5%150A~1000A(45~65)Hz:Urel=0.
4%直流功率JJF(沪)1-2003数字多用表校准规范JJF1075-2001钳形电流表校准规范33mV~1000V0.
33A~20.
49A:Urel=0.
2%20.
5A~1000A:Urel=0.
5%交流功率JJG780-1992交流数字功率表检定规程JJF1075-2001钳形电流表校准规范30V~600V(45Hz~65Hz)0.
33A~20.
49A:Urel=0.
3%20.
5A~44.
99A:Urel=0.
6%45A~1000A:Urel=0.
5%电阻0402JJF(沪)1-2003数字多用表校准规范JJG124-2005电流表、电压表、功率表及电阻表检定规程1Ω~100MΩUrel=0.
1%251数字功率表功率0410JJG780-1992交流数字功率表检定规程3*(30~600)V、3*(50mA~100A)Urel=0.
01%电流0410JJF(沪)1-2003数字多用表校准规范3*(50mA~100A)Urel=0.
01%电压0410JJF(沪)1-2003数字多用表校准规范3*(30~600)VUrel=0.
01%252数字功率源功率0410JJG780-1992交流数字功率表检定规程3*(30V~600V)3*(50mA~100A)Urel=0.
02%电流04103*(50mA~100A)Urel=0.
02%电压04103*(30V~600V)Urel=0.
02%253变压比电桥变比0411JJG970-2002变压比电桥检定规程1~1000U=0.
02%254高压表电压0411JCJ/F121001.
1-2006高压表校准规范1V~100kVAC:Urel=0.
25%DC:Urel=0.
13%255泄漏电流测量仪(表)电流0410JJG843-2007泄漏电流测量仪检定规程10μA~400mAAC:Urel=1.
1%(0~400)mADC:Urel=0.
8%电压0410(10~1000)VAC:Urel=0.
9%(0~1000)VDC:Urel=0.
3%256回路电阻测试仪电阻0402JJG1052-2009回路电阻测试仪、直阻仪10-5Ω~1.
9mΩUrel=0.
2%+1字257直流低电阻表电阻0402JJG837-2003直流低电阻表JJG1052-2009回路电阻测试仪、直阻仪10-5Ω~100MΩ10-5Ω~10-4ΩUrel=0.
05%+1字10-4Ω~100MΩUrel=0.
02%+1字258交流电压校准源电压0409JJG410-1994精密交流电压校准源检定规程(1~2.
2)mV10Hz~20Hz:U=0.
17%*RD+1.
3μV20Hz~40Hz:U=0.
074%*RD+1.
3μV40Hz~20kHz:U=0.
042%*RD+1.
3μV20kHz~50kHz:U=0.
081%*RD+2.
0μV50kHz~100kHz:U=0.
12%*RD+2.
5μV258交流电压校准源电压0409JJG410-1994精密交流电压校准源检定规程100kHz~300kHz:U=0.
23%*RD+4.
0μV300kHz~500kHz:U=0.
24%*RD+8.
0μV500kHz~1MHz:U=0.
35%*RD+8.
0μV1MHz~1.
2MHz:U=0.
07%*RD+1μV1.
2MHz~2MHz:U=0.
07%*RD+1μV2MHz~10MHz:U=0.
17%*RD+1μV10MHz~20MHz:U=0.
30%*RD+1μV20MHz~30MHz:U=0.
70%*RD+2μV(2.
2~7)mV10Hz~20Hz:U=0.
085%*RD+1.
3μV20Hz~40Hz:U=0.
037%*RD+1.
3μV40Hz~20kHz:U=0.
021%*RD+1.
3μV20kHz~50kHz:U=0.
040%*RD+2.
0μV50kHz~100kHz:U=0.
060%*RD+2.
5μV100kHz~300kHz:U=0.
12%*RD+4.
0μV300kHz~500kHz:U=0.
13%*RD+8.
0μV258交流电压校准源电压0409JJG410-1994精密交流电压校准源检定规程500kHz~1MHz:U=0.
23%*RD+8.
0μV1MHz~1.
2MHz:U=0.
07%*RD+1μV1.
2MHz~2MHz:U=0.
07%*RD+1μV2MHz~10MHz:U=0.
10%*RD+1μV10MHz~20MHz:U=0.
17%*RD+1μV20MHz~30MHz:U=0.
37%*RD+1μV(7~22)mV10Hz~20Hz:U=0.
029%*RD+1.
3μV20Hz~40Hz:U=0.
019%*RD+1.
3μV40Hz~20kHz:U=0.
011%*RD+1.
3μV20kHz~50kHz:U=0.
021%*RD+2.
0μV50kHz~100kHz:U=0.
031%*RD+2.
5μV100kHz~300kHz:U=0.
081%*RD+4.
0μV300kHz~500kHz:U=0.
089%*RD+8.
0μV500kHz~1MHz:U=0.
17%*RD+8.
0μV258交流电压校准源电压0409JJG410-1994精密交流电压校准源检定规程1MHz~1.
2MHz:Urel=0.
07%1.
2MHz~2MHz:Urel=0.
07%2MHz~10MHz:Urel=0.
10%10MHz~20MHz:Urel=0.
17%20MHz~30MHz:Urel=0.
37%(22~70)mV10Hz~20Hz:U=0.
024%*RD+1.
5μV20Hz~40Hz:U=0.
012%*RD+1.
5μV40Hz~20kHz:U=0.
0065%*RD+1.
5μV20kHz~50kHz:U=0.
013%*RD+2.
0μV50kHz~100kHz:U=0.
026%*RD+2.
5μV100kHz~300kHz:U=0.
051%*RD+4.
0μV300kHz~500kHz:U=0.
067%*RD+8.
0μV500kHz~1MHz:U=0.
11%*RD+8.
0μV1MHz~1.
2MHz:Urel=0.
05%1.
2MHz~2MHz:Urel=0.
05%2MHz~10MHz:Urel=0.
10%10MHz~20MHz:Urel=0.
15%20MHz~30MHz:Urel=0.
35%258交流电压校准源电压0409JJG410-1994精密交流电压校准源检定规程(70~220)mV10Hz~20Hz:U=0.
021%*RD+1.
5μV20Hz~40Hz:U=0.
0085%*RD+1.
5μV40Hz~20kHz:U=0.
0038%*RD+1.
5μV20kHz~50kHz:U=0.
0069%*RD+2.
0μV50kHz~100kHz:U=0.
016%*RD+2.
5μV100kHz~300kHz:U=0.
025%*RD+4.
0μV300kHz~500kHz:U=0.
038%*RD+8.
0μV500kHz~1MHz:U=0.
10%*RD+8.
0μV1MHz~1.
2MHz:Urel=0.
05%1.
2MHz~2MHz:Urel=0.
05%2MHz~10MHz:Urel=0.
10%10MHz~20MHz:Urel=0.
15%20MHz~30MHz:Urel=0.
35%(220~700)mV10Hz~20Hz:U=0.
021%*RD+1.
5μV20Hz~40Hz:U=0.
0076%*RD+1.
5μV40Hz~20kHz:U=0.
0033%*RD+1.
5μV20kHz~50kHz:U=0.
0051%*RD+2.
0μV258交流电压校准源电压0409JJG410-1994精密交流电压校准源检定规程50kHz~100kHz:U=0.
0079%*RD+2.
5μV100kHz~300kHz:U=0.
018%*RD+4.
0μV300kHz~500kHz:U=0.
030%*RD+8.
0μV500kHz~1MHz:U=0.
096%*RD+8.
0μV1MHz~1.
2MHz:Urel=0.
05%1.
2MHz~2MHz:Urel=0.
05%2MHz~10MHz:Urel=0.
10%10MHz~20MHz:Urel=0.
15%20MHz~30MHz:Urel=0.
35%(0.
7~2.
2)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0066%40Hz~20kHz:Urel=0.
0024%20kHz~50kHz:Urel=0.
0046%50kHz~100kHz:Urel=0.
0071%100kHz~300kHz:Urel=0.
016%300kHz~500kHz:Urel=0.
026%500kHz~1MHz:Urel=0.
090%1MHz~1.
2MHz:Urel=0.
05%1.
2MHz~2MHz:Urel=0.
05%2MHz~10MHz:Urel=0.
10%258交流电压校准源电压0409JJG410-1994精密交流电压校准源检定规程10MHz~20MHz:Urel=0.
15%20MHz~30MHz:Urel=0.
35%(2.
2~7)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0067%40Hz~20kHz:Urel=0.
0024%20kHz~50kHz:Urel=0.
0048%50kHz~100kHz:Urel=0.
0081%100kHz~300kHz:Urel=0.
019%300kHz~500kHz:Urel=0.
040%500kHz~1MHz:Urel=0.
12%1MHz~1.
2MHz:Urel=0.
05%1.
2MHz~2MHz:Urel=0.
05%2MHz~10MHz:Urel=0.
10%10MHz~20MHz:Urel=0.
15%20MHz~30MHz:Urel=0.
35%(7~22)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0067%40Hz~20kHz:Urel=0.
0027%20kHz~50kHz:Urel=0.
0048%50kHz~100kHz:Urel=0.
0081%100kHz~300kHz:Urel=0.
019%300kHz~500kHz:Urel=0.
040%500kHz~1MHz:Urel=0.
12%258交流电压校准源电压0409JJG410-1994精密交流电压校准源检定规程(22~70)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0068%40Hz~20kHz:Urel=0.
0032%20kHz~50kHz:Urel=0.
0057%50kHz~100kHz:Urel=0.
0094%100kHz~300kHz:Urel=0.
020%300kHz~500kHz:Urel=0.
041%500kHz~1MHz:Urel=0.
12%(70~220)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0068%40Hz~20kHz:Urel=0.
0031%20kHz~50kHz:Urel=0.
0069%50kHz~100kHz:Urel=0.
0098%100kHz~300kHz:Urel=0.
021%300kHz~500kHz:Urel=0.
050%(220~700)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0099%40Hz~20kHz:Urel=0.
0041%20kHz~50kHz:Urel=0.
013%50kHz~100kHz:Urel=0.
050%(700~1000)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0099%40Hz~20kHz:Urel=0.
0038%20kHz~50kHz:Urel=0.
013%50kHz~100kHz:Urel=0.
050%259电压表直流电压0410JJG124-2005电流表、电压表、功率表及电阻表检定规程(0~1000)VUrel=0.
02%交流电压0410(0~1000)VUrel=0.
03%260电流表直流电流0410JJG124-2005电流表、电压表、功率表及电阻表检定规程(0~30)AUrel=0.
03%交流电流0410(0~50)AUrel=0.
03%261功率表直流功率0410JJG124-2005电流表、电压表、功率表及电阻表检定规程(0~600)V,(0~30)AUrel=0.
03%交流功率0410(0~300)V,(0~20A)Urel=0.
03%262万用表直流电压0410JJG124-2005电流表、电压表、功率表及电阻表检定规程(0~1000)VUrel=0.
2%交流电压0410(0~1000)VUrel=0.
3%直流电流0410(0~20)AUrel=0.
2%交流电流0410(0~20)AUrel=0.
3%直流电阻0402(0~11.
11110)MΩUrel=0.
3%263绝缘电阻表(兆欧表)电阻0403JJG622-1997绝缘电阻表(兆欧表)检定规程1kΩ~100MΩUrel=1.
0%100MΩ~1GΩUrel=1.
5%1GΩ~10GΩUrel=2.
5%10GΩ~100GΩUrel=6.
0%264电子式绝缘电阻表绝缘电阻0410JJG1005-2005电子式绝缘电阻表1kΩ~100MΩUrel=1.
0%100MΩ~1GΩUrel=1.
5%1GΩ~10GΩUrel=2.
5%10GΩ~1000GΩUrel=6.
0%265离子风机时间0426JCJ/G301004.
1/0-2009离子风机校准规范(0~100)sU=0.
3s离子平衡度0426(0~1000)VUrel=5.
0%266焓差试验台电压0409JJG780-1992交流数字功率表检定规程(0~33)V45Hz~1kHz:Urel=0.
05%(33~330)V45Hz~1kHz:Urel=0.
05%(330~1000)V45Hz~1kHz:Urel=0.
05%电流0409(0~0.
33)A45Hz~100Hz:Urel=0.
15%(0.
33~3)A45Hz~100Hz:Urel=0.
15%(3~11)A45Hz~100Hz:Urel=0.
15%(11~20)A45Hz~100Hz:Urel=0.
15%频率041210Hz~1kHzUrel=0.
015%功率0410(0~20)kWUrel=0.
15%温度1514JJG115-1999标准铜-铜镍(康铜)热电偶检定规程T:(-150~0~120~300)℃U=0.
3℃JJG229-1998工业铂、铜热电阻检定规程PT100:(-30~200)℃U=0.
07℃压力1320JJG860-1994压力传感器(静态)检定规程(-0.
1~5)MPaUrel=0.
1%JJG882-2004压力变送器检定规程(-1000~1000)PaUrel=0.
1%转速1324JJG105-2000转速表检定规程(0~10000)r/minU=1.
2r/min267数据采集器直流电压0409JJG315-1983直流电压检定规程(0~330)mVUrel=0.
005%(0~3.
3)VUrel=0.
005%(0~33)VUrel=0.
005%(30~330)VUrel=0.
005%交流电压0409JJG(航天)34-1999交流电压检定规程(0~33)V45Hz~1kHz:Urel=0.
05%(33~330)V45Hz~1kHz:Urel=0.
05%温度1514JJG617-1996数字温度指示调节仪检定规程铂电阻(PT100385)(-40~600)℃℃铂电阻温度:U=0.
12℃~0.
15℃热电偶(K)(-40~-25)℃热电偶温度:U=0.
2℃(-25~120)℃U=0.
2℃(120~600)℃U=0.
3℃电阻0402JJG724-1991直流数字式欧姆表检定规程(0~11)ΩUrel=0.
015%(11~110)ΩUrel=0.
015%(0.
11~1.
1)kΩUrel=0.
015%(1.
1~11)kΩUrel=0.
015%(11~110)kΩUrel=0.
015%(0.
11~1.
1)MΩUrel=0.
015%(1.
1~3)MΩUrel=0.
025%268冷量试验台电压0409JJG780-1992交流数字功率表检定规程(0~33)V45Hz~1kHz:Urel=0.
05%(33~330)V45Hz~1kHz:Urel=0.
05%(330~1000)V45Hz~1kHz:Urel=0.
05%电流0409(0~0.
33)A45Hz~100Hz:Urel=0.
15%(0.
33~3)A45Hz~100Hz:Urel=0.
15%(3~11)A45Hz~100Hz:Urel=0.
15%(11~20)A45Hz~100Hz:Urel=0.
15%频率041210Hz~1kHzUrel=0.
015%功率0410(0~20)kWUrel=0.
15%温度1514JJG115-1999标准铜-铜镍(康铜)热电偶检定规程T:(-30~0~120~300)℃U=0.
3℃JJG229-1998工业铂、铜热电阻检定规程PT100:(-30~200)℃U=0.
07℃压力1320JJG860-1994压力传感器(静态)校准规范(-1000~1000)PaUrel=0.
1%JJG882-2004压力变送器检定规程(-0.
1~5)MPaUrel=0.
1%转速1324JJG105-2000转速表检定规程(0~10000)r/minU=1.
2r/min269空调机(室外机)综合测试仪电压0409JJG780-1992交流数字功率表检定规程(0~33)V45Hz~1kHz:Urel=0.
05%(33~330)V45Hz~1kHz:Urel=0.
05%(330~1000)V45Hz~1kHz:Urel=0.
05%电流0409(0~0.
33)A45Hz~100Hz:Urel=0.
15%(0.
33~3)A45Hz~100Hz:Urel=0.
15%(3~11)A45Hz~100Hz:Urel=0.
15%(11~20)A45Hz~100Hz:Urel=0.
15%频率0412JJG780-1992交流数字功率表检定规程10Hz~1kHzUrel=0.
015%功率0410JJG780-1992交流数字功率表检定规程(0~20)kWUrel=0.
15%温度1514JJG115-1999标准铜-铜镍(康铜)热电偶检定规程T:(-30~0~120~300)℃U=0.
3℃压力1320JJG860-1994压力传感器(静态)检定规程(-0.
1~5)MPaUrel=0.
1%270过程仪表认证校准仪直流电压0409JJG315-1983直流数字电压表检定规程(0~330)VUrel=0.
09%测量部分交流电压0409JJG(航天)34-1999交流数字电压表检定规程(0~330)V45Hz~1kHz:Urel=0.
3%直流电流0409JJG598-1989直流数字电流表检定规程(0~330)mAUrel=0.
07%频率0412JJG349-2001通用计数器检定规程(0~119.
99)kHzUrel=0.
02%电阻0402JJG724-1991直流数字式欧姆表检定规程(0~100)kΩUrel=0.
015%温度1514JJG617-1996数字温度指示调节仪检定规程热电偶(K)(-200~-100)℃U=0.
4℃(-100~1000)℃U=0.
3℃(1000~1370)℃U=0.
5℃铂电阻(PT100385)(-200~-80~800)℃U=0.
12℃~0.
28℃直流电压0409JJG445-1986直流标准电压源检定规程(0~15)VUrel=0.
09%输出部分直流电流0409JJG(航天)38-1987直流标准电流源检定规程(0~2)mAUrel=0.
07%(0~20)mAUrel=0.
06%电阻0402JJF1183-2007温度变送器校准规范(0~10)kΩUrel=0.
1%温度1514热电偶(K)(-200~-100)℃U=0.
4℃(-100~1000)℃U=0.
3℃(1000~1370)℃U=0.
5℃铂电阻(PT100385)(-200~-80~800)℃U=0.
12℃~0.
28℃271继电器保护测试仪直流电压0409JCJ/G301011.
1-2007继电器保护测试仪校准规范(0~1000)VUrel=0.
05%交流电压0410(0~1000)V45Hz~1kHz:Urel=0.
15%交流电流0410(0~10)A45Hz~100Hz:Urel=0.
25%直流电流0409(0~10)AUrel=0.
22%272二次电池测试仪直流电压0409JCJ/G301008.
1-2007二次电池测试仪校准规范(0~24)VUrel=0.
2%电阻0409(20~500)mΩUrel=0.
8%直流电流0409(0~10)AUrel=0.
3%273开关特性测试仪直流电压0409JCJ/G301009.
1-2009开关特性测试仪校准规范(0~1000)VUrel=0.
1%时间0412(0~1000)msU=0.
1ms274离子平板监视仪直流电压0409JCJ/G301010.
1-2007离子平板监视仪校准规范(0~1000)VUrel=0.
2%时间0412(0~100)sU=0.
2s275磁粉探伤机交流电流0409JCJ/G301007.
1/0-2006磁粉探伤机校准规范(0~9000)AUrel=1.
9%直流电流0409(0~6000)AUrel=2.
6%276互感器校验仪互感器校验仪0411JJG169-1993互感器校验仪比差:(0.
0001~100)%角差:(0.
0005~500)′阻抗:(0.
001~10)Ω导纳:(0.
01~10)mSUrel=0.
3%277失真度仪检定装置电压0409JJG802-1993失真度仪检定装置检定规程0.
3mV~1000mV10Hz~30Hz:Urel=0.
2%30Hz~50kHz:Urel=0.
06%50kHz~100kHz:Urel=0.
2%100kHz~200kHz:Urel=0.
5%200kHz~400kHz:Urel=1.
0%频率10Hz~1GHzUrel=1.
2*10-6278测量滤波器(低通、高通)通带内波动1401JJG(电子)12016-1987843型收音机录音机测量滤波器计量试行检定规程(10~-70)dB10Hz~1GHz:U=0.
1dB衰减(10~-70)dB10Hz~1GHz:U=0.
5dB279音频分析仪电压0413JJG782-1992低频电子电压表检定规程(1~2.
2)mV10Hz~20Hz:U=0.
055%*RD+4.
5μV20Hz~40Hz:U=0.
021%*RD+4.
5μV40Hz~20kHz:U=0.
0105%*RD+4.
5μV20kHz~50kHz:U=0.
037%*RD+4.
5μV50kHz~100kHz:U=0.
085%*RD+7μV100kHz~300kHz:U=0.
11%*RD+13μV300kHz~500kHz:U=0.
17%*RD+25μV500kHz~1MHz:U=0.
34%*RD+25μV(2.
2~22)mV10Hz~20Hz:U=0.
055%*RD+5μV20Hz~40Hz:U=0.
021%*RD+5μV40Hz~20kHz:U=0.
0105%*RD+5μV20kHz~50kHz:U=0.
037%*RD+5μV279音频分析仪电压0413JJG782-1992低频电子电压表检定规程50kHz~100kHz:U=0.
085%*RD+7μV100kHz~300kHz:U=0.
11%*RD+12μV300kHz~500kHz:U=0.
17%*RD+25μV500kHz~1MHz:U=0.
34%*RD+25μV(22~220)mV10Hz~20Hz:U=0.
055%*RD+13μV20Hz~40Hz:U=0.
021%*RD+8μV40Hz~20kHz:U=0.
0105%*RD+8μV20kHz~50kHz:U=0.
032%*RD+8μV50kHz~100kHz:U=0.
085%*RD+25μV100kHz~300kHz:U=0.
11%*RD+25μV300kHz~500kHz:U=0.
17%*RD+35μV500kHz~1MHz:U=0.
34%*RD+80μV(0.
22~2.
2)V10Hz~20Hz:U=0.
050%*RD+80μV20Hz~40Hz:U=0.
016%*RD+25μV40Hz~20kHz:U=0.
01%*RD+6μV279音频分析仪电压0413JJG782-1992低频电子电压表检定规程20kHz~50kHz:U=0.
012%*RD+16μV50kHz~100kHz:U=0.
025%*RD+70μV100kHz~300kHz:U=0.
043%*RD+130μV300kHz~500kHz:U=0.
105%*RD+350μV500kHz~1MHz:U=0.
22%*RD+850μV(2.
2~22)V10Hz~20Hz:U=0.
050%*RD+800μV20Hz~40Hz:U=0.
016%*RD+250μV40Hz~20kHz:U=0.
01%*RD+60μV20kHz~50kHz:U=0.
012%*RD+160μV50kHz~100kHz:U=0.
025%*RD+350μV100kHz~300kHz:U=0.
05%*RD+1500μV300kHz~500kHz:U=0.
125%*RD+4300μV500kHz~1MHz:U=0.
27%*RD+8500μV(22~220)V10Hz~20Hz:U=0.
050%*RD+8mV279音频分析仪电压0413JJG782-1992低频电子电压表检定规程20Hz~40Hz:U=0.
016%*RD+2.
5mV40Hz~20kHz:U=0.
01%*RD+0.
8mV20kHz~50kHz:U=0.
022%*RD+3.
5mV50kHz~100kHz:U=0.
050%*RD+8mV100kHz~300kHz:U=0.
15%*RD+90mV300kHz~500kHz:U=0.
47%*RD+90mV500kHz~1MHz:U=1.
15%*RD+190mV(220~300)V15Hz~50Hz:U=0.
040%*RD+16mV50Hz~1kHz:U=0.
01%*RD+3.
5mV失真度0413JJG251-1997失真度测量仪检定规程0.
003%~0.
01%10Hz~1kHz:U=10%*RD+0.
0003%0.
01%~0.
02%10Hz~20kHz:U=5%*RD+0.
0003%0.
02%110Hz~10kHz:U=4%*RD+0.
0002%0.
03%10Hz~20Hz:U=7%*RD+0.
0003%20Hz~20kHz:U=7%*RD+0.
0002%110Hz~10kHz:U=2%*RD+0.
0002%279音频分析仪失真度0413JJG251-1997失真度测量仪检定规程0.
04%10Hz~20Hz:U=5%*RD+0.
0003%20Hz~20kHz:U=4%*RD+0.
0002%110Hz~10kHz:U=2%*RD+0.
0002%0.
05%~0.
1%10Hz~20Hz:U=4%*RD+0.
0003%20Hz~20kHz:U=3%*RD+0.
0002%110Hz~10kHz:U=1%*RD+0.
0002%20kHz~50kHz:U=10%*RD+0.
0003%0.
1%~0.
3%10Hz~20Hz:U=2%*RD+0.
0003%20Hz~20kHz:U=2%*RD+0.
0002%110Hz~10kHz:U=0.
7%*RD+0.
0002%20kHz~50kHz:U=4%*RD+0.
0003%50kHz~200kHz:U=8%*RD+0.
0003%0.
3%~100%10Hz~20Hz:U=2%*RD+0.
0003%20Hz~20kHz:U=1%*RD+0.
0002%110Hz~10kHz:U=0.
7%*RD+0.
0002%20kHz~50kHz:U=2%*RD+0.
0003%50kHz~200kHz:U=4%*RD+0.
0003%频率JJG602-1996低频信号发生器检定规程10Hz~1MHzUrel=1*10-6280晶体管特性图示仪X轴电压0413JJF1236-2010半导体管特性图示仪校准规范0.
1V~1000VUrel=0.
34%Y轴电流10mA~10A281射频通信测试仪RF频率0419JJF1065-2000射频通信测试仪校准规范20kHz~40GHzUrel=1.
2*10-9RF功率+20dBm~-120dBmU=0.
25dB调频≤400kHzUrel=1.
2%调幅≤99%Urel=1.
2%AF频率10Hz~20kHzUrel=1.
2*10-9AF电平(0~750)VUrel=0.
10%DC电平(0~1000)VUrel=0.
0063%282驻波测试仪驻波比0419JJG360-1984同轴测量线检定规程>1.
025MHz~3000MHzUrel=1.
2%283阻抗分析仪频率0419JJG(电子)05007-1987P4192A型低频阻抗分析仪检定规程5Hz~1MHzUrel=1.
2*10-4电平(0~750)VUrel=0.
10%电容1pF、10pF、100pF、1000pFUrel=0.
12%电阻100W、1kW、10kW、100kWUrel=0.
12%284网络分析仪电平0419JJG(电子)07009-1991HP-3577A型网络分析仪检定规程12dBm~-36dBmU=0.
25dB衰减0dB~100dBU=0.
25dB频率10Hz~40GHzUrel=1.
2*10-9285彩色图像信号发生器信号电平0416JJG(电子)12002-1987216/2彩条发生器检定规程0.
05V~2VUrel=0.
58%色度相位0°~360°U=0.
35°信号宽度10μs~30μsU=0.
1μs286衰减器衰减0419JJG387-200510MHz~18GHz频段衰减器检定规程0dB~80dB150kHz~18GHzU=0.
25dB80~100dB150kHz~18GHzU=(0.
25~0.
05)dB287频谱分析仪频率0419JJG501-2000频谱分析仪检定规程30Hz~40GHzUrel=1.
8*10-8校准信号幅度-10dBm~-20dBmUrel=0.
25dB扫频宽度0Hz,100Hz~40GHzUrel=1.
8*10-3参考电平(-127~30)dBmUrel=0.
25dB288测量接收机功率0419JJF1173-2007测量接收机校准规范功率:(-127~30)dBm150kHz~26.
5GHz:Urel=0.
25dB衰减衰减:(0~100)dB150kHz~26.
5GHz:U=0.
15dB289EMI接收机电平0419JJF1144-2006电磁骚扰测量接收机校准规范-33dBmV~120dBmV9kHz~20GHz:Urel=0.
6dB衰减(0~100)dB9kHz~20GHz:U=0.
9dB脉冲幅度0dBmV~60dBmV9kHz~1GHz:U=0.
7dB重复频率响应0dBmV~60dBmV9kHz~1GHz:U=0.
8dB290环形天线天线系数0419GB/T6113.
104-2008CISPR16-1-4:2005无线电骚扰和抗扰度测量设备和测量方法规范第1-4部分:无线电骚扰和抗扰度测量设备辅助设备辐射骚扰80dB9kHz~30MHz:U=1dB291功率吸收钳插入损耗0419JJF1155-200630MHz~10GHz吸收式功率钳校准规范0dB~30dB30MHz~1000MHz:U=2.
5dB292函数信号发生器频率0416JJG840-1993函数信号发生器检定规程10Hz~80MHzUrel=1.
8*10-8幅度(-127~30)dBmU=0.
15dB293示波器上升时间0413JJG262-1996模拟示波器检定规程1ns~25psUrel=2%+3ps(25ps)频带宽度10MHz~20GHzUrel=5%扫描时间系数(0.
2ns~50s)/div模拟Urel=0.
6%数字Urel=0.
1%垂直偏转系数(1mV~20V/divUrel=0.
6%294取样示波器上升时间0413JJG491-19871GHz取样示波器检定规程1ns~25psUrel=2%+3ps频带宽度10MHz~20GHzUrel=5%扫描时间系数(0.
2ns~50s)/divUrel=0.
6%垂直偏转系数(1mV~5V)/divUrel=0.
6%295示波器校准仪时间0409JJG278-2002示波器校准仪检定规程0.
2ns~5sUrel=5*10-8幅度10mV~200VUrel=0.
05%电压±(50mV~200V)Urel=2*10-5296脉冲发生器频率0409JJG490-2002脉冲信号发生器检定规程1Hz~1000MHzUrel=0.
01%时间(宽度,延时)1ns~1sUrel=1%幅度(0.
1~10)VUrel=2%上升下降沿25ps~1nsUrel=1%±5ps297高频Q表Q值0404JJF1073-2000高频Q表校准规范Q值:0~500100kHz~50MHz:Urel=2.
5%298信号发生器频率0416JJG173-2003信号发生器检定规程30Hz~20GHzUrel=1.
8*10-8电平(-127~30)dBmUrel=(0.
2~0.
5)dB调幅度99%Urel=1%频偏≤400kHzU=1%299调制度测量仪调幅度0413JJF1111-2003调制度测量仪校准规范≤99%Urel=1.
2%频偏≤400kHzUrel=1.
2%300功率传感器校准因子0419JJG282-1981同轴热电薄膜功率座检定规程0.
5mW~10mW(0.
01~26.
5)GHz:Urel=(1.
6~2.
4)%301超高频毫伏表电压0410JJG308-1983超高频毫伏表检定规程0.
2V~2V100kHz~1GHz:Urel=1.
2%302低频电子电压表电压0410JJG782-1992低频电子电压表检定规程(1~2.
2)mV10Hz~20Hz:U=0.
055%*RD+4.
5μV20Hz~40Hz:U=0.
021%*RD+4.
5μV40Hz~20kHz:U=0.
0105%*RD+4.
5μV20kHz~50kHz:U=0.
037%*RD+4.
5μV50kHz~100kHz:U=0.
085%*RD+7μV302低频电子电压表电压0410JJG782-1992低频电子电压表检定规程100kHz~300kHz:U=0.
11%*RD+13μV300kHz~500kHz:U=0.
17%*RD+25μV500kHz~1MHz:U=0.
34%*RD+25μV(2.
2~22)mV10Hz~20Hz:U=0.
055%*RD+5μV20Hz~40Hz:U=0.
021%*RD+5μV40Hz~20kHz:U=0.
0105%*RD+5μV20kHz~50kHz:U=0.
037%*RD+5μV50kHz~100kHz:U=0.
085%*RD+7μV100kHz~300kHz:U=0.
11%*RD+12μV300kHz~500kHz:U=0.
17%*RD+25μV500kHz~1MHz:U=0.
34%*RD+25μV(22~220)mV10Hz~20Hz:U=0.
055%*RD+13μV20Hz~40Hz:U=0.
021%*RD+8μV40Hz~20kHz:U=0.
0105%*RD+8μV20kHz~50kHz:U=0.
032%*RD+8μV50kHz~100kHz:U=0.
085%*RD+25μV100kHz~300kHz:U=0.
11%*RD+25μV302低频电子电压表电压0410JJG782-1992低频电子电压表检定规程300kHz~500kHz:U=0.
17%*RD+35μV500kHz~1MHz:U=0.
34%*RD+80μV(0.
22~2.
2)V10Hz~20Hz:U=0.
050%*RD+80μV20Hz~40Hz:U=0.
016%*RD+25μV40Hz~20kHz:U=0.
0075%*RD+6μV20kHz~50kHz:U=0.
012%*RD+16μV50kHz~100kHz:U=0.
025%*RD+70μV100kHz~300kHz:U=0.
043%*RD+130μV300kHz~500kHz:U=0.
105%*RD+350μV500kHz~1MHz:U=0.
22%*RD+850μV(2.
2~22)V10Hz~20Hz:U=0.
050%*RD+800μV20Hz~40Hz:U=0.
016%*RD+250μV40Hz~20kHz:U=0.
01%*RD+60μV20kHz~50kHz:U=0.
012%*RD+160μV50kHz~100kHz:U=0.
025%*RD+350μV100kHz~300kHz:U=0.
05%*RD+1500μV300kHz~500kHz:U=0.
125%*RD+4300μV302低频电子电压表电压0410JJG782-1992低频电子电压表检定规程500kHz~1MHz:U=0.
27%*RD+8500μV(22~220)V10Hz~20Hz:U=0.
050%*RD+8mV20Hz~40Hz:U=0.
016%*RD+2.
5mV40Hz~20kHz:U=0.
01%*RD+0.
8mV20kHz~50kHz:U=0.
022%*RD+3.
5mV50kHz~100kHz:U=0.
050%*RD+8mV100kHz~300kHz:U=0.
15%*RD+90mV300kHz~500kHz:U=0.
47%*RD+90mV500kHz~1MHz:U=1.
15%*RD+190mV(220~1000)V15Hz~50Hz:U=0.
040%*RD+16mV50Hz~1kHz:U=0.
01%*RD+3.
5mV(1~1.
1)mV1MHz~1.
2MHz:U=0.
2%*RD+3μV1.
2MHz~2MHz:U=0.
2%*RD+3μV2MHz~10MHz:U=0.
4%*RD+3μV10MHz~20MHz:U=0.
6%*RD+3μV20MHz~30MHz:U=10.
5%*RD+15μV(1.
1~3)mV1MHz~1.
2MHz:U=0.
1%*RD+3μV302低频电子电压表电压0410JJG782-1992低频电子电压表检定规程1.
2MHz~2MHz:U=0.
1%*RD+3μV2MHz~10MHz:U=0.
3%*RD+3μV10MHz~20MHz:U=0.
5%*RD+3μV20MHz~30MHz:U=10.
5%*RD+3μV3mV~7V1MHz~1.
2MHz:U=0.
1%*RD+3μV1.
2MHz~2MHz:U=0.
1%+3μV2MHz~10MHz:U=0.
2%*RD+3μV10MHz~20MHz:U=0.
4%*RD+3μV20MHz~30MHz:U=1%*RD+3μV303场强仪电压0419JJG358-1984RR-2A干扰场强测量仪检定规程(0~120)dBmV10Hz~18GHz:U=0.
50dB衰减(0~120)dB10Hz~18GHz:U=0.
35dB304失真度测量仪失真度0413JJG251-1997失真度测量仪检定规程0.
003%~0.
01%10Hz~1kHz:U=10%*RD+0.
0003%0.
01%~0.
02%10Hz~20kHz:U=5%*RD+0.
0003%0.
02%110Hz~10kHz:U=4%*RD+0.
0002%0.
03%10Hz~20Hz:U=7%*RD+0.
0003%20Hz~20kHz:U=7%*RD+0.
0002%110Hz~10kHz:U=2%*RD+0.
0002%0.
04%10Hz~20Hz:U=5%*RD+0.
0003%20Hz~20kHz:U=4%*RD+0.
0002%110Hz~10kHz:U=2%*RD+0.
0002%0.
05%~0.
1%10Hz~20Hz:U=4%*RD+0.
0003%20Hz~20kHz:U=3%*RD+0.
0002%110Hz~10kHz:U=1%*RD+0.
0002%20kHz~50kHz:U=10%*RD+0.
0003%0.
1%~0.
3%10Hz~20Hz:U=2%*RD+0.
0003%20Hz~20kHz:U=2%*RD+0.
0002%110Hz~10kHz:U=0.
7%*RD+0.
0002%20kHz~50kHz:U=4%*RD+0.
0003%50kHz~200kHz:U=8%*RD+0.
0003%0.
3%~100%10Hz~20Hz:U=2%*RD+0.
0003%20Hz~20kHz:U=1%*RD+0.
0002%20kHz~50kHz:U=2%*RD+0.
0003%50kHz~200kHz:U=4%*RD+0.
0003%305静电放电发生器峰值电流0421GB/T17626.
2-2006电磁兼容试验和测量技术静电放电抗扰度试验0~112.
5A(由0~30kV转换所得)Urel=6%上升时间0.
1ns~100sUrel=8%306快速瞬变脉冲群发生器峰值电压0421GB/T17626.
4-2008电磁兼容试验和测量技术电快速瞬变脉冲群抗扰度试验(0~8)kVUrel=5%上升时间0.
5ns~100sUrel=7%持续时间0.
5ns~100sUrel=5%重复频率0.
5ns~100sUrel=4%脉冲群周期0.
5ns~100sUrel=4%脉冲群持续时间0.
5ns~100sUrel=4%307浪涌信号发生器开路电压0421GB/T17626.
5-2008电磁兼容试验和测量技术浪涌(冲击)抗扰度试验(0~40)kVUrel=5%上升时间0.
5ns~100sUrel=5%持续时间0.
5ns~100sUrel=4%短路电流(0~20)kAUrel=5%308谐波测量仪谐波电压0413GB/T17626.
7-2008供电系统及所连设备谐波、谐间波的测量和测量仪器导则(0~504)V/(2~100次)Urel=0.
35%谐波电流0413(0~24)A/(2~100次)Urel=0.
5%309电压跌落模拟器输出电压0421GB/T17626.
11-2008电磁兼容试验和测量技术电压暂降、短时中断和电压变化的抗扰度试验(0~2.
5)kVUrel=3%突变电压上升时间0.
5ns~100sUrel=4%突变电压下降时间0.
5ns~100sUrel=4%电压跌落时间0.
5ns~100sUrel=4%310振铃波发生器(阻尼振荡波发生器)开路电压0421GB/T17626.
12-1998电磁兼容试验和测量技术振荡波抗扰度试验(0~40)kVUrel=5%衰减(0~40)kVUrel=5%振荡频率0.
5ns~100sUrel=4%上升时间0.
5ns~100sUrel=5%短路电流(0~20)kAUrel=5%311工频磁场抗扰度试验感应线圈磁场强度0424GB/T17626.
8-2006电磁兼容试验和测量技术工频磁场抗扰度试验1A/m、3A/m、10A/m、30A/m、100A/m、300A/m、1000A/mUrel=0.
8dB感应线圈因数0.
1~1000Urel=1dB312功率放大器最大输出功率0419JJG(电子)09008-1989FW3型微波功率放大器检定规程1W≤P≤100W9kHz~1000MHz:Urel=0.
25dB1W≤P≤25W1GHz~18GHz:Urel=0.
25dB功率增益0419≥20dBUrel=0.
25dB313人工电源网络阻抗0419GB/T6113.
102-2008CISPR16-1-2:2006无线电骚扰和抗扰度测量设备和测量方法规范第1-1部分:无线电骚扰和抗扰度测量设备辅助设备传导骚扰10Hz~300MHzUrel=3.
6%电压分压系数041910Hz~300MHz(-100~20)dBmU=0.
06dB314高频电感电容测量仪电感0406JJG197-1979LCCG-1型高频电感电容测量仪检定规程1μH~100mHUrel=0.
6%电容(100-2000)pFUrel=0.
6%315抖晃仪抖晃0419JJG47—1990抖晃仪(0~3.
999)%Urel=0.
2%316误码测试仪内时钟速率0419JJF1237-2010SDH/PDH传输分析仪校准规范2Mbit/sUrel=2*10-8输出波形幅度0.
1V~3VUrel=2.
5%317数字移动通信综合测试仪频率0419JJF1131-2005TDMA(GSM)数字移动通信综合测试仪校准规范10MHz~3GHz接收:Urel=1*10-7发送:Urel=1.
2*10-7电平(-127~15)dBmUrel=0.
30dB谐波、次谐波、非谐波(-127~30)dBmUrel=1dB相位噪声(-127~30)dBmUrel=1dB数字调制800MHz~3GHz峰值相位误差:U=1°有效值相位误差:U=0.
3°电平平坦度:U=0.
10dBRho:U=0.
0008频率误差:U=1HzEVM:U=0.
5%317数字移动通信综合测试仪功率分析仪0419JJF1131-2005TDMA(GSM)数字移动通信综合测试仪校准规范(-120~30)dBm800MHz~3GHz:Urel=0.
30dB数字调制分析800MHz~3GHz峰值相位误差:U=1°有效值相位误差:U=0.
3°电平平坦度:U=0.
10dBRho:U=0.
0008频率误差:U=1HzEVM:U=0.
5%邻道泄漏功率测量(-120~10)dBm250kHz~3GHz:Urel=0.
5dB占用带宽(-120~10)dBm250kHz~3GHz:Urel=0.
5dB音频频率50Hz~5kHzU=0.
001Hz音频电平(50~5000)mVUrel=0.
5%音频失真(0~100)%(50Hz~200kHz、50mV~5000mV)Urel=1dB音频频率测量50Hz~5kHzU=0.
006Hz音频电平分析仪(5~5000)mVUrel=0.
6%音频失真分析仪0.
1%~50%(5~5000)mVUrel=1dB射频输入和输出端口电压驻波比1.
01~5(100MHz~3GHz)Urel=1dB318矢量信号分析仪参考输出频率0419JJF1128-2004矢量信号分析仪校准规范10MHz~8GHzUrel=1*10-7频率测量041910MHz~8GHzUrel=1*10-7载波幅度测量0419(-127~15)dBmUrel=0.
30dB载波幅度测量线性0419(-100~10)dBmUrel=0.
15dB双通道测量不一致性0419(-100~10)dBmUrel=0.
4dB矢量分析误差0419800MHz~8GHzEVM:U=0.
5%(rms)频率误差:U=1Hz峰值相位误差:U=1°有效值相位误差:U=0.
3°三阶互调失真0419(-50~10)dBm(800MHz~3GHz)Urel=1dB输入通道谐波0419(-50~10)dBm250kHz~8GHzUrel=1dB输入通道内部噪声0419250kHz~8GHzUrel=1dB电压驻波比04191.
01~5800MHz~8GHzUrel=1dB319电话分析仪DTMF频率0419JJG(YD)032-1995双音多频电话机测试仪检定规程100Hz~2kHzUrel=0.
1%DTMF电平-50dBm~10dBmUrel=0.
3dB320蓝牙测试仪输出频率0419JJF1128-2004矢量信号分析仪校准规范JJF1131-2005TDMA-GSM数字移动通信综合测试仪校准规范JJF1128-2004矢量信号分析仪校准规范JJF1131-2005TDMA-GSM数字移动通信综合测试仪校准规范0.
01Hz~3GHzUrel=5*10-8输出电平(-127~30)dBmUrel=0.
3dB输出信号频率响应-60dBm~20dBmUrel=0.
3dB输出信号二、三次谐波(-127~30)dBmUrel=1dB输出信号单边带相位噪声(-127~30)dBmUrel=1dB调制频偏10MHz~26.
5GHz(10~-80)dBm:U=0.
5kHz调制10MHz~26.
5GHz(10~-80)dBmEVM(RMS):U=1.
5%频率测量(-127~30)dBmUrel=5*10-8电平测量(-127~30)dBmUrel=0.
3dB输入频率响应(-127~30)dBmUrel=0.
3dB回波损耗0~35dBUrel=1dB321无线局域网测试仪输出频率0419JJF1128-2004矢量信号分析仪校准规范JJF1131-2005TDMA-GSM数字移动通信综合测试仪校准规范0.
01Hz~13GHzUrel=5*10-8输出电平(-127~30)dBmUrel=0.
3dB输出信号二、三次谐波(-127~30)dBmUrel=1dB输出信号单边带相位噪声(-127~30)dBmUrel=1dB调制10MHz~26.
5GHz/(10dBm~-80dBm)EVM(RMS):U=2%电平测量(-127~30)dBmUrel=0.
3dB矢量信号分析误差(-127~30)dBmEVM(RMS:)U=2%回波损耗40MHz~18GHzUrel=1dB322铷原子频率标准频率0412JJG292-2009铷原子频率标准检定规程0.
1MHz1MHz5MHz10MHz100MHzUrel=5*10-13323电话计时计费装置时间0412JJG107-2002单机型和集中管理分散计费型电话计时计费器检定规程(0.
01~3600)sU=0.
1s324电话计时计费装置检定装置时间0412JJG983-2003单机型和集中管理分散型电话计费器检定仪检定规程1MHz5MHz(0.
01~3600)sUrel=5.
8*10-10325IC卡公用电话计时计费装置时间0412JJG977-2003IC卡公用电话计时计费装置检定规程(0.
01~3600)sU=(0.
01+5T*10-5)s326指针式时间间隔测量仪时间0412JJG237-1995指针式时间间隔测量仪检定规程(1~3600)sUrel=3*10-7327数字式时间间隔测量仪频率0412JJG238-1995数字式时间间隔测量仪检定规程1MHz、5MHzUrel=5.
8*10-10时间(0~18000)sUrel=3*10-7328校表仪频率0412JJG488-2008校表仪检定规程(0.
00~9.
99)s/d;(0.
0~99.
9)s/d;(0~999)s/dUrel=5.
8*10-10329石英晶体振荡器/通用计数器频率0412JJG180-2002电子测量仪器内石英晶体振荡器检定规程JJG349-2001通用计数器检定规程1MHz5MHz10MHz(0~1)GHzUrel=5.
8*10-10330数字传输分析仪输出波形幅度0419JJF1237-2010SDH/PDH传输分析仪校准规范(0.
1~3)V(2Mbit/s~155Mbit/s)Urel=2.
5%不能测:2Mbit/s120Ω接口输入口回波损耗(电口)(0~45)dB(2Mbit/s~155Mbit/s)Urel=1dB内时钟速率2Mbit/s~2.
5Gbit/sUrel=2*10-8输入口回波损耗(光口)(0~45)dB(155Mbit/s~2.
5Gbit/s)Urel=2dB平均发送光功率(-40~10)dBm1310nm/1550nmUrel=0.
2dB接收机灵敏度(-45~-20)dBmUrel=0.
5dB眼图155Mbit/s~2.
5Gbit/sUrel=0.
15dB消光比0~30dBU=0.
5dB抖动发生/测量抖动幅度0~20UIp-pU=0.
5%(电口)U=0.
6%(光口)331通信用光功率计光功率0430JJG965-2001通信用光功率计检定规程JJG(YD)033-1995微小光功率计检定规程(600~1600)nm;(-70~10)dBmUrel=0.
17dB332通信用光衰减器光衰减器0430JJF1199-2008通信用光衰减器校准规范(1310±20)nm;(1550±20)nm;(0~60)dBUrel=0.
05dB/10dB333光传输用稳定光源输出功率0430JJG958-2000光传输用稳定光源检定规程(-70~10)dBm850nm/1310nm/1550nmUrel=0.
17dB输出功率稳定度0430Urel=0.
005dB光谱特性(光波长)0430Urel=2.
5*10-5334通信用光谱分析仪光波长0430JJG1035-2008通信用光谱分析仪检定规程(600~1750)nmU=0.
05nm光功率0430(-60~10)dBm600nm~1750nm:Urel=0.
20dB分辨率带宽04300.
05nm~1nmU=0.
05nm335光回波损耗(后向反射)测试仪光功率测量0419JJG965-2001通信用光功率计检定规程JJG958-2000光传输用稳定光源检定规程(-70~10)dBmUrel=0.
17dB输出功率(-70~10)dBmUrel=0.
17dB输出功率稳定度(-70~10)dBmUrel=0.
17dB光谱特性(600~1750)nmUrel=2.
5*10-5(光波长)光回波损耗(后向反射)(0~65)dBUrel=0.
6dB336激光能量计灵敏度1621JJG312-1983激光能量检定规程A/J,V/J,读数/JUrel=4%(0.
19~20)μm;0.
1mJ~0.
01J;Urel=5.
2%激光能量(10-2~20)JUrel=4%(20~300)JUrel=5.
2%337白度计白度1613JJG512-2002白度计检定规程0~100U=1.
7(U(R457))338反射率仪反射率1613JJF1232-2009反射率测定仪校准规范ρ:(0~100)%U=1.
7(U(Y))339罗维朋比色计罗维朋色度1613JJG758-1991罗维朋比色计检定规程(0.
1~79.
9)罗维朋单位U=0.
6罗维朋单位340测色色差计表面色x,y,Y1613JJG595-2002测色色差计检定规程Y:0~100x,y:任意U(Y)=1.
7U(x),U(y)=0.
0045341通信用光波长计光波长0430JJG963-2001通信用光波长计检定规程633nm(1440~1640)nm633nm波段:Urel=1.
12*10-7(1440~1640)nmU=2.
9pm342光时域反射计(OTDR)距离0430JJG959-2001光时域反射计检定规程1310nm1550nm(1~3)kmU=0.
10m(1310nm)U=0.
09m(1550nm)损耗1310nm1550nm(0.
5~1)dBUrel=0.
019dB/dB(1310nm)Urel=0.
033dB/dB(1550nm)343标准色板表面色x,y,Y1613JJG453-2002标准色板检定规程Y:0~100x,y:任意U(Y)=1.
8U(x),U(y)=0.
0046344辐射热计辐射量修正系数1621JCJ/F431005.
1/0-2006辐射热计校准规范(0.
002~3.
6)kW/m2Urel=1.
6%345透光率/雾度仪透过率1613JCJ/F431004.
1/0-2006透光率/雾度仪校准规范(0~100.
0)%U=1.
1%雾度(0~30)%U=0.
31%346紫外辐照计(能量计)辐照度1606JJG879-2002紫外辐照计检定规程JCJ/F411001.
1/0-2006紫外辐射照度计(能量计)校准规范100J:Urel=2.
6%;≤100J:U=2.
6J478激光二极管驱动仪电流设定值0410JJG(航天)38-1987直流标准电流源检定规程(0~3)AUrel=0.
07%电流限定值(0~3)AUrel=0.
07%479光示波器光功率测量0430JJG965-2001通信用光功率计检定规程JJG262-1996模拟示波器检定规程(-40~5)dBm/(850nm,1310nm,1550nm)Urel=0.
17dB扫描时间1ns~1msUrel=0.
1%480黑白密度片密度值1613JJG452-2006黑白密度片检定规程D:0.
000~4.
000(0.
000~2.
000)U=0.
007;(2.
000~4.
000)U=0.
013481气相色谱-质谱联用仪灵敏度0236JJF1164-2006台式气相色谱-质谱联用仪校准规范10~5000Urel=7.
9%482酶标分析仪吸光度0236JJG861-2007酶标分析仪检定规程(0~2)AU=0.
012A483电解质分析仪浓度0236JJG1051-2009电解质分析仪检定规程K:(0~168.
3)mg/kgNa:(0~3151)mg/kgCl:(0~3520)mg/kgK:Urel=2.
3%Na:Urel=1.
8%Cl:Urel=1.
6%484通道式车辆放射性监测系统活度响应1620JJF1248-2010通道式车辆放射性监测系统校准规范9*10-4~9*10-2s-1·Bq-1Urel=5.
0%485行人/行李放射性监测装置活度响应1620JCJ/H001006.
1-2010行人/行李放射性监测装置校准规范8*10-4~8*10-2s-1·Bq-1Urel=4.
6%486X射线安全检查设备空气比释动能率1620JCJ/H001007.
1-2010X射线安全检查设备校准规范(0.
1~100)mGy/minUrel=5.
5%487全自动测阻(测温)电桥电阻比0411JJG506-1987直流比较仪式电桥JCE/F271002.
1/0-2010全自动测阻(测温)电桥校准方法补充文件0.
1Ω:0.
1Ω~100MΩ:100MΩU=5*10-8488高压静电电压表电压0411JJG494-2005高压静电电压表检定规程(0~30)kVAC:Urel=0.
34%DC:Urel=0.
26%489压陷式眼压计质量1320JJG574-2004压陷式眼压计检定规程(0~210)gU=0.
024g位移示值(0~25)mmU=0.
001mmCHINANATIONALACCREDITATIONSERVICEFORCONFORMITYASSESSMENTAPPENDIXOFACCREDITATIONCERTIFICATE(RegistrationNo.
CNASL0134)NAME:ShanghaiInstituteofMeasurementandTestingTechnology(NationalCenterofMeasruementandTestingforEastChina/NationalCenterofTestingTechnology,Shanghai)ADDRESS:No.
1500,ZhanghengRoad,Shanghai,ChinaDateofIssue:2009-08-21DateofExpiry:2012-08-20DateofUpdate:2011-02-10APPENDIX2-1SCOPEOFACCREDITEDCALIBRATION№InstrumentParameterCodeofFieldTitle,CodeofCalibrationMethodRangeUncertainty(CMC,k=2)LimitationNote1GaugeBlocksLength1308V.
R.
ofGaugeBlocksJJG146-2003(0.
5~100)mmU=(0.
03+0.
2L)μm(L:m)GradeⅡSteel(0.
5~1000)mm(0.
5~100)mm:U=(0.
04+0.
5L)μm(L:m)GradeⅢSteel(100~1000)mm:U=(0.
1+0.
6L)μm(L:m)(0.
5~1000)mm(0.
5~100)mm:U=(0.
06+0.
6L)μm(L:m)GradeⅣSteel(100~1000)mm:U=(0.
2+0.
8L)μm(L:m)(0.
5~1000)mm(0.
5~100)mm:U=(0.
1+3L)μm(L:m)GradeⅤSteel(100~1000)mm:U=(0.
5+2L)μm(L:m)2AngularPolygonAngle1308V.
R.
ofAngularPolygonJJG283-20070°~360°U=0.
01″GradeⅡU=0.
18″GradeⅢU=0.
34″GradeⅣ3GoniometersAngle1308V.
R.
ofGoniometersJJG97-20010°~360°U=1″4PreciseAngleDividingTableAngle1308V.
R.
ofPreciseAngleDividingTableJJG472-20070°~360°U=0.
04″5OpticalDigitalDividingHeadAngle1308V.
R.
ofOpticalDigitalDividingHeadJJG57-19990°~360°U=0.
5″6AngleGradeAngle1308V.
R.
ofAngleGradeJJG70-20040°~360°U=1.
0″Class0U=1.
4″Class1U=2.
4″Class27OpticalClinometerAngle1308C.
S.
forOpticalClinometerJJF1083-20020°~360°U=6″8AutocollimatorAngle1309V.
R.
ofAutocollimatorJJG202-20070'~10'Photoelectric:U=0.
1″typeSighttype:U=0.
2″9OpticalFlatsPlaneness1303V.
R.
ofOpticalFlatsJJG28-2000OpticalFlat:φ150mmU=0.
010μmGrade1U=0.
020μmGrade2PlaneOpticalflat:Φ(30-60)mmU=0.
01(mGrade1Φ(80-150)mmU=0.
02(mGrade1PlaneOpticalFlat:Φ(30-150)mmU=0.
03(mGrade2PlaneOpticalBar:210mmU=0.
01μmPlaneOpticalBar:310mmU=0.
03μmParallelismglass:(0~100)mmU=0.
03μmParallelismParallelismglass:(0~100)mmU=0.
2μm10MillingStraightEdgesPlaneness1303V.
R.
ofMillingStraightEdgeJJG740-2005≤500mmU=0.
03μm11RoughnessComparsionSpecimens(Gauge)Roughness1308C.
S.
ofRoughnessComparsionSpecimensJJF1099-2003Ra:(0.
01~25)μmUrel=3%~5%12ContactInstrumentsofSurfaceRoughnessMeasurementbytheProfileMethodRoughness1305C.
S.
forContactInstrumentsofSurfaceRoughnessMeasurementbytheProfileMethodJJF1105-2003Ra:(0.
01~4.
0)μmUrel=5%13InterferenceMicroscopesLength1309V.
R.
ofInterferenceMicroscopesJJG77-2006H:(0.
1~1.
0)mmUrel=10%14Light-SectionMicroscopesLength1309C.
S.
forLight-SectionMicroscopesJJF1092-2002H:(0.
8~80)μmUrel=10%15MetalLineLength1308V.
R.
ofHigh-precisionLineScaleJJG73-2005(0~1000)mmU=(0.
07+0.
3L)μm;L—Measuredthelength,m.
GradeⅠU=(0.
14+0.
6L)μm;L—Measuredthelength,m.
GradeⅡ16GlassLineLength1308V.
R.
ofHigh-precisionLineScaleJJG73-2005(0~200)mmU=(0.
07+0.
4L)μm;L—Measuredthelength,m.
GradeⅠ(0~200)mmU=(0.
14+1.
0L)μm;L—Measuredthelength,m.
GradeⅡ17LinearComparatorLength1308V.
R.
ofLinearComparatorJJG72-1980(0~250)mmU=0.
9μm18UniversalComparator200Length1308V.
R.
ofUniversalComparator200JJG523-1988(0~200)mmU=0.
3μm19OpticalComparatorsforAngleMeasurementAngle1308C.
S.
forOpticalComparatorsforAngleMeasurementJJF1078-2002(0~60)′U=10′20ConcentricityTesterLength1309C.
S.
forConcentricityTesterJJF1109-2003(0~1000)mmU=2.
0μm21Toolmaker'sMicroscopeLength1309V.
R.
ofToolmaker'sMicroscopeJJG56-2000(0~200)mmU=0.
8μm22MeasuringMicroscopeLength1303V.
R.
ofReadingMicroscopeandMeasuringMicroscopeJJG571-2004(0~8)mmU=1.
5μm23MicroscopeforReadingLength1303V.
R.
ofReadingMicroscopeandMeasuringMicroscopeJJG571-2004(0~8)mmU=1.
5μm24OptimetersLength1309V.
R.
ofOptimetersJJG45-1999(-100~100)μm(0~200)mmU=0.
12μm25ContactTypeInterferometerLength1309V.
R.
ofContactTypeInterferometerJJG101-2004(-10~10)μmU=0.
01μm26VerticalLaserMetroscopeLength1309V.
R.
ofVerticalLaserMetroscopeJJG764-1992(0~100)mmU=0.
3μm27KosterInterferenceComparatorLength1309V.
R.
ofKosterInterferenceComparatorJJG770-1992(0~125)mmU=0.
04μm28LaserBlockInterferometersLength1309V.
R.
ofGaugeBlockInterferometersJJG371-2005(0~100)mmU=0.
3μm29DigitalDisplayHeightMeasuringInstrumentLength1303V.
R.
ofDigitalDisplayHeightMeasuringInstrumentJJG929-1998(0~1)mU=2.
2μm30HorizontalMicroscopeLength1309V.
R.
ofHorizontalMicroscopeJJF1189-2008(0~100)mmU=0.
3μm(101~300)mmU=0.
6μm(301~500)mmU=1.
0μm31LengthMeasuringMachineLength1309C.
S.
ofLengthMeasuringMachineJJF1066-2000(0~1000)mmU=3.
5μm(1001~2000)mmU=4.
5μm(2001~3000)mmU=6.
0μm32ProjectorLength1309C.
S.
ofProjectorJJF1093-2002(0~1000)mmU=(1.
2+2L)μm(L:m)33MeasurementInstrumentofRoundnessRoundness1309V.
R.
ofMeasuremenInstrumentofRoundnessJJG429-2000≤Φ200mmUrel=2%34PrecisionBoreDiameterMeasuringInstrumentLength1309V.
R.
ofPrecisionBoreDiameterMeasuringInstrumentJJG467-1986Φ(1~50)mmU=0.
4μm35PneumaticMeasuringInstrumentForMicrometers(Point)长度1309V.
R.
ofPneumaticMeasuringInstrumentForMicrometerJJG356-2004V.
R.
ofPointPneumaticMeasuringInstrumentsJJG466-1993≤100mmU=0.
3μm36OpticalTheodoliteAngle1309V.
R.
ofOpticalTheodoliteJJG414-2003Horizontaldirection:0°~360°U=0.
2″Angle:±30°U=0.
4″37LevelAngle1309V.
R.
ofLevelJJG425-2003(2~∞)m±20"U=1.
5″38ElectronictacheometersTotalStationElectronictacheometersElectro-opticalDistanceMeterLength1309V.
R.
ofElectronicTachometerTotalStationJJG100-2003V.
R.
ofElectro-magneticDistanceMeterJJG703-2003(0~1.
5)kmU=(1+1D)mm;D—Measuredthelength,km.
RentBaselineAngle(0~360)U=0.
5″39CoordinateMeasuringMachineLength1309C.
S.
ofCoordinateMeasuringMachineJJF1064-2004100mm~50m≤1m:U=(0.
1+1L)μm(L:m)>1m:U=1.
5μm40EddyCurrentMeasuingInstrumentforCoatingThicknessLength1303V.
R.
ofMegneticandEddyCurrentMeasuingInstrumentforCoatingThicknessJJG818-2005(0~500)μmU=1.
1μm(500~1250)μmU=2.
2μm41MagneticResistanceThicknessGaugeLength1303V.
R.
ofMegneticandEddyCurrentMeasuingInstrumentforCoatingThicknessJJG818-2005(0~500)μmU=1.
1μm(500~1250)μmU=2.
2μm42X-RayThicknessGuageLength1303V.
R.
ofX-RayThicknessGuageJJG480-2007(0.
1~20)mmU=4.
0(m43ThicknessDialGaugeLength1303V.
R.
ofDialGaugeJJG34-2008V.
R.
ofWideRangeDialGaugeReadingJJG379-1995(0~50)mmdivisionvalue0.
001mmU=2μm(0~50)mmdivisionvalue0.
01mmU=0.
01mm44γ-RayThicknessGaugeLength1303V.
R.
ofγ-RayThicknessGaugeJJG935-1998(0~30)mmU=(0.
06~1.
00)mm45UltrasonicThicknessGaugeLength1303C.
S.
forUltrasonicThicknessInstrumentJJF1126-2004(0~50)mmdivisionvalue0.
01mmU=0.
04mm(0~50)mmdivisionvalue0.
1mmU=0.
1mm46Hand-heldLaserDistanceMeterLength1309V.
R.
ofHand-heldLaserDistanceMeterJJG966-2001(0~100)mU=1mm47UltrasonicLength1309V.
R.
ofUltrasonicRangerJJG928-1998(0~100)mU=18mm48Four-wheelalignmentNeedtobenewitemevaluationAngle1309C.
S.
forFour-wheelalignmenterJJF1154-2006±10°U=0.
02°ExceptforCamberbiff49BaselineandBasenetLength1309C.
S.
forBaselineandBasenetJJF1214-2008(0~100)mU=0.
6mm50ExtensometerLength1323V.
R.
ofExtensometersJJG762-2007(0~20)mm≤0.
3mm:U=3.
2μm>0.
3mm:Urel=0.
88%51CalibratorofExtensometersLength334C.
S.
forCalibratorofExtensometersJJF1096-2002(1~25)mmU=1.
5μm52CylindricalMeasuringPinLength1301C.
S.
forCylindricalMeasuringPinJJF1207-2008φ(0.
1~25)mmU=(0.
3~0.
5)μm53FeelerGaugeLength1303V.
R.
ofFeelerGaugeJJG62-2007(0.
02~3.
00)mmU=(2~3)μm54SmoothLimitGaugeLength1301V.
R.
ofSmoothLimitGaugeJJG343-1996(0~320)mmU=(0.
5~1.
0)μm55MetallicScale(GradeⅢ)Length1308V.
R.
ofMetallicScale(GradeⅢ)JJG71-2005φ(0~1000)mmU=12μm56SteelRuleLength1303V.
R.
ofRuleJJG1-1999(0~1000)mmU=0.
1mm57SteelTapeLength1303V.
R.
ofSteelTapeJJG4-1999(0~200)mⅠ级:U=(0.
1+0.
002L)mmL:mⅡ级:U=(0.
2+0.
002L)mmL:m58ClothTapeLength1303V.
R.
ofFiberTapesAndMeasuringRopesJJG5-2001(0~50)mU=(0.
6+0.
002L)mmL:m59SteelTapeLength1303V.
R.
ofSteelTapeJJG741-2005(0~100)mU=(10~45)μm60CasingCouplingMeterLength1303V.
R.
ofCasingCouplingMeterJJG473-2009(0~3000)mmU=(0.
06(0.
24)mm61TesterforDialIndicatorGaugeLength1303V.
R.
ofTesterforDialIndicatorGaugeJJG201-2008TesterForDialGauge:(0~25)mmU=1.
1μmTesterforDialGauge:(0~5)mmU=0.
2μmGratingTesterForDialGauges:(0~50)mmU=1.
1μm62ElectronicComparatorLength1309V.
R.
ofElectronicComparatorJJG396-2002(-1999~+1999)μm31800.
1μm:U=0.
1μm0.
5μm:U=0.
3μm63CurrentCalipersLength1303V.
R.
ofCurrentCalipersJJG30-2002VernierCaliper:(0~1000)mmU=0.
01mmDialCaliper:(0~300)mmU=0.
01mmDigitalDisplayCaliper:(0~1000)mmU=0.
01mmVernierDepthGauge:(0~500)mmU=0.
01mm64HeightCaliperLength1303V.
R.
ofHeightCaliperJJG31-1999(0~1000)mmU=0.
01mm65MicrometersLength1303V.
R.
ofMicrometerJJG21-2008C.
S.
forMicrometerswithMeasuringRangefrom(500~3000)mmJJF1088-2002(0~3000)mmU=(1~4)μm66InternalMicrometerLength1309V.
R.
ofInternalMicrometerJJG22-2003(50~3000)mmU=(1~15)μm67MicrometersforMeasuringInsideDimensionLength1309C.
S.
forMicrometersforMeasuringInsideDimensionJJF1091-2002InternalMicrometer:(5~100)mmU=2μmBoreDiameterMeasuringMicrometer:(6~200)mmU=(1~3)μm68DepthMicrometerLength1309V.
R.
ofDepthMicrometerJJG24-2003(0~150)mmU=(1~2)μm69MicrometerswithDialComparatorandIndicatingSnapGaugeLength1309V.
R.
ofMicrometerswithDialComparatorandIndicatingSnapGaugeJJG26-2001IndicatingMicrometer:(0~200)mmU=(1.
3~2)μmIndicatingSnapGauge:(0~1)mmU=0.
5μm70MicrometerswithGaugeScaleDivisionof0.
001mmLength1309V.
R.
ofMicrometerswithGaugeJJG427-2004(0~100)mmU=1.
4μm71DialGaugeLength1303V.
R.
ofDialGaugeJJG34-2008DialGauge(0.
01mm)::(0~10)mmU=2μmDialGauge(0.
001mm):(0~5)mmU=2.
0μm72DialTestIndicatorLength1303V.
R.
ofDialTestIndicatorJJG35-2006DialTestIndicator(0.
01mm):(0~2)mmU=2μmDialTestIndicator(0.
001mm):(0~0.
5)mmU=1.
0μm73BoreDialIndicatorsLength1303C.
S.
ofBoreDialIndicatorsJJF1102-2003BoreDialIndicator(0.
01mm):(2~450)mmU=3μmBoreDialIndicator(0.
01mm):(10~400)mmU=2.
0μm74DepthGaugeReadingin0.
01mmLength1303V.
R.
ofDepthGaugeJJG830-2007(0~10)mmU=2μm75CylindricalScrewThreadGaugeLength1301V.
R.
ofPitchDiameterofCylindricalScrewThreadGaugeJJG888-1995SpiralRingGauge:(M4~M300)U=3.
0μmSpiralPlugGauge:(M1~M300)U=2.
0μm76CapacitanceComparatorLength1309V.
R.
ofCapacitanceComparatorJJG570-2006±300μmU=(0.
3~3)μm77FinenessofGrindGaugeLength1303V.
R.
ofFinenessofGrindGaugeJJG905-2006(15~500)μmU=(0.
5~2)μm78WideRangeDaugesLength1303V.
R.
ofWideRangeGaugesReadingin0.
01mmJJG379-1995(0~100)mmDial:U=7μmDigital:U=0.
01mm79RadiusGaugeLength1301V.
R.
ofRadiusGaugeJJG58-1996R(1.
0~25.
0)mmU=(7(9)μm80ScrewThreadGaugeLength1301V.
R.
ofScrewThreadGaugeJJG60-1996P(0.
4~6.
0)mmU=(4(6)μm81Wedge-feedCalibratorforMicrometersLength1309V.
R.
ofWedge-feedCalibratorforMicrometersJJG525-20022000μm1μm:U=0.
2μm400μm0.
2μm:U=0.
1μm200μmU=0.
02μm82ComparatorsofMachineTypeLength1303V.
R.
ofComparatorsofMachineTypeJJG39-2004±100μmU=0.
5μm83Micro-KatorLength1303V.
R.
ofMicro-KatorJJG118-1996±100μmU=0.
3μm84WoodenRule(WoodenFoldedRule)Length1303V.
R.
ofWoodenRule(WoodenFoldedRule)JJG2-1999(0~1000)mmU=0.
1mm85CommonNormalMicrometerLength1309V.
R.
oftheclassofCommonNormalMicrometerJJG82-2010(0~200)mmU=(0.
9~2.
0)μm86TrackGageforGaugeRailwayLength1303V.
R.
ofTrackGageforGaugeRailwayJJG219-2008TrackGage:(1338~1470)mmU=0.
09mmSuperelevation:(0~150)mmU=0.
08mm87RailwaySwitchOffsetRuleLength1303V.
R.
ofRailwaySwitchOffsetRuleJJG(railroad)186-2005(100~1290)mmU=0.
08mm88FlatPlatePlaneness1303V.
R.
ofFlatPlateJJG117-2005(100~5000)mmU=(0.
5~7.
0)μm89StraightEdgePlaneness1303C.
S.
forStraightEdgeJJF1097-2003≤3000mmU=(0.
1~1.
3)μm90StraightEdgeStraightness1303V.
R.
ofStraightEdgeJJG63-2007(75~500)mmU=(0.
3~1.
3)μm91ElectronicLevelAngle1309V.
R.
ofElectronicLevelsandCoincidenceLevelsJJG103-2005(0~40)'U=2μm/m92CoincidenceLevelAngle1309V.
R.
ofElectronicLevelandCoincidenceLevelJJG103-2005(0~40)'U=0.
6μm/m93FrameLevelandShaftLevelAngle1309C.
S.
ofFrameLevelandShaftLevelJJF1084-2002(0~40)'Urel=4%94SquareAngle1303V.
R.
ofSquaresJJG7-2004(70*200~160*1000)mmU=0.
8μm(40*63~630*1000)mmU=(0.
1+10L)μmL:mm(40*63~125*200)mmU=1μm(150~500)mmU=0.
1mm95UniversalBevelProtractorsAngle1308V.
R.
ofUniversalBevelProtractorsJJG33-2002(0~360)Graduatorvalue2′:U=1′Graduatorvalue5′:U=3′96SineBarsAngle1308V.
R.
ofSineBarsJJG37-2005(100~200)mmU=1.
4″97BoxPlateAngle1303V.
R.
ofBoxPlateJJG194-2007(100~500)mmU=2μm98SquareTesterAngle1303C.
S.
forSquareTesterJJF1140-2006(0~500)mmU=0.
8μm99CalibratorforLevelAngle1303V.
R.
ofCalibratorforLevelJJG191-2002(0~1.
5)mm/mU=1.
8%100CallipersforWeldingInspectionLength1303V.
R.
ofCallipersforWeldingInspectionJJG704-2005(0~60)mmU=0.
03mmAngle1303(0~90)U=8′101WeightsMass1310V.
R.
ofWeightsJJG99-20061g~20kg(E2)20kg:8mg10kg:5mg5kg:2.
2mg2kg:0.
6mg1kg:0.
4mg500g:0.
1mg200g:0.
04mg100g:0.
02mg50g:0.
02mg20g:0.
018m10g:0.
016m5g:0.
010mg2g:0.
010mg1g:0.
006mg(1~500)g(E2)500g:0.
1mg200g:0.
04mg100g:0.
02mg50g:0.
02mg20g:0.
018mg10g:0.
016mg5g:0.
010mg2g:0.
010mg1g:0.
006mg(1~500)mg(E2)500mg:0.
0034mg200mg:0.
0024mg100mg:0.
0016mg50mg:0.
001mg20mg:0.
0016mg10mg:0.
0012mg5mg:0.
0016mg2mg:0.
0028mg1mg:0.
0020mg102DynamometeForce0333V.
R.
ofDynamometersJJG144-2007(10~6000)NUrel=0.
10%(5~100)kNUrel=0.
10%(10~2000)kNUrel=0.
10%103DynamometerforMeasuringInstrumentForce0333C.
S.
forWorkingForceMeasuringMachinesforSpecialPurposesJJF1134-2005(0~20)NUrel=0.
26%104WorkingDynamometerForce0333V.
R.
ofWorkingDynamometersJJG455-2000(0~2)MNUrel=0.
15%105MeasuringVibrationInstrumentAcceleration1407V.
RofWorkingMeasuringVibrationInstrumentJJG676-2000(10~300)m/s2Urel=3.
0%Velocity(10~300)mm/sUrel=3.
0%Displacement(0.
01~16)mmUrel=3.
0%106AccelerometerAcceleration1407PiezoelectricAccelerometerJJG233-2008(10~300)m/s2Urel=1.
0%(20Hz-1000Hz)Urel=2.
0%(1000Hz-2000Hz)107VelocityTransducerVelocity1407V.
R.
OfMangnetolelectricTypeVelocityTransducerJJG134-2003(10~300)mm/sUrel=3.
0%108VibrationDisplacementTransducerDisplace-ment1407V.
R.
ofVibrationDisplacementTransducerJJG644-2003(0.
01~16)mmUrel=3.
0%109DigitalElectrodynamicVibrationTestingSystem(ElectrodynamicVibrationGenerator)Acceleration1407V.
R.
ofDigitalElectrodynamicVibrationTestingSystemJJG948-1999V.
R.
ofElectrodynamicVibrationGeneratorforTestingJJG190-1997Acceleration:(10~1000)m/s2frequency:(5~1000)HzUrel=3.
5%110MechanicalVibrationGeneratorAccelera-tion1407V.
R.
ofMechanicalVibrationGeneratorforTestingJJG189-1997Acceleration:(10~1000)m/s2(5Hz~150Hz)Urel=3.
5%111HydraulicVibrationGeneratorAccelera-tion1407V.
R.
ofHydraulicVibrationGeneratorJJG638-1990Acceleration:(10~100)m/s2(5Hz~60Hz)Urel=3.
5%112CalibrationVibrationGeneratorAccelera-tion1407V.
R.
ofVibratorWithMiddleFrequency(ComparisonMethod)JJG298-2005Acceleration(10~100)m/s2(5Hz~3000Hz)Urel=3.
0%113PowerMeasureMachinesTorque1325V.
R.
ofEquipmentofPowerMeasuringJJG653-2003(2~5000)NmUrel=0.
26%114TorsionmeterTorque1325V.
R.
ofTorsionmeterJJG557-1988(2~5000)NmUrel=0.
13%115CalibratingInstrumentforTorqueWrenchesTorque1325V.
R.
ofCalibratingInstrumentforTorqueWrenchesJJG797-1992(0.
1~5000)NmUrel=0.
42%116Tacho-torqueMeasuringDeviceSystemTorque1325V.
R.
ofTacho-torqueMeasuringDeviceSystemJJG924-1996(2~5000)NmUrel=0.
13%(500~6000)r/minUrel=0.
06%117WrenchforMeasurementofTorqueTorque1325V.
R.
ofWrenchforMeasurementofTorqueJJG707-2003(0.
1~5000)NmUrel=0.
56%118TorsionTestingMachinesTorque1325V.
R.
ofTorsionTestingMachinesJJG269-2006(2~5000)NmUrel=0.
42%119TorqueMeasuringDeviceerrorofindication1325V.
R.
ofStaticTorqueMeasuringDevicesJJG995-2005(2-5000)NmUrel=0.
13%120CalibratorofStrainAnalogueQuantity(DC)StrainAnalogue1309V.
R.
ofResistanceStrainGaugeIndicatorJJG623-2005(0~105)μεUrel=0.
05%121DynamicResistanceStrainMeterStrainAnalogue1309V.
R.
ofResistanceStrainGaugeIndicatorJJG623-2005(0~105)μεUrel=0.
12%122RockwellHardnessTestingMachineHardness0301V.
R.
ofMetallicRockwellHardnessTestersJJG112-2003(80~88)HRAU=0.
4HRA(85~95)HRBU=0.
6HRB(20~30)HRCU=0.
6HRC(35~55)HRCU=0.
5HRC(60~70)HRCU=0.
4HRC123BrinellHardnessTestingMachineHardness0301V.
R.
ofMetalBrinellHardnessTesterJJG150-2005225HBWUrel=1.
5%124VickersHardnessTestingMachineHardness0301V.
R.
ofMetallicVickersHardnessTesterJJG151-2006(700~800)HV5Urel=2.
5%(175~225)HV5Urel=2.
0%(400~600)HV10Urel=2.
0%(400~600)HV30Urel=1.
5%125SuperficialRockwellHardnessTestingMachineHardness0301V.
R.
ofMetallicRockwellHardnessTestersJJG112-2003(70~94)HR15NU=0.
8HR15N(42~86)HR30NU=0.
8HR30N(20~77)HR45NU=0.
8HR45N(67~93)HR15TU=1.
0HR15T(29~82)HR30TU=1.
0HR30T126Microhardo-meterHardness0301V.
R.
ofMetallicVickersHardnessTesterJJG151-2006(700~800)HV1Urel=2.
0%(700~800)HV.
0.
5Urel=3.
5%(700~800)HV.
0.
2Urel=4.
0%(400~600)HV0.
1Urel=4.
5%(175~225)HV0.
05Urel=5.
0%127RockwellHardnessTestBlockHardness0301V.
R.
ofMetallicRockwellHardnessReferenceBlocksJJG113-2003(80~88)HRAU=0.
2HRA(85~95)HRBU=0.
4HRB(20~30)HRCU=0.
4HRC(35~55)HRCU=0.
3HRC(60~70)HRCU=0.
2HRC128VickersMicrohardnessTestBlockHardness0301V.
R.
ofVickersHardnessReferenceBlockJJG148-2006(700~800)HV1Urel=1.
1%(700~800)HV.
0.
5Urel=1.
5%(700~800)HV.
0.
2Urel=2.
0%(400~600)HV0.
1Urel=2.
5%(175~225)HV0.
05Urel=3.
0%129LeebHardnessTestingMachineHardnessHL0301V.
R.
ofLeebHardnessTestingMachineJJG747-1999(750~830)HLU=8HL(510~670)HLU=6HL130MetallicWebsterHardnessTestingMachineHardnessHW0301V.
R.
ofMetallicWebsterHardnessTestingMachineJJG944-1999(5~18)HWU=0.
7HW131AtapeShoreHardnessTestingMachine(Durometer)Hardness0301V.
R.
ofAtapeShoreHardnessTestingMachineJJG304-2003(0~100)HAU=0.
3HA132DtapeShoreHardnessTestingMachine(Durometer)Hardness0301V.
R.
ofDtapeShoreHardnessTestingMachineJJG1039-2008(0~100)HDU=0.
6HD133UniversalMaterialTensionandCompressionTestingMachineForce1326V.
R.
ofUniversalTensionandCompressionTestingMachineJJG139-1999(0~5)MNUrel=0.
10%134ElectronicUniversalTestingMachineForce1326V.
R.
ofElectronicUniversalTestingMachineJJG475-2008(0~5)MNUrel=0.
10%135FlexureTestingMachineForce1326V.
R.
ofFlexureTestingMachineJJG476-2001(0~100)kNUrel=0.
10%136SpringTensionandCompressionTestingMachineForce1326C.
S.
forWorkingForceMeasuringMachinesforSpecialPurposesJJF1134-2005(0~100)kNUrel=0.
10%137UniversalTensionandCompressionTestingMachinesforNon-metallicForce1326V.
R.
ofUniversalTensionandCompressionTestingMachinesforNon-metallicJJG157-2008(0~5)MNUrel=0.
10%138High-TemperatureCreepandStress-RuptureTestingMachineForce1326V.
R.
ofHigh-TemperatureCreepandStress-RuptureTestingMachineJJG276-2009(0~5)MNUrel=0.
10%139HydraulicJackForce1326V.
R.
ofHydraulicJackJJG621-2005(0~5)MNUrel=0.
10%140PendulumImpactTestingMachinesEnergy0336V.
R.
ofPendulumImpactTestingMachinesJJG145-2007(0~500)JUrel=0.
10%141VolumetricGlassCapacity1312V.
R.
ofGeneralVolumetricGlassJJG196-2006V.
R.
ofCapacityMeasures(glass)JJG20-2001V.
R.
ofSpecialGlasswareJJG10-2005(1~10)mlU=0.
003ml(10~20)mlU=0.
008ml(20~100)mlU=0.
018ml(100~200)mlU=0.
04ml(200~500)mlU=0.
07ml(500~1000)mlU=0.
12ml(1000~2000)mlU=0.
18ml142TheMeasureforDrinkingCapacity1312V.
R.
oftheMeasureforDrinkingJJG558-2006(0.
02~5)LU=(3*10-4~4*10-2)L143GlassSyringesforMedicalUseCapacity1312V.
R.
ofSyringsforMedicalUseJJG18-1990(0~100)mlU=(2.
5*10-3~1)ml144LocomotivePipetteCapacity1312V.
R.
ofLocomotivePipetteJJG646-2006(1~10)μlU=0.
007μl(10~100)μlU=0.
03μl(100~1000)μlU=0.
07μl(1000~10000)μlU=3.
5μl145QuantitativeFillingMachineforLiquidstateMaterialCapacity1312V.
R.
ofQuantitativeFillingMachineforLiquidStateMaterialJJG687-2008(50~3000)mlU=(0.
8~2)ml146Raingauge/MeasuringCylinderCapacity1312V.
R.
ofRaingauge/MeasuringCylinderJJG524-1988(0~1000)mlU=(0.
01~0.
02)ml147MetalTankCapacity1312V.
R.
ofMetalTankJJG259-2005(1~2000)LUrel=2.
0*10-4(1~5000)L148VerticalMetalTankCapacity1312V.
R.
ofVerticalMetalTankVolumeJJG168-2005(20~100)m3Urel=3*10-3(100~700)m3Urel=2*10-3﹥700m3Urel=1*10-3149MetallicHorizontalTankCapacity1312V.
R.
ofMetallicHorizontalTankJJG266-1996(20~100)m3Urel=4*10-3150SphericalMetalTankCapacity1312V.
R.
ofSphericalMetalTankCapacityJJG642-2007(80~3000)m3Urel=3*10-3151A-gradealcoholmeterDensity1314GlassHydrometersJJG86-2001q:(0~100)%q:(0.
039~0.
043)%152B-gradealcoholmeterDensity1314GlassHydrometersJJG86-2001q:(0~100)%q:0.
08%153AlcoholmeterDensity1314WorkingGlassHydrometersJJG42-2001q:(0~100)%q:0.
2%154B-gradedensimeterDensity1314GlassHydrometersJJG86-2001(0.
65~2.
00)g/cm3U=(2.
3~2.
8)*10-4g/cm3155DensimeterDensity1314WorkingGlassHydrometersJJG42-2001(0.
65~2.
00)g/cm3U=0.
0010g/cm3156B-gradePetrohydrometerDensity1314GlassHydrometersJJG86-2001(0.
65~1.
01)g/cm3U=5*10-4g/cm3157PetrohydrometerDensity1314WorkingGlassHydrometersJJG42-2001(650~1100)kg/m3U=5*10-1kg/m3158SeawaterdensimeterDensity1314WorkingGlassHydrometersJJG42-20011.
000~1.
040relativedensityU=1*10-4159SaccharometerDensity1314WorkingGlassHydrometersJJG42-2001p:(0~80)%p:0.
1%160LiquidlevelmeasurementdevicesPosition0337V.
R.
ofLiquidlevelMeasurementDevicesJJG971-2002(0~700)mmU=2mm161Piston-TypePressureGaugepressure1321V.
R.
ofPiston-TypePressureGaugeJJG59-2007(0.
04~250)MPaClass0.
01,0.
02:Urel=0.
0042%Class0.
05:Urel=0.
015%162PistonTypePressure-VacuumGauge(class0.
02)pressure1321VerificationRegulationofPistonTypePressure-VacuumGaugeJJG236-2009(-0.
1~+0.
25)MPaUrel=0.
0042%163PistonTypePressure-VacuumGauge(class0.
05)pressure1321VerificationRegulationofPistonTypePressure-VacuumGaugeJJG236-2009(-0.
1~+0.
25)MPaUrel=0.
013%164DualPistonPressure-VacuumGaugepressure1321V.
R.
ofDualPistonPressure-VacuumGaugeJJG159-2008(-0.
1~1)MPaUrel=0.
0042%Urel=0.
015%165CompensatedMicro-manometerPressure1320V.
R.
ofCompensatedMicro-manometerJJG158-1994(-1500~+1500)PaU=0.
5PaGradeⅡ(-2500~-1500)PaU=0.
6Pa(+1500~+2500)PaU=0.
6Pa166TiltingTubeMicro-manometerPressure1320V.
R.
ofTiltingTubeMicro-manometerJJG172-1994(-2000~+2000)PaUrel=0.
13%Class0.
5andBelow167PressureTransmitterPressure0337V.
R.
ofPressureTransmittersJJG882-2004(-0.
1~+1500)MPaUrel=0.
015%Class0.
05andBelow168DigitalPressureGaugePressure1320V.
R.
ofDigitalPressureGaugeJJG875-2005(-0.
1~+100)MPaUrel=0.
005%Class0.
01andBelow169ElasticitySphygmomanometerPressure1320V.
R.
ofBourdonTubePrecisePressureGaugeandVacuumGaugeJJG49-1999(0~50)kPaUrel=0.
02%Class0.
16170PressuretransducerPressure1320V.
R.
ofPressureTransducer(Static)JJG860-1994(-0.
1~+1500)MPaUrel=0.
025%Class0.
1andBelow171DigitalElectronicsphygmomanometerPressure0337V.
R.
ofDigitalElectronicsphygmomanometer(Static)JJG692-1999(0~40)kPaU=0.
4kPa172BellowsgaugePressure0337V.
R.
ofBellowsgaugeJJG573-2003(0~400)kPaUrel=0.
4%Class1.
6andBelow173theRecordPressureGaugePressureVacuumGaugeandVacuumGaugeforGeneralUsePressure0337V.
R.
oftheRecordPressureGaugePressureVacuumGaugeVacuumandVacuumGaugeforGeneralUseJJG926-1997(-0.
1~250)MPaUrel=0.
05%Class0.
25andBelow174TyrePressuregaugePressure0337V.
R.
ofTyrePressuregaugeJJG927-1997(0~2500)kPaUrel=0.
4%Class1.
6andBelow175pressurecontrollerPressure0337V.
R.
ofPressureControllerJJG544-1997(-0.
1~60)MPaUrel=0.
1%Class0.
5andBelow176sphygmomanometerPressure0337V.
R.
ofSphygmomanometerJJG270-2008(0~40)kPaU=0.
5kPa177PressuregaugePressure1320V.
R.
ofBourdonTubePrecisePressureGaugeandVacuumGaugeJJG49-1999(-0.
1~+1500)MPaUrel=0.
1%Class0.
1andBelowBourdonTubePressureGauge、Pressure-VacuumGaugeandVacuumGaugeandVacuumGaugeforGeneralUseJJG52-1999(-0.
1~+1000)MPaUrel=0.
2%Class1andBelow178BuoyTypeOxygenInhalator,pressurereducerPressure0337V.
R.
ofBuoyTypeOxygenInhalerJJG913-1996(0~25)MPaUrel=0.
8%Flow(0~30)L/minUrel=1.
4%179IonizationVacuumgaugePressure1320V.
R.
ofSecondaryIonizationVacuumGaugesJJG462-2004(10-3~10-1)PaUrel=3.
2%MPE:±10%C.
S.
ofIonizationVacuumGaugeJJF1062-1999Urel=7%MPE:±50%180ThermalConductivityVacuumGaugePressure1320CalibrationSpecificationofWorkingThermalConductivityVacuumGaugeJJF1050-1996(10-1~105)PaUrel=12%MPE:±50%181FloatMetersFlowrate1316V.
R.
ofFloatMetersJJG257-2007(0.
016~45)m3/hUrel=0.
20%Class1andBelowgas182WetGasMetersFlowrate1316V.
R.
ofGasDisplacementMetersJJG633-2005(0.
016~45)m3/hUrel=0.
20%Class1andBelow183.
1MassFlowMetersFlowrate1316V.
R.
ofMassFlowMetersJJG897-1995(0.
016~45)m3/hUrel=0.
20%AccreditedonlyforGas183.
2CoriolisMassFlowMetersFlowrate1316V.
R.
ofCoriolisMassFlowMetersJJG1038-2008(0.
016~45)m3/hUrel=0.
20%AccreditedonlyforGas184DiaphragmGasMetersFlowrate1316V.
R.
ofDiaphragmGasMetersJJG577-2005(0.
016~45)m3/hUrel=0.
20%185.
1VelocityFlowMetersFlowrate1316V.
R.
ofVelocityFlowMetersJJG198-1994(0.
016~45)m3/hUrel=0.
20%AccreditedonlyforGas185.
2Vortex-sheddingFlowmetersFlowrate1316V.
R.
ofVortex-sheddingFlowmetersJJG1029-2007(0.
016~45)m3/hUrel=0.
20%AccreditedonlyforGas185.
3TurbineFlowmeterFlowrate1316V.
R.
ofTurbineFlowmeterJJG1037-2008(0.
016~45)m3/hUrel=0.
20%AccreditedonlyforGas185.
4UltrasonicFlowmetersFlowrate1316V.
R.
ofUltrasonicFlowmetersJJG1030-2007(0.
016~45)m3/hUrel=0.
20%AccreditedonlyforGas186FlowdisplayinginstrumentsFlowrate1316V.
R.
oftheFlowDisplayingInstrumentsJJG(沪)45-2000(0~99999)FlowengineeringunitUrel=0.
02%~0.
1%Class0.
5andBelowV.
R.
ofFlowdisplayinginstrumentsJJG1003-2005(0~99999)FlowengineeringunitFlowsignalisanalogelectricsignal(withpressure、temperaturefeedback):Urel=5*10-4.
Flowsignalispulsesignal:Urel=2.
0*10-5Class0.
2andBelow187ColdwatermeterFlowrate1316V.
R.
ofColdwatermeterJJG162-2009DN15~DN50Urel=0.
5%188BombcalorimeterThermalCapacity1505V.
R.
ofthebombcalorimeterJJG672-2001(1500~18000)J/KU=30J/KExceptforthetestofmixheatandthetestofsteadyonthebalancepoint189Platinum-10%Rhodium/PlatinumThermocoupleTemperature1501V.
R.
ofthePlatinum-10%Rhodium/PlatinumThermocoupleJJG75-1995(419.
527~1084.
62)℃419.
527℃:U=0.
3℃660.
323℃:U=0.
4℃1084.
62℃:U=0.
4℃GradeⅠ419.
527℃:U=0.
5℃660.
323℃:U=0.
6℃1084.
62℃:U=0.
6℃GradeⅡ190Platinum-30%Rhodium/Platinum-6%RhodiumThermocoupleTemperature1501V.
R.
ofThePlatinum-30%Rhodium/Platinum-6%RhodiumThermocoupleJJG167-1995(1100~1500)℃U=2.
5℃GradeⅡ191WorkingNobleMetalThermocoupleTemperature1501V.
R.
oftheWorkingNobleMetalThermocoupleJJG141-2000S、R:(300~1300)℃S、R:U=(1.
3~0.
4)℃ClassⅠClassⅡB:(1100~1500)℃B:U=2.
5℃ClassⅡClassⅢ192WorkingBaseMetalThermocoupleTemperature1501VerificationRegulationofWorkingBaseMetalThermocoupleJJG351-1996(-80~300)℃U=(0.
5~1.
0)℃ClassⅠ、ClassⅡ(300~1100)℃U=(2.
2~1.
1)℃193Copper/Copper-NickelThermocoupleTemperature1501VerificationRegulationofTheCopper/Copper-NickelThermocoupleJJG115-1999(-196~+300)℃U=(0.
2~0.
5)℃MPE:±0.
2℃194WorkingCopper/Copper-NickelThermocoupleTemperature1501VerificationRegulationofWorkingCopper/Copper-NickelThermocoupleJJG368-2000(-200~+300)℃U=(0.
2~0.
5)℃Class1andBelow195TungstenRibbonLampTemperature1501V.
R.
ofTungstenRibbonLampJJG110-2008(800~1400)℃U=(3.
3~2.
8)℃(1400~2000)℃U=(2.
9~3.
6)℃(2000~2500)℃U=(3.
6~4.
4)℃196PhotoPyrometerforWorkingTemperature1501V.
RofDisappearanceFilamentofPhotoPyrometerforWorkingJJG68-1991(800~1400)℃U=(8.
2~5.
6)℃Class1.
0andBelow(1200~2000)℃U=(9.
3~9.
8)℃(1800~3200)℃U=(35.
1~39.
4)℃197WorkingRadiationThermometersTemperature1501V.
R.
ofWorkingRadiationThermometersJJG856-1994VerificationRegulationofWorkingRadiationThermometersbelow500℃JJG415-2001(-20~150)℃U=0.
7℃Class0.
5andBelow(50~500)℃U=0.
4℃(300~1500)℃U=(0.
7~2.
2)℃(900~2200)℃U=(2.
0~3.
9)℃(1000~3000)℃U=(2.
2~7.
8)℃198InfraredThermometersTemperature1503CalibrationSpecificationofInfraredThermometersforMeasurementofHumanTemperatureJJF1107-2003(34.
0~43.
0)℃U=0.
1℃MPE:±0.
2℃or±0.
3℃199PlatinumResistanceThermometer(GradeⅠ)Temperature1501V.
R.
ofthePlatinumResistanceThermometerJJG160-2007(-189.
3442~660.
323)℃660.
323℃:U=4.
5mK;419.
527℃:U=3.
5mK;231.
928℃:U=2.
8mK;0.
01℃:U=1.
0mK;-38.
8344℃:U=2.
5mK;-189.
3442℃:U=3.
6mKGradeⅠ200PlatinumResistanceThermometer(GradeⅡ)Temperature1501V.
R.
ofPlatinumResistanceThemometerJJG160-2007(-189.
3442~419.
527)℃660.
323℃:U=7.
0mK;419.
527℃:U=5.
2mK;231.
928℃:U=3.
4mK;0.
01℃:U=2.
0mK;-38.
8344℃:U=2.
8mK;-189.
3442℃:U=4.
0mKGradeⅡ201IndustrialPlatinumCopperResistanceThermometersTemperature1501V.
R.
ofIndustrialPlatinumCopperResistanceThermometersJJG229-1998(-200~+420)℃0℃:U=0.
1℃;100℃:U=0.
1℃ClassA、ClassB202Mercury-in-GlassThermometer(GradeⅠ)Temperature1501V.
R.
ofMercury-in-GlassThermometer(GradeⅠ)JJG161-1994(-30~20)℃U=0.
02℃(0~100)℃U=0.
010℃(100~300)℃U=0.
03℃203Mercury-in-GlassThermometer(GradeⅡ)Temperature1501V.
R.
ofMercury-in-GlassThermometer(GradeⅡ)JJG128-2003(-30~0)℃U=0.
03℃(0~100)℃U=0.
03℃(100~200)℃U=0.
04℃(200~300)℃U=0.
06℃204HighPrecisionMercury-inGlassThermometerTemperature1501V.
R.
ofHighPrecisionMercury-inGlassThermometerJJG618-1999(0~150)℃U=(0.
012~0.
018)℃MPE:±0.
100℃andBelow205BeckmannThermometerTemperature1501V.
R.
ofBeckmannThermometerJJG114-1999(-20~+125)℃U=0.
020℃MPE:±0.
01℃andBelow206Liquid-in-GlassthermometersforworkingTemperature1501V.
R.
ofLiquid-in-GlassThermometerforWorkingJJG130-2004(-80~-60)℃U=0.
06℃(-60~0)℃U=0.
08℃(0~200)℃U=0.
07℃(200~300)℃U=0.
13℃207Liquid-in-GlassThermometerforPetroleumProductsTemperature1501V.
R.
ofLiquid-in-GlassThermometerforPetroleumProductsJJG50-1996(-80~-60)℃U=0.
06℃(-60~0)℃U=0.
08℃(0~200)℃U=0.
07℃(200~300)℃U=0.
13℃208PressureThermometerTemperature1501V.
R.
ofPressureThermometerJJG310-2002(-80~+300)℃U=1.
0℃Class1andBelow209BimetalThermometerTemperature1501V.
R.
ofBimetalThermometerJJG226-2001(-80~+300)℃U=1.
0℃Class1andBelow210SurfaceThermometerTemperature1501V.
R.
ofSurfaceThermometerJJG364-1994(50~500)℃U=2℃MPE:±1℃andBelow211DigitalThermometerTemperature1501V.
R.
ofSemiconductorThermistorThermometerJJG363-1984(-80~300)℃U=0.
1℃MPE:±1℃andBelow(300~600)℃U=0.
7℃212SemiconductorThemistorThermometerTemperature1501V.
R.
ofSemiconductorThemistorThermometerJJG363-1984(-60~+300)℃U=(0.
50~0.
75)℃Class1andBelow213Auto-measuringSystemofResistanceThermometersandThermocouplesTemperature1501CalibrationSpecificationforAuto-measuringSystemofResistanceThermometersandThermocouplesJJF1098-2003(-190~+1100)℃Auto-measuringSystemofResistanceThermometersU=(0.
05~0.
15)℃Auto-measuringSystemofThermocouples:U=(0.
7~0.
9)℃214PolymeraseChainReactionInstrumentsTemperature1504CalibrationSpecificationofPolymeraseChainReactionInstrumentsJCJ/E111025.
1-2006(10~105)℃U=0.
13℃215TemperatureIndicationControllerTemperature1502V.
R.
ofTemperatureIndicationControllerJJG874-2007(-60~20)℃U=0.
10℃MPE:±0.
1℃andBelow(0~100)℃U=0.
08℃(100~300)℃U=0.
20℃216MobileDetectingMeterofTemperature,TemperatureCurveCalibratorTemperature1501C.
S.
ofMobileDetectingMeterofTemperatureJJF1171-2007(-80~-60)℃U=0.
06℃Class0.
2andBelow(-60~0)℃U=0.
07℃(0~300)℃U=0.
18℃V.
R.
oftheRecorderforInstrumentsProcessMeasurementJJG74-2005(-200~0)℃U=(0.
5~0.
02)℃(0~+1800)℃U=(0.
02~1.
4)℃217TemperatureTransmittersTemperature1501C.
S.
ofTemperaturetransmittersJJF1183-2007(-80~+300)℃U=0.
08℃TransmitterswithResistanceThermometers:Class0.
5andBelow(300~1100)℃U=(2.
2~1.
3)℃Thermocouples:Class1.
0andBelowTransmitters:Class0.
5andBelow(-200~0)℃U=(0.
5~0.
02)℃Class0.
2andBelow(0~+1800)℃U=(0.
02~1.
4)℃218RecorderforInstrumentsProcessMeasurement(Self-balancedisplayinstruments)Temperature1502V.
R.
oftheRecorderforInstrumentsProcessMeasurementJJG74-2005(-200~0)℃U=(0.
5~0.
02)℃Class0.
1andBelow(0~+1800)℃U=(0.
02~1.
4)℃219DigitalTemperatureIndicatorsandControllersTemperature1502V.
R.
ofDigitalTemperatureIndicatorsandControllersJJG617-1996(-200~0)℃U=(0.
5~0.
02)℃Class0.
1andBelow(0~+1800)℃U=(0.
02~1.
4)℃220MovingCoilIndicatorsandStep-IndicationControllersAssociatedforMeasuringTemperatureTemperature1502V.
R.
ofMovingCoilIndicatorsandStep-indicationControllersAssociatedforMeasuringTemperatureJJG186-1997(-200~0)℃U=(0.
5~0.
02)℃Class1.
0(0~+1800)℃U=(0.
02~1.
4)℃221AnalogueTemperatureIndicatorsandControllersTemperature1502V.
R.
ofAnalogueTemperatureIndicatorsandControllersJJG951-2000(-200~0)℃U=(0.
5~0.
02)℃Class0.
2andBelow(0~+1800)℃U=(0.
02~1.
4)℃222TemperatureCalibratorTemperature1502V.
R.
ofDigitalTemperatureIndicatorsandControllersJJG617-1996(-200~0)℃U=(0.
5~0.
02)℃Class0.
1andBelow(0~+1800)℃U=(0.
02~1.
4)℃222TemperatureCalibratorTemperature1502C.
S.
forTheOutputofTemperatureCalibratorJCJ/G401001.
1/0/-2006(-200~0)℃U=(0.
32~0.
02)℃Class0.
02andBelow(0~+1800)℃U=(0.
02~0.
14)℃223EquipmentoftheEnvironmentalTestingforTemperatureandHumidityTemperature1504C.
S.
fortheEquipmentoftheEnvironmentalTestingforTemperatureandHumidityJJF1101-2003(-60~0)℃U=(0.
5~0.
13)℃(0~300)℃U=(0.
13~0.
7)℃Humidity(20~100)%U=1.
3%224Watt-hourMeterWatt-hour0410V.
R.
ofElectromechanicalMetersforMeasuringAlternating-currentElectricalEnergyJJG307-2006V.
R.
ofElectricalEnergyMeterswithElectronicsJJG596-19993*(48~600)V3*(0.
1~100)A合相1.
0:Urel=0.
010%0.
5L:Urel=0.
010%0.
8C:Urel=0.
010%分相1.
0:Urel=0.
010%0.
5L:Urel=0.
010%225VerificationEquipmentforACElectricalEnergyMeterWatt-hour0410V.
R.
ofVerificationEquipmentforACElectricalEnergyMeterJJG597-20053*(48~600)V3*(0.
1~100)A合相1.
0:Urel=0.
010%0.
5L:Urel=0.
012%0.
8C:Urel=0.
012%分相1.
0:Urel=0.
010%0.
5L:Urel=0.
013%226VoltagetransducersV.
R.
ofElectricalmeasuringtransducersJJG126-1995(10~500)VUrel=0.
02%Currenttransducers(0.
1~100)AUrel=0.
02%Powertransducers600V100AUrel=0.
02%ElectricalmeasuringtransducersPowerfactortransducers17000.
5L-1-0.
5CUrel=0.
02%Frequencytransducers45Hz~60HzUrel=0.
02%Phasetransducers0~360Urel=0.
02%227VerificationEquipmentforElectricalmeasuringtransducersACVoltagemeasuring1700V.
R.
ofElectricalmeasuringtransducersJJG126-1995V.
R.
ofDCDigitalVoltmeterJJG315-1983VerificationEquipmentforACElectricalEnergyMetersJJG597-2005V.
R.
ofDCDigitalAmperemeterJJG598-1989(60~480)VUrel=0.
015%ACCurrentmeasuring(0.
005~120)AUrel=0.
015%Activepowermeasuring480V/120AUrel=0.
015%Powerfactormeasuring0.
5L-1-0.
5CUrel=0.
015%Phasemeasuring0~360Urel=0.
015%Frequencymeasuring(45~65)HzUrel=0.
015%DCVoltagemeasuring(0~10)VUrel=6*10-5DCCurrentmeasuring(0~20)mAUrel=6*10-5228DCPotentiometerVoltage0411V.
R.
ofD.
C.
PotentiometersJJG123-2004(10-7~2.
1111110)VUrel=1.
6*10-6(10-3~10-2)VUrel=2.
5*10-6(10-7~10-3)VU=0.
06μV229DCBridgeResistance0402V.
R.
ofDCBridgesJJG125-2004(10-3~105)ΩUrel=1.
5*10-5(R1、R2);Urel=3*10-5(*102Ω~*103Ω)Urel=1.
5*10-4(*10Ω);Urel=3*10-4(*1Ω);Urel=3*10-3(*0.
1Ω);Urel=3*10-2(*0.
01Ω)230DigitalDCbridgeresistance0402V.
R.
ofD.
C.
lowResistanceMetersJJG837-200310-3Ω~2*107ΩUrel=0.
02%+1字231D.
C.
BridgesforMeasuringTemperatureResistance0411V.
R.
ofD.
C.
BridgesforMeasuringTemperatureJJG484-2007(0.
0010~555.
5600)Ω测量盘*1(1~102)Ω:Urel=0.
0016%(10-1~1)Ω:Urel=0.
006%(10-2~10-1)Ω:Urel=0.
002%(10-3~10-2)Ω:Urel=0.
02%(10-3~10-2)Ω:Urel=0.
5%量程变换器Urel=0.
0010%232TheDCResisitiveVoltRatioBoxVoltRatio0402V.
R.
ofTheDCResisitiveVoltRatioBoxJJG531-2003(0~1000)VUrel=0.
002%233D.
CResistorDCResistor0402V.
R.
ofDCResistorJJG166-1993(10-6~105)Ω1Ω:Urel=0.
5*10-6;(10-1、10~104)Ω:Urel=1.
5*10-6;(10-3、10-2、105)Ω:Urel=3*10-6;10-4Ω:Urel=3*10-5;10-5Ω:Urel=1*10-4;10-6Ω:Urel=1*10-3233D.
CResistorDCResistor0402V.
R.
ofD.
C.
ResistanceBoxJJG982-2003(10-3~105)Ω*102Ω~*104Ω:Urel=1.
5*10-5;*10Ω:Urel=3*10-5;*1Ω:Urel=1.
5*10-4;*10-1Ω:Urel=1.
5*10-3;*10-2Ω~*10-3Ω:Urel=1.
5*10-2234DigitalMulti-meterDCVoltage0410RulefortheDigitalMulti-meterCalibrationJJF(HU)1-2003V.
R.
ofDCDigitalVoltmeterJJG315-1983V.
R.
ofDCDigitalAmperemeterJJG598-1989V.
R.
ofDCDigitalOhmmeterJJG724-199110mV~220mVU=0.
00075%*RD+0.
4μV220mV~2.
2VU=0.
0005%*RD+0.
7μV2.
2V~11VU=0.
00035%*RD+2.
5μV11V~22VU=0.
00035%*RD+4μV22V~220VU=0.
0005%*RD+40μV220V~1000VU=0.
00065%*RD+400μVDCcurrent041010μA~220μAU=0.
004%*RD+6nA220μA~2.
2mAU=0.
0035%*RD+7nA2.
2mA~22mAU=0.
0035%*RD+40nA22mA~220mAU=0.
0045%*RD+0.
7μA220mA~2.
2AU=0.
0080%*RD+12μA2.
2A~11AU=0.
036%*RD+480μA234DigitalMulti-meterresistance0410RulefortheDigitalMulti-meterCalibrationJJF(HU)1-2003V.
R.
ofDCDigitalVoltmeterJJG315-1983V.
R.
ofDCDigitalAmperemeterJJG598-1989V.
R.
ofDCDigitalOhmmeterJJG724-19911ΩUrel=0.
0095%1.
9ΩUrel=0.
0095%10ΩUrel=0.
0023%19ΩUrel=0.
0023%100ΩUrel=0.
0010%190ΩUrel=0.
0010%1kΩUrel=0.
00085%1.
9kΩUrel=0.
00085%10kΩUrel=0.
00085%19kΩUrel=0.
00085%100kΩUrel=0.
0011%190kΩUrel=0.
0011%1MΩUrel=0.
0020%1.
9MΩUrel=0.
0021%10MΩUrel=0.
0040%19MΩUrel=0.
0050%100MΩUrel=0.
0100%(10~22)mV50Hz-20kHz:U=0.
008%*RD+4μV20kHz~50kHz:U=0.
020%*RD+4μV234DigitalMulti-meterACVoltage0410RulefortheDigitalMulti-meterCalibrationJJF(HU)1-2003V.
R.
ofDCDigitalVoltmeterJJG315-1983V.
R.
ofDCDigitalAmperemeterJJG598-1989V.
R.
ofDCDigitalOhmmeterJJG724-199150kHz~100kHz:U=0.
050%*RD+5μV100kHz~300kHz:U=0.
105%*RD+10μV300kHz~500kHz:U=0.
14%*RD+20μV500kHz~1MHz:U=0.
27%*RD+20μV(22~220)mV50Hz~20kHz:U=0.
008%*RD+7μV20kHz~50kHz:U=0.
020%*RD+7μV50kHz~100kHz:U=0.
046%*RD+17μV100kHz~300kHz:U=0.
090%*RD+20μV300kHz~500kHz:U=0.
14%*RD+25μV500kHz~1MHz:U=0.
27%*RD+45μV234DigitalMulti-meterACVoltage0410RulefortheDigitalMulti-meterCalibrationJJF(HU)1-2003V.
R.
ofDCDigitalVoltmeterJJG315-1983V.
R.
ofDCDigitalAmperemeterJJG598-1989V.
R.
ofDCDigitalOhmmeterJJG724-1991(0.
22~2.
2)V50Hz~20kHz:U=0.
005%*RD+8μV20kHz~50kHz:U=0.
0075%*RD+10μV50kHz~100kHz:U=0.
011%*RD+30μV100kHz~300kHz:U=0.
042%*RD+80μV300kHz~500kHz:U=0.
10%*RD+200μV500kHz~1MHz:U=0.
17%*RD+300μV(2.
2~22)V50Hz~20kHz:U=0.
005%*RD+80μV20kHz~50kHz:U=0.
0075%*RD+100μV50kHz~100kHz:U=0.
010%*RD+200μV100kHz~300kHz:U=0.
0275%*RD+600μV234DigitalMulti-meterACVoltage0410RulefortheDigitalMulti-meterCalibrationJJF(HU)1-2003V.
R.
ofDCDigitalVoltmeterJJG315-1983V.
R.
ofDCDigitalAmperemeterJJG598-1989V.
R.
ofDCDigitalOhmmeterJJG724-1991300kHz~500kHz:U=0.
10%*RD+2000μV500kHz~1MHz:U=0.
15%*RD+3200μV(22~220)V50Hz~20kHz:U=0.
0052%*RD+0.
6mV20kHz~50kHz:U=0.
008%*RD+1mV50kHz~100kHz:U=0.
015%*RD+2.
5mV100kHz~300kHz:U=0.
090%*RD+16mV300kHz~500kHz:U=0.
44%*RD+40mV500kHz~1MHz:U=0.
80%*RD+80mV(220~1000)V50Hz~1kHz:U=0.
007%*RD+3.
5mV234DigitalMulti-meterACcurrent0410RulefortheDigitalMulti-meterCalibrationJJF(HU)1-2003V.
R.
ofDCDigitalVoltmeterJJG315-1983V.
R.
ofDCDigitalAmperemeterJJG598-1989V.
R.
ofDCDigitalOhmmeterJJG724-1991(10~220)μA50Hz~1kHz:U=0.
02%*RD+35nA1kHz~5kHz:U=0.
020%*RD+0.
11μA5kHz~10kHz:U=0.
11%*RD+0.
65μA(0.
22~2.
2)mA50Hz~1kHz:U=0.
02%*RD+0.
35μA1kHz~5kHz:U=0.
020%*RD+0.
55μA5kHz~10kHz:U=0.
11%*RD+5μA(2.
2~22)mA50Hz~1kHz:U=0.
02%*RD+2.
5μA1kHz~5kHz:U=0.
020%*RD+3.
5μA5kHz~10kHz:U=0.
11%*RD+10μA(22~220)mA50Hz~1kHz:U=0.
02%*RD+2.
5μA1kHz~5kHz:U=0.
020%*RD+3.
5μA5kHz~10kHz:U=0.
11%*RD+10μA(0.
22~2.
2)A50Hz~1kHz:U=0.
026%*RD+35μA1kHz~5kHz:U=0.
045%*RD+80μA5kHz~10kHz:U=0.
70%*RD+160μA(2.
2~11)A50Hz~1kHz:U=0.
046%*RD+170μA1kHz~5kHz:U=0.
095%*RD+380μA5kHz~10kHz:U=0.
36%*RD+750μA235Multi-calibratorDCVoltage0409V.
R.
ofDCStandardVoltageSourceJJG445-198610mV~200mVU=0.
00027%*RD+0.
00005%RANGE200mV~2VU=0.
00027%*RD+0.
00002%RANGE2V~20VU=0.
00027%*RD+0.
00002%RANGE20V~200VU=0.
00040%*RD+0.
00002%RANGE200V~1000VU=0.
00040%*RD+0.
00005%RANGEDCcurrentC.
R.
forMulti-calibratorJCJ/B041002.
1-200410μA~200μAU=0.
001%*RD+0.
0002%RANGE200μA~2mAU=0.
001%*RD+0.
0002%RANGE2mA~20mAU=0.
001%*RD+0.
0002%RANGE20mA~200mAU=0.
0033%*RD+0.
0004%RANGE200mA~2AU=0.
0170%*RD+0.
0008%RANGE2A~11AU=0.
0380%*RD+0.
0020%RANGEresistance0409C.
R.
forMulti-calibratorJCJ/B041002.
1-20041Ω~2ΩU=0.
0010%*RD+0.
0002%RANGE2Ω~20ΩU=0.
0007%*RD+0.
00007%RANGE20Ω~200ΩU=0.
0007%*RD+0.
000025%RANGE200Ω~2kΩU=0.
0007%*RD+0.
000025%RANGE2kΩ~20kΩU=0.
0007%*RD+0.
000025%RANGE20kΩ~200kΩU=0.
0007%*RD+0.
000025%RANGE200kΩ~2MΩU=0.
0007%*RD+0.
00005%RANGE2MΩ~20MΩU=0.
0009%*RD+0.
0005%RANGE20MΩ~100MΩU=0.
0030%*RD+0.
0050%RANGEACVoltage0409V.
R.
forpreciseACvoltagecalibrationsourceJJG410-1994(10~200)mV1Hz~10Hz:U=0.
012%*RD+0.
0070%RANGE10Hz~40Hz:U=0.
012%*RD+0.
0020%RANGE40Hz~100Hz:U=0.
010%*RD+0.
0020%RANGE100Hz~2kHz:U=0.
010%*RD+0.
0010%RANGE2kHz~10kHz:U=0.
010%*RD+0.
0020%RANGE10kHz~30kHz:U=0.
030%*RD+0.
0040%RANGE30kHz~100kHz:U=0.
070%*RD+0.
0100%RANGE(0.
2~200)V1Hz~10Hz:U=0.
010%*RD+0.
0060%RANGE10Hz~40Hz:U=0.
010%*RD+0.
0010%RANGE40Hz~100Hz:U=0.
0080%*RD+0.
0010%RANGE100Hz~2kHz:U=0.
0060%*RD+0.
0010%RANGE2kHz~10kHz:U=0.
0080%*RD+0.
0010%RANGE10kHz~30kHz:U=0.
020%*RD+0.
0020%RANGE30kHz~100kHz:U=0.
050%*RD+0.
010%RANGE100kHz~300kHz:U=0.
3%*RD+0.
1%RANGE300kHz~1MHz:U=1%*RD+1%RANGE(200~1000)V1Hz~10Hz:U=0.
010%*RD+0.
0070%RANGE10Hz~40Hz:U=0.
010%*RD+0.
0020%RANGE40Hz~10kHz:U=0.
008%*RD+0.
0020%RANGE10kHz~30kHz:U=0.
020%*RD+0.
0040%RANGE30kHz~100kHz:U=0.
050%*RD+0.
020%RANGEACcurrent0409C.
R.
forMulti-calibratorJCJ/B041002.
1-200410μA~20mA1Hz~10Hz:U=0.
025%*RD+0.
010%RANGE10Hz~10kHz:U=0.
025%*RD+0.
010%RANGE10kHz~30kHz:U=0.
060%*RD+0.
010%RANGE30kHz–100kHz:U=0.
4%*RD+0.
010%RANGE20mA~200mA1Hz~10Hz:U=0.
025%*RD+0.
010%RANGE10Hz~10kHz:U=0.
025%*RD+0.
010%RANGE10kHz~30kHz:U=0.
060%*RD+0.
010%RANGE200mA~2A10Hz~2kHz:U=0.
060%*RD+0.
010%RANGE2kHz~10kHz:U=0.
070%*RD+0.
010%RANGE236CurrentTransformersofMeasuringServiceRatioofDifference;PhaseDifference0411CurrentTransformersofMeasuringServiceJJG313-1994(0.
1~5)A/5ARatioofDifference:U=3.
3*10-5PhaseDifference:U=3.
3*10-5rad(5~5000)A/5ARatioofDifference:U=1.
7*10-5PhaseDifferenceU=1.
7*10-5rad(5~5000)A/1ARatioofDifference:U=3.
3*10-5PhaseDifference:U=3.
3*10-5rad(5~2500)A/0.
5ARatioofDifference:U=3.
3*10-5PhaseDifference:U=3.
3*10-5rad237EarthResistanceMeterEarthResistance0403V.
R.
ofEarthResistanceMetersJJG366-2004(10-3~1000)ΩUrel=1.
1%238VoltageTransformersofMeasuringServiceRatioofDifference;PhaseDifference0411VoltageTransformersofMeasuringServiceJJG314-1994(0~1000)V/(0~222.
222)V;(0~600)V/(0~666.
666)V;RatioofDifference:U=1.
2*10-5PhaseDifference:U=1.
2*10-5radRatioofDifference:U=1.
1*10-4PhaseDifference:U=0.
3'RatioofDifference:U=7.
0*10-5PhaseDifference:U=7.
0*10-5rad238VoltageTransformersofMeasuringServiceRatioofDifference;PhaseDifference0411VoltageTransformersofMeasuringServiceJJG314-1994RatioofDifference:U=8.
0*10-5PhaseDifference:U=8.
0*10-5radRatioofDifference:U=1.
6*10-4PhaseDifference:U=0.
4'239Earth-ContinuityTestersresistance0410Earth-ContinuityTestersJJG984-2004(0.
02-0.
5)ΩUrel=1.
3%current(0-25)AUrel=1.
3%240HighInsulationResistanceMetersresistance0402HighInsulationResistanceMetersJJG690-20031kΩ~100MΩUrel=0.
6%100MΩ~1GΩUrel=1.
2%1GΩ~10GΩUrel=2.
4%10GΩ~1TΩUrel=5.
8%241ElectricalSafetyAnalyerWithstandingvoltage:voltage0411V.
R.
ofWithstandingVoltageTestersJJG795-2004(0~20)kVAC:Urel=1.
5%(k=2.
58)DC:Urel=0.
7%(k=2.
58)Withstandingvoltage:current10μA~400mAAC:Urel=1.
5%(k=2.
58)(0~400)mADC:Urel=0.
6%(k=2.
58)Leakagecurrent:currentV.
R.
ofLeakageCurrentInstrumentandMeterJJG843-200710μA~400mAAC:Urel=1.
1%(0~400)mADC:Urel=0.
8%Leakagecurrent:voltage(10~1000)VAC:Urel=0.
9%(0~1000)VDC:Urel=0.
3%Earth–Continuity:resistanceV.
R.
ofEarth-ContinuityTestersJJG984-2004(0.
02~0.
5)ΩUrel=1.
3%Earth–Continuity:current(0-25)AUrel=1.
3%Insulationresistance:resistanceV.
R.
ofMegohm-meterJJG622-19971kΩ~100MΩUrel=0.
6%100MΩ~1GΩUrel=1.
2%1GΩ~10GΩUrel=2.
4%10GΩ~1TΩUrel=5.
8%242PhaseMeter(Includingthephaseanglemeterandpowerfactormeter)Phase0410V.
R.
ofIndustryFrequencySingle-PhasePhaseMeterJJG440-2008V.
R.
ofTheModelBX-21lowfrequencydigitalphasemeterJJG381-19860°~360°or-180°~+180°U=0.
12°PowerFactor04100~1U=0.
12°243StandardCellVoltage0407V.
R.
ofStandardCellJJG153-19961.
018600V~1.
018670VU=1μV244StandardInductorInductance0406V.
R.
ofStandardInductorJJG726-19911μH~1H(100Hz~1MHz)f=1kHz(100μH~1H):Urel=0.
02%f=(100~1k)Hz(1μH~1H):Urel=1%~0.
05%245StandardCapacitorCapacitance0404V.
R.
ofStandardCapacitorJJG183-19921pF~1F(20Hz~1MHz)f=1kHz(1pF~1μF):Urel=0.
001%~0.
01%f=500Hz~2kHz(1pF~1μF):Urel=0.
002%~0.
02%f=50Hz~10kHz(1pF~1μF):Urel=0.
01%~2%f=20Hz~100Hz(1μF~1F):Urel=0.
5%~5%f=10kHz~1MHz:Urel=2%~0.
5%Loss1~1*10-5U=1*10-5246Tesla-MeterMagneticInductionDensity0405V.
R.
ofTesla-MeterJJG242-1995(0.
035~2.
0)TUrel=0.
08%247MagneticFluxMeterMagneticFlux0405V.
R.
ofMagneticFluxMeterJJG317-1983(0~10)mWbUrel=0.
5%248LCRMeterCapacitance0411V.
R.
ofAlternatingCurrentBridgeJJG441-20081pF~0.
1F(100Hz~13MHz)f=1kHz(100pF~1μF):Urel=0.
02%f=100Hz~13MHz(1pF~1μF):Urel=5%~0.
5%Inductance1μH~104H(100Hz~1kHz)f=1kHz(100μH~1H):Urel=0.
02%f=100Hz(1H~104H):Urel=0.
2%~10%f=100Hz~1kHz,(1H~1μH):Urel=0.
2%~20%Resistance0.
001Ω~100MΩ(100Hz~13MHz)f=1kHz(100Ω~100kΩ):Urel=0.
02%f=100Hz~13MkHz(0.
001Ω~100MΩ):Urel=0.
5%~20%Loss1~10-5U=1*10-4249WithstandingVoltageTesterVoltage0411V.
R.
ofWithstandingVoltageTestersJJG795-2004(0~20)kVAC:Urel=1.
5%(k=2.
58)DC:Urel=0.
7%(k=2.
58)Current20μA~100mAAC:Urel=1.
5%(k=2.
58)DC:Urel=0.
6%(k=2.
58)250ClampMeterD.
C.
Voltage0410RulefortheDigitalMultimeterCalibrationJJF(HU)1-2003Amperemeters、Voltmeters、WattmetersandOhmmetersJJG124-200510mV~1000V(45Hz~10kHz)Urel=0.
1%A.
C.
Voltage0410RulefortheDigitalMultimeterCalibrationJJF(HU)1-2003Amperemeters、Voltmeters、WattmetersandOhmmetersJJG124-200510mV~1000V50Hz~10kHz:Urel=0.
2%D.
C.
current0410CalibrationSpecificationofClampAmmetersJJF1075-200110μA~20.
49AUrel=0.
2%20.
5A~1000AUrel=0.
4%A.
C.
current0410CalibrationSpecificationofClampAmmetersJJF1075-200130μA~2.
999A(45~1k)HzUrel=0.
2%3A~20.
49A(45~100)HzUrel=0.
2%20.
5A~149.
9A(45~65)HzUrel=0.
5%150A~1000A(45~65)HzUrel=0.
4%D.
C.
power0410RulefortheDigitalMultimeterCalibrationJJF(HU)1-2003CalibrationSpecificationofClampAmmetersJJF1075-200133mV~1000V0.
33A~20.
49AUrel=0.
2%33mV~1000V20.
5A~1000AUrel=0.
5%A.
C.
power0410A.
C.
DigitalPowerMeterJJG780-1992CalibrationSpecificationofClampAmmetersJJF1075-200130V~600V(45~65)Hz0.
33A~20.
49A:Urel=0.
3%20.
5A~44.
99A:Urel=0.
6%45A~1000A:Urel=0.
5%Resistor0402RulefortheDigitalMultimeterCalibrationJJF(HU)1-2003Amperemeters、Voltmeters、WattmetersandOhmmetersJJG124-20051Ω~100MΩUrel=0.
1%251DigitalPowerMeterPower0410A.
C.
DigitalPowerMeterJJG780-19923*(30~600)V、3*(50mA~100A)Urel=0.
01%Current0410RulefortheDigitalMultimeterCalibrationJJF(HU)1-20033*(50mA~100A)Urel=0.
01%Voltage0410RulefortheDigitalMultimeterCalibrationJJF(HU)1-20033*(30~600)VUrel=0.
01%252DigitalPowerSourcePower0410A.
C.
DigitalPowerMeterJJG780-19923*(30V~600V)3*(50mA~100A)Urel=0.
02%Current04103*(50mA~100A)Urel=0.
02%Voltage04103*(30V~600V)Urel=0.
02%253TransformersTurnRatioTestSetsTrans-formersTurnRatio0411V.
R.
ofTransformersTurnRatioTestSetsJJG970-20021~1000U=0.
02%254HighVoltageMeterVoltage0411C.
S.
ofHighVoltageMeterJCJ/F121001.
1-20061V~100kVAC:Urel=0.
25%DC:Urel=0.
13%255LeakageCurrentTesterCurrent0410V.
R.
ofLeakageCurrentTesterJJG843-200710μA~400mAAC:Urel=1.
1%(0~400)mADC:Urel=0.
8%Voltage0410(10~1000)VAC:Urel=0.
9%(0~1000)VDC:Urel=0.
3%256LoopResistanceTesterResistance0402LoopResistanceTesterandDCResistanceMetersJJG1052-200910-5Ω~1.
9mΩUrel=0.
2%+1字257D.
C.
lowResistanceMetersResistance0402D.
C.
lowResistanceMetersJJG837-2003LoopResistanceTesterandDCResistanceMetersJJG1052-200910-5Ω~100MΩ10-5Ω~10-4ΩUrel=0.
05%+1字10-4Ω~100MΩUrel=0.
02%+1字258ACVoltageCalibratorVoltage0409V.
R.
ofPreciseACVoltageCalibrationSourceJJG410-1994(1~2.
2)mV10Hz~20Hz:U=0.
17%*RD+1.
3μV20Hz~40Hz:U=0.
074%*RD+1.
3μV40Hz~20kHz:U=0.
042%*RD+1.
3μV20kHz~50kHz:U=0.
081%*RD+2.
0μV50kHz~100kHz:U=0.
12%*RD+2.
5μV100kHz~300kHz:U=0.
23%*RD+4.
0μV300kHz~500kHz:U=0.
24%*RD+8.
0μV500kHz~1MHz:U=0.
35%*RD+8.
0μV1MHz~1.
2MHz:U=0.
07%*RD+1μV1.
2MHz~2MHz:U=0.
07%*RD+1μV2MHz~10MHz:U=0.
17%*RD+1μV10MHz~20MHz:U=0.
30%*RD+1μV20MHz~30MHz:U=0.
70%*RD+2μV(2.
2~7)mV10Hz~20Hz:U=0.
085%*RD+1.
3μV258ACVoltageCalibratorVoltage0409V.
R.
ofPreciseACVoltageCalibrationSourceJJG410-199420Hz~40Hz:U=0.
037%*RD+1.
3μV40Hz~20kHz:U=0.
021%*RD+1.
3μV20kHz~50kHz:U=0.
040%*RD+2.
0μV50kHz~100kHz:U=0.
060%*RD+2.
5μV100kHz~300kH:U=0.
12%*RD+4.
0μV300kHz~500kHz:U=0.
13%*RD+8.
0μV500kHz~1MHz:U=0.
23%*RD+8.
0μV1MHz~1.
2MHz:U=0.
07%*RD+1μV1.
2MHz~2MHz:U=0.
07%*RD+1μV2MHz~10MHz:U=0.
10%*RD+1μV10MHz~20MHz:U=0.
17%*RD+1μV20MHz~30MHz:U=0.
37%*RD+1μV(7~22)mV10Hz~20Hz:U=0.
029%*RD+1.
3μV20Hz~40Hz:U=0.
019%*RD+1.
3μV258ACVoltageCalibratorVoltage0409V.
R.
ofPreciseACVoltageCalibrationSourceJJG410-199440Hz~20kHz:U=0.
011%*RD+1.
3μV20kHz~50kHz:U=0.
021%*RD+2.
0μV50kHz~100kHz:U=0.
031%*RD+2.
5μV100kHz~300kHz:U=0.
081%*RD+4.
0μV300kHz~500kHz:U=0.
089%*RD+8.
0μV500kHz~1MHz:U=0.
17%*RD+8.
0μV1MHz~1.
2MHz:Urel=0.
07%1.
2MHz~2MHz:Urel=0.
07%2MHz~10MHz:Urel=0.
10%10MHz~20MHz:Urel=0.
17%20MHz~30MHz:Urel=0.
37%(22~70)mV10Hz~20Hz:U=0.
024%*RD+1.
5μV20Hz~40Hz:U=0.
012%*RD+1.
5μV40Hz~20kHz:U=0.
0065%*RD+1.
5μV20kHz~50kHz:U=0.
013%*RD+2.
0μV258ACVoltageCalibratorVoltage0409V.
R.
ofPreciseACVoltageCalibrationSourceJJG410-199450kHz~100kHz:U=0.
026%*RD+2.
5μV100kHz~300kHz:U=0.
051%*RD+4.
0μV300kHz~500kHz:U=0.
067%*RD+8.
0μV500kHz~1MHz:U=0.
11%*RD+8.
0μV1MHz~1.
2MHz:Urel=0.
05%1.
2MHz~2MHz:Urel=0.
05%2MHz~10MHz:Urel=0.
10%10MHz~20MHz:Urel=0.
15%20MHz~30MHz:Urel=0.
35%(70~220)mV10Hz~20Hz:U=0.
021%*RD+1.
5μV20Hz~40Hz:U=0.
0085%*RD+1.
5μV40Hz~20kHz:U=0.
0038%*RD+1.
5μV20kHz~50kHz:U=0.
0069%*RD+2.
0μV50kHz~100kHz:U=0.
016%*RD+2.
5μV100kHz~300kHz:U=0.
025%*RD+4.
0μV258ACVoltageCalibratorVoltage0409V.
R.
ofPreciseACVoltageCalibrationSourceJJG410-1994300kHz~500kHz:U=0.
038%*RD+8.
0μV500kHz~1MHz:U=0.
10%*RD+8.
0μV1MHz~1.
2MHz:Urel=0.
05%1.
2MHz~2MHz:Urel=0.
05%2MHz~10MHz:Urel=0.
10%10MHz~20MHz:Urel=0.
15%20MHz~30MHz:Urel=0.
35%(220~700)mV10Hz~20Hz:U=0.
021%*RD+1.
5μV20Hz~40Hz:U=0.
0076%*RD+1.
5μV40Hz~20kHz:U=0.
0033%*RD+1.
5μV20kHz~50kHz:U=0.
0051%*RD+2.
0μV50kHz~100kHz:U=0.
0079%*RD+2.
5μV100kHz~300kHz:U=0.
018%*RD+4.
0μV300kHz~500kHz:U=0.
030%*RD+8.
0μV500kHz~1MHz:U=0.
096%*RD+8.
0μV1MHz~1.
2MHz:Urel=0.
05%258ACVoltageCalibratorVoltage0409V.
R.
ofPreciseACVoltageCalibrationSourceJJG410-19941.
2MHz~2MHz:Urel=0.
05%2MHz~10MHz:Urel=0.
10%10MHz~20MHz:Urel=0.
15%20MHz~30MHz:Urel=0.
35%(0.
7~2.
2)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0066%40Hz~20kHz:Urel=0.
0024%20kHz~50kHz:Urel=0.
0046%50kHz~100kHz:Urel=0.
0071%100kHz~300kHz:Urel=0.
016%300kHz~500kHz:Urel=0.
026%500kHz~1MHz:Urel=0.
090%1MHz~1.
2MHz:Urel=0.
05%1.
2MHz~2MHz:Urel=0.
05%2MHz~10MHz:Urel=0.
10%10MHz~20MHz:Urel=0.
15%20MHz~30MHz:Urel=0.
35%(2.
2~7)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0067%40Hz~20kHz:Urel=0.
0024%258ACVoltageCalibratorVoltage0409V.
R.
ofPreciseACVoltageCalibrationSourceJJG410-199420kHz~50kHz:Urel=0.
0048%50kHz~100kHz:Urel=0.
0081%100kHz~300kHz:Urel=0.
019%300kHz~500kHz:Urel=0.
040%500kHz~1MHz:Urel=0.
12%1MHz~1.
2MHz:Urel=0.
05%1.
2MHz~2MHz:Urel=0.
05%2MHz~10MHz:Urel=0.
10%10MHz~20MHz:Urel=0.
15%20MHz~30MHz:Urel=0.
35%(7~22)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0067%40Hz~20kHz:Urel=0.
0027%20kHz~50kHz:Urel=0.
0048%50kHz~100kHz:Urel=0.
0081%100kHz~300kHz:Urel=0.
019%300kHz~500kHz:Urel=0.
040%500kHz~1MHz:Urel=0.
12%(22~70)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0068%258ACVoltageCalibratorVoltage0409V.
R.
ofPreciseACVoltageCalibrationSourceJJG410-199440Hz~20kHz:Urel=0.
0032%20kHz~50kHz:Urel=0.
0057%50kHz~100kHz:Urel=0.
0094%100kHz~300kHz:Urel=0.
020%300kHz~500kHz:Urel=0.
041%500kHz~1MHz:Urel=0.
12%(70~220)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0068%40Hz~20kHz:Urel=0.
0031%20kHz~50kHz:Urel=0.
0069%50kHz~100kHz:Urel=0.
0098%100kHz~300kHz:Urel=0.
021%300kHz~500kHz:Urel=0.
050%(220~700)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0099%40Hz~20kHz:Urel=0.
0041%20kHz~50kHz:Urel=0.
013%50kHz~100kHz:Urel=0.
050%(700~1000)V10Hz~20Hz:Urel=0.
020%20Hz~40Hz:Urel=0.
0099%258ACVoltageCalibratorVoltage0409V.
R.
ofPreciseACVoltageCalibrationSourceJJG410-199440Hz~20kHz:Urel=0.
0038%20kHz~50kHz:Urel=0.
013%50kHz~100kHz:Urel=0.
050%259VoltmeterD.
C.
Voltage0410V.
R.
ofVoltmeter、Ammeter、WattmeterandResistorJJG124-2005(0~1000)VUrel=0.
02%A.
C.
Voltage0410(0~1000)VUrel=0.
03%260AmmeterD.
C.
Current0410V.
R.
ofVoltmeter、Ammeter、WattmeterandResistorJJG124-2005(0~30)AUrel=0.
03%A.
C.
Current0410(0~50)AUrel=0.
03%261WattmeterD.
C.
Power0410V.
R.
ofVoltmeter、Ammeter、WattmeterandResistorJJG124-2005(0~600)V,(0~30)AUrel=0.
03%A.
C.
Power0410(0~600)V,(0~20A)Urel=0.
03%262MultimeterD.
C.
Voltage0410V.
R.
ofVoltmeter、Ammeter、WattmeterandResistorJJG124-2005(0~1000)VUrel=0.
2%A.
C.
Voltage0410(0~1000)VUrel=0.
3%D.
C.
Current0410(0~20)AUrel=0.
2%A.
C.
Current0410(0~20)AUrel=0.
3%Resistance0402(0~11.
11110)MΩUrel=0.
3%263InsulationOhmmeterInsulationResistance0403V.
R.
oftheMeg-ohmmeterJJG622-19971kΩ~100MΩUrel=1.
0%100MΩ~1GΩUrel=1.
5%1GΩ~10GΩUrel=2.
5%10GΩ~100GΩUrel=6.
0%264ElectronicInsulatingResistanceMetersInsulatingResistance0410V.
R.
ofElectronicInsulatingResistanceMetersJJG1005-20051kΩ~100MΩUrel=1.
0%100MΩ~1GΩUrel=1.
5%1GΩ~10GΩUrel=2.
5%10GΩ~1000GΩUrel=6.
0%265IonizerDischargeRate0426C.
S.
forIonizerJCJ/G301004.
1/0-2009(0~100)sU=0.
3sChargebalance(0~1000)VUrel=5.
0%266HaicaTesterVoltage0409V.
R.
ofACDigitalPowerMeterJJG780-1992(0~33)V(33~330)V(330~1000)VUrel=0.
05%Urel=0.
05%Urel=0.
05%Current0409(0~0.
33)A(0.
33~3)A(3~11)A(11~20)AUrel=0.
15%Urel=0.
15%Urel=0.
15%Urel=0.
15%Frequency041210Hz~1kHzUrel=0.
015%Power0410(0~20)kWUrel=0.
15%266HaicaTesterTemperature1514V.
R.
oftheCopper/Copper-NickelThermocoupleJJG115-1999T:(-150~0~120~300)℃U=0.
3℃V.
R.
ofIndustryPlatinumCopperResistanceThermometersJJG229-1998PT100:(-30~200)℃U=0.
07℃Pressure1320V.
R.
ofPressureTransducer(Static)JJG860-1994(-0.
1~5)MPaUrel=0.
1%V.
R.
ofPressureTransmittersJJG882-2004(-1000~1000)PaUrel=0.
1%Tachometer1324V.
R.
ofTachometerJJG105-2000(0~10000)r/minU=1.
2r/min267DataAcquisitionSystemDCVoltage0409V.
R.
ofDCDigitalVoltmeterJJG315-1983(0~330)mV(0~3.
3)V(0~33)V(30~330)VUrel=0.
005%Urel=0.
005%Urel=0.
005%Urel=0.
005%ACVoltage0409V.
R.
ofACdigitalvoltmeterJJG(HT)34-1999(0~33)V45Hz~1kHz:Urel=0.
05%(33~330)V45Hz~1kHz:Urel=0.
05%Temperature1514V.
R.
ofDigitalTemperatureIndicatorsandControllersJJG617-1996RTD(PT100385)(-40~600)℃RTD:U=0.
12℃~0.
15℃TC(K)(-40~-25)℃TC:U=0.
2℃(-25~120)℃U=0.
2℃(120~600)℃U=0.
3℃Resistance0402V.
R.
ofDCDigitalOhmmeterJJG724-1991(0~11)Ω(11~110)Ω(0.
11~1.
1)kΩ(1.
1~11)kΩ(11~110)kΩ(0.
11~1.
1)MΩ(1.
1~3)MΩUrel=0.
015%Urel=0.
015%Urel=0.
015%Urel=0.
015%Urel=0.
015%Urel=0.
015%Urel=0.
025%268CalorieTesterVoltage0409V.
R.
ofACDigitalPowerMeterJJG780-1992(0~33)V45Hz~1kHz:Urel=0.
05%(33~330)V45Hz~1kHz:Urel=0.
05%(330~1000)V45Hz~1kHz:Urel=0.
05%Current(0~0.
33)A45Hz~100Hz:Urel=0.
15%(0.
33~3)A45Hz~100Hz:Urel=0.
15%(3~11)A45Hz~100Hz:Urel=0.
15%(11~20)A45Hz~100Hz:Urel=0.
15%Frequency041210Hz~1kHzUrel=0.
015%Power0410(0~20)kWUrel=0.
15%268CalorieTesterTemperature1514V.
R.
oftheCopper/Copper-NickelThermocoupleJJG115-1999T:(-30~0~120~300)℃U=0.
3℃V.
R.
ofIndustryPlatinumCopperResistanceThermometersJJG229-1998PT100:(-30~200)℃U=0.
07℃Pressure1320V.
R.
ofPressureTransducer(Static)JJG860-1994(-1000~1000)PaUrel=0.
1%V.
R.
ofPressureTransmittersJJG882-2004(-0.
1~5)MPaUrel=0.
1%Tachometer1324V.
R.
ofTachometerJJG105-2000(0~10000)r/minU=1.
2r/min269Air-conditionMulti-testerVoltage0409V.
R.
ofACDigitalPowerMeterJJG780-1992(0~33)V45Hz~1kHz:Urel=0.
05%(33~330)V45Hz~1kHz:Urel=0.
05%(330~1000)V45Hz~1kHz:Urel=0.
05%Current(0~0.
33)A45Hz~100Hz:Urel=0.
15%(0.
33~3)A45Hz~100Hz:Urel=0.
15%(3~11)A45Hz~100Hz:Urel=0.
15%(11~20)A45Hz~100Hz:Urel=0.
15%Frequency041210Hz~1kHzUrel=0.
015%Power0410(0~20)kWUrel=0.
15%Temperature1514V.
R.
oftheCopper/Copper-NickelThermocoupleJJG115-1999T:(-30~0~120~300)℃U=0.
3℃Pressure1320V.
R.
ofPressureTransducer(Static)JJG860-1994(-0.
1~5)MPaUrel=0.
1%270DocumentingProcessCalibratorDCVoltageMeasure0409V.
R.
ofDCDigitalVoltmeterJJG315-1983(0~330)VUrel=0.
09%MeasurementpartACVoltageMeasureV.
R.
ofACDigitalVoltmeterJJG(HT)34-1999(0~330)V45Hz~1kHz:Urel=0.
3%DCCurrentMeasureV.
R.
ofDCDigitalAmperemeterJJG598-1989(0~330)mAUrel=0.
07%FrequencyMeasure0412V.
R.
ofUniversalCountersJJG349-2001(0~119.
99)kHzUrel=0.
02%Resistance0402V.
R.
ofDCDigitalOhmmeterJJG724-1991(0~100)kΩUrel=0.
015%TemperatureMeasure1514V.
R.
ofDigitalTemperatureIndicatorsandControllersJJG617-1996(K)(-200~-100)℃(-100~1000)℃(1000~1370)℃U=0.
4℃U=0.
3℃U=0.
5℃(PT100385)(-200~-80~800)℃U=0.
12℃~0.
28℃DCVoltageOutput0409V.
R.
ofDCStandardVoltageSourceJJG445-1986(0~15)VUrel=0.
09%DCCurrentOutput0409V.
R.
ofDCSourceJJG(HT)38-1987(0~2)mA(0~20)mAUrel=0.
07%Urel=0.
07%ResistanceOutput0402C.
S.
fortheTemperatureTransmitterJJF1183-2007(0~10)kΩUrel=0.
1%Outputparttemperature1514(K)(-200~-100)℃(-100~1000)℃(1000~1370)℃U=0.
4℃U=0.
3℃U=0.
5℃(PT100385)(-200~-80~800)℃U=0.
12℃~0.
12℃~0.
28℃271ProtectiverelaytestdeviceDCVoltage0409ProtectiverelaytestdeviceCalibrationJCJ/G301011.
1-2007(0~1000)VUrel=0.
05%ACVoltage0410(0~1000)V45Hz~1kHz:Urel=0.
15%ACCurrent0410(0~10)A45Hz~100Hz:Urel=0.
25%DCCurrent0409(0~10)AUrel=0.
22%272SecondarybatterytestdeviceDCVoltage0409SecondarybatterytestdeviceCalibrationJCJ/G301008.
1-2007(0~24)VUrel=0.
2%Resistance0409(20~500)mΩUrel=0.
8%DCCurrent0409(0~10)AUrel=0.
3%273SwitchCharacteristicTestDeviceDCVoltage0409SwitchCharacteristicTestDeviceCalibrationJCJ/G301009.
1-2009(0~1000)VUrel=0.
1%DynamicTime0412(0~1000)msU=0.
1ms274ChargePlateMonitorDCVoltage0409ChargePlateMonitorCalibrationJCJ/G301010.
1-2007(0~1000)VUrel=0.
2%DecayTime0412(0~100)sU=0.
2s275MagneticParticleFlawDetectorsACCurrent0409C.
S.
forMagneticParticleFlawDetectorsJCJ/G301007.
1/0-2006(0~9000)AUrel=1.
9%DCCurrent(0~6000)AUrel=2.
6%276InstrumentTransformerTestSetInstrumentTransformerTestSet0411V.
R.
ofInstrumentTransformerTestSetJJG169-1993ratioerror:phaseerrorImpedenceUrel=0.
3%277DistortionMeterCalibratorVoltage0409V.
R.
ofDistortionMeterCalibratorJJG802-19930.
3mV~1000mV10Hz~30Hz:Urel=0.
2%30Hz~50kHz:Urel=0.
06%50kHz~100kHz:Urel=0.
2%100kHz~200kHz:Urel=0.
5%200kHz~400kHz:Urel=1.
0%Frequency10Hz~1GHzUrel=1.
2*10-6278MeasuringFilter(low-pass,high-pass)undulateresponseinchannel1401V.
R.
ofType843radio,taperecordermeasurementfilterJJG(electronic)12016-1987(10~-70)dB(10Hz~1GHz)U=0.
1dBattenuation(10~-70)dB(10Hz~1GHz)U=0.
5dB279AudioAnalyzerVoltage0413V.
R.
ofLFElectronicVoltmeterJJG782-1992(1~2.
2)mV10Hz~20Hz:U=0.
055%*RD+4.
5μV20Hz~40Hz:U=0.
021%*RD+4.
5μV40Hz~20kHz:U=0.
0105%*RD+4.
5μV20kHz~50kHz:U=0.
037%*RD+4.
5μV50kHz~100kHz:U=0.
085%*RD+7μV100kHz~300kHz:U=0.
11%*RD+13μV300kHz~500kHz:U=0.
17%*RD+25μV500kHz~1MHz:U=0.
34%*RD+25μV(2.
2~22)mV10Hz~20Hz:U=0.
055%*RD+5μV20Hz~40Hz:U=0.
021%*RD+5μV40Hz~20kHz:U=0.
0105%*RD+5μV20kHz~50kHz:U=0.
037%*RD+5μV50kHz~100kHz:U=0.
085%*RD+7μV279AudioAnalyzerVoltage0413V.
R.
ofLFElectronicVoltmeterJJG782-1992100kHz~300kHz:U=0.
11%*RD+12μV300kHz~500kHz:U=0.
17%*RD+25μV500kHz~1MHz:U=0.
34%*RD+25μV(22~220)mV10Hz~20Hz:U=0.
055%*RD+13μV20Hz~40Hz:U=0.
021%*RD+8μV40Hz~20kHz:U=0.
0105%*RD+8μV20kHz~50kHz:U=0.
032%*RD+8μV50kHz~100kHz:U=0.
085%*RD+25μV100kHz~300kHz:U=0.
11%*RD+25μV300kHz~500kHz:U=0.
17%*RD+35μV500kHz~1MHz:U=0.
34%*RD+80μV(0.
22~2.
2)V10Hz~20Hz:U=0.
050%*RD+80μV20Hz~40Hz:U=0.
016%*RD+25μV40Hz~20kHz:U=0.
01%*RD+6μV279AudioAnalyzerVoltage0413V.
R.
ofLFElectronicVoltmeterJJG782-199220kHz~50kHz:U=0.
012%*RD+16μV50kHz~100kHz:U=0.
025%*RD+70μV100kHz~300kHz:U=0.
043%*RD+130μV300kHz~500kHz:U=0.
105%*RD+350μV500kHz~1MHz:U=0.
22%*RD+850μV(2.
2~22)V10Hz~20Hz:U=0.
050%*RD+800μV20Hz~40Hz:U=0.
016%*RD+250μV40Hz~20kHz:U=0.
01%*RD+60μV20kHz~50kHz:U=0.
012%*RD+160μV50kHz~100kHz:U=0.
025%*RD+350μV100kHz~300kHz:U=0.
05%*RD+1500μV300kHz~500kHz:U=0.
125%*RD+4300μV500kHz~1MHz:U=0.
27%*RD+8500μV(22~220)V10Hz~20Hz:U=0.
050%*RD+8mV279AudioAnalyzerVoltage0413V.
R.
ofLFElectronicVoltmeterJJG782-199220Hz~40Hz:U=0.
016%*RD+2.
5mV40Hz~20kHz:U=0.
01%*RD+0.
8mV20kHz~50kHz:U=0.
022%*RD+3.
5mV50kHz~100kHz:U=0.
050%*RD+8mV100kHz~300kHz:U=0.
15%*RD+90mV300kHz~500kHz:U=0.
47%*RD+90mV500kHz~1MHz:U=1.
15%*RD+190mV(220~300)V15Hz~50Hz:U=0.
040%*RD+16mV50Hz~1kHz:U=0.
01%*RD+3.
5mVDistortion0413V.
R.
ofDistortionMeterJJG251~19970.
003%~0.
01%10Hz~1kHz:U=10%*RD+0.
0003%0.
01%~0.
02%10Hz~20kHz:U=5%*RD+0.
0003%0.
02%110Hz~10kHz:U=4%*RD+20μV0.
03%10Hz~20Hz:U=7%*RD+30μV20Hz~20kHz:U=7%*RD+20μV110Hz~10kHz:U=2%*RD+20μV0.
04%10Hz~20Hz:U=5%*RD+30μV20Hz~20kHz:U=4%*RD+20μV110Hz~10kHz:U=2%*RD+20μV0.
05%~0.
1%10Hz~20Hz:U=4%*RD+30μV20Hz~20kHz:U=3%*RD+20μV110Hz~10kHz:U=1%*RD+20μV20kHz~50kHz:U=10%*RD+30μV0.
1%~0.
3%10Hz~20Hz:U=2%*RD+30μV20Hz~20kHz:U=2%*RD+20μV110Hz~10kHz:U=0.
7%*RD+20μV20kHz~50kHz:U=4%*RD+30μV50kHz~200kHz:U=8%*RD+30μV0.
3%~100%10Hz~20Hz:U=2%*RD+30μV20Hz~20kHz:U=1%*RD+20μV110Hz~10kHz:U=0.
7%*RD+20μV20kHz~50kHz:U=2%*RD+30μV50kHz~200kHz:U=4%*RD+30μVFrequency0413V.
R.
ofLow~frequencySignalGeneratorJJG602-199610Hz~1MHzUrel=1*10-6280SemiconductorDeviceCurveTracersX-Voltage0413C.
S.
forSemiconductorDeviceCurveTracersJJF1236-20100.
1V~1000VUrel=0.
34%Y-Current10mA~10A281RFCommunicationTestSetRFFrequency0419C.
S.
forRFCommunicationTestSetJJF1065-200020kHz~40GHzUrel=1.
2*10-9RFPower+20dBm~-120dBmU=0.
25dBFM≤400kHzUrel=1.
2%AM≤99%Urel=1.
2%AFFrequency10Hz~20kHzUrel=1.
2*10-9AFLevel0V~750VUrel=0.
10%DCLevel0V~1000VUrel=0.
0063%282SiteMasterVSWR0419V.
R.
ofCoaxialSlottedLineJJG360-1984>1.
0(25MHz~3000MHz)Urel=1.
2%283ImpedanceAnalyzerFrequency0419V.
R.
ofHP4192ALFImpedanceAnalyzerJJG(Electronic)05007-19875Hz~1MHzUrel=1.
2*10-4Level0V~750VUrel=0.
10%Capacitance1pF、10pF、100pF、1000pFUrel=0.
12%Resister100W、1kW、10kW、100kWUrel=0.
12%284NetworkAnalyzerLevel0419V.
R.
ofHP3577ANetworkAnalyzerJJG(Electronic)07009-199112dBm~-36dBmU=0.
25dBAttenuation10dB~100dBU=0.
25dBFrequency10Hz~40GHzUrel=1.
2*10-9285VideoSignalGeneratorSignalLevel0416V.
R.
ofColourBarGeneratorJJG(Electronic)12002-19870.
05V~2VUrel=0.
58%ChrominancePhase0°~360°U=0.
35°BarWidth10μs~30μsU=0.
1μs286AttenuatorAttenuation0419V.
R.
ofAttenuatorinFrequencyBand10MHz~18GHzJJG387-20050dB~80dB150kHz~18GHzU=0.
25dB80dB~100dB150kHz~18GHzU=(0.
25~0.
5)dB287SpectrumAnalyzerFrequency0419V.
R.
ofSpectrumAnalyzerJJG501-200030Hz~40GHzUrel=1.
8*10-8CALAmplitude-10dBm~-20dBmUrel=0.
25dBSweepSpan0Hz,100Hz~40GHzUrel=1.
8*10-3ReferenceLevel-120dBm~30dBmUrel=0.
25dB288MeasuringReceiverPowerAttenuation0419C.
S.
ofMeasuringReceiversJJF1173-2007Power:(-127~30)dBm(150kHz~26.
5GHz)Urel=0.
25dBAttenuation:(0~100)dB(150kHz~26.
5GHz)U=0.
15dB289EMIReceiverLevel0419C.
S.
forEMITestingReceiverJJF1144-2006(-33~120)dBmV(9kHz~20GHz)Urel=0.
6dBAttenuation0dB~100dB(9kHz~20GHz)U=0.
9dBPulseLvel0dBmV~60dBmV(9kHz~1GHz)U=0.
7dBRepeatFrequencyResponse0dBmV~60dBmV(9kHz~1GHz)U=0.
8dB290LoopAntennaAntennaFactor0419Specificationsforradiodisturbanceandimmunitymeasuringapparatusandmethodspart1-4:radiodisturbanceandimmunitymeasuringapparatus—ancillaryequipment-radiateddisturbancesGB/T6113.
104-2008/CISPR16-1-4-200580dB(9kHz~30MHz)U=1dB291AbsorbingClampInsertLoss0419C.
S.
forAbsorbingClampintherangeof30Mhz-10GHzJJF1155-20060dB~30dB(30MHz~1000MHz)U=2.
5dB292FunctionGeneratorFrequency0416V.
R.
ofFunctionSignalGeneratorJJG840-199310Hz~80MHzUrel=1.
8*10-8Level-127dB~30dBmU=0.
15dB293OscilloscopeRisetime0413V.
R.
ofAnalogueOscilloscopeJJG262-19961ns~25psUrel=2%+3ps(25ps)bandwidth10MHz~20GHzUrel=5%sweeptimecoefficient(0.
2ns~50s)/divAnalogUrel=0.
6%DigitalUrel=0.
1%Verticaldeflectioncoefficient(1mV~20V)/divUrel=0.
6%294SamplingOscilloscopeRisetime0413V.
R.
of1GHzSamplingOscilloscopeJJG491-19871ns~25psUrel=2%+3psbandwidth10MHz~20GHzUrel=5%sweeptimecoefficient(0.
2ns~50s)/divUrel=0.
6%Verticaldeflectioncoefficient(1mV~5V)/divUrel=0.
6%295OscilloscopeCalibratorTime0409V.
R.
ofOscilloscopeCalibratorJJG278-20020.
2ns~5sUrel=5*10-8Amplitude10mV~200VUrel=0.
05%Voltage±(50mV~200V)Urel=2*10-5296PulseGeneratorFrequency0409V.
R.
ofPulseGeneratorJJG490-20021Hz~1000MHzUrel=0.
01%Time(Width、Delay)1ns~1sUrel=1%Amplitude(0.
1~10)VUrel=2%riseandfalledge25ps~1nsUrel=1%±5ps297HFQMeterQValue0404C.
S.
forHFQMeterJJF1073-20000~500(100kHz~50MHz)Urel=2.
5%298SignalGeneratorFrequency0416V.
R.
ofSignalGeneratorsJJG173-200330Hz~20GHzUrel=1.
8*10-8Level-127dBm~30dBmUrel=(0.
2~0.
5)dBAM≤99%Urel=1%FM≤400kHzU=1%299ModulationMeterAM0413C.
S.
ofModulationJJF1111-2003≤99%Urel=1.
2%FrequencyDeviation≤400kHzUrel=1.
2%300PowerSensorCalibrationFactor0419V.
R.
oftheCoaxialThinFilmThermoelectricPowerHeadJJG282-19810.
5mW~10mW(0.
01~26.
5)GHzUrel=(1.
6~2.
4)%301UHFElectronicMillivoltmeterVoltage0410V.
R.
ofUHFElectronicMilli-VoltmeterJJG308-19830.
2V~2V(100kHz~1GHz)Urel=1.
2%302LFElectronicVoltmeterVoltage0410V.
R.
ofLFElectronicVoltmeterJJG782-1992(1~2.
2)mV10Hz~20Hz:U=0.
055%*RD+4.
5μV20Hz~40Hz:U=0.
021%*RD+4.
5μV40Hz~20kHz:U=0.
0105%*RD+4.
5μV20kHz~50kHz:U=0.
037%*RD+4.
5μV50kHz~100kHz:U=0.
085%*RD+7μV100kHz~300kH:U=0.
11%*RD+13μV300kHz~500kH:U=0.
17%*RD+25μV500kHz~1MHz:U=0.
34%*RD+25μV(2.
2~22)mV10Hz~20Hz:U=0.
055%*RD+5μV20Hz~40Hz:U=0.
021%*RD+5μV40Hz~20kHz:U=0.
0105%*RD+5μV20kHz~50kHz:U=0.
037%*RD+5μV50kHz~100kHz:U=0.
085%*RD+7μV302LFElectronicVoltmeterVoltage0410V.
R.
ofLFElectronicVoltmeterJJG782-1992100kHz~300kHz:U=0.
11%*RD+12μV300kHz~500kHz:U=0.
17%*RD+25μV500kHz~1MHz:U=0.
34%*RD+25μV(22~220)mV10Hz~20Hz:U=0.
055%*RD+13μV20Hz~40Hz:U=0.
021%*RD+8μV40Hz~20kHz:U=0.
0105%*RD+8μV20kHz~50kHz:U=0.
032%*RD+8μV50kHz~100kHz:U=0.
085%*RD+25μV100kHz~300kHz:U=0.
11%*RD+25μV300kHz~500kHz:U=0.
17%*RD+35μV500kHz~1MHz:U=0.
34%*RD+80μV(0.
22~2.
2)V10Hz~20Hz:U=0.
050%*RD+80μV20Hz~40Hz:U=0.
016%*RD+25μV40Hz~20kHz:U=0.
0075%*RD+6μV20kHz~50kHz:U=0.
012%*RD+16μV302LFElectronicVoltmeterVoltage0410V.
R.
ofLFElectronicVoltmeterJJG782-199250kHz~100kHz:U=0.
025%*RD+70μV100kHz~300kHz:U=0.
043%*RD+130μV300kHz~500kHz:U=0.
105%*RD+350μV500kHz~1MHz:U=0.
22%*RD+850μV(2.
2~22)V10Hz~20Hz:U=0.
050%*RD+800μV20Hz~40Hz:U=0.
016%*RD+250μV40Hz~20kHz:U=0.
01%*RD+60μV20kHz~50kHz:U=0.
012%*RD+160μV50kHz~100kHz:U=0.
025%*RD+350μV100kHz~300kHz:U=0.
05%*RD+1500μV300kHz~500kHz:U=0.
125%*RD+4300μV500kHz~1MHz:U=0.
27%*RD+8500μV(22~220)V10Hz~20Hz:U=0.
050%*RD+8mV20Hz~40Hz:U=0.
016%*RD+2.
5mV302LFElectronicVoltmeterVoltage0410V.
R.
ofLFElectronicVoltmeterJJG782-199240Hz~20kHz:U=0.
01%*RD+0.
8mV20kHz~50kHz:U=0.
022%*RD+3.
5mV50kHz~100kHz:U=0.
050%*RD+8mV100kHz~300kHz:U=0.
15%*RD+90mV300kHz~500kHz:U=0.
47%*RD+90mV500kHz~1MHz:U=1.
15%*RD+190mV(220~1000)V15Hz~50Hz:U=0.
040%*RD+16mV50Hz~1kHz:U=0.
01%*RD+3.
5mV(1~1.
1)mV1MHz~1.
2MHz:U=0.
2%*RD+3μV1.
2MHz~2MHz:U=0.
2%*RD+3μV2MHz~10MHz:U=0.
4%*RD+3μV10MHz~20MHz:U=0.
6%*RD+3μV20MHz~30MHz:U=10.
5%*RD+15μV(1.
1~3)mV1MHz~1.
2MHz:U=0.
1%*RD+3μV1.
2MHz~2MHz:U=0.
1%*RD+3μV2MHz~10MHz:U=0.
3%*RD+3μV10MHz~20MHz:U=0.
5%*RD+3μV302LFElectronicVoltmeterVoltage0410V.
R.
ofLFElectronicVoltmeterJJG782-199220MHz~30MHz:U=10.
5%*RD+3μV3mV~7V1MHz~1.
2MHz:U=0.
1%*RD+3μV1.
2MHz~2MHz:U=0.
1%+3μV2MHz~10MHz:U=0.
2%*RD+3μV10MHz~20MHz:U=0.
4%*RD+3μV20MHz~30MHz:U=1%*RD+3μV303InterferenceandFieldStrengthMeasuringInstrumentLevelAttenuation0419V.
R.
ofModelRR-2AInterferenceandFieldStrengthMeasuringInstrumentJJG358-19840dBmV~120dBmV(10Hz~18GHz)U=0.
50dB(0~120)dB(10Hz~18GHz)U=0.
35dB304DistortionMeterDistortion0413V.
R.
ofDistortionMeterJJG251-19970.
003%~0.
01%10Hz~1kHz:U=10%*RD+0.
0003%0.
01%~0.
02%10Hz~20kHz:U=5%*RD+0.
0003%0.
02%110Hz~10kHz:U=4%*RD+0.
0002%0.
03%10Hz~20Hz:U=7%*RD+0.
0003%20Hz~20kHz:U=7%*RD+0.
0002%110Hz~10kHz:U=2%*RD+0.
0002%0.
04%10Hz~20Hz:U=5%*RD+0.
0003%20Hz~20kHz:U=4%*RD+0.
0002%110Hz~10kHz:U=2%*RD+0.
0002%0.
05%~0.
1%10Hz~20Hz:U=4%*RD+0.
0003%20Hz~20kHz:U=3%*RD+0.
0002%110Hz~10kHz:U=1%*RD+0.
0002%20kHz~50kHz:U=10%*RD+0.
0003%0.
1%~0.
3%10Hz~20Hz:U=2%*RD+0.
0003%20Hz~20kHz:U=2%*RD+0.
0002%110Hz~10kHz:U=0.
7%*RD+0.
0002%20kHz~50kHz:U=4%*RD+0.
0003%50kHz~200kHz:U=8%*RD+0.
0003%0.
3%~100%10Hz~20Hz:U=2%*RD+0.
0003%20Hz~20kHz:U=1%*RD+0.
0002%20kHz~50kHz:U=2%*RD+0.
0003%50kHz~200kHz:U=4%*RD+0.
0003%305ElectrostaticDischargeGeneratorPeakCurrent0421techniquesElectrostaticdischargeimmunitytestGB/T17626.
2-2006(0~112.
5)A(convertedby(0~30)kVUrel=6%RiseTime0.
1ns~100sUrel=8%306ElectricalFastTransient/BurstGeneratorPeakVoltage0421ElectromagneticcompatibilityTestingandmeasurementtechniquesElectricalfasttransient/burstimmunitytestGB/T17626.
4-2008(0~8)kVUrel=5%RiseTime0.
5ns~100sUrel=7%DurationTime0.
5ns~100sUrel=5%RepetionFrequency0.
5ns~100sUrel=4%Transient/BurstPeriod0.
5ns~100sUrel=4%Transient/BurstDurationTime0.
5ns~100sUrel=4%307SurgeGeneratorOpen-circuitVoltage0421ElectromagneticcompatibilityTestingandmeasurementtechniquesSurgeimmunitytestGB/T17626.
5-2008(0-40)kVUrel=5%RiseTime0.
5ns~100sUrel=5%DurationTime0.
5ns~100sUrel=4%Short-circuitCurrent(0-20)kAUrel=5%308harmonicmeasurementinstrumentharmonicvoltageharmoniccurrent0413ElectromagneticcompatibilityTestingandmeasurementtechniquesGeneralguideonharmonicsandinterharmonicsmeasurementsandinstrumentation,forpowerGB/T17626.
7-2008(0~504)V/(2~100th)Urel=0.
35%(0~24)A/(2~100th)Urel=0.
5%309voltagedipsgeneratoroutputvoltage0421Electromaneticcompatibility-Testingandmeasurementtechniques-Voltagedips,shortinterruptionsandvoltagevariationsimmunitytestGB/T17626.
11-2008(0~2.
5)kVUrel=3%risetime0.
5ns~100sUrel=4%fulltime0.
5ns~100sUrel=4%timeatreducedvoltage0.
5ns~100sUrel=4%310ringwavegenerator(dampedoscillatorywavegenerator)open-circuitvoltage0421Electromaneticcompatibility-Testingandmeasurementtechniques-OscillatorywavesimmunitytestGB/T17626.
12-1998(0~40)kVUrel=5%decaying(0~40)kVUrel=5%oscillationfrequency0.
5ns~100sUrel=4%risetime0.
5ns~100sUrel=5%short-circuitcurrent(0~20)kAUrel=5%311PowerfrequencymagneticfieldimmunitytestinductioncoilMagneticFieldstrength0424Electromaneticcompatibility-Testingandmeasurementtechniques-PowerfrequencymagneticfieldimmunitytestGB/T17626.
8-20061A/m、3A/m、10A/m、30A/m、100A/m、300A/m、1000A/mUrel=0.
8dBInductioncoilfactor0.
1~1000Urel=1dB312AmplifierPoweroutputmaximum0419V.
R.
ofFW3microwaveAmplifierJJG(electric)09008-19891W≤P≤100W(9kHz≤f≤1000MHz)1W≤P≤25W(1GHz≤f≤18GHz)Urel=0.
25dBPowergain≥20dBUrel=0.
25dB313ArtificialMainsNetworkimpedance0419Specificationsforradiodisturbanceandimmunitymeasuringapparatusandmethodspart1-2:radiodisturbanceandimmunitymeasuringapparatus—ancillaryequipment—conducteddisturbancesGB/T6113.
102-2008/CISPR16-1-2-200610Hz~300MHzUrel=3.
6%Voltagedivisionfactor041910Hz~300MHz(-100~20)dBmU=0.
06dB314HighFrequencyLC-MeterInductance0406V.
R.
ofHighFrequencyLC-MeterTypeLCCG-1JJG197-19791μH~100mHUrel=0.
6%Capacitance(100-2000)pFUrel=0.
6%315WowFlutterMeterWowFlutter0419V.
R.
ofofWowFlutterMeterJJG47-1990(0~3.
999)%Urel=0.
2%316ErrorTesterInternalClockFrequency0419C.
S.
forSDH/PDHTransmissionAnalyzerJJF1237-20102Mbit/sUrel=2*10-8OutputsignalAmplitude0.
1V-3VUrel=2.
5%317DigitalMobiletelecommunicationanalyzerFrequency0419C.
S.
forTDMA(GSM)RadioCommunicationtesterJJF1131-200510MHz~3GHzTransmit:U=1*10-7Receive:U=1.
2*10-7Level(-127~15)dBmUrel=0.
30dBHarmonic、sub-harmonic、non-harmonic(-127~30)dBmUrel=1dBPhasenoise(-127~30)dBmUrel=1dBDigitalmodulation800MHz~3GHzpeakphaseerror:U=1°rmsphaseerror:U=0.
3°Amplitudeflatness:U=0.
10dBRho:U=0.
0008Freq.
error:U=1HzEVM:U=0.
5%Powermeter(-120~30)dBm(800MHz~3GHz)Urel=0.
30dB317DigitalMobiletelecommunicationanalyzerDigitalmodulationAnalyzing0419C.
S.
forTDMA(GSM)RadioCommunicationtesterJJF1131-2005800MHz~3GHzpeakphaseerror:U=1°rmsphaseerror:U=0.
3°(Amplitudeflatness:U=0.
10dBRho:U=0.
0008Freq.
error:U=1HzEVM:U=0.
5%Adjacentleakagepowermeasurement250kHz~3GHz(-120~10)dBmUrel=0.
5dBOccupiedbandwidth250kHz~3GHz(-120~10)dBmUrel=0.
5dBAudioFrequency50Hz~5kHzU=0.
001HzAudioLevel(50~5000)mVUrel=0.
5%Audiodistortion(0~100)%(50Hz~200kHz50mV~5000mV)Urel=1dBAudioFrequencymeasurement50Hz~5kHzU=0.
006HzAudiolevelmeasurement(5~5000)mVUrel=0.
6%317DigitalMobiletelecommunicationanalyzerAudiodistortionmeasurement0419C.
S.
forTDMA(GSM)RadioCommunicationtesterJJF1131-20050.
1%~50%(5~5000)mVUrel=1dBVSWR1.
01~5(100MHz~3GHz)Urel=1dB318VectorsignalanalyzerReferenceoutputfrequency0419C.
S.
forVectorSignalAnalyzerJJF1128-200410MHz~8GHzUrel=1*10-7Frequencymeasurement10MHz~8GHzUrel=1*10-7Carrierlevelmeasurement(-127~15)dBmUrel=0.
30dBCarrierlevelmeasurementlinearity(-100~10)dBmUrel=0.
15dB2portamplitudeunbalance(-100~10)dBmUrel=0.
4dBVectorsignalanalyzingerror800MHz~8GHzEVM:U=0.
5%(rms)Freqerror:U=1Hzpeakphaseerror:U=1°rmsphaseerror:U=0.
3°3rdintermodulationdistortion(-50~10)dBm(800MHz~3GHz)Urel=1dBInputportharmonics250kHz~8GHz(-50~10)dBmUrel=1dBInternalnoiseofinputport250kHz~8GHzUrel=1dBVSWR1.
01~5(800MHz~8GHz)Urel=1dB319TelephoneAnalyzerDTMFfrequency0419VerificationRegulationofToneTelephoneAnalyzerJJG(YD)032-1995100Hz~2kHzUrel=0.
1%Ringvoltage-50dBm~10dBmUrel=0.
3dB320BluetoothtestsetOutputfrequency0419CalibrationSpecificationforVectorSignalAnalyzerJJF1128-2004CalibrationSpecificationforTDMA-GSMRadioCommunicationTesterJJF1131-20050.
01Hz~3GHzUrel=5*10-8Outputlevel(-127~30)dBmUrel=0.
3dBOutputfrequencyresponse-60dBm~20dBmUrel=0.
3dB2nd、3rdHarminic(-127~30)dBmUrel=1dBSinglesidephasenoise(-127~30)dBmUrel=1dBFSKModulationdeviationCalibrationSpecificationforVectorSignalAnalyzerJJF1128-2004CalibrationSpecificationforTDMA-GSMRadioCommunicationTesterJJF1131-200510MHz~26.
5GHz/(10dBm~-80dBm)U=0.
5kHzFSKModulation10MHz~26.
5GHz/(10dBm~-80dBm)EVM(RMS):U=1.
5%Frequencymeasuring(-127~30)dBmUrel=5*10-8Levelmeasuring(-127~30)dBmUrel=0.
3dBInputfrequencyresponse(-127~30)dBmUrel=0.
3dBReturnloss(0~35)dBUrel=1dB321WLANtestsetOutputfrequency0419CalibrationSpecificationforVectorSignalAnalyzerJJF1128-2004CalibrationSpecificationforTDMA-GSMRadioCommunicationTesterJJF1131-20050.
01Hz~13GHzUrel=5*10-8Outputlevel(-127~30)dBmUrel=0.
3dB2nd、3rdharmonics(-127~30)dBmUrel=1dBSingle-sidephasenoise(-127~30)dBmUrel=1dBModulation10MHz~26.
5GHz(10dBm~-80dBm)EVM(RMS):U=2%Levelmeasuring(-127~30)dBmUrel=0.
3dBModulationanalysis(-127~30)dBmEVM(RMS:)U=2%ReturnLoss40MHz~18GHzUrel=1dB322RubidiumGASCellFrequencyFrequency0412V.
R.
ofRubidiumGASCellFrequencyJJG292-20090.
1MHz1MHz5MHz10MHz100MHzUrel=5*10-13323TelephoneAccountersTime0412V.
R.
ofSingleandDispersionControlCentrelyTelephoneAccountersJJG107-2002(0.
01~3600)sU=0.
1s324TelephoneAccountTesterTime0412V.
R.
ofVerifyingInstrumentforSingleandDispersionControlledCentrallyTelephoneAccounterJJG983-20031MHz5MHz(0.
01~3600)sUrel=5.
8*10-10325TimingandchargingdeviceforICcardpublictelephonetime0412V.
R.
ofTimingandchargingdeviceforICcardpublictelephoneJJG977-2003(0.
01~3600)sU=(0.
01+5T*10-5)s326TimeIntervalMeasuringInstrumentwithNeedleTime0412V.
R.
ofTimeIntervalMeasuringInstrumentwithNeedleIndicationJJG237-1995(1~3600)sUrel=3*10-7327DigitalTimeIntervalMeasuringInstrumentFrequency0412V.
R.
ofDigitalTimeIntervalMeasuringInstrumentJJG238-19951MHz、5MHzUrel=5.
8*10-10Time(0~18000)sUrel=3*10-7328WatchTesterFrequency0412V.
R.
ofWatchTesterJJG488-2008(0.
00~9.
99)s/d;(0.
0~99.
9)s/d;(0~999)s/dUrel=5.
8*10-10329CrystalOscillator(UniversalCounter)Frequency0412V.
R.
ofCrystalOscillatorInsidetheElectricalMeasurementInstrumentJJG180-2002V.
R.
ofUniversalCountersJJG349-20011MHz、5MHz、10MHz、(0~1)GHzUrel=5.
8*10-10330DigitalTransmissionanalyzerOutputwaveform0419C.
S.
forSDH/PDHTransmissionAnalyzerJJF1237-2010(0.
1~3)V(2Mbit/s~155Mbit/s)Urel=2.
5%Exceptfor2Mbit/s120ΩReturnlossofinputport(electrical)(0~45)dB(2Mbit/s~155Mbit/s)Urel=1dBInternalClockFrequency2Mbit/s~2.
5Gbit/sUrel=2*10-8Returnlossofinputport(Optical)(0~45)dB(155Mbit/s~2.
5Gbit/s)Urel=2dBAveragetransmittingopticalpower(-40~10)dBm1310nm/1550nmUrel=0.
2dBSensitivityofreceiver(-45~-20)dBmUrel=0.
5dBEyediagram155Mbit/s~2.
5Gbit/sUrel=0.
15dBExtinguishratio(0~30)dBU=0.
5dBJittergeneration/measurement(0~20)UIp-pU=0.
5%(Electrical)U=0.
6%(Optical)331TelecommunicationOpticalPowerMeterOpticalpower0430V.
R.
ofOpticalPowerMeterinTelecommunicationJJG965-2001VerificationRegulationofOpticalPowerMeterinLowPowerRangeJJG(YD)040-2006(600~1600)nm;(-70~10)dBmUrel=0.
17dB332TelecommunicationopticalattenuatorOpticalattenuator0430C.
S.
ofOpticalAttenuatorforTelecommunicationsJJF1199-2008(1310±20)nm;(1550±20)nm;(0~60)dBUrel=0.
05dB/10dB333TelecommunicationstabileopticalpowersourceOutputpower0430V.
R.
ofStabilizedLaserSourceforOpticalTransmitJJG958-2000(-70~10)dBm850nm/1310nm/1550nmUrel=0.
17dBStabilityofoutputpower0430Urel=0.
005dBOpticalspectrum0430Urel=2.
5*10-5334OpticalspectrumanalyzerOpticalWavelengthmeasurement0430V.
R.
ofOpticalSpectrumAnalyzersinTelecommunicationJJG1035-2008(600~1750)nmU=0.
05nmOpticalpowermeasurement0430(-60~10)dBm(600nm~1750nm)Urel=0.
20dBRBW04300.
05nm~1nmU=0.
05nm335OpticalReturnloss(Backreflection)meterOpticalpowermeasurement0419V.
R.
ofOpticalPowerMeterinTelecommunicationJJG965-2001V.
R.
ofStabilizedLaserSourceforOpticalTransmitJJG958-2000(-70~10)dBmUrel=0.
17dBOutputopticalpower(-70~10)dBmUrel=0.
17dBOutputpowerstability(-70~10)dBmUrel=0.
17dBOpticalspectrum(600~1750)nmUrel=2.
5*10-5(wavelength)Opticalreturnloss(backreflection)(0~65)dBUrel=0.
6dB336LaserEnergyMeterSensitivity1621V.
R.
oflaserenergymeterJJG312-1983A/J,V/J,读数/JUrel=4%(0.
19~20)μm;0.
1mJ~0.
01J;Urel=5.
2%Laserenergy(10-2~20)JUrel=4%(20~300)JUrel=5.
2%337WhitenessMeterWhiteness(orY)1613V.
R.
ofWhitenessMeterJJG512-20020~100U=1.
7(U(R457))338ReflectometryReflectivity(orY)1613CalibrationSpecificationforReflectometersJJF1232-2009ρ:(0~100)%U=1.
7(U(Y))339LovibondComparableColormeterLovibondChromaticness1613V.
R.
ofLovibondComparableColormeterJJG758-1991(0.
1~79.
9)LovibondunitU=0.
6Lovibondunit340ColormetersandColorDifferenceMetersChromaticness1613V.
R.
ofColormetersandColorDifferenceMetersJJG595-2002Y:0~100x,y:U(Y)=1.
7U(x),U(y)=0.
0045341OpticalWavelengthCountersinTelecommunicationOpticalWavelength0430V.
R.
ofOpticalWavelengthCountersinTelecommunicationJJG963-2001633nm(1440~1640)nm633nm:Urel=1.
12*10-7(1440~1640)nmU=2.
9pm342OpticalTimeDomainReflectometer(OTDR)Distance0430V.
R.
ofOpticalTimeDomainReflectometerJJG959-20011310nm1550nm(1~3)kmU=0.
10m(1310nm)U=0.
09m(1550nm)LossMeasurement1310nm1550nm(0.
5~1)dBUrel=0.
019dB/dB(1310nm)Urel=0.
033dB/dB(1550nm)343ColorStandardPlatesChromaticness1613V.
R.
ofColorStandardPlatesJJG453-2002Y:0~100x,yU(Y)=1.
8U(x),U(y)=0.
0046344HearRadiometerCorrectnessFactorC1621CalibrationofHearRadiometerJCJ/F431005.
1/0-2006(0.
002~3.
6)kW/m2Urel=1.
6%345Transmittance/HazemeterTransmittance1613C.
S.
forTransmittance&HazemeterJCJ/F431004.
1/0-2006(0~100.
0)%U=1.
1%Haze(0~30)%U=0.
31%346UltravioletIrradianceMeter(Energymeter)Irradiance1606V.
R.
ofUltravioletIrradianceMetersJJG879-2002C.
S.
forUltravioletIrradianceMeters(Energymeter)JCJ/F411001.
1/0-2006100J:Urel=2.
6%;≤100J:U=2.
6J478LaserdiodedriverElectricalcurrentsettingvalue0410V.
SofDCstandardcurrentsourceJJG(航天)38-1987(0~3)AUrel=0.
07%Electricalcurrentlimitsetting(0~3)AUrel=0.
07%479OpticaloscilloscopeOpticalpowermeasurement0430V.
RofopticalpowermeterintelecommunicationJJG965-2001V.
RofAnalogueoscilloscopeJJG262-1996(-40~5)dBm/(850nm,1310nm,1550nm)Urel=0.
17dBSweeptime1ns~1msUrel=0.
1%480BlackandwhitesteptabletDensity1613V.
R.
ofBlackandwhitesteptabletJJG452-2006D:0.
000~4.
000(0.
000~2.
000)U=0.
007;(2.
000~4.
000)U=0.
013481GasChromatography-MassSpectrometersSensitivity0236C.
SforBenchTopGasChromatography-MassSpectrometersJJF1164-200610~5000Urel=7.
9%482ELISAAnalyticalInstrumentsAbsorbance0236V.
R.
forELISAAnalyticalInstrumentsJJG861-2007(0~2)AU=0.
012A483ElectrolyteAnalyzersConcentration0236V.
RforElectrolyteAnalyzersJJG1051-2009K:(0~168.
3)mg/kgNa:(0~3151)mg/kgCl:(0~3520)mg/kgK:Urel=2.
3%Na:Urel=1.
8%Cl:Urel=1.
6%484Channelvehicleradioactivitymonitoringsystemsactivityresponse1620C.
SforChannelvehicleradioactivitymonitoringsystemsJJF1248-20109*10-4~9*10-2s-1·Bq-1Urel=5.
0%485Pedestrian&luggageradioactivitymonitoringdeviceactivityresponse1620C.
SforPedestrian&luggageradioactivitymonitoringdeviceJCJ/H001006.
1-20108*10-4~8*10-2s-1·Bq-1Urel=4.
6%486X-rayinspectionsystemairkermarate1620C.
SforX-rayinspectionsystemJCJ/H001007.
1-2010(0.
1~100)mGy/minUrel=5.
5%487AutomatedResistance(Thermometry)BridgeRatioofResistance0411VerificationRegulationofD.
C.
ComparatorBridgeJJG506-1987supplementfileofCalibrationmethodforAutomatedResistance(Thermometry)BridgeJCE/F271002.
1/0-20100.
1Ω:0.
1Ω~100MΩ:100MΩU=5*10-8488HighVoltageElectrostaticVoltmetersvoltage0411VerificationRegulationofHighVoltageElectrostaticVoltmetersJJG494-2005(0~30)kVAC:Urel=0.
34%DC:Urel=0.
26%489TonometersMass1320VerificationRegulationofImpressionTonometersJJG574-2004(0~210)gU=0.
024gDisplacementVerificationRegulationofImpressionTonometersJJG574-2004(0~25)mmU=0.
001mm中国合格评定国家认可委员会认可证书(注册号:CNASL0134)名称:上海市计量测试技术研究院(华东国家计量测试中心/中国上海测试中心)地址:上海市张衡路1500号签发日期:2009年08月21日有效期至:2012年08月20日更新日期:2012年02月10日3-1认可的授权签字人及领域序号姓名授权签字领域备注1余培英长度、力学和声学检测与校准项目2印保靖长度、力学和声学检测与校准项目3傅云霞长度、力学和声学检测与校准项目4姜志华长度、力学和声学检测与校准项目5虞伟良长度、力学和声学检测与校准项目6马建敏长度、力学和声学检测与校准项目7张鸿顺长度检测与校准项目8吴志群在线检测、温度仪表、万能量具、小容量、压力、测力、电学的检测与校准项目9余国瑞在线检测、温度仪表、万能量具、小容量、压力、测力、电学的检测与校准项目10张红温度仪表、万能量具、压力、测力、电学的检测与校准项目11凌彦萃温度仪表、万能量具、压力、测力、电学的检测与校准项目.
12许景阳万能量具、压力、小容量的检测与校准项目13张进明温度、湿度、压力、真空、流量、中大容量、黏度、密度检测与校准项目14张翊温度、湿度、压力、真空、流量、中大容量、黏度、密度检测与校准项目15任学弟温度、湿度、压力、真空、流量、中大容量、黏度、密度检测与校准项目16史国豪温度、湿度、压力、真空、流量、中大容量、黏度、密度检测与校准项目17吕红温度、湿度检测与校准项目18张文东温度、湿度检测与校准项目19胡安伦压力、真空检测与校准项目20朱绚华黏度、密度检测与校准项目21陈超流量、中大容量检测与校准项目22王灿流量、中大容量检测与校准项目23来磊电磁、无线电、光学、时间频率全部检测与校准项目24石雷兵电磁、无线电、光学、时间频率全部检测与校准项目25叶军安光学全部检测与校准项目26黄玉珲无线电、时间频率全部检测与校准项目27朱剑平电磁全部检测与校准项目28王炜电磁全部检测与校准项目29桑昱无线电、时间频率、电磁、光学检测与校准项目30任淑贞化学与电离辐射的校准与检测项目31龚飞雁化学与电离辐射的校准与检测项目32眭国平化学与电离辐射的校准与检测项目33唐方东电离辐射校准与检测项目34杨曙平化学校准与检测项目35蔡建华气体分析仪与气体检测报警器的检测与校准项目36丁敏电化学类、光谱类和色谱类等化学仪器的检测与校准项目37张波电化学类、光谱类和色谱类等化学仪器的检测与校准项目38王虎理化分析检测、化工品运输危险特性分析检测项目39陈鹰理化分析检测、化工品运输危险特性分析检测项目CHINANATIONALACCREDITATIONSERVICEFORCONFORMITYASSESSMENTAPPENDIXOFACCREDITATIONCERTIFICATE(RegistrationNo.
CNASL0134)NAME:ShanghaiInstituteofMeasurementandTestingTechnology(NationalCenterofMeasruementandTestingforEastChina/NationalCenterofTestingTechnology,Shanghai)ADDRESS:No.
1500,ZhanghengRoad,Shanghai,ChinaDateofIssue:2009-08-21DateofExpiry:2012-08-20DateofUpdate:2012-02-10APPENDIX3-1ACCREDITEDSIGNATORIESANDSCOPE№NameAuthorizedScopeofSignatureNote1YuPeiyingCalibrationandTestItemsforGeometry,Mechanics,Acoustic2YinBaojingCalibrationandTestItemsforGeometry,Mechanics,Acoustic3FuYunxiaCalibrationandTestItemsforGeometry,Mechanics,Acoustic4JiangZhihuaCalibrationandTestItemsforGeometry,Mechanics,Acoustic5YuWeiliangCalibrationandTestItemsforGeometry,Mechanics,Acoustic6MaJianminCalibrationandTestItemsforGeometry,Mechanics,Acoustic7ZhangHongshunCalibrationandTestItemsforGeometry8WuZhiqunTestandcalibrationitemsforon-linetest,temperature,length,capacity,pressure,force,electricity.
9YuGuoruiTestandcalibrationitemsforon-linetest,temperature,length,capacity,pressure,force,electricity.
10ZhangHongTestandcalibrationitemsfortemperature,length,pressure,force,electricity.
11LingYancuiTestandcalibrationitemsfortemperature,length,pressure,force,electricity.
12XuJingyangTestandcalibrationitemsforlength,pressure,capacity13ZhangJinmingTestandCalibrationprogramforTemperature、Humidity、Pressure、Vacuum、Flow、MiddleandLargeCapacity、ViscosityandDensity14ZhangYiTestandCalibrationprogramforTemperature、Humidity、Pressure、Vacuum、Flow、MiddleandLargeCapacity、ViscosityandDensity15RenXuediTestandCalibrationprogramforTemperature、Humidity、Pressure、Vacuum、Flow、MiddleandLargeCapacity、ViscosityandDensity16ShiGuohaoTestandCalibrationprogramforTemperature、Humidity、Pressure、Vacuum、Flow、MiddleandLargeCapacity、ViscosityandDensity17LvHongTestandCalibrationprogramforTemperatureandHumidity18ZhangWendongCalibrationandTestItemsfortemperature,humidity19HuAnlunTestandCalibrationprogramforPressureandVacuum20ZhuXuanhuaCalibrationandTestItemsforviscosity&density21ChenChaoTestandCalibrationprogramforFlow、MiddleandLargeCapacity22WangCanTestandCalibrationprogramforFlow、MiddleandLargeCapacity23LaiLeiCalibrationandTestItemsforElectromagnetism,radio,Optics,time&frequency24ShiLeibingCalibrationandTestItemsforElectromagnetism,radio,Optics,time&frequency25YeJunanCalibrationandTestItemsforOptics26HuangyuhuiCalibrationandTestItemsforradio,time&frequency27ZhujianpingCalibrationandTestItemsforElectromagnetism28WangweiCalibrationandTestItemsforElectromagnetism29SangyuCalibrationandTestItemsforElectromagnetism,radio,time&frequency,Optics30RenShuzhenCalibrationandTestItemsforChemicalandIonizingRadiation31GongFeiyanCalibrationandTestItemsforChemicalandIonizingRadiation32SuiGuopingCalibrationandTestItemsforChemicalandIonizingRadiation33TangFangdongCalibrationandTestItemsforIonizingRadiation34YangShupingCalibrationandTestItemsforChemicalMetrology35CaiJianhuaCalibrationandTestItemsforGasanalyzerandGasalarmdetector36DingMinCalibrationandTestItemsforElectrochemicalinstruments,ChromatographicinstrumentsandSpectroscopyinstruments37ZhangBoCalibrationandTestItemsforElectrochemicalinstruments,ChromatographicinstrumentsandSpectroscopyinstruments38WangHuTestitemsforphysical&chemicalanalysis,dangerousgoodspropertiesanalysis.
39ChenyingTestitemsforphysical&chemicalanalysis,dangerousgoodspropertiesanalysis.
中国合格评定国家认可委员会认可证书(注册号:CNASL0134)名称:上海市计量测试技术研究院(华东国家计量测试中心/中国上海测试中心)地址:上海市宜山路716号签发日期:2009年08月21日有效期至:2012年08月20日更新日期:2011年06月01日1-2认可的检测能力范围序号检测对象项目/参数领域代码检测标准(方法)名称及编号(含年号)限制范围说明序号名称1金银铂制(饰)品1指环尺寸0201首饰指环尺寸的定义、测量和命名GB/T11888-20012质量贵金属饰品质量测量允差的规定QB/T1690-20043密度贵金属及其合金密度的测试方法GB/T1423-19961金银铂制(饰)品4含量(成色/纯度)0201首饰贵金属纯度的规定及命名方法GB11887-2008首饰贵金属含量的测定X射线荧光光谱法GB/T18043-2008黄金制品金含量无损测定方法第2部分:综合测定方法GB/T17363.
2-2009金合金首饰金含量的测定灰吹法(火试金法)GB/T9288-2006首饰含银量化学分析方法GB/T11886-2001金化学分析方法金量的测定火试金法GB/T11066.
1-2008金化学分析方法银量的测定火焰原子吸收光谱法GB/T11066.
2-2008金化学分析方法铁量的测定火焰原子吸收光谱法GB/T11066.
3-2008金化学分析方法铜、铅和铋量的测定火焰原子吸收光谱法GB/T11066.
4-2008金化学分析方法银、铜、铁、铅、锑和铋量的测定火焰原子吸收光谱法GB/T11066.
5-20081金银铂制(饰)品4含量(成色/纯度)0201银化学分析方法银量的测定氯化银沉淀-火焰原子吸收光谱法GB/T11067.
1-2006银化学分析方法铜量的测定火焰原子吸收光谱法GB/T11067.
2-2006银化学分析方法硒和碲量的测定电感耦合等离子体原子发射光谱法GB/T11067.
3-2006银化学分析方法锑量的测定电感耦合等离子体原子发射光谱法GB/T11067.
4-2006银化学分析方法铅和铋量的测定火焰原子吸收光谱法GB/T11067.
5-2006银化学分析方法铁量的测定火焰原子吸收光谱法GB/T11067.
6-2006贵金属饰品术语QB/T1689-2006贵金属饰品QB/T2062-2006银合金首饰银含量的测定溴化钾容量法(电位滴定法)GB/T17832-20081金银铂制(饰)品4含量(成色/纯度)0201化学试剂电位滴定法通则GB/T9725-2007铂合金首饰铂、钯含量的测定氯铂酸铵重量法和丁二酮肟重量法GB/T19720-2005贵金属合金首饰中贵金属含量的测定ICP光谱法第4部分:999‰贵金属合金首饰贵金属含量的测定差减法GB/T21198.
4-2007贵金属合金首饰中贵金属含量的测定ICP光谱法第5部分:999‰银合金首饰银含量的测定差减法GB/T21198.
5-2007贵金属合金首饰中贵金属含量的测定ICP光谱法第6部分:差减法GB/T21198.
6-2007电感耦合等离子体发射光谱EPA6010C-2007首饰镍释放量的测定光谱法GB/T19719-2005首饰镍含量的测定火焰原子吸收光谱法GB/T19718-2005原子吸收光谱分析法通则GB/T15337-20085覆盖层厚度0202金属覆盖层覆盖层厚度测量X射线光谱方法GB/T16921-2005首饰金覆盖层厚度的测定方法化学法QB/T1133-1991首饰银覆盖层厚度的测定方法化学法QB/T1134-1991首饰金、银覆盖层厚度的测定X射线荧光光谱法QB/T1135-2006轻工产品金属镀层和化学处理层的厚度测试方法金相显微镜法QB/T3817-1999首饰金覆盖层厚度的规定QB1131-2005首饰银覆盖层厚度的规定QB1132-20051几何尺寸0201贵金属及其合金材料几何尺寸测量方法GB/T15077-20082密度贵金属及其合金密度测试方法GB/T1423-19962金银铂材料及其合金3含量(成色/纯度)0201冶金产品分析方法X射线荧光光谱法通则GB/T16597-1996金化学分析方法金量的测定火试金法GB/T11066.
1-2008金化学分析方法银量的测定火焰原子吸收光谱法GB/T11066.
2-2008金化学分析方法铁量的测定火焰原子吸收光谱法GB/T11066.
3-2008金化学分析方法铜、铅和铋量的测定火焰原子吸收光谱法GB/T11066.
4-2008金化学分析方法银、铜、铁、铅、锑和铋量的测定火焰原子吸收光谱法GB/T11066.
5-2008银化学分析方法银量的测定氯化银沉淀-火焰原子吸收光谱法GB/T11067.
1-20062金银铂材料及其合金3含量(成色/纯度)0201银化学分析方法铜量的测定火焰原子吸收光谱法GB/T11067.
2-2006银化学分析方法硒和碲量的测定电感耦合等离子体原子发射光谱法GB/T11067.
3-2006银化学分析方法锑量的测定电感耦合等离子体原子发射光谱法GB/T11067.
4-2006银化学分析方法铅和铋量的测定火焰原子吸收光谱法GB/T11067.
5-2006银化学分析方法铁量的测定火焰原子吸收光谱法GB/T11067.
6-2006金箔QB/T1734-2008金锭GB/T4134-2003银GB/T4135-2002金饰工艺画第1部分:金膜画金层QB/T2630.
1-2004金饰工艺画第2部分:金箔画金层QB/T2630.
2-2004不测结合强度检验2金银铂材料及其合金3含量(成色/纯度)0201银合金首饰银含量的测定溴化钾容量法(电位滴定法)GB/T17832-2008化学试剂电位滴定法通则GB/T9725-2007铂合金首饰铂、钯含量的测定氯铂酸铵重量法和丁二酮肟重量法GB/T19720-2005贵金属合金首饰中贵金属含量的测定ICP光谱法第4部分:999‰贵金属合金首饰贵金属含量的测定差减法GB/T21198.
4-2007贵金属合金首饰中贵金属含量的测定ICP光谱法第5部分:999‰银合金首饰银含量的测定差减法GB/T21198.
5-2007贵金属合金首饰中贵金属含量的测定ICP光谱法第6部分:差减法GB/T21198.
6-2007电感耦合等离子体发射光谱EPA6010C-2007首饰镍释放量的测定光谱法GB/T19719-2005首饰镍含量的测定火焰原子吸收光谱法GB/T19718-2005原子吸收光谱分析法通则GB/T15337-2008海绵铂GB/T1419-20044覆盖层厚度0202金属覆盖层覆盖层厚度测量X射线光谱方法GB/T16921-2005轻工产品金属镀层和化学处理层的厚度测试方法金相显微镜法QB/T3817-1999金饰工艺画第1部分:金膜画金层QB/T2630.
1-2004金饰工艺画第2部分:金箔画金层QB/T2630.
2-2004不测结合强度检验3金属、合金及固体材料1金相组织形态和分布状态,各种材料显微形貌图像的拍摄0201金属平均晶粒度测定方法GB/T6394-2002金属显微组织检验方法GB/T13298-1991合金工具钢GB/T1299-20004粉末1微小颗粒形态观察及尺寸0244粒子尺寸分布的测定方法第4部分:显微镜和图象分析方法的导则BS3406-4:1993(R2007)5钯制(饰)品1含量(成色/纯度)0201首饰贵金属纯度的规定ISO9202:1991(E)首饰贵金属纯度的规定及命名方法GB11887-2008首饰贵金属含量的测定X射线荧光光谱法GB/T18043-2008铂合金首饰铂、钯含量的测定氯铂酸铵重量法和丁二酮肟重量法GB/T19720-2005贵金属合金首饰中贵金属含量的测定ICP光谱法第4部分:999‰贵金属合金首饰贵金属含量的测定差减法GB/T21198.
4-2007贵金属合金首饰中贵金属含量的测定ICP光谱法第6部分:差减法GB/T21198.
6-2007电感耦合等离子体发射光谱EPA6010C-20076钯材料及其合金1含量(成色/纯度)0201首饰贵金属含量的测定X射线荧光光谱法GB/T18043-2008铂合金首饰铂、钯含量的测定氯铂酸铵重量法和丁二酮肟重量法GB/T19720-2005贵金属合金首饰中贵金属含量的测定ICP光谱法第4部分:999‰贵金属合金首饰贵金属含量的测定差减法GB/T21198.
4-2007贵金属合金首饰中贵金属含量的测定ICP光谱法第6部分:差减法GB/T21198.
6-2007电感耦合等离子体发射光谱EPA6010C-2007海绵钯GB/T1420-20047钻石1全部项目0203钻石分级GB/T16554-20038珠宝玉石1全部项目0203珠宝玉石名称GB/T16552-2003珠宝玉石鉴定GB/T16553-20039人造板及其制品/室内装饰装修材料1全部项目0244室内装饰装修材料人造板及其制品中甲醛释放限量GB18580-200110溶剂型木器涂料/室内装饰装修材料1全部项目0212室内装饰装修材料溶剂型木器涂料中有害物质限量GB18581-200911内墙涂料/室内装饰装修材料1全部项目0215室内装饰装修材料内墙涂料中有害物质限量GB18582-200812粘胶剂/室内装饰装修材料1全部项目0223室内装饰装修材料胶粘剂中有害物质限量GB18583-2008木材胶粘剂及其树脂检验方法GB/T14074-200613木家具/室内装饰装修材料1全部项目0223室内装饰装修材料木家具中有害物质限量GB18584-200114壁纸/室内装饰装修材料1全部项目0244室内装饰装修材料壁纸中有害物质限量GB18585-200115聚氯乙烯卷材/室内装饰装修材料1全部项目0221室内装饰装修材料聚氯乙烯卷材地板中有害物质限量GB18586-200116建筑材料/室内装饰装修材料放射性核素1全部项目1620建筑材料放射性核素限量GB6566-200117地毯、地毯衬垫及地毯胶粘剂/室内装饰装修材料1部分项目0244室内装饰装修材料地毯、地毯衬垫及地毯胶粘剂有害物质释放限量GB18587-2001只测总挥发性有机化合物、甲醛、苯乙烯18混凝土外加剂中释放氨1全部项目0244混凝土外加剂中释放氨的限量GB18588-200119天然花岗石及天然板石建筑板材物理性能1全部项目0244天然饰面石材试验方法GB/T9966.
1~3-2001天然花岗石建筑板材GB/T18601-2009天然板石GB/T18600-2009天然大理石建筑板材GB/T19766-200520民用建筑工程室内环境污染1全部项目0234民用建筑工程室内环境污染控制规范GB50325-200121空气中甲醛1全部项目0234居室空气中甲醛的卫生标准GB/T16127-199522室内空气质量1部分项目0234室内空气质量标准GB/T18883-2002不测苯并[a]芘23空气中苯乙烯1全部项目0234工作场所空气有毒物质测定芳香烃类化合物GBZ/T160.
42-200724空气中尘埃1部分项目0234电子计算机场地通用规范GB/T2887-2000只测尘埃25专用蓄电池1**部分项目0414电力助动车专用蓄电池DB31/202-1997固定型防酸式铅酸蓄电池技术条件GB/T13337.
1-1991固定性防酸式铅酸蓄电池规格尺寸GB/T13337.
2-1991电动道路车辆用锂离子蓄电池GB/Z18333.
1-2001起动用铅酸蓄电池GB/T5008.
1-2005牵引用铅酸蓄电池GB/T7403.
1-2008电动助动车用密封铅酸蓄电池GB/T22199-2008不测防爆能力26电动机及控制器1全部项目0422电力助动车用电动机及控制器DB31/201-199727蓄电池专用充电器1全部项目0438家用和类似用途的电器安全电池充电器的特殊要求GB4706.
18-2005家用机类似用途电器的安全第一部分通用要求GB4706.
1-200528空气净化器(剂)以及其他空气净化类产品1全部项目0507室内空气质量标准GB/T18883-2002家用和类似用途电器的安全空气净化器的特殊要求GB4706.
45-2008空气净化器GB/T18801-20082**全部项目0234室内空气净化功能涂覆材料净化性能JC/T1074-2008室内空气净化产品净化效果测定方法QB/T2761-200629普通、生物洁净室(区)1部分项目1027医药工业洁净室(区)悬浮粒子、浮游菌和沉降菌的测试方法GB/T16292~16294-1996微生物和生物医学实验室生物安全通用准则WS233-2002生物安全柜JG170-2005洁净厂房设计规范GB50073-2001生物安全实验室建筑技术规范GB50346-2004医院洁净手术部建筑技术规范GB50333-2002生物安全柜YY0569-2005层流洁净工作台检验标准JG/T19-1999只测风速、静压差、温度、相对湿度、空气洁净度、菌、照度、噪声、泄漏、振动、静电、绝缘电阻、耐电压测试30过滤材料及过滤器1部分项目0244高效空气过滤器性能试验方法:效率和阻力GB/T6165-2008微米级长度的扫描电镜测量方法通则GB/T16594-2008高效空气过滤器GB/T13554-2008空气过滤器GB/T14295-2008不测透过率(钠焰法)、运输振动性能31油烟净化器1全部项目0244饮食业油烟排放标准GB18483-200132机动车尾气净化设备1部分项目0244车用汽油机排气污染物试验方法GB14762-2008车用压燃式发动机排气污染物排放限值及测量方法GB17691-2005轻型汽车污染物排放限值及测量方法GB18352-2005汽车加速行驶车外噪声限值及测量方法GB1495-2002声学汽车车内噪声测量方法GB/T18697-2002只测一氧化碳、车内噪声33污染气体1部分项目0234空气质量氨的测定纳氏试剂分光光度法HJ533-2009固定污染源排气中氯化氢的测定硫氰酸汞分光光度计HJ/T27-1999只测氨、氯化氢34压缩气体1部分项目0234石油类和动植物油的测定红外光度法GB/T16488-1996一般用压缩空气质量等级GB/T13277-1991压缩空气第一部分:污染物净化等级GB/T13277.
1-2008只测固体颗粒、水份、油份35水1部分项目0233水质pH值的测定玻璃电极法GB/T6920-1986石油类和动植物油的测定红外光度法GB/T16488-1996电导率仪法《水和废水监测分析方法》第四版水质氨氮的测定纳氏试剂分光光度法HJ535-2009水质高锰酸盐指数的测定GB/T11892-1989生活饮用水标准检验法感官性状和物理指标GB/T5750.
4-2006只测PH、油份、电导率、氨氮、高锰酸盐指数、总硬度36除尘机组1部分项目1700高压风机袋式除尘机组JB/T8699-2010不测风机叶片静平衡、机组最大真空度37离心式除尘器1全部项目1700离心式除尘器JB/T9054-200038过滤式除尘器1部分项目1700袋式除尘器技术要求GB/T6719-2009脉冲喷吹类袋式除尘器JB/T8532-2008回转反吹类袋式除尘器JB/T8533-2010内滤分室反吹类袋式除尘器JB/T8534-2010袋式除尘器安装技术要求与验收规范JB/T8471-2010不测耐压强度39机械压滤机1部分项目1700带式压榨过滤机JB/T8102-2008只测空负荷试验、负荷试验、噪声、液压系统清洁度、绝缘电阻40废弃物焚烧炉1全部项目1700造船与船舶技术船用焚烧炉要求GB10836-2008医疗废物焚烧炉技术要(试行)GB19218-200341净水剂1部分项目0244化学试剂三氯化铁HG/T3474-2000生活饮用水用聚合氯化铝GB15892-2009只测三氯化铁、聚合氯化铝42活性炭1全部项目0244煤炭颗粒活性炭试验方法GB7702.
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17-1997GB7702.
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20-2008木质活性炭试验方法GB/T12496-199943CFC及其替代品1全部项目0244液体石油产品水含量测定法卡尔·费休法GB11133-1989工业用一氟三氯甲烷GB7371-1987工业用二氟二氯甲烷GB7372-1987工业用二氟一氯甲烷GB7373-2006液化石油气GB11174-199744可降解塑料制品1全部项目0244塑料一次性餐饮具通用技术条件GB18006.
1-2009一次性可降解餐饮具降解性能试验方法GB18006.
2-1999包装用降解聚乙烯薄膜QB/T2461-199945家用太阳热水系统1部分项目0357家用太阳热水系统技术条件GB/T19141-2003不测过热保护有防冻液的家用太阳热水系统、耐冻试验46空调通风系统(清洗后验收)1部分项目0343空调通风系统清洗规范GB19210-2003只测清洗效果检验(残留尘粒量)47空调系统1部分项目0234组合式空调机组GB/T14294-2008只测基本规定、外观、标志和包装、启动运行、机组噪声、断面风速均匀度、安全性能48臭氧老化箱1全部项目1700臭氧老化箱检测规范JCJ/I201002.
1-200649接触式IC卡1初始化功能和电特性0418识别卡带触点的集成电路卡第3部分:电信号和传输协议GB/T16649.
3-2006撤销2卡的几何尺寸和厚度识别卡物理特性GB/T14916-20063触点的尺寸与位置识别卡带触点的集成电路卡第2部分:触点的尺寸和位置GB/T16649.
2-20064部分项目识别卡测试方法GB/T17554.
1-2006只测温度、湿度条件下卡尺寸的稳定性和翘曲检测、动态弯曲特性、动态扭曲特性、可燃性、耐化学性、剥离强度、粘连和并块、振动5部分项目0418识别卡-物理特性ISO/IEC7810-2003只测卡的翘曲、卡的弯曲韧性6部分项目识别卡带触点的集成电路卡第1部分:物理特性GB/T16649.
1-2006只测触点的电阻、抗电磁场、抗静电、抗紫外线、抗X射线、触点的表面断面、卡的功率49接触式IC卡7部分项目0418识别卡-带触点的集成电路卡-第一部分:物理特性ISO/IEC7816-1-1998只测粘合力测试、触点的耐压力(点畸变)、点压力撤销8三轮压力识别卡-测试方法ISO/IEC10373-3-20019卡的可靠性上海市公共交通卡集成电路卡第一部分卡的特性DB31/239.
1-200010IC卡电性能识别卡集成电路卡第3部分:带触点的卡电接口和传输协议ISO/IEC7816-3-200650非接触式IC卡1部分项目0418识别卡-非接触式集成电路卡-临近卡-第一部分:物理特性ISO/IEC14443-1-2008识别卡物理特性GB/T14916-2006城市轨道交通单程票非接触集成电路IC卡通用技术规范DGJ08-1102-2005J10511-2005城市公共交通非接触集成电路IC卡通用技术规范DGJ08-1103-2005J10512-2005只测卡的几何尺寸和厚度、动态弯曲特性、动态扭曲特性、抗紫外线、抗静磁场、抗静电、抗交变电磁场、抗X射线、温度、湿度条件下卡尺寸的稳定性和翘曲检测、卡的翘曲、卡的弯曲韧性、耐化学性、可燃性撤销2部分项目0418识别卡测试方法第1部分:一般特性测试GB/T17554.
1-2006城市轨道交通单程票非接触集成电路IC卡通用技术规范DGJ08-1102-2005J10511-2005城市公共交通非接触集成电路IC卡通用技术规范DGJ08-1103-2005J10512-2005只测粘连和并块、剥离强度、振动50非接触式IC卡3部分项目0418识别卡-非接触式集成电路卡-临近卡-第二部分:无线电传输频率和信号接口ISO/IEC14443-2-2001上海市公共交通卡集成电路卡第一部分卡的特性DB31/239.
1-2000城市轨道交通单程票非接触集成电路IC卡通用技术规范DGJ08-1102-2005J10511-2005城市公共交通非接触集成电路IC卡通用技术规范DGJ08-1103-2005J10512-2005只测初始化功能和电性能、13.
56MHz时的应答振幅、谐振频率、频率特性、完成一次交易时间、调制深度、波形失真、动态刷卡时间撤销4卡与POS寿命SHC1101系列非接触式集成电路卡Q/OAKC001-2001撤销51接触式IC卡POS机1部分项目0419集成电路(IC)卡读写机通用规范GB/T18239-2000城市公共交通非接触式集成电路(IC)卡第二部分:收费机技术规范DB31/239.
2-2000只测外观及结构、功能、可靠性、电源适应能力、环境适应性、振动、冲击、碰撞、包装跌落试验、交易时间、POS机寿命试验、安全、电磁兼容性52非接触式IC卡POS机1部分项目0419集成电路(IC)卡读写机通用规范GB/T18239-2000识别卡非接触式集成电路卡临近卡第二部分无线电传输频率和信号接口ISO/IEC14443-2-2001城市公共交通非接触式集成电路(IC)卡第二部分收费机技术规范DB31/239.
2-2000城市轨道交通单程票非接触集成电路IC卡通用技术规范DGJ08-1102-2005J10511-2005城市公共交通非接触集成电路IC卡通用技术规范DGJ08-1103-2005J10512-2005只测外观及结构、功能、可靠性、工作频率、功率传输、工作场强、电源适应能力、包装跌落试验、碰撞、冲击、环境适应性、POS机寿命试验、振动、交易时间、最大刷卡距离、安全、电磁兼容性53税控IC卡1全部项目0418税控收款机第2部分:税控IC卡规范GB18240.
2-2003撤销54税控收款机1部分项目0419税控收款机第1部分:机器规范GB18240.
1-2003税控收款机第3部分:税控器规范GB18240.
3-2003只测安全、电源适应能力、电磁兼容性、环境适应性、噪声试验、税控收款机税控要求、税控收款机中文信息处理、税控收款机接口接通性、可靠性、标志、包装、运输、贮存、功能要求和接口他、文件检查、振动、冲击、碰撞、运输包装件跌落试验55行式打印机1全部项目0421行式打印机通行技术条件GB/T9312-198856台式喷墨打印机1全部项目0421台式喷墨打印机通用规范GB/T17974-200057台式激光打印机1全部项目0421台式激光打印机通用规范GB/T17540-199858微型计算机1全部项目0421微型计算机通用规范GB/T9813-200059显示器1部分项目0421数字电子计算机用阴极射线管显示设备通用技术条件GB/T9313-1995不测显示项目60硬盘驱动器1部分项目0419硬磁盘驱动器通用规范GB/T12628-2008只测安全、电源适应能力、噪声、电磁兼容性、环境适应性、可靠性、平均寻道时间、数据传输率、外观结构61开关电源1部分项目0421微小型计算机系统设备用开关电源通用技术条件GB/T14714-2008只测环境适应性、电磁兼容性、安全、可靠性、外观结构、主要技术性能62扫描仪1部分项目0421平板式扫描仪通用规范GB/T18788-2008只测安全、电源适应能力、电磁兼容性、环境适应性、可靠性、主要设计要求、外观和结构、噪声63手持式个人信息处理设备1部分项目0421手持式个人信息处理设备通用规范GB/T18220-2000不测键盘测试64电子计算器1部分项目0421电子计算器通用技术条件GB/T4967-1995不测键盘测试65学习机1部分项目0421学习机通用规范GB/T17541-1998只测电源适应能力、功能、性能(除频道允量)、电磁兼容性、安全、环境适应性、设计要求、外观和结构、可靠性和键寿命66软盘驱动器1部分项目0421软磁盘驱动器通用技术条件GB/T12627-1990设备可靠性试验恒定失效率假设下的失效率与平均无故障时间的验证试验方案GB/T5080.
7-1986只测外观结构、主要技术性能、安全、电源适应能力、噪声、电磁兼容性、环境适应性、可靠性67软件产品(即软件包)1部分项目0420信息技术软件包质量要求和测试GB/T17544-1998软件工程产品质量GB/T16260.
1~4-2006只测产品描述、用户文档、功能性68鼠标1部分项目0421信息技术鼠标器通用规范SJ/T11270-2002设备可靠性试验恒定失效率假设下的失效率与平均无故障时间的验证试验方案GB/T5080.
7-1986只测外观及结构、联接方式、性能、功能、安全、电源适应能力、电磁兼容性、环境适应性、可靠性69液晶显示器1部分项目0421计算机用液晶显示器通用规范SJ/T11292-2003设备可靠性试验恒定失效率假设下的失效率与平均无故障时间的验证试验方案GB/T5080.
7-1986只测外观和结构、安全、电源适应能力、性能、电磁兼容性、环境适应性、可靠性70LED显示器1部分项目0421LED显示屏通用规范SJ/T11141-2003设备可靠性试验恒定失效率假设下的失效率与平均无故障时间的验证试验方案GB/T5080.
7-1986发光二极管(LED)显示屏测试方法SJ/T11281-2007只测硬件环境、软件环境、结构与外观、安全要求、功能特性、光学性能、电学性能、供电电源、环境适应性、可靠性要求71电工电子产品的环境试验1低温0431电工电子产品环境试验第2部分:试验方法试验A:低温GB/T2423.
1-20082温度变化电工电子产品环境试验第2部分:试验方法试验N:温度变化GB/T2423.
22-20023高温电工电子产品环境试验第2部分:试验方法试验B:高温GB/T2423.
2-20084湿热电工电子产品环境试验第2部分:试验方法试验Cab:恒定湿热试验GB/T2423.
3-2006电工电子产品环境试验第2部分:试验方法试验Db交变湿热(12h+12h循环)GB/T2423.
4-20085振动电工电子产品环境试验第2部分:试验方法试验Fc:振动(正弦)GB/T2423.
10-200871电工电子产品的环境试验6冲击0431电工电子产品环境试验第2部分:试验方法试验Ea和导则:冲击GB/T2423.
5-19957碰撞电工电子产品环境试验第2部分:试验方法试验Eb和导则:碰撞GB/T2423.
6-19958**盐雾电工电子产品环境试验第2部分:试验方法试验Ka:盐雾GB/T2423.
17-2008电工电子产品环境试验第2部分:试验试验Kb:盐雾,交变(氯化钠溶液)GB/T2423.
18-20009自由跌落电工电子产品环境试验第2部分:试验方法试验Ed:自由跌落GB/T2423.
8-1995只测跌落高度(250~1100)mm载重(0~100)kg72电子测量仪器的环境试验1全部项目0431电子测量仪器环境试验总纲GB/T6587.
1~6-1986GB/T6587.
8-198673医用电气设备的环境试验1全部项目0431医用电气设备环境要求及试验方法GB/T14710-2009不测放射性设备74仪器仪表的环境试验1全部项目0431仪器仪表运输、运输贮存基本环境条件及试验方法JB/T9329-199975轻工产品的环境试验1全部项目0431轻工产品金属镀层腐蚀试验结果的评价QB/T3832-1999轻工产品金属镀层和化学处理层的耐腐蚀试验方法中性盐雾试验(NSS)法QB/T3826-199976防静电活动地板1部分项目0434防静电活动地板通用规范SJ/T10796-2001只测集中荷载、极限集中荷载、均布荷载77电子、电器产品的电磁兼容1全部项目1207电磁兼容试验和测量技术静电放电抗扰度试验GB/T17626.
2-2006IEC61000-4-2:2008EN61000-4-2:20092全部项目1207电磁兼容试验和测量技术射频电磁场辐射抗扰度试验GB/T17626.
3-2006IEC61000-4-3:2006+A1:2008+A2:2010EN61000-4-3:2006+A1:20083全部项目1207电磁兼容试验和测量技术电快速瞬变脉冲群抗扰度试验GB/T17626.
4-2008IEC61000-4-4:2004+A1:2010EN61000-4-4:200477电子、电器产品的电磁兼容4全部项目1207电磁兼容试验和测量技术浪涌(冲击)抗扰度试验GB/T17626.
5-2008IEC61000-4-5:2005EN61000-4-5:20065全部项目1207电磁兼容试验和测量技术射频场感应的传导骚扰抗扰度GB/T17626.
6-2008IEC61000-4-6:2008EN61000-4-6:20096全部项目1207电磁兼容试验和测量技术工频磁场抗扰度试验GB/T17626.
8-2006IEC61000-4-8:2009EN61000-4-8:1993+A1:20017全部项目1207电磁兼容试验和测量技术脉冲磁场抗扰度试验GB/T17626.
9-1998IEC61000-4-9:2001EN61000-4-9:1993+A1:20018全部项目1207电磁兼容试验和测量技术电压暂降、短时中断和电压变化的抗扰度试验GB/T17626.
11-2008IEC61000-4-11:2004EN61000-4-11:20049全部项目1207电磁兼容试验和测量技术振荡波抗扰度试验GB/T17626.
12-1998IEC61000-4-12:2006EN61000-4-12:200610全部项目1207电磁兼容试验和测量技术交流电源端口谐波、谐间波及电网信号的低频抗扰度试验GB/T17626.
13-2006IEC61000-4-13:2002+A1:2009EN61000-4-13:2002+A1:200977电子、电器产品的电磁兼容11全部项目1207无线电骚扰和抗扰度测量方法GB/T6113.
201-2008GB/T6113.
202-2008GB/T6113.
203-2008GB/T6113.
204-2008CISPR16-2-1:2008CISPR16-2-2:2005CISPR16-2-3:2006CISPR16-2-4:200312**全部项目1207电磁兼容试验和测量技术阻尼振荡磁场抗扰度试验GB/T17626.
10-1998IEC61000-4-10:2001EN61000-4-10:1993+A1:200113**全部项目1207电磁兼容试验和测量技术0Hz~150kHz共模传导骚扰抗扰度试验GB/T17626.
16-2007IEC61000-4-16:2002+A2:2009EN61000-4-16:1998+A1:200414**全部项目1207电磁兼容试验和测量技术直流电源输入端口电压暂降、短时中断和电压变化的抗扰度试验GB/T17626.
29-2006IEC61000-4-29:2000EN61000-4-29:200078家用和类似用途电动电热器具,电动工具以及类似电器的电磁兼容1全部项目1203家用和类似用途、电热器具,电动工具以及类似电器无线电干扰特性测量方法和允许值GB4343.
1-2009CISPR14-1:2009EN55014-1:2006+A1:2009电磁兼容家用电器、电动工具和类似电热器具的要求第2部分:抗扰度GB4343.
2-2009EN55014-2:1997+A1:2001+A2:200879信息技术设备的电磁兼容1全部项目1201信息技术设备的无线电骚扰限值和测量方法GB9254-2008FCC47CFRPart15SubpartB:2009CISPR22:2008EN55022:2006+A1:2007信息技术设备的抗扰度限值和测量方法GB/T17618-1998CISPR24:1997+A1:2001+A2:2002EN55024:1998+A2:200380工业,科学和医疗(ISM)射频设备的电磁兼容1全部项目1205工业、科学、医疗(ISM)射频设备电磁骚扰特性的测量方法和限值GB4824-2004CISPR11:2009+A1:2010EN55011:200981微波炉(1GHz以上)的电磁兼容1全部项目1207微波炉在1GHz以上的辐射干扰测量方法GB/T16607-1996CISPR19:198382低压电器设备及电子设备的电磁兼容1全部项目1207低压电气及电子设备发出的谐波电流限值(设备每相输入电流≤16A)GB17625.
1-2003IEC61000-3-2:2005+A1:2008+A2:2009EN61000-3-2:2006+A2:2009电磁兼容限值对每相额定电流≤16A且无条件接入的设备在公用低压供电系统中产生的电压变化、电压波动和闪烁的限制GB17625.
2-2007IEC61000-3-3:2008EN61000-3-3:200883电气照明和类似设备的电磁兼容1全部项目1204电气照明和类似设备的无线电骚扰特性的限值和测量方法GB17743-2007CISPR15:2009EN55015:2006+A1:2007+A2:2009一般照明用设备电磁兼容抗扰度要求GB/T18595-2001EN61547:2009IEC61547:200984汽车内电子零部件的电磁兼容1全部项目1206汽车电磁能的窄带辐射骚扰零部件测试方法ISO11452-1:2005+A1:2008ISO11452-2:2004SAEJ1113-21:2005ISO11452-3:2001SAEJ1113-24:2006ISO11452-4:2005SAEJ1113-4:2004ISO11452-5:2002ISO11452-7:2003ISO11452-8:2007机动车电子电器组件的电磁辐射抗扰性限值和测量方法GB/T17619-19982全部项目1206汽车传导和耦合的电气骚扰GB/T21437.
1-2008ISO7637-1:2002+A1:2008SAEJ1113-42:2006GB/T21437.
2-2008ISO7637-2:2004+A1:2008SAEJ1113-11:2007ISO7637-3:2007SAEJ1113-12:20063全部项目1206用于保护车载接收机的无线电骚扰特性的限值和测量方法GB18655-2002CISPR25:2008EN55025:200884汽车内电子零部件的电磁兼容4全部项目1206车辆、机动船和由火花点火发动机驱动的装置的无线电骚扰特性的限值和测量方法GB14023-2006CISPR12:2009EN55012:2007+A1:20095全部项目1206汽车静电放电的电气骚扰GB/T19951-2005ISO10605:2008SAEJ1113-13:20046全部项目1206道路车辆电气和电子设备的环境条件和试验第2部分:电力负荷ISO16750-2:20107全部项目1206汽车零部件电磁兼容测量程序(飞行器除外):30Hz至250kHz所有线路的传导抗扰度SAEJ1113-2:200485电动车辆的电磁兼容1全部项目1206电动车辆的电磁场辐射强度的限值和测量方法宽带9kHz~30MHzGB/T18387-2008SAEJ551-5:200486居住、商业和轻工业环境中产品的电磁兼容1全部项目1207电磁兼容通用标准居住、商业和轻工业环境中的抗扰度试验GB/T17799.
1-1999IEC61000-6-1:2005EN61000-6-1:2007电磁兼容通用标准居住、商业和轻工业环境中的发射标准GB17799.
3-2001IEC61000-6-3:2006EN61000-6-3:200787工业环境中的产品的电磁兼容1全部项目1207电磁兼容通用标准工业环境中的抗扰度试验GB/T17799.
2-2003IEC61000-6-2:2005EN61000-6-2:2005电磁兼容通用标准工业环境中的发射标准GB17799.
4-2001IEC61000-6-4:2006EN61000-6-4:200788弧焊设备的电磁兼容1全部项目1205弧焊设备第10部分:电磁兼容要求EN60974-10:2007GB/T15579.
10-200889不间断电源系统的电磁兼容1全部项目1207不间断电源系统(UPS)第2部分:电磁兼容性要求GB7260.
2-2009EN62040-2:200690电梯、自动扶梯和输送机产品的电磁兼容1全部项目1207电磁兼容电梯、自动扶梯和自动人行道的产品系列标准发射GB/T24807-2009EN12015:2004电磁兼容电梯、自动扶梯和自动人行道的产品系列标准抗扰度GB/T24808-2009EN12016:200491移动通信系统的电磁兼容1全部项目1207900/1800MHzTDMA数字蜂窝移动通信系统电磁兼容性限值和测量方法第一部分:移动台及其辅助设备YD1032-2000ETS300342-1:1997800MHzCDMA数字蜂窝移动通信系统电磁兼容性要求和测量方法第一部分:移动台及其辅助设备GB19484.
1-2004900/1800MHzTDMA数字蜂窝移动通信系统的电磁兼容性要求和测量方法第2部分:基站及其辅助设备YD/T1139-2006ETS300342-2:1994800MHzCDMA数字蜂窝移动通信系统电磁兼容性要求和测量方法第二部分:基站及其辅助设备YD1169.
2-20012手机电磁辐射吸收比1207对于确定无线通讯设备对人体头部的特别吸收比的空间平均峰值的推荐测量技术IEEE1528:2003FCCOETBulletin65SupplementC证明移动电话符合有关人暴露于电磁场(300MHz-3GHz)基本限制的产品标准EN50360:2001人暴露于手持和车载无线通信设备产生的射频场人体模型、仪器使用和规程第一部分紧贴耳朵使用的手持设备的吸收率(SAR)测定规程EN62209-1:2006IEC62209-1:2005YD/T1644.
1-200792无线电通讯设备的电磁兼容1全部项目1207电磁兼容和无线电频谱事务(ERM);无线电设备和服务的电磁兼容(EMC)标准;第一部分:通用技术要求ETSIEN301489-1:2008YD/T1312.
1-20082全部项目1207电磁兼容和无线电频谱事务(ERM);无线电设备和服务的电磁兼容(EMC)标准;第三部分:工作频率在9kHz到40GHz的短程设备(SRD)的特别要求ETSIEN301489-3:2002YD/T1312.
8-20043全部项目1207电磁兼容和无线电频谱事务(ERM);无线电设备和服务的电磁兼容(EMC)标准;第七部分:数字蜂窝移动通信系统(GSM/DCS)移动式和便携式设备及其辅助设备的特别要求ETSIEN301489-7:20054全部项目1207电磁兼容和无线电频谱事务(ERM);无线电设备和服务的电磁兼容(EMC)标准;第八部分:GSM基站的特别要求ETSIEN301489-8:20025全部项目1207电磁兼容和无线电频谱事务(ERM);无线电设备和服务的电磁兼容(EMC)标准;第十七部分:2,4GHz多频传输系统和5GHz高性能RLAN设备的特别要求ETSIEN301489-17:2008YD/T1312.
2-20046全部项目1207电磁兼容和无线电频谱事务(ERM);无线电设备和服务的电磁兼容(EMC)标准;第23部分:IMT-2000CDMA直接传播(UTRA)基站(BS)无线电,转发器和辅助设备的特别要求ETSIEN301489-23:20077全部项目1207电磁兼容和无线电频谱事务(ERM);无线电设备和服务的电磁兼容(EMC)标准;第24部分:移动和便携式(UE)无线电辅助设备的IMT-2000CDMA直接传播ETSIEN301489-24:20078全部项目1207电磁兼容和无线电频谱事务(ERM);IMT-200第三代蜂窝网络的基站(BS),转发器和用户设备(UE);第1部分:在R&TTE导则第3.
2章下IMT-2000的协调标准,介绍和普通要求ETSIEN301908-1:20079全部项目1207电磁兼容和无线电频谱事务(ERM);无线电通讯网络设备;电磁兼容(EMC)要求ETSIEN300386:2008YD/T1244-2002GB19286-200310全部项目1207电磁兼容和无线电频谱事务(ERM);短程设备(SRD);频率范围为25MHz至1000MHz,最大功率为500mW的无线电设备ETSIEN300220-1:2010ETSIEN300220-2:2010ETSIEN300220-3:200092无线电通讯设备的电磁兼容11全部项目1207电磁兼容和无线电频谱事务(ERM);短程设备(SRD);频率范围为9kHz至25MHz及电感回路系统的无线电设备ETSIEN300330-1:2010ETSIEN300330-2:201012全部项目1207电磁兼容和无线电频谱事务(ERM);短程设备(SRD);应用于1GHz至40GHz的频率范围内的无线电设备ETSIEN300440-1:2010ETSIEN300440-2:201013全部项目1207电磁兼容和无线电频谱事务(ERM);宽带传输系统;在2.
4GHzISM频带中工作的并使用宽带调制技术的数据传输设备ETSIEN300328:200614全部项目1207频率配置和无线电条约事务;通用标准和规则FCCPART2:200915全部项目1207公共移动服务FCCPART22:200916全部项目1207个人通讯服务FCCPART24:200917全部项目1207第三代合作伙伴计划3GPP;技术规范组无线接入网;基站(BS)和转发器电磁兼容性(EMC)3GPPTS25.
113:2007ETSITS136113:201092无线电通讯设备的电磁兼容18部分项目1207数字蜂窝通讯系统(Phase2+);移动台(MS)一致性规范;第一部分:一致性规范要求ETSITS151010-1:2010(3GPPTS51.
010-1)ETSIEN301502:2001只测传导杂散;辐射杂散;传导杂散(R-GSM);辐射杂散(R-GSM)19全部项目1207电信终端设备电磁兼容性要求与测量方法YD968-200220全部项目1207通信电源设备电磁兼容性限值及测量方法YD/T983-199821全部项目1207无绳电话的电磁兼容性要求及测量GB19483-200422部分项目1207射频设备—C部分—有意发射设备FCC47CFRPart15:2009只测信道间隔、跳频信道数、信道驻留时间、占用带宽、峰值输出功率、功率密度、传导杂散骚扰、辐射杂散骚扰23全部项目1207电信终端设备防雷技术要求及试验方法YD/T993-200693铁路机车产品的电磁兼容1全部项目1207轨道交通电磁兼容.
第1部分:总则EN50121-1:2006GB/T24338.
1-2009IEC62236-1:2008轨道交通电磁兼容.
第2部分:通信国外的全铁路系统的发射EN50121-2:2006IEC62236-2:2008轨道交通电磁兼容第3-1部分:机车车辆列车和整车EN50121-3-1:2006GB/T24338.
3-2009IEC62236-3-1:2008轨道交通电磁兼容第3-2部分:机车车辆设备EN50121-3-2:2006GB/T24338.
4-2009IEC62236-3-2:2008轨道交通电磁兼容第4部分:信号和通信设备的发射和抗扰度EN50121-4:2006GB/T24338.
5-2009IEC62236-4:2008轨道交通电磁兼容第5部分:地面供电装置和设备的发射和抗扰度EN50121-5:2006GB/T24338.
6-2009IEC62236-5:200894测量、控制和实验室用的电设备的电磁兼容1全部项目1205测量、控制和实验室用的电设备电磁兼容性要求GB/T18268-2000EN61326-1:2006EN61326-2-1:2006EN61326-2-2:2006EN61326-2-3:2006EN61326-2-4:2006EN61326-2-5:2006EN61326-2-6:200695医用电气设备的电磁兼容1全部项目1207医用电气设备第1-2部分:安全通用要求并列标准:电磁兼容要求和试验YY0505-2005IEC60601-1-2:200796军用设备和分系统的电磁兼容1部分项目1207军用设备和分系统电磁发射和敏感度测量GJB152A-1997MIL-STD-461F:2007+APPENDIX只测CE10125Hz~10kHz电源线传导发射CE10210kHz~10MHz电源线传导发射CE107电源线尖峰信号(时域)传导发射CS10125Hz~50kHz电源线传导敏感度CS10950Hz~100kHz壳体电流传导敏感度CS11410kHz~400MHz电缆束注入传导敏感度RE10125Hz~100kHz磁场辐射发射RE10210kHz~18GHz电场辐射发射RS10125Hz~100kHz磁场辐射敏感度RS10320MHz~18GHz电场辐射敏感度97定量包装商品1全部项目1700定量包装商品净含量计量检验规则JJF1070-200598验光镜片1全部项目1601眼科仪器验光镜片GB17342-200999眼镜镜片1全部项目1601眼镜镜片第1部分:单光和多焦点镜片GB10810.
1-2005100光学树脂眼镜片1部分项目1601光学树脂眼镜片QB2506-2001不测折射率和色散系数101配装眼镜1全部项目1601配装眼镜GB13511-1999102眼镜架1全部项目1601眼镜架通用要求和试验方法GB/T14214-2003103太阳镜1全部项目1601太阳镜QB2457-1999104非自动天平1全部项目1318电子天平JB5374-1991非自动天平、杠杆式天平GB/T4168-1992架盘天平QB/T2087-1995105烘干法谷物水分测定仪1全部项目1318非自动天平、杠杆式天平GB/T4168-1992106非自动衡器1全部项目1318电子台案秤GB/T7722-2005电子吊秤GB/T11883-2002非自行指示秤GB/T335-2002人体秤QB/T2065-1994弹簧度盘秤GB/T11884-2008107重力式自动装料衡器1全部项目1318重力式自动装料衡器QB/T2501-2000108动态公路车辆自动衡器1全部项目1318固定式电子衡器GB/T7723-2008动态公路车辆自动衡器检定规程JJG907-2006109连续累计自动衡器(皮带秤)1全部项目1318连续累计自动衡器(电子皮带秤)GB/T7721-2007110非连续累计自动衡器1全部项目1318非连续累计自动衡器(累计料斗秤)QB/T1078-2004111称重显示器1全部项目1318电子称重仪表GB/T7724-2008112称重传感器1全部项目1318称重传感器GB/T7551-2008113出租汽车计价器1全部项目1324电子式出租汽车计价器CJ5024-1997114心电图机1全部项目0433单道和多道心电图机YY1139-2000115心电监护仪1全部项目0433心电监护仪YY1079-2008116焦度计1全部项目1601光学和光学仪器焦度计GB17341-1998117风速表1部分项目1316电接风向风速计技术条件JB/T9450-1999不测风向118手持糖量(含量)计及手持折射仪1全部项目1603手持式糖量计JB/T6781-1993119烟尘测试仪1全部项目0236烟尘采样器技术条件HJ/T48-1999120粉尘采样器1部分项目0236粉尘采样器通用技术MT162-1995(2005)粉尘采样器技术条件LD62-1994不测防暴121防静电洁净织物1部分项目0224防静电洁净织物GB/T24249-2009不测水洗尺寸变化率、断裂强力、耐磨指数.
122电波暗室1场地电压驻波比测试1207无线电干扰和抗扰测量仪及方法用规范.
第1-4部分:无线电干扰和抗扰测量仪.
辅助设备.
辐射干扰CISPR16-1-4:2010只测场地电压驻波比CHINANATIONALACCREDITATIONSERVICEFORCONFORMITYASSESSMENTAPPENDIXOFACCREDITATIONCERTIFICATE(RegistrationNo.
CNASL0134)NAME:ShanghaiInstituteofMeasurementandTestingTechnology(NationalCenterofMeasruementandTestingforEastChina/NationalCenterofTestingTechnology,Shanghai)ADDRESS:No.
716,YishanRoad,Shanghai,ChinaDateofIssue:2009-08-21DateofExpiry:2012-08-20DateofUpdate:2011-06-01APPENDIX1-2SCOPEOFACCREDITEDTESTING№TestObjectItem/ParameterCodeofFieldTitle,CodeofStandardorMethodLimitationNote№Item/Parameter1Gold,Silver,PlatinumProductsandJewellery1Ring-size0201Jewellery—Ring-size—Definition,measurementanddesignationGB/T11888-20012Weight0201ProvisionofpermissibleerrorsformeasurementofpreciousmetalsadornmentmassQB/T1690-20043Density0201MethodofmeasurementofdensityforpreciousmetalsandtheiralloysGB/T1423-19964Cotent0201Jewellery—FinenessofpreciousmetalalloysanddesignationGB11887-2008Jewellery—Determinationofpreciousmetalcontent—MethodusingX-RayfluorescencespectrometryGB/T18043-2008Nondestructivemensurationofgoldcontentinthegoldproducts—Part2:MethodofcompositivedetermineGB/T17363.
2-20091Gold,Silver,PlatinumProductsandJewellery4Cotent0201Goldjewelleryalloys—Determinationofgold—Cupellationmethod(fireassay)GB/T9288-2006Chemicalanalysis—MethodofsilvercontentinjewelleryGB/T11886-2001Methodsforchemicalanalysisofgold-Determinationofgoldcontent—FireassayingmethodGB/T11066.
1-2008Methodsforchemicalanalysisofgold-Determinationofsilvercontent—FlameatomicabsorptionspectrometryGB/T11066.
2-2008Methodsforchemicalanalysisofgold-Determinationofironcontent—FlameatomicabsorptionspectrometryGB/T11066.
3-2008Methodsforchemicalanalysisofgold-Determinationofcopper,leadandbismuthcontents—FlameatomicabsorptionspectrometryGB/T11066.
4-2008Methodsforchemicalanalysisofgold-Determinationofsilver,copper,iron,lead,antimonyandbismuthcontents—AtomicemissionspectrometryGB/T11066.
5-20081Gold,Silver,PlatinumProductsandJewellery4Cotent0201Methodsforchemicalanalysisofsilver-Determinationofsilvercontent—Silverchlorideprecipitation-flameatomicabsorptionspectrometricmethodGB/T11067.
1-2006Methodsforchemicalanalysisofsilver-Determinationofcoppercontents—FlameatomicabsorptionspectrometricmethodGB/T11067.
2-2006Methodsforchemicalanalysisofsilver-Determinationofseleniumandtelluriumcontent—InductivelycoupledplasmaatomicemissionspectrometricmethodGB/T11067.
3-2006Methodsforchemicalanalysisofsilver-Determinationofantimonycontent—TheinductivelycoupledplasmaatomicemissionspectrometricmethodGB/T11067.
4-2006Methodsforchemicalanalysisofsilver-Determinationofleadandbismuthcontents—FlameatomicabsorptionspectrometricmethodGB/T11067.
5-2006Methodsforchemicalanalysisofsilver-Determinationofironcontents—FlameatomicabsorptionspectrometricmethodGB/T11067.
6-20061Gold,Silver,PlatinumProductsandJewellery4Cotent0201TermsofpreciousmetaladornmentQB/T1689-2006PreciousmetaladornmentQB/T2062-2006Silverjewelleryalloys-Determinationofsilver-Volumetric(potentionmetric)methodusingpotassiumbromideGB/T17832-2008Chemicalreagent—GeneralruleforpotentionmetrictitrationGB/T9725-2007Platinumjewelleryalloys—Determinationofplatinumandpalladium—GravimetricmethodafterprecipitationofdiammoniumhexachloroplatinateanddimethylglyoximeGB/T19720-2005Determinationofpreciousmetalsinpreciousmetalsjewelleryalloys—MethodusingICPspectrometry—Part4:999‰preciousmetalsjewelleryalloys—Determinationofpreciousmetals—DifferencemethodGB/T21198.
4-2007Determinationofpreciousmetalsinpreciousmetalsjewelleryalloys—MethodusingICPspectrometry—Part5:999‰silverjewelleryalloys—Determinationofsilver—DifferencemethodGB/T21198.
5-20071Gold,Silver,PlatinumProductsandJewellery4Cotent0201Determinationofpreciousmetalsinpreciousmetalsjewelleryalloys—MethodusingICPspectrometry—Part6:DifferencemethodGB/T21198.
6-2007Inductivelycoupledplasma-atomicemissionspectrometryEPA6010C-2007Jewellery—Determinationofthereleaseofnickel—MethodofspectrometryGB/T19719-2005Jewellery—Determinationofnickelcontent—MethodofflameatomicabsorptionspectrometryGB/T19718-2005GeneralrulesforatomicabsorptionspectrometricanalysisGB/T15337-20081Gold,Silver,PlatinumProductsandJewellery5Coatingtickness0202Metalliccoatings-Measurementofcoatingtickness-X-rayspectrometricmethodsGB/T16921-2005Jewellery-Measurementofgoldcoatingtickness-chemicalanalysismethodsQB/T1133-1991Jewellery-Measurementofsilvercoatingthickness-chemicalanalysismethodsQB/T1134-1991Jewellery-Measurementofgoldandsilvercoatingtickness-X-rayfluorescencespectrometricmethodsQB/T1135-2006ThicknesstestingmethodofthemetaldepositsandconversioncoatingforthelightindustrialproductsMetallographicmicroscopicmethodQB/T3817-1999Jewellery-TheprovisionofgoldcoatingticknessQB1131-2005Jewellery-TheprovisionofsilvercoatingticknessQB1132-20052Gold,Silver,PlatinumMaterialsandAlloys1Geometricsize0201GeometricsizemeasuringmethodsofpreciousmetalsandtheiralloymaterialsGB/T15077-20082DensityMethodofmeasurementofdensityforpreciousmetalsandtheiralloysGB/T1423-19962Gold,Silver,PlatinumMaterialsandAlloys3Cotent0201AnalyticalmethodsofmetallurgicalproductsGeneralruleforX-rayfluorescencespectrometricmethodsGB/T16597-1996Methodsforchemicalanalysisofgold-Determinationofgoldcontent—FireassayingmethodGB/T11066.
1-2008Methodsforchemicalanalysisofgold-Determinationofsilvercontent—FlameatomicabsorptionspectrometryGB/T11066.
2-2008Methodsforchemicalanalysisofgold-Determinationofironcontent—FlameatomicabsorptionspectrometryGB/T11066.
3-2008Methodsforchemicalanalysisofgold-Determinationofcopper,leadandbismuthcontents—FlameatomicabsorptionspectrometryGB/T11066.
4-2008Methodsforchemicalanalysisofgold-Determinationofsilver,copper,iron,lead,antimonyandbismuthcontents—AtomicemissionspectrometryGB/T11066.
5-20082Gold,Silver,PlatinumMaterialsandAlloys3Cotent0201Methodsforchemicalanalysisofsilver-Determinationofsilvercontent—Silverchlorideprecipitation-flameatomicabsorptionspectrometricmethodGB/T11067.
1-2006Methodsforchemicalanalysisofsilver-Determinationofcoppercontents—FlameatomicabsorptionspectrometricmethodGB/T11067.
2-2006Methodsforchemicalanalysisofsilver-Determinationofseleniumandtelluriumcontent—InductivelycoupledplasmaatomicemissionspectrometricmethodGB/T11067.
3-2006Methodsforchemicalanalysisofsilver-Determinationofantimonycontent—TheinductivelycoupledplasmaatomicemissionspectrometricmethodGB/T11067.
4-2006Methodsforchemicalanalysisofsilver-Determinationofleadandbismuthcontents—FlameatomicabsorptionspectrometricmethodGB/T11067.
5-2006Methodsforchemicalanalysisofsilver-Determinationofironcontents—FlameatomicabsorptionspectrometricmethodGB/T11067.
6-20062Gold,Silver,PlatinumMaterialsandAlloys3Cotent0201GoldfoilQB/T1734-2008GoldingotsGB/T4134-2003SilverGB/T4135-2002Goldcraftpicture—Part1:GoldfilmongoldcraftpicturesQB/T2630.
1-2004Goldcraftpicture—Part1:GoldfoilongoldcraftpicturesQB/T2630.
2-2004ExceptforbondstrengthSilverjewelleryalloys-Determinationofsilver-Volumetric(potentionmetric)methodusingpotassiumbromideGB/T17832-2008Chemicalreagent—GeneralruleforpotentionmetrictitrationGB/T9725-2007Platinumjewelleryalloys—Determinationofplatinumandpalladium—GravimetricmethodafterprecipitationofdiammoniumhexachloroplatinateanddimethylglyoximeGB/T19720-20052Gold,Silver,PlatinumMaterialsandAlloys3Cotent0201Determinationofpreciousmetalsinpreciousmetalsjewelleryalloys-MethodusingICPspectrometry-Part4:999‰preciousmetalsjewelleryalloys-Determinationofpreciousmetals-DifferencemethodGB/T21198.
4-2007Determinationofpreciousmetalsinpreciousmetalsjewelleryalloys-MethodusingICPspectrometry-Part5:999‰silverjewelleryalloys-Determinationofsilver-DifferencemethodGB/T21198.
5-2007Determinationofpreciousmetalsinpreciousmetalsjewelleryalloys-MethodusingICPspectrometry-Part6:DifferencemethodGB/T21198.
6-2007Inductivelycoupledplasma-atomicemissionspectrometryEPA6010C-2007Jewellery-Determinationofthereleaseofnickel—MethodofspectrometryGB/T19719-2005Jewellery-Determinationofnickelcontent-MethodofflameatomicabsorptionspectrometryGB/T19718-2005GeneralrulesforatomicabsorptionspectrometricanalysisGB/T15337-2008SpongePlatinumGB/T1419-20042Gold,Silver,PlatinumMaterialsandAlloys4Coatingthickness0202Metalliccoatings-Measurementofcoatingtickness-X-rayspectrometricmethodsGB/T16921-2005ThicknesstestingmethodofthemetaldepositsandconversioncoatingforthelightindustrialproductsMetallographicmicroscopicmethodQB/T3817-1999Goldcraftpicture—Part1:GoldfilmongoldcraftpicturesQB/T2630.
1-2004Goldcraftpicture—Part1:GoldfoilongoldcraftpicturesQB/T2630.
2-2004Exceptforbondstrength3Metalalloyandsolidmaterial1Metallographicstructureandconcentrationmode;takingimagesofmicrostructurefordifferentmetrical0201Metal-methodsforestimatingtheaveragegrainsizeMetalmicrostructureinspectionmethodGB/T6394-2002MicrograinsizeinspectionandgrainsizedistributionGB/T13298-1991AlloysteelmicrostructureinspectionmethodGB/T1299-20004Powder1Metal-methodsforestimatingtheaveragegrainsize;Metalmicrostructureinspectionmethod0244MethodsfordeterminationofparticlesizedistributionPart4.
GuidetomicroscopeandimageanalysesmethodsBS3406-4:1993(R2007)5PalladiumProductsandJewellery1Cotent0201Jewellery—FinenessofpreciousmetalalloysISO9202:1991(E)Jewellery—FinenessofpreciousmetalalloysanddesignationGB11887-2008Jewellery—Determinationofpreciousmetalcontent—MethodusingX-RayfluorescencespectrometryGB/T18043-2008Platinumjewelleryalloys—Determinationofplatinumandpalladium—GravimetricmethodafterprecipiationofdiammoniumhexachloroplatinateanddimethylglyoximeGB/T19720-2005DeterminationofpreciousmetalsinDeterminationofpreciousmetalsinpreciousmetalsjewelleryalloys—MethodusingICPspectrometry—Part4:999‰preciousmetalsjewelleryalloys—Determinationofpreciousmetals—DifferencemethodGB/T21198.
4-2007Determinationofpreciousmetalsinpreciousmetalsjewelleryalloys—MethodusingICPspectrometry—Part6:DifferencemethodGB/T21198.
6-2007Inductivelycoupledplasma-atomicemissionspectrometryEPA6010C-20076Palladiummaterialsandalloys1Cotent0201Jewellery—Determinationofpreciousmetalcontent—MethodusingX-RayfluorescencespectrometryGB/T18043-2008Platinumjewelleryalloys—Determinationofplatinumandpalladium—GravimetricmethodafterprecipitationofdiammoniumhexachloroplatinateanddimethylglyoximeGB/T19720-2005Determinationofpreciousmetalsinpreciousmetalsjewelleryalloys—MethodusingICPspectrometry—Part4:999‰preciousmetalsjewelleryalloys—Determinationofpreciousmetals—DifferencemethodGB/T21198.
4-2007Determinationofpreciousmetalsinpreciousmetalsjewelleryalloys—MethodusingICPspectrometry—Part6:DifferencemethodGB/T21198.
6-2007Inductivelycoupledplasma-atomicemissionspectrometryEPA6010C-2007SpongepalladiumGB/T1420-20047Diamond1Allitems0203DiamondgradingGB/T16554-20038Gemstoneandjade1Allitems0203Gems-NomenclatureGB/T16552-2003Gems-TestingGB/T16553-20039Wood-basedpanelsandfinishingproducts/Indoordecoratingandrefurbishingmaterials1Allitems0244Indoordecoratingandrefurbishingmaterials-limitofformaldehydeemissionofwoodbasedpanelsandfinishingproductsGB18580-200110Solventcoatingsforwoodenware/Indoordecoratingandrefurbishingmaterials1Allitems0212Indoordecoratingandrefurbishingaterials-limitofharmfulsubstancesofsolventcoatingsforwoodenwareGB18581-200911Interiorarchitecturalcoatings/Indoordecoratingandrefurbishingmaterials1Allitems0215Indoordecoratingandrefurbishingmaterials–limitofharmfulsubstancesofinteriorarchitecturalcoatingsGB18582-200812Adhesives/Indoordecoratingandrefurbishingmaterials1Allitems0223Indoordecoratingandrefurbishingmaterials–limitofharmfulsubstancesofharmfulsubstancesofadhesivesGB18583-2008TestingmethodsforwoodadhesivesandtheirresinsGB/T14074-200613Woodbasedfurniture/Indoordecoratingandrefurbishingmaterials1Allitems0244Indoordecoratingandrefurbishingmaterials–limitofharmfulsubstancesofharmfulsubstancesofwoodbasedfurnitureGB18584-200114Wallpapers/Indoordecoratingandrefurbishingmaterials1Allitems0244Indoordecoratingandrefurbishingmaterials–limitofharmfulsubstancesofharmfulsubstancesofwallpapersGB18585-200115Polyvinylchloridefloorcoverings/Indoordecoratingandrefurbishingmaterials1Allitems0221Indoordecoratingandrefurbishingmaterials–limitofharmfulsubstancesofharmfulsubstancesofpolyvinylchloridefloorcoveingsGB18586-200116Buildingmaterials/Indoordecoratingandrefurbishingmaterials1Allitems1620LimitofradionuclidesinbuildingmaterialsGB6566-200117Substancesemittedfromcarpets,carpetcushionsandadhesives/Indoordecoratingandrefurbishingmaterials1Partialitems0244Limiationsofharmfulsubstancesemittedfromcarpets,carpetcushionsandadhesives/IndoordecoratingandrefurbishingmaterialsGB18587-2001AccreditedonlyforTVOC,formaldehyde,styrene18Ammoniaemittedfromtheconcreteadmixtures1Allitems0244LimitofammoniaemittedfromtheconcreteadmixturesGB18588-200119Physicalpropertiesofnaturalgraniteandnaturalslateforbuildingslab1Allitems0244TestmethodsfornaturalfacingstonesGB/T9966.
1~3-2001SpecificationfornaturalgraniteforbuildingslabGB/T18601-2009NaturalslateGB/T18600-2009SpecificationfornaturalmarbleforbuildingslabGB/T19766-200520Indoorenvironmentalpollutionofcivilbuildingengineering1Allitems0234CodeforindoorenvironmentalpollutioncontrolofcivilbuildingengineeringGB50325-200121Formaldehydeinair1Allitems0234HygienicstandardforformaldehydeinindoorairofhouseGB/T16127-199522Indoorairqualitystandard1Partialitems0234IndoorairqualitystandardGB/T18883-2002Exceptforbenzo(a)pyrene23Styreneinair1Allitems0234methodsfordeterminiationofaromatichydrocarbonsintheairofworkplaceGBZ/T160.
42-200724dustinair1Partialitems0234SpecificationforelectroniccomputerfieldGB/T2887-2000Accreditedonlyfordust25Testingofstoragebattery1**Partialitems0414StoragebatteryuseforElectricpower-aidedvehicleDB31/202-1997Stationaryacidspray-prooflead-acidbatteriesGB/T13337.
1-1991Stationaryacidspray-prooflead-acidbatteriesCapacityspecificationsandsizeGB/T13337.
2-1991Lithium-ionbatteriesforelectricroadvehiclesGB/Z18333.
1-2001Lead-acidstarterbatteries—TechnicalconditionsGB/T5008.
1-2005Lead-acidtractionbatteriesGB/T7403.
1-2008Scaledlead-acidbatteryforelectricmopedGB/T22199-2008ExceptforBlast26Testingofelectromotorandcontrolsystem1Allitems0422ElectricmotorandcontrolleruseforelectricvehicleDB31/201-199727Testingofstoragebatterychargers1Allitems0438SafetyofhouseholdandsimilarelectricalappliancesParticularrequirementsforbatterychargersGB4706.
18-2005Householdandsimilarelectricalappliances-Safety-Part1:GeneralrequirementsGB4706.
1-200528Aircleaner1Allitems0507IndoorairqualitystandardGB/T18883-2002SafetyofhouseholdandsimilarelectricalappliancesParticularrequirementsforair-cleaningappliancesGB4706.
45-2008AircleanerGB/T18801-200828Aircleaner2**AllItems0234PurifcatoryperformanceofcoatingwithairpurificationJC/T1074-2008MethodsfordeterminationofpurificatoryeffectofindoorenvironmentdecontaminationproductQB/T2761-200629Cleanroom、Biomedicalcleanlaboratories(area)1Partialitems1027Testmethodforairborneparticles,airbornemicrobeandsettlingmicrobeincleanroom(area)ofthepharmaceuticalindustryGB/T16292~16294-1996GeneralbiosafetystandardformicrobiologicalandbiomedicallaboratoriesWS233-2002BiosafetycabinetJG170-2005CodefordesignofcleanroomGB50073-2001ArchitecturalandtechnicalcodeforbiosafetylaboratoriesGB50346-2004ArchitecturaltechnicalcodeforhospitalcleanoperatingdepartmentGB50333-2002BiologicalsafetycabinetsYY0569-2005TeststandardforlaminarcleanbenchJG/T19-1999Accreditedonlyforvelocity,StaticPressureDifferencetest,Temperature,RelativeHumidity,Aircleanliness,Bacteriatest,Illuminance,Noisetest,Filterleakdetection,Vibration,StaticElectricity,Insulationresistancetest,WithstandVoltageTest.
30Airfilter1Partialitems0244Testmethedoftheperformanceofhighefficiencyparticulateairfilter.
EfficencyandrisistanceGB/T6165-2008GeneralrulesformeasurementoflengthinmicronscalebySEMGB/T16594-2008HighefficiencyparticulateairfilterGB/T13554-2008AirfilterGB/T14295-2008ExceptforTransmissionoffilter(Testingmethodofsodiumflame),Transportationvibrationtest.
31Cleaningequipmentsforcookingfume1Allitems0244EmissionstandardofcookingfumeGB18483-200132Cleaningequipmentsforexhaustpollutantsfromvehicles1Partialitems0244Limitsandmeasurementmethodforexhaustpollutantsfromgasolineengiesofheavy-dutyvehiclesGB14762-2008LimitsandmeasurementmethodsforexhaustpollutantsfromcompressionignitionandgasfuelledpositiveignitionenginesofvehiclesGB17691-2005Limitsandmeasurementmethodsforemissionsfromlight-dutyvehiclesGB18352-2005LimitsandmeasurementmethodsfornoiseemittedbyacceleratingmotorvehiclesGB1495-2002Acoustics-MeasurementofnoiseinsidemotorvehiclesGB/T18697-2002AccreditedonlyforCO,noiseinsidemotorvehicles33Pollutedgas1Partialitems0234Airquality-Determinationofammonia-Nessler'sreagentcolorimetricmethodHJ533-2009Stationarysourceemission-determinationofhydrogenchloride-MercuricthiocyanatespectrophotometricmethodHJ/T27-1999AccreditedonlyforNH3,HCL34CompressedAir1Partialitems0234Waterquality--Determinationofpetroleumoil,animalandvegetableoils--InfraredphotometricmethodGB/T16488-1996Compressedairforgeneraluse–QualityclassesGB/T13277-1991Compressedair:Part1:ContaminantsandpurityclassesGB/T13277.
1-2008Accreditedonlyforparticle,oil,moisture35Water1Partialitems0233Waterquality-DeterminationofpHvalue-GlasselectrodemethodGB/T6920-1986Waterquality-Determinationofpetroleumoil,animalandvegetableoils-InfraredphotometricmethodGB/T16488-1996MethodsfortestingandanalysisofwaterandwastedwaterWaterquality-Determinationofammonium-nessler'sreagentcolorimetricmethodHJ535-2009Waterquality-DeterminationofpermanganateindexGB/T11892-1989StandardexaminationmethodsfordrinkingwaterGB/T5750.
4-2006AccreditedonlyforpH,oil,conductance,permanganateindex,totalhardness,NH3-N36Dustcollectingunit1Partialitems1700High-pressureventilatorbagfilterunitJB/T8699-2010ExceptforStaticbalancetestoffanleaves,Maxvacuumtestofunit37Centrifugaldustcollector1Allitems1700CentrifugaldustcollectorJB/T9054-200038Bagfilterdustcollector1Partialitems1700SpecificationsforbaghouseGB/T6719-2009PulseblowbagfilterJB/T8532-2008RotaryreversebagfilterJB/T8533-2010SectionreverseblowtypebagfilterJB/T8534-2010CodeforacceptanceofbagfilterInstallationJB/T8471-2010ExceptforCompressivestrengthtest39Filterbeltpress1Partialitems1700FilterbeltpressJB/T8102-2008AccreditedonlyforZeroloadtest,Stresstest,Noisetest,HydraulicSystemCleanliness,InsulationResistancetest.
40Wasteincinerator1Allitems1700Shipsandmarinetechnology-Shipboardincinerators–RequirementsGB10836-2008TechnicalstandardformedicalwasteincineratorGB19218-200341Watertreatment1Partialitems0244ChemicalreagentIron(Ⅲ)chloridehexahydrateHG/T3474-2000PolyaluminiumchloridefortreatmentofdrinkingwaterGB15892-2009AccreditedonlyforIron(Ⅲ)chloridehexahydrate,Polyaluminiumchloride42Activatedcarbon1Allitems0244Standardtestmethodforgranularactivatedcarbonfromcoal-DeterminationGB7702.
1.
2.
4.
5.
13.
16.
17-1997GB7702.
3.
6.
7.
8.
9.
10.
14.
15.
18.
19.
20-2008TestmethodofwoodenactivatedcarbonGB/T12496-199943CFCanditsalternatives1Allitems0244Liquidpetroleumproducts-Determinationofwater-KarlFischerreagentmethodGB11133-1989TrichloromonofluoromethaneforindustrialusesGB7371-1987DichlorodifluoromethaneforindustrialusesGB7372-1987MonochlorodifluoromethaneforindustrialusesGB7373-2006LiquefidepetroleumgasesGB11174-199744Degradableplasticplants1Allitems0244GeneralrequirementofplasticdisposabletablewareGB18006.
1-2009TestmethodfordeterminingthedegradabilityofsingleuseandlunchcontaineranddrinkingsetGB/T18006.
2-1999DegradationofPolyethyleneFilmPackagingQB/T2461-199945Domesticsolarwaterheatingsystems1Partialitems0357SpecificationofdomesticsolarwaterheatingsystemsGB/T19141-2003ExceptforDomesticsolarwaterheatingsystemswhichhaveantifreeze;ExceptforNo.
16item46Cleaningcodeforairductsysteminheating,ventilatingandair-conditioningsystems1Partialitems0343Cleaningforairductsysteminheating,ventilatingandair-conditioningsystemsGB19210-2003Accreditedonlyforcleaningeffect47Central-stationairhandlingunits1Partialitems0234Central-stationairhandlingunitsGB/T14294-2008AccreditedonlyforBasicperformancetest,Appearance,Logoandpackaging,Startrunningtest,Noisetest,Evennessofsectionvelocity,Electricsafetyperformancetest48OzoneAgingcontainer1Allitems1700TechnicalconditionsofOzoneAgingcontainerJCJ/I201002.
1-200649Integratedcircuit(s)cardswithcontactes1Electricalcharacteritics0418Identificationcards-Integratedcircuit(s)cardswithcontacts-Parts3:ElectronicsignalsandtransmissionprotocolsGB/T16649.
3-2006Revocation2DimensionofcardsIdentificationcards-PhysicalcharacteristicsGB/T14916-20063DimensionandLocationofthecontactsIdentificationcards-Integratedcircuit(s)withcontacts-Part2DimensionandLocationofthecontactsGB/T16649.
2-20064Partialitems0418Identificationcards-TestmethodsGB/T17554.
1-2006AccreditedonlyforCarddimensionalstabilityandwarpagewithtemperatureandhumidity,Bendingproperties,Torsionproperties,Flammability,Resistancetochemical,Peelstrength,Adhensionorblocking,VibrationsRevocation5Partialitemscards-PhysicalcharacteristicsISO/IEC7810-2003AccreditedonlyforOverallcardwarpage,Cardwarpage49Integratedcircuit(s)cardswithcontactes6Partialitems0418Identificationcards-Integratedcircuit(s)withcontacts-Integratedcircuit(s)cardswithconcacts-Parts1:PhysicalcharacteristicsGB/T16649.
1-2006AccreditedonlyforContactresistance,Staticelectromagneticfield,Electricalresistance(ofcontacts),Ultravioletlight,X-rays,Surfaceprofileofcontacts,Cardspower49Integratedcircuit(s)cardswithcontactes7Partialitems0418Identificationcards-Integratedcircuit(s)cardswithcontacts_Parts1:PhysicalcharacteristicsISO/IEC7816-1-1998AccreditedonlyforAdhesionofcards,Embossingreliefheightofcharacter,Mechanicalstrength(ofcardsandcontacts)Revocation8Mechanicalstrength-3wheeltestIdentificationcards-TestmethodsISO/IEC10373-3-20019CardsandPOSlifeContactlessIntegratedCircuit(s)(IC)CardforCityPublicTrafficPart1:TechnicalSpecificationofICCardDB31/239.
1-200010ElectricalcharacteristicsIdentificationcards-Integratedcircuitcards-Part3:Cardswithcontacts-ElectricalinterfaceandtransmissionprotocolsISO/IEC7816-3-200650ContactlessIntegratedcircuit(s)cards1Partialitems0418Identificationcards-Contactlessintegratedcircuit(s)cards-Proximitycards-part1:PhysicalcharacteristicsISO/IEC14443-1-2008Identificationcards-PhysicalcharacteristicsGB/T14916-2006Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofsinglejourneyticketforurbanrailtransitDGJ08-1102-2005J10511-2005Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofurbanpublictransportDGJ08-1103-2005J10512-2005AccreditedonlyforDimensionofcards,Carddimensionalstabilityandwarpagewithtemperatureandhumidity,Overallcardwarpage,cardwarpage,Bendingproperties,Torsionproperties,Resistancetochemical,Flammability,Ultravioletlight,Staticelectromagneticfield,Electricalresistance,Alternatingelectromagneticfield,X-rays,Revocation2PartialitemsIdentificationcards-TestmethodsGB/T17554.
1-2006Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofsinglejourneyticketforurbanrailtransitDGJ08-1102-2005J10511-2005Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofurbanpublictransportDGJ08-1103-2005J10512-2005AccreditedonlyforAdhesionorblocking,Peelstrength,Vibrations50ContactlessIntegratedcircuit(s)cards3Partialitems0418Identificationcards-Contactlessintegratedcircuit(s)cards-Proximitycards-part2:RadiofrequencypowerandsignalinterfaceISO/IEC14443-2-2001ContactlessIntegratedCircuit(s)(IC)CardforCityPublicTrafficPart1:TechnicalSpecificationofICCardDB31/239.
1-2000Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofsinglejourneyticketforurbanrailtransitDGJ08-1102-2005J10511-2005Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofurbanpublictransportDGJ08-1103-2005J10512-2005AccreditedonlyforElectricalcharacteristicsAnsweringswingat13.
56MHzSyntonicfrequency,Syntonicfrequency,Frequencyspecialty,OnetradetimeModulation,ModulationSignalreality,SignalrealityRevocation4CardandPOSlifeSHC1101Seriescontactlessintegratedcircuit(IC)cardQ/OAKC001-2001Revocation51ContactlessIntegratedcircuit(s)cards1Partialitems0419GenericspecificationforintegratedcircuitcardreaderGB/T18239-2000ContactlessIntegratedCircuit(IC)CardsforCityPublicTrafficPart2:TechnicalSpecificationofPayableMachineDB31/239.
2-2000AccreditedonlyforAppearanceandmachinerytest,function,Safety,Endurancetothevoltage,Electromagneticcompatibility,Enduranceto,temperaturecondition,Vibrations,impulsion,Collision,Packagingdeclination,Tradetime,Readerlife,Reliability52ContactlessIntegratedcircuitcardreader1Partialitems0419GenericspecificationforintegratedcircuitcardreaderGB/T18239-2000Identificationcards-Contactlessintegratedcircuit(s)cards-Proximitycards-part2:RadiofrequencypowerandsignalinterfaceISO/IEC14443-2-2001ContactlessIntegratedCircuit(IC)CardsforCityPublicTraficPart2:TechnicalSpecificationofPayableMachineDB31/239.
2-2000Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofsinglejourneyticketforurbanrailtransitDGJ08-1102-2005J10511-2005Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofurbanpublictransportDGJ08-1103-2005J10512-2005AccreditedonlyforAppearanceandmachinerytest,function,Workingfrequency,Powertransmitting,Workingmagneticfieldstrength,Readerlife,safety,Endurancetothevoltage,Electromagneticcompatibility,Enduranceto,temperaturecondition,Vibrations,impulsion,impulsion,Collision,Packagingdeclination,Tradetime,Reliability,Maxdistanceofreading53FiscalICcard1Allitems0418Fiscalcashregister-Part2:SpecificationforfiscalICcardGB18240.
2-2003Revocation54Fiscalcashregister1Partialitems0419Fiscalcashregister-Part1:SpecificationofdeciceGB18240.
1-2003Fiscalcashregister-Part3:SpecificationoffiscalprocessorGB18240.
3-2003AccreditedonlyforSafetyofFiscalcashregister,Fiscalcashregister-adaptilitytothepower,Fiscalcashregister-electromagnetism,Fiscalcashregister-environmentcondition,Fiscalcashregister-noise,Fiscalcashregister-vibrations,Fiscalcashregister-Collision,Fiscalcashregister-impulsion,Fiscalcashregister-packagingdeclination,Fiscalcashregister-fiscalrequire54Fiscalcashregister1Partialitems0419Fiscalcashregister-Part1:SpecificationofdeciceGB18240.
1-2003Fiscalcashregister-Part3:SpecificationoffiscalprocessorGB18240.
3-2003ment,compatibility,Fiscalcashregister-Chineseinformationconsaction,Fiscalcashregister-fecthing,Fiscalcashregister-Reliability,Sign,package,transportation,storage,Functionrequirementandfetching,Documentschecking55lineprinter1Allitems0421GeneralspecificationoflineprinterGB/T9312-198856desktopInk-Jetprinter1Allitems0421GeneralspecificationfordesktopInk-JetprinterGB/T17974-200057desktoplaserprinter1Allitems0421GeneralspecificationfordesktoplaserprinterGB/T17540-199858microcomputer1Allitems0421GenericspecificationformicrocosmsputersGB/T9813-200059CRTdisplaydevice1Partialitems0421GeneralspecificationforCRTdisplaydeviceofcomputerGB/T9313-1995Exceptfordisplay60harddiskdrive1Partialitems0419GenericspecificationforharddiskdriveGB/T12628-2008AccreditedonlyforSecuritychecking,Capabilityofelectricalsourceadaptabilitytest,Noisetesting,ElectromagneticCompatibility,Environmenttest,Reliabilitytesting,averageseektime,datatransferrate,Surface/structurechecking61switchingpowersupply1Partialitems0421Generalspecificationofswitchingpowersupplyformini-microcomputersystemGB/T14714-2008AccreditedonlyforEnvironmenttest,ElectromagneticCompatibility,Securitychecking,Reliabilitytesting,Surface/structurechecking,Maintechnologyperformancechecking62flatbedscanner1Partialitems0421GeneralspecificationforflatbedscannersGB/T18788-2008AccreditedonlyforSecuritychecking,Capabilityofelectricalsourceadaptabilitytest,ElectromagneticCompatibility,Environmenttest,Reliabilitytesting,Maindesignchecking,Surface/structurechecking,,noise63Handpersonalinformationprocessunit1Partialitems0421GeneralspecificationforhandpersonalinformationprocessunitGB/T18220-2000Exceptforkey-boardtesting64electroniccalculators1Partialitems0421GeneralspecificationforelectroniccalculatorsGB/T4967-1995Exceptforkey-boardtesting65elementarycomputer1Partialitems0421GeneralspecificationforelementarycomputerGB/T17541-1998AccreditedonlyforCapabilityofelectricalsourceadaptabilitytest,function,Maintechnologyperformancechecking,ElectromagneticCompatibility,Securitychecking,Environmenttest,Maindesignchecking,Surface/structurechecking,Reliabilitytestingandlife66flexiblediskdrive1Partialitems0421GenericspecificationforflexiblediskdriveGB/T12627-1990EquipmentreliabilitytestingCompliancetestplansforfailurerateandmeantimebetweenfailuresassumingconstantfailurerateGB/T5080.
7-1986AccreditedonlyforEnvironmenttest,ElectromagneticCompatibility,Securitychecking,Reliabilitytesting,noisetesting,Surface/structurechecking,Maintechnologyperformancechecking67Softwareproduct1Partialitems0420Informationtechnology--Softwarepackages--QualityrequirementsandtestingGB/T17544-1998Softwareengineering—ProductqualityGB/T16260.
1~4-2006AccreditedonlyforProductDescription,Userdocumentation,Functiontesting68mouse1Partialitems0421Informationtechnology--GeneralspecificationformouseSJ/T11270-2002EquipmentreliabilitytestingCompliancetestplansforfailurerateandmeantimebetweenfailuresassumingconstantfailurerateGB/T5080.
7-1986AccreditedonlyforSurface/structurechecking,Connectionmode,Performance,functionality,Environmenttest,ElectromagneticCompatibility,Securitychecking,Reliabilitytesting69LCDdevice1Partialitems0421GeneralspecificationforcomputerforliquidcrystaldisplaydeviceSJ/T11292-2003EquipmentreliabilitytestingCompliancetestplansforfailurerateandmeantimebetweenfailuresassumingconstantfailurerateGB/T5080.
7-1986AccreditedonlyforSurface/structurechecking,functionality,Environmenttest,ElectromagneticCompatibility,Securitychecking,Reliabilitytesting70LEDdevice1Partialitems0421GenericspecificationforLEDpanelsSJ/T11141-2003EquipmentreliabilitytestingCompliancetestplansforfailurerateandmeantimebetweenfailuresassumingconstantfailurerateGB/T5080.
7-1986TestmethodsofLEDpanelsSJ/T11281-2007AccreditedonlyforHardwareenvironment,softwareenvironment,Surface/structurechecking,Securitychecking,functionality,Opticalproperties,Powersupply,Environmenttest,Reliabilitytesting71EnviromentaltestingforElectricandelectronicproducts1Cold0431Environmentaltestingforelectricandelectronicproducts-Part2:Testmethods-TestA:coldGB/T2423.
1-20082oftemperatureEnviromentaltestingforelectricandelectronicproducts-Part2:Testmethods-TestN:oftemperatureGB/T2423.
22-20023DryheatEnvironmentaltestingforelectricandelectronicproducts-Part2:Testmethods-TestB:DryheatGB/T2423.
2-20084DampheatEnviromentaltestingforelectricandelectronicproducts-Part2:Testmethods-TestCab:Dampheat,steadystateGB/T2423.
3-2006Environmentaltestingforelectricandelectronicproducts-Part2:Testmethod-TestDb:Dampheat,cyclic(12h+12hcycle)GB/T2423.
4-200871EnviromentaltestingforElectricandelectronicproducts5Vibration0431Environmentaltestingforelectricandelectronicproducts-Part2:Testsmethods-TestFc:Vibration(sinusoidal)GB/T2423.
10-20086ShockEnviromentaltestingforelectricandelectronicproducts-Part2:Testmethods-TestEaandguidance:ShockGB/T2423.
5-19957BumpEnviromentaltestingforelectricandelectronicproducts-Part2:Testmethods-TestEbandguidance:BumpGB/T2423.
6-19958**SaltmistEnvrionmentaltestingforelectricandelectronicproducts-Part2:Testmethod-TestKa:SaltmistGB/T2423.
17-2008EnvironmentaltestingforelectricandelectronicproductsPart2:TestsTestKb:Saltmist,cyclic(sodiumchloridesolution)GB/T2423.
18-20009FreeFallEnviromentaltestingforelectricandelectronicproducts-Part2:Testmethods-TestEd:FreeFallGB/T2423.
8-1995Accreditedonlyforheightoffall(250~1100)mmLoad(0~100)kg72Electronicmeasuringinstrument1Allitems0431EnviromentaltestsprogramforelectronicmeasuringinstrumentGB/T6587.
1~6-1986GB/T6587.
8-198673Medicalelectricalequipment1Allitems0431TheenvironmentalrequirementsandtestmethodsformedicalelectricalequipmentGB/T14710-2009ExceptforRadioactiveequipment74Instruments1Allitems0431BasicenviromentalconditionsandtestingmethodsforinstrumentstransportationandstorageinthetransportationJB/T9329-199975Lightindustrialproducts1Allitems0431EvaluationofthecorrosiontestresultsofthemetaldepositsforthelightindustrialproductsQB/T3832-1999Corrosion-resistanttestingmethodofthemetaldepositsandconversioncoatingsforthelightindustrialproductsNeutralsaltsprayingtest(NSS)QB/T3826-199976Raisedaccessfloorsforelectrostaticprotection1Partialitems0434GeneralspecificationforraisedaccessfloorsforelectrostaticprotectionSJ/T10796-2001ExceptforConcentratedLoad,UltimateConcentratedLoad,Uniformload77ElectromagneticCompatibilityforElectro\Electric-product1Allitems1207Electromagneticcompatibility--Testingandmeasurementtechniques--ElectrostaticdischargeimmunitytestGB/T17626.
2-2006IEC61000-4-2:2008EN61000-4-2:20092Allitems1207Electromagneticcompatibility--Testingandmeasurementtechniques—Radiated,radio-frequency,electromagneticfieldimmunitytestGB/T17626.
3-2006IEC61000-4-3:2006+A1:2008+A2:2010EN61000-4-3:2006+A1:20083Allitems1207Electromagneticcompatibility--Testingandmeasurementtechniques--Electricalfasttransient/burstimmunitytestGB/T17626.
4-2008IEC61000-4-4:2004+A1:2010EN61000-4-4:20044Allitems1207Electromagneticcompatibility--Testingandmeasurementtechniques--SurgeimmunitytestGB/T17626.
5-2008IEC61000-4-5:2005EN61000-4-5:200677ElectromagneticCompatibilityforElectro\Electric-product5Allitems1207Electromagneticcompatibility--Testingandmeasurementtechniques--Immunitytoconducteddisturbances,inducedbyradio-frequencyfieldsGB/T17626.
6-2008IEC61000-4-6:2008EN61000-4-6:20096Allitems1207Electromagneticcompatibility(EMC)-Part4-8:Testingandmeasurementtechniques-PowerfrequencymagneticfieldimmunitytestGB/T17626.
8-2006IEC61000-4-8:2009EN61000-4-8:1993+A1:20017Allitems1207Electromagneticcompatibility--Testingandmeasurementtechniques--PulsemagneticfieldimmunitytestGB/T17626.
9-1998IEC61000-4-9:2001EN61000-4-9:1993+A1:20018Allitems1207Electromagneticcompatibility--Testingandmeasurementtechniques--Voltagedips,shortinterruptionsandvoltagevariationsimmunitytestGB/T17626.
11-2008IEC61000-4-11:2004EN61000-4-11:200477ElectromagneticCompatibilityforElectro\Electric-product9Allitems1207Electromagneticcompatibility--Testingandmeasurementtechniques--OscillatorywavesimmunitytestGB/T17626.
12-1998IEC61000-4-12:2006EN61000-4-12:200610Allitems1207Electromagneticcompatibility-Testingandmeasurementtechniques–Harmonicsinterharmonicsincludingmainssignalingata.
c.
powerport,lowfrequencyimmunitytestGB/T17626.
13-2006IEC61000-4-13:2002+A1:2009EN61000-4-13:2002+A1:200911Allitems1207MethodsofmeasurementofradiodisturbanceandimmunityGB/T6113.
201-2008GB/T6113.
202-2008GB/T6113.
203-2008GB/T6113.
204-2008CISPR16-2-1:2008CISPR16-2-2:2005CISPR16-2-3:2006CISPR16-2-4:200312**AllItems1207Electromagneticcompatibility—Testingandmeasurementtechniques--DampedoscillatorymagneticfieldimmunitytestGB/T17626.
10-1998IEC61000-4-10:2001EN61000-4-10:1993+A1:200177ElectromagneticCompatibilityforElectro\Electric-product13**AllItems1207Electromagneticcompatibility-Testingandmeasurementtechniques-Testforimmunitytoconductedcommonmodedisturbancesinthefrequencyrange0Hzto150kHzGB/T17626.
16-2007IEC61000-4-16:2002+A2:2009EN61000-4-16:1998+A1:200414**AllItemsElectromagneticcompatibility-Testingandmeasurementtechniques-Voltagedips,shortinterruptionsandvoltagevariationsond.
c.
inputpowerportimmunitytestsGB/T17626.
29-2006IEC61000-4-29:2000EN61000-4-29:200078ElectromagneticCompatibilityforelectricalmotor-operatedandthermalappliancesforhouse-holdandsimilarpurposes,electrictoolsandsimilarelectricapparatus1Allitems1203Limitsandmethodsofmeasurementofradiodisturbancecharacteristicsofelectricalmotor-operatedandthermalappliancesforhouse-holdandsimilarpurposes,electrictoolsandsimilarelectricapparatusGB4343.
1-2009CISPR14-1:2009EN55014-1:2006+A1:2009ElectromagneticcompatibilityRequirementsforhouseholdappliances,electrictoolsandsimilarapparatusPart2:ImmunityGB4343.
2-2009EN55014-2:1997+A1:2001+A2:200879ElectromagneticCompatibilityforInformationtechnologyequipment1Allitems1201Informationtechnologyequipment--Radiodisturbancecharacteristics--LimitsandmethodsGB9254-2008FCC47CFRPart15SubpartB:2009CISPR22:2008EN55022:2006+A1:2007Informationtechnologyequipment--Immunitycharacteristics--LimitsandmethodsofmeasurementGB/T17618-1998CISPR24:1997+A1:2001+A2:2002EN55024:1998+A2:200380ElectromagneticCompatibilityforIndustrial,scientificandmedical(ISM)radio-frequencyequipment1Allitems1205Industrial,scientificandmedical(ISM)radio-frequencyequipment-Electromagneticdisturbancecharacteristics-LimitsandmethodsofmeasurementGB4824-2004CISPR11:2009+A1:2010EN55011:200981ElectromagneticCompatibilityformicrowaveovensforfrequenciesabove1GHz1Allitems1207Methodsofmeasurementofradiatedinterferencefrommicrowaveovensforfrequenciesabove1GHzGB/T16607-1996CISPR19-198382ElectromagneticCompatibilityforvoltageelectricalandelectronicequipments1Allitems1207Electromagneticcompatibility-Limits-Limitsforharmoniccurrentemissions(equipmentinputcurrent≤16Aperphase)GB17625.
1-2003IEC61000-3-2:2005+A1:2008+A2:2009EN61000-3-2:2006+A2:2009ElectromagneticcompatibilityLimitsLimitationofvoltagefluctuationsandflickerinlow-voltagesuppllysystemsforequipmentwithratedcurrent≤16AGB17625.
2-2007IEC61000-3-3:2008EN61000-3-3:200883ElectromagneticCompatibilityforelectricallightingandsimilarequipment1Allitems1204LimitsandmethodsofmeasurementofradiodisturbancecharacteristicsofelectricallightingandsimilarequipmentGB17743-2007CISPR15:2009EN55015:2006+A1:2007+A2:2009EquipmentforgenerallightingpurposesEMCimmunityrequirementsGB/T18595-2001EN61547:2009IEC61547:20091Allitems1206Roadvehicles-Electricaldisturbancesbynarrowbandradiatedelectromagneticenergy-ComponenttestmethodsISO11452-1:2005+A1:2008ISO11452-2:2004SAEJ1113-21:2005ISO11452-3:2001SAEJ1113-24:2006ISO11452-4:2005SAEJ1113-4:2004ISO11452-5:2002ISO11452-7:2003ISO11452-8:2007Limitsandmethodsoftestingforimmunityofelectrical/electronicsub-assembliesinvehiclestoelectromagneticradiationGB/T17619-199884ElectromagneticCompatibilityforRoadvehiclesComponent2Allitems1206Roadvehicles-ElectricaldisturbancesbyconductionandcouplingGB/T21437.
1-2008ISO7637-1:2002+A1:2008SAEJ1113-42:2006GB/T21437.
2-2008ISO7637-2:2004+A1:2008SAEJ1113-11:2007ISO7637-3:2007SAEJ1113-12:20063Allitems1206LimitsandmethodsofmeasurementofradiodiaturbancecharacteristicsfortheprotectionofreceiversusedonboardvehiclesGB18655-2002CISPR25:2008EN55025:200884ElectromagneticCompatibilityforRoadvehiclesComponent4Allitems1206Vehicles,motorboatsandspark-ignitedengine-drivendevices--Radiodisturbancecharacteristics-LimitsandmethodsofmeasurementGB14023-2006CISPR12:2009EN55012:2007+A1:20095Allitems1206Roadvehicles–TestmethodsforelectricaldisturbancesfromelectrostaticdischargeGB/T19951-2005ISO10605:2008SAEJ1113-13-20046Allitems1206Roadvehicles–Environmentalconditionsandtestingforelectricalandelectronicequipment–Part2:ElectricalloadsISO16750-2:20107Allitems1206ElectromagneticCompatibilityMeasurementProcedureforVehicleComponents(exceptaircraft):ConductedImmunity30Hzto250kHz.
AllleadsSAEJ1113-2:200485ElectromagneticCompatibilityforElectricvehicles1Allitems1206Performancelevelsandmethodsofmeasurementofmagneticandelectricfieldstrengthfromelectricvehicles,broadband,9kHzto30MHzGB/T18387-2008SAEJ551-5:200486ElectromagneticCompatibilityforProductsofresidential,commercialandlight-industrialenvironments1Allitems1207Electromagneticcompatibility--Genericstandards--Immunityforresidential,commercialandlight-industrialenvironmentsGB/T17799.
1-1999IEC61000-6-1:2005EN61000-6-1:2007Electromagneticcompatibility-Genericstandards-Emissionstandardforresidential,commercialandlight-industrialenvironmentsGB17799.
3-2001IEC61000-6-3:2006EN61000-6-3:200787ElectromagneticCompatibilityforProductsofindustrialenvironments1Allitems1207Electromagneticcompatibility-Genericstandards-ImmunityforindustrialenvironmentsGB/T17799.
2-2003IEC61000-6-2:2005EN61000-6-2:2005Electromagneticcompatibility-Genericstandards-EmissionstandardforIndustrialenvironmentsGB17799.
4-2001IEC61000-6-4:2006EN61000-6-4:200788ElectromagneticCompatibilityforArcweldingequipment1Allitems1205ArcweldingequipmentPart10:Electromagneticcompatibility(EMC)requirementsEN60974-10:2007GB/T15579.
10-200889ElectromagneticCompatibilityforUninterruptiblepowersystem1Allitems1207Uninterruptiblepowersystems(UPS)-Part2:ElectromagneticcompatibilityrequirementsGB7260.
2-2009EN62040-2:200690ElectromagneticCompatibilityforLift,escalatorsandmovingwalks1Allitems1207Electromagneticcompatibility–Productfamilystandardforlifts,escalatorsandmovingwalks–EmissionGB/T24807-2009EN12015:2004Electromagneticcompatibility–Productfamilystandardforlifts,escalatorsandmovingwalks–ImmunityGB/T24808-2009EN12016:200491ElectromagneticCompatibilityforMobileTelecommunicationsSystem1Allitems1207LimitsandMeasurementMethodsofElectromagneticCompatibilityfor900/1800MHzDigitalCellularTelecommunicationsSystemPart1:MobileStationandAncillaryEquipmentYD1032-2000ETS300342-1:1997RequirementandMeasurementMethodsofElectromagneticCompatibilityfor800MHzCDMADigitalCellularMobileTelecommunicationsSystemPart1:MobileStationandAncillaryEquipmentGB19484.
1-2004RequirementandMeasurementMethodsofElectromagneticCompatibilityfor900/1800MHzDigitalCellularTelecommunicationsSystemPart2:baseStationandAncillaryEquipmentYD/T1139-2006ETS300342-2:1994RequirementandMeasurementMethodsofElectromagneticCompatibilityfor800MHzCDMADigitalCellularMobileTelecommunicationsSystemPart2:BaseStationandAncillaryEquipmentYD1169.
2-200191ElectromagneticCompatibilityforMobileTelecommunicationsSystem2SpecificAbsorptionRate1207IEEERecommendedPracticeforDeterminingthePeakSpatial-AverageSpecificAbsorptionRate(SAR)intheHumanHeadfromWirelessCommunicationsDevices:MeasurementTechniquesIEEE1528:2003FCCOETBulletin65SupplementCProductstandardtodemonstratethecomplianceofmobilephoneswiththebasicrestrictionsrelatedtohumanexposuretoelectromagneticfields(300MHz–3GHz)EN50360:2001Humanexposuretoradiofrequencyfieldsfromhand-heldandbody-mountedwirelesscommunicationdevices—Humanmodels,instrumentation,andprocedures—Part1:Proceduretodeterminethespecificabsorptionrate(SAR)forhand-helddevicesusedincloseproximitytotheear(frequencyrangeof300MHzto3GHz)EN62209-1:2006IEC62209-1:2005YD/T1644.
1-200792ElectromagneticCompatibilityforRadiotelecommunicationequipments1Allitems1207RadiospectrumMatters(ERM);ElectroMagneticCompatibility(EMC)standardforradioequipmentandservices;Part1:CommontechnicalrequirementsETSIEN301489-1:2008YD/T1312.
1-20082Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);ElectroMagneticCompatibility(EMC)standardforradioequipmentandservices;Part3:SpecificconditionsforShort-RangeDevices(SRD)operatingonfrequenciesbetween9kHzand40GHzETSIEN301489-3:2002YD/T1312.
8-20043Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);ElectroMagneticCompatibility(EMC)standardforradioequipmentandservices;Part7:Specificconditionsformobileandportableradioandancillaryequipmentofdigitalcellularradiotelecommunicationssystems(GSMandDCS)ETSIEN301489-7:200592ElectromagneticCompatibilityforRadiotelecommunicationequipments4Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);ElectroMagneticCompatibility(EMC)standardforradioequipmentandservices;Part8:SpecificconditionsforGSMbasestationsETSIEN301489-8:20025Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);ElectroMagneticCompatibility(EMC)standardforradioequipmentandservices;Part17:Specificconditionsfor2,4GHzwidebandtransmissionsystemsand5GHzhighperformanceRLANequipmentETSIEN301489-17:2008YD/T1312.
2-20046Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);ElectroMagneticCompatibility(EMC)standardforradioequipmentandservices;Part23:SpecificconditionsforIMT-2000CDMADirectSpread(UTRA)BaseStation(BS)radio,repeaterandancillaryequipmentETSIEN301489-23:200792ElectromagneticCompatibilityforRadiotelecommunicationequipments7Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);Electromagneticcompatibility(EMC)standardforradioequipmentandservices;Part24SpecificconditionsforIMT-2000CDMADirectSpread(UTRA)forMobileandportable(UE)radioandancillaryequipmentETSIEN301489-24:20078Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);BaseStations(BS),RepeatersandUserEquipment(UE)forIMT-2000Third-Generationcellularnetworks;Part1:HarmonizedENforIMT-2000,introductionandcommonrequirements,coveringessentialrequirementsofarticle3.
2oftheR&TTEDirectiveETSIEN301908-1:20079Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);Telecommunicationnetworkequipment;ElectroMagneticCompatibility(EMC)requirementsETSIEN300386:2008YD/T1244-2002GB19286-200392ElectromagneticCompatibilityforRadiotelecommunicationequipments10Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);ShortRangeDevices(SRD);Radioequipmenttobeusedinthe25MHzto1000MHzfrequencyrangewithpowerlevelsrangingupto500mWETSIEN300220-1:2010ETSIEN300220-2:2010ETSIEN300220-3:200011Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);ShortRangeDevices(SRD);Radioequipmentinthefrequencyrange9kHzto25MHzandinductiveloopsystemsinthefrequencyrange9kHzto30MHzETSIEN300330-1:2010ETSIEN300330-2:201012Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);Shortrangedevices;Radioequipmenttobeusedinthe1GHzto40GHzfrequencyrange;ETSIEN300440-1:2010ETSIEN300440-2:201013Allitems1207ElectromagneticcompatibilityandRadiospectrumMatters(ERM);Widebandtransmissionsystems;Datatransmissionequipmentoperatinginthe2,4GHzISMbandandusingwidebandmodulationtechniques;HarmonizedENcoveringessentialrequirementsunderarticle3.
2oftheR&TTEDirectiveETSIEN300328:200614Allitems1207FREQUENCYALLOCATIONSANDRADIOTREATYMATTERS;GENERALRULESANDREGULATIONSFCCPART2:200915Allitems1207PUBLICMOBILESERVICESFCCPART22:200916Allitems1207PERSONALCOMMUNICATIONSSERVICESFCCPART24:200917Allitems12073rdGenerationPartnershipProject;TechnicalSpecificationGroupRadioAccessNetworks;BasestationandRepeaterelectromagneticcompatibility(EMC)3GPPTS25.
113:2007ETSITS136113:201092ElectromagneticCompatibilityforRadiotelecommunicationequipments18Partialitems1207Digitalcellulartelecommunicationssystem(Phase2+);MobileStation(MS)conformancespecification;Part1:ConformancespecificationETSITS151010-1:2010(3GPPTS51.
010-1)ETSIEN301502:2001AccreditedonlyforConductedspuriousemissions,Radiatedspuriousemissions,ConductedspuriousemissionsforMSsupportingtheRGSMfrequencyband,RadiatedspuriousemissionsforMSsupportingtheR-GSMfrequencyband19Allitems1207RequirementsandmethodsofmeasurementofelectromagneticcompatibilityfortelecommunicationterminalequipmentYD968-200220Allitems1207LimitsandmethodsofmeasurementofelectromagneticcompatibilityfortelecommunicationpowersupplyequipmentYD/T983-199821Allitems1207ElectromagneticCompatibilityRequirementsforCordlessPhoneGB19483-200492ElectromagneticCompatibilityforRadiotelecommunicationequipments22Partialitems1207RadioFrequencydevices--SubpartC--IntentionalRadiatorsFCC47CFRPart15:2009AccreditedonlyforCarrierFrequencySeparation、NumberofHoppingFrequencies、TimeofOccupancy(DwellTime)、OccupiedBandwidth、PeakOutputPower、PowerSpectralDensity、SpuriousRFConductedEmissions、SpuriousRadiatedEmissions23Allitems1207TechnicalrequirementandtestmethodsoflightningresistibilityfortelecommunicationterminalequipmentYD/T993-200693ElectromagneticCompatibilityforRailwayapplications1Allitems1207Railwayapplications–Electromagneticcompatibility–Part1:GeneralEN50121-1:2006GB/T24338.
1-2009IEC62236-1:2008Railwayapplications–Electromagneticcompatibility–Part2:EmissionofthewholerailwaysystemtotheoutsideworldEN50121-2:2006IEC62236-2:2008Railwayapplications–Electromagneticcompatibility–Part3-1:Rollingstock–TrainandcompletevehicleEN50121-3-1:2006GB/T24338.
3-2009IEC62236-3-1:2008Railwayapplications–Electromagneticcompatibility–Part3-2:Rollingstock–ApparatusEN50121-3-2:2006GB/T24338.
4-2009IEC62236-3-2:2008Railwayapplications–Electromagneticcompatibility–Part4:EmissionandimmunityofthesignallingandtelecommunicationsapparatusEN50121-4:2006GB/T24338.
5-2009IEC62236-4:2008Railwayapplications–Electromagneticcompatibility–Part4:EmissionandimmunityoffixedpowersupplyinstallationsandapparatusEN50121-5:2006GB/T24338.
6-2009IEC62236-5:200894ElectromagneticCompatibilityforElectricalequipmentformeasurement,controlandlaboratoryuse1Allitems1205Electricalequipmentformeasurement,controlandlaboratoryuse–EMCrequirementsGB/T18268-2000EN61326-1:2006EN61326-2-1:2006EN61326-2-2:2006EN61326-2-3:2006EN61326-2-4:2006EN61326-2-5:2006EN61326-2-6:200695ElectromagneticCompatibilityforMedicalelectricalequipment1Allitems1207Medicalelectricalequipment–Part1-2:Generalrequirementsforsafety–Collateralstandard:Electromagneticcompatibility–RequirementsandtestsYY0505-2005IEC60601-1-2:200796ElectromagneticCompatibilityformilitaryequipmentandsubsystems1Partialitems1207MeasurementofelectromagneticemissionandsusceptibilityformilitaryequipmentandsubsystemsGJB152A-1997MIL-STD-461F:2007+APPENDIXAccreditedonlyforCE101ConductedEmissions,PowerLeads,25Hzto10kHzCE102ConductedEmissions,PowerLeads,10kHzto10MHzCE107ConductedEmissions,PowerLeadsimpulse96ElectromagneticCompatibilityformilitaryequipmentandsubsystems1Partialitems1207MeasurementofelectromagneticemissionandsusceptibilityformilitaryequipmentandsubsystemsGJB152A-1997MIL-STD-461F:2007+APPENDIXsignal(TimeDomain)CS101ConductedSusceptibility,PowerLeads,25Hz~50kHzCS109ConductedSusceptibility,StructureCurrent,50Hz~100kHzCS114ConductedSusceptibility,BulkCableInjection,10kHz~400MHzRE101RadiatedEmissions,MagneticField,25kHz~100kHzRE102RadiatedEmissions,ElectricField,10kHz~18GHzRS101,radiatedsusceptibility,magneticfield,25Hzto100kHzRS103,radiatedsusceptibility,electricfield,20MHzto18GHz97productsinprepackageswithfixedcontent1Allitems1700RulesofMetrologicaltestingfornetquantityofproductsinprepackageswithfixedcontentJJF1070-200598Trialcaselenses1Allitems1601Ophthalmicinstrument—TrialcaselensesGB17342-200999Spectacleslenses1Allitems1601Uncutfinishedspectaclelenses—Part1:Single-visionandmultifocallensesGB10810.
1-2005100OpticPlexiglasLenses1Partitems1601OpticPlexiglasLensesQB2506-2001Exceptforrefractive-index&chromaticcoefficienttest101AssembledSpectacles1Allitems1601AssembledSpectaclesGB13511-1999102SpectacleFrames1Allitems1601Spectacleframes—GeneralrequirementsandtestmethodsGB/T14214-2003103SunGlasses1Allitems1601SunGlassesQB2457-1999104Non-automaticBalance1Allitems1318ElectronicBalanceJB5374-1991Non-automaticBalance—BeamBalanceGB/T4168-1992TableBalancesQB/T2087-1995105InstrumentsforMeasuringtheMoistureContentwithBakingMethod1Allitems1318Non-automaticBalance—BeamBalanceGB/T4168-1992106NonautomaticweighingInstruments1Allitems1318ElectronicportableplatformandbenchscaleGB/T7722-2005ElectronicsuspendscaleGB/T11883-2002Non-self-indicationWeighingInstrumentsGB/T335-2002BodyscaleQB/T2065-1994SpringDialscaleGB/T11884-2008107AutomaticGravimetricFillingInstruments1Allitems1318AutomaticGravimetricFillingInstrumentsQB/T2501-2000108AutomaticInstrumentsforWeighingRoadVehiclesinMotion1Allitems1318FixedlocationelectronicinstrumentGB/T7723-2008V.
R.
ofAutomaticInstrumentsforWeighingRoadVehiclesinMotionJJG907-2006109ContinuousTotalizingAutomaticWeighingInstrument(BeltWeigher)1Allitems1318ContinuousTotalizingAutomaticWeighingInstrument(BeltWeigher)GB/T7721-2007110DiscontinuousTotalizingAutomaticWeighingInstrument1Allitems1318Discontinuoustotalizingautomaticweighinginstruments(totalizinghopperweighers)QB/T1078-2004111DigitalWeighingIndicator1Allitems1318DigitalWeighingIndicatorGB/T7724-2008112LoadCell1Allitems1318LoadCellGB/T7551-2008113Taximeter1Allitems1324ElectronTatimeterCJ5024-1997114Electrocardiograph1Allitems0433SingleandmultichannelelectrocardiographYY1139-2000115ElectroCardiacMonitor1Allitems0433ElectroCardiacMonitorYY1079-2008116Focimeters1Allitems1601Opticsandopticalinstruments—FocimetersGB17341-1998117Anemometer1Partialitems1316SpecificationforelectricalcontactorwindspeedandwinddirectionrecorderJB/T9450-1999Exceptforwinddirectiontesting118HandSaccharimeter(Content-meter)andRefractometer1Allitems1603HandSaccharimeterJB/T6781-1993119MeasuringApparatusforDustContentinStack1Allitems0236TechnicalconditionsofsamplerforstackdustHJ/T48-1999120DustSampler1Partialitems0236TechnicalconditionsofDustSamplerMT162-1995(2005)TechnicalRequirementofdustsamplerLD62-1994ExceptforBlast121Antistaticfabricforcleanroomgarmentsystem1Partialitems0224AntistaticfabricforcleanroomgarmentsystemGB/T24249-2009Exceptfordimensional、breakingforce、abrasionresistance122AnechoicChamber1SiteVoltageStandingWaveRatio1207Specificationforradiodisturbanceandimmunitymeasuringapparatusandmethods–Part1-4:Radiodisturbanceandimmunitymeasuringapparatus–Ancillaryequipment–RadiateddisturbancesCISPR16-1-4:2010AccreditedonlyforSiteVoltageStandingWaveRatio中国合格评定国家认可委员会认可证书(注册号:CNASL0134)名称:上海市计量测试技术研究院(华东国家计量测试中心/中国上海测试中心)地址:上海市宜山路716号签发日期:2009年08月21日有效期至:2012年08月20日更新日期:2012年02月10日2-2认可的校准能力范围序号测量仪器名称校准参量领域代码规范代号(含年号)名称测量范围扩展不确定度(校准和测量能力,k=2)限制说明备注1砝码质量1310JJG99-2006砝码检定规程1mg~20kgU=(0.
006~30)mg1mg~1tU=0.
02mg~5g50mg~1tU=0.
13mg~30g2非自动天平质量1318JJG1036-2008电子天平检定规程2g~55kgU=(0.
013~27)mgJJG98-2006机械天平检定规程20g~3tU=0.
024mg~15gJJG46-2004扭力天平检定规程5mg~2.
5gU=(0.
002~0.
021)mgJJG156-2004架盘天平检定规程100g~20kgU=1.
6mg~0.
3gJJG171-2004液体相对密度天平检定规程0~2.
0000Urel=0.
020%3烘干法谷物水分测定仪质量1318JJG658-1990烘干法谷物水分测定仪检定规程5g~200gU=(0.
05~0.
3)mg4非自动衡器质量1318JJG539-1997数字指示秤检定规程JJG555-1996非自动秤通用检定规程50g~150tU=1.
0mg~4.
5kgJJG14-1997非自行指示秤检定规程JJG555-1996非自动秤通用检定规程50kg~1tU=0.
8g~16gJJG13-1997模拟指示秤检定规程JJG555-1996非自动秤通用检定规程500g~1tU=8mg~16g5重力式自动装料衡器质量1318JJG564-2002重力式自动装料衡器(定量自动衡器)检定规程5g~150tUrel=(0.
02~0.
23)%6动态公路车辆自动衡器质量1318JJG907-2006动态公路车辆自动衡器检定规程(0.
5~150)tUrel=0.
08%7连续累计自动衡器(皮带秤)质量1318JJG195-2002连续累计自动衡器(皮带秤)检定规程(20kg~3000t)/hUrel=0.
08%8非连续累计自动衡器质量1318JJG648-1996非连续累计自动衡器检定规程1kg~30tUrel=0.
08%9称重显示器质量1318JJG649-1990数字称重显示器试行检定规程(0~3000)nU=0.
08e~0.
25e10称重传感器质量1318JJG669-2003称重传感器检定规程1g~1tU=0.
15υ~0.
4υ11转速表转速1324JJG105-2000转速表检定规程(20~100000)r/minUrel=1*10-412转速标准装置转速1324JJG326-2006转速标准装置检定规程(20~100000)r/minUrel=1*10-413出租汽车计价器转速1324JJG517-2009出租汽车计价器检定规程(50~1500)r/minUrel=1*10-314出租汽车计价器标准装置转速1324JJG738-2005出租汽车计价器标准装置检定规程(50~1500)r/minUrel=3*10-4转数(0.
1~99999.
9)rU=1r15数字式电子血压计压力1320JJG692-1999数字式电子血压计(静态)检定规程(0~40)kPaU=0.
1kPa16心电图机电压0433JJG543-2008心电图机检定规程80.
0μV~30.
0V(峰-峰)Urel=1.
0%定标电压Urel=1.
3%时间间隔2ms~50sUrel=0.
2%时标Urel=0.
5%幅频特性(1~100)HzUrel=1.
4%17脑电图机定标电压0433JJG1043-2008脑电图机检定规程80.
0μV~30.
0V(峰-峰)Urel=1.
2%电压Urel=3.
6%时间间隔2ms~50sUrel=2.
0%幅频特性(1~100)HzUrel=2.
2%18数字脑电图仪电压0433JJG954-2000数字脑电图仪及脑电地形图仪检定规程10μV~30V(峰-峰)Urel=1.
6%时间间隔2ms~50sUrel=1.
9%19心电监护仪电压0433JJG760-2003心电监护仪检定规程1mV~30V(峰-峰)(1~60)Hz(27~200)次/minUrel=1.
4%扫描速度Urel=0.
4%心率Urel=0.
2%20验光机顶焦度1601JJG892-2005验光机检定规程主观式:(-15~+15)m-1U=0.
08m-1客观式:(-20~+20)m-121焦度计顶焦度1601JJG580-2005焦度计检定规程(-25~+25)m-1U=0.
03m-122汽车侧滑检验台侧滑量0324JJG908-2009汽车侧滑检验台检定规程(-10~0~10)m/kmU=0.
07m/km23摩托车轮偏检测仪偏差量0324JJG910-1996摩托车轮偏检测仪检定规程(-10~0~10)mmU=0.
07mm24轴(轮)重仪重量0324JJG1014-2006机动车检测专用轴(轮)重仪检定规程轴重:(0~10)t;轮重:(0~5)tUrel=0.
8%25汽车制动踏板力计力值0324JJF1169-2007汽车制动操纵力计校准规范(0~1)kNUrel=1.
1%26汽车拉力计(驻车制动操纵力计)力值0324JJF1169-2007汽车制动操纵力计校准规范(0~3)kNUrel=1.
1%27汽车底盘测功机转距0347JJG653-2003测功装置检定规程(0~3000)N.
mUrel=1.
0%转速0347(100~10000)r/minUrel=0.
2%28滚筒反力式制动检验台力值0324JJG906-2009滚筒反力式制动检验台检定规程(0~100)kNUrel=0.
4%29滚筒式车速表检验台速度0324JJG909-2009滚筒式车速表检验台检定规程(0~80)km/hUrel=0.
9%30机动车前照灯检测仪发光强度0324JJG745-2002机动车前照灯检测仪检定规程发光强度:(5~40)kcd光轴偏移角(值):上(0~1)°(0~20)cm/dam;下、左、右(0~2)°(0~40)cm/dam发光强度:Urel=6%光轴偏移角(值)光轴偏移角(值):水平:U=3′28″垂直:U=1′9″31滤纸式烟度计烟度0234JJG847-1993滤纸式烟度计检定规程(0~10)RbU=0.
2Rb32汽车排放气体测试仪气体含量0236JJG688-2007汽车排放气体测试仪检定规程丙烷:(0~9999)*10-6;一氧化碳:(0.
00~14.
00)*10-2;二氧化碳:(0.
0~18.
0)*10-2;氧气:(0.
0~25.
0)*10-2;氮氧化合物:(0~5000)*10-6;C3H8:Urel=1.
5%;CO:Urel=1.
3%;CO2:Urel=1.
2%;O2:Urel=1.
1%;NO:Urel=2.
0%33热式风速仪风速1316JJG(建设)0001-1992热球式风速仪检定规程(0.
1~30.
0)m/sUrel=2.
5%34叶轮(风杯)风速仪风速1316JJG431-1986轻便三杯风向风速表检定规程(0.
1~30.
0)m/sUrel=2.
5%35风速表风速1316JJG515-1987轻便磁感风向风速表检定规程JJG613-1989电接风向风速仪检定规程(0.
1~30.
0)m/sUrel=2.
5%36风量仪风量1316JCJ/I201004.
1-2006风量仪量校准规范(50~3400)m3/hUrel=2%37尘埃粒子计数器粒径分布0234JJF1190-2008尘埃粒子计数器校准规范0%~100%U=10.
2%粒子浓度(10~100000)个/28.
3LU=12%38阿贝折射仪折射率1604JJG625-2001阿贝折射仪检定规程1.
2500~1.
7000U=7*10-539手持糖量(含量)计及手持折射仪糖量1603JJG820-1993手持糖量(含量)计及手持折射仪检定规程(0-100)%U=0.
06%40大气采样器流量1316JJG956-2000大气采样器检定规程(0.
1~15.
0)L/minUrel=1.
2%41烟尘测试仪流量0236JJG680-2007烟尘采样器检定规程(0.
1~60)L/minUrel=1.
3%42粉尘采样器流量0236JJG520-2005粉尘采样器检定规程JJG(煤炭)03-1996矿用粉尘采样器(0.
1~60)L/minUrel=1.
3%43总悬浮颗粒物采样器流量0236JJG943-1998总悬浮颗粒物采样器检定规程(80~120)L/min(0.
8~1.
2)m3/minUrel=1.
6%44透射式烟度计光吸收比0236JJG976-2010透射式烟度计检定规程(0~100)%Urel=0.
6%45甲醛气体检测仪甲醛浓度0236JJG1022-2007甲醛气体检测仪检定规程(0.
01~0.
10)μmol/molUrel=3.
8%(0.
10~2.
0)μmol/mol46电场探头探头因子0424IEC62209-1:2005人暴露于手持和车载无线通信装置产生的射频场人体模型、测试设备和规程第1部分:紧贴耳朵用的手持装置(频率范围300MHz-3GHz)的吸收率(SAR)测定规程800MHz~3GHzU=1.
0dB47电场偶极子天线反射系数IEC62209-1:2005人暴露于手持和车载无线通信装置产生的射频场人体模型、测试设备和规程第1部分:紧贴耳朵用的手持装置(频率范围300MHz-3GHz)的吸收率(SAR)测定规程IEEE1528:2003对于确定无线通讯设备对人体头部的特别吸收比的空间平均峰值的推荐测量技术JCJ/J101002.
1/0-2007SAR偶极子天线校准规范+3dB~-15dB:(800MHz~3GHz)U=0.
8dB-15dB~-25dB(800MHz~3GHz)U=1.
2dB-25dB~-35dB(800MHz~3GHz)U=3.
1dB48离心机转速1324JJG326-2006转速标准装置检定规程(20~30000)r/minUrel=0.
5%49动态(可移动)心电图机最大输入电压0433JJG1042-2008动态(可移动)心电图机检定规程幅度:8.
0μV~30V;频率:(1~100)HzUrel=2.
4%硬拷贝描记速度误差Urel=2.
4%50超声多普勒胎心仪超声源输出波速声强0433JJG893-2007超声多普勒胎心仪超声源检定规程超声功率2mW~20WU=0.
4mW/cm251超声多普勒胎儿监护仪超声源空间平均时间平均声强0433JJG394-1997超声多普勒胎儿监护仪超声源检定规程超声功率2mW~20WU=0.
2mW/cm2CHINANATIONALACCREDITATIONSERVICEFORCONFORMITYASSESSMENTAPPENDIXOFACCREDITATIONCERTIFICATE(RegistrationNo.
CNASL0134)NAME:ShanghaiInstituteofMeasurementandTestingTechnology(NationalCenterofMeasruementandTestingforEastChina/NationalCenterofTestingTechnology,Shanghai)ADDRESS:No.
716,YishanRoad,Shanghai,ChinaDateofIssue:2009-08-21DateofExpiry:2012-08-20DateofUpdate:2012-02-10APPENDIX2-2SCOPEOFACCREDITEDCALIBRATION№InstrumentParameterCodeofFieldTitle,CodeofCalibrationMethodRangeUncertainty(CMC,k=2)LimitationNote1WeightsMass1310V.
R.
ofweihtsJJG99-20061mg~20kgU=(0.
006~30)mg1mg~1tU=0.
02mg~5g50mg~1tU=0.
13mg~30g2Non-automaticBalanceMass1318V.
R.
ofElectronicBalanceJJG1036-20082g~55kgU=(0.
013~27)mgV.
R.
ofMechanicalBalanceJJG98-200620g~3tU=0.
024mg~15gV.
R.
ofTorsionBalanceJJG46-20045mg~2.
5gU=(0.
002~0.
021)mgV.
R.
ofTableBalancesJJG156-2004100g~20kgU=1.
6mg~0.
3gV.
R.
ofRalativeDensityBalanceforLiquidJJG171-20040~2.
0000Urel=0.
020%3InstrumentsforMeasuringtheMoistureContentwithBakingMethodMass1318V.
R.
ofInstrumentsforMeasuringtheMoistureContentofGrainwithBakingMethodJJG658-19905g~200gU=(0.
05~0.
3)mg4NonautomaticweighingInstrumentsMass1318V.
R.
ofDigitalIndicatingWeighingInstrumentJJG539-1997V.
R.
ofnonautomaticweighinginstrumentJJG555-199650g~150tU=1.
0mg~4.
5kgV.
R.
ofNon-self-indicationWeighingInstrumentsJJG14-1997V.
R.
ofNonautomaticweighinginstrumentJJG555-199650kg~1tU=0.
8g~16gV.
R.
ofAnalogueindicationWeighingInstrumentsJJG13-1997V.
R.
ofNonautomaticweighinginstrumentJJG555-1996500g~1tU=8mg~16g5AutomaticGravimetricFillingInstrumentsMass1318V.
R.
ofAutomaticGravimetricFillingInstrumentsJJG564-20025g~150tUrel=(0.
02~0.
23)%6AutomaticInstrumentsforWeighingRoadVehiclesinMotionMass1318V.
R.
ofAutomaticInstrumentsforWeighingRoadVehiclesinMotionJJG907-2006(0.
5~150)tUrel=0.
08%7ContinuousTotalizingAutomaticWeighingInstrumentMass1318V.
R.
ofContinuousTotalizingAutomaticWeighingInstrumentJJG195-2002(20kg~3000t)/hUrel=0.
08%8DiscontinuousTotalizingAutomaticWeighingInstrumentMass1318V.
R.
ofDiscontinuousTotalizingAutomaticWeighingInstrumentJJG648-19961kg~30tUrel=0.
08%9DigitalWeighingIndicatorMass1318V.
R.
ofDigitalWeighingIndicatorJJG649-1990(0~3000)nU=0.
08e~0.
25e10LoadCellMass1318V.
R.
ofLoadCellJJG669-20031g~1tU=0.
15υ~0.
4υ11TachometerRevolutionSpeed1324V.
R.
ofTachometerJJG105-2000(20~100000)r/minUrel=1*10-412StandardequipmentforrevolutionspeedRevolutionSpeed1324V.
R.
ofStandardequipmentforrevolutionspeedJJG326-2006(20~100000)r/minUrel=1*10-413TaximeterRevolutionSpeed.
1324V.
R.
ofTaximeterJJG517-2009(50~1500)r/minUrel=1*10-314StandardequipmentforTaximeterRevolutionSpeed1324V.
R.
ofStandardEquipmentforTaximeterJJG738-2005(50~1500)r/minUrel=3*10-4RotationCount(0.
1~99999.
9)rU=1r15DigitalElectronicsphygmomanometerPressure1320V.
R.
oftheDigitalElectronicsphygmomanometer(static)JJG692-1999(0~40)kPaU=0.
1kPa16ElectrocardiographVoltage0433V.
R.
ofElectrocardiographJJG543-200880.
0μV~30.
0V(peak~peak)Urel=1.
0%StandardizationvoltageUrel=1.
3%Timeinterval2ms~50sUrel=0.
2%TimestandardizationUrel=0.
5%Amplitudeandfrequencypeculiarity(1~100)HzUrel=1.
4%17ElectroencephalographsStandardizationvoltage0433V.
R.
ofElectroencephalographsJJG1043-200880.
0μV~30.
0V(peak-peak)Urel=1.
2%voltageUrel=3.
6%Timeinterval2ms~50sUrel=2.
0%Amplitudeandfrequencypeculiarity(1~100)HzUrel=2.
2%18DigitalElectroencephalogramMappingvoltage0433V.
R.
ofDigitalElectroencephalogamMapping&BrainElectricActivityMappingJJG954-200010μV~30V(peak-peak)Urel=1.
6%Timeinterval2ms~50sUrel=1.
9%19ElectroCardiacMonitorVoltage0433V.
R.
ofElectroCardiacMonitorJJG760-20031mV~30V(peak-peak)(1~60)Hz(27~200)次/minUrel=1.
4%ScanspeedUrel=0.
4%HeartrateUrel=0.
2%20EyeRefractometersVertexpower1601V.
R.
ofEyeRefractometersJJG892-2005Subjective:(-15~+15)m-1U=0.
08m-1Objective:(-20~+20)m-121FocimetersVertexpower1601V.
R.
ofFocimetersJJG580-2005(-25~+25)m-1U=0.
03m-122Slipeplatetypeautomobilesideslipetesterm/km0324V.
R.
ofslipeplatetypeautomobilesideslipetesterJJG908-2009(-10~0~10)m/kmU=0.
07m/km23Testerforwheeldeviationofmotorcyclesmm0324V.
R.
oftesterforwheeldeviationofmotorcyclesJJG910-1996(-10~0~10)mmU=0.
07mm24Axle(wheel)loadscalet0324V.
R.
ofspecialAxle(wheel)loadscaleformotorvehicletestJJG1014-2006Axle:(0~10)t;wheel:(0~5)tUrel=0.
8%25pedalForcetesterforautomotivebrakeN0324C.
SformanipulatingforcetesterforautomotivebrakeJJF1169-2007(0~1)kNUrel=1.
1%26AutomotivebrakepullForcetester(manipulatingforcetesterforautomotivebrake)N0324C.
S.
formanipulatingforcetesterforautomotivebrakeJJF1169-2007(0~3)kNUrel=1.
1%27AutomotiveChassisDynamometerN.
m0347V.
R.
ofEquipmentofPowerMeasuringJJG653-2003(0~3000)N.
mUrel=1.
0%RevolutionSpeed(100~10000)r/minUrel=0.
2%28RolleroppositeforcestypebraketesterN0324V.
R.
ofRolleroppositeforcestypebraketesterJJG906-2009(0~100)kNUrel=0.
4%29Rollertypespeedometertesterkm/h0324V.
R.
ofrollertypespeedometertesterJJG909-2009(0~80)km/hUrel=0.
9%30Headlamptestersformotorvehicleirradianceintensity0324V.
R.
ofHeadlamptestersformotorvehicleJJG745-2002Irradianceintensity:(5~40)kcdopticalaxisoffset(angle):Up(0~1)°(0~20)cm/dam;down、left、right(0~2)°(0~40)cm/damIrradianceintensity:Urel=6%opticalaxisoffset(angle)opticalaxisoffset(price):Horizontal:U=3′28″perpendicularity:U=1′9″31Filter-TypesmokemetersSmokeintensity0234V.
R.
ofFilter-TypesmokemetersJJG847-1993(0~10)RbU=0.
2Rb32VehicleExhaustEmissionsMeasuringInstrumentsGascontent0236V.
R.
ofVehicleExhaustEmissionsMeasuringInstrumentsJJG688-2007dimethylmethane:(0~9999)*10-6;carbonmonoxide:(0.
00~14.
00)*10-2;carbondioxide:(0.
0~18.
0)*10-2;oxygen:(0.
0~25.
0)*10-2;compoundsofnitrogenandoxygen:(0~5000)*10-6;C3H8:Urel=1.
5%;CO:Urel=1.
3%;CO2:Urel=1.
2%;O2:Urel=1.
1%;NO:Urel=2.
0%33ThermalAnemometerAirVelocity1316V.
R.
ofHotBallShapedAnemometerJJG0001-1992(0.
1~30.
0)m/sUrel=2.
5%34CuporpropelleranemometerAirVelocity1316V.
R.
ofPortable3-CupAnemometerJJG431-1986(0.
1~30.
0)m/sUrel=2.
5%35AnemometerAirVelocity1316V.
R.
ofPortableInductionAnemometerJJG515-1987ContactAnemorumbometerJJG613-1989(0.
1~30.
0)m/sUrel=2.
5%36AirCaptureHoodsAirvolumeflowing1316CalibrationRegulationofAirCaptureHoodsJCJ/I201004.
1-2006(50~3400)m3/hUrel=2%37DustParticlesCounterParticledistributing0234V.
R.
forDustParticlesCounterJJG1190-20080%-100%U=10.
2%Theconcentrationofparticle(10~100000)个/28.
3LU=12%38AbbeRefractomenterrefractiveindex1604V.
R.
ofAbbeRefractometerJJG625-20011.
2500~1.
7000U=7*10-539HandSaccharimeter(Content-meter)andRefractometersugarcontent1603V.
R.
ofHandSaccharimeter(Content-meter)andRefractometerJJG820-1993(0-100)%U=0.
06%40Airsamplerflux1316V.
R.
ofAirSamplerJJG956-2000(0.
1~15.
0)L/minUrel=1.
2%41MeasuringApparatusforDustContentinStackflux0236V.
R.
ofMeasuringApparatusforDustContentinStackJJG680-2007(0.
1~60)L/minUrel=1.
3%42DustSamplerflux0236V.
R.
ofDustSamplerJJG520-2005V.
R.
ofMineDustSamplerJJG(ChinaCoalDepartment)03-1996(0.
1~60)L/minUrel=1.
3%43TotalSuspendedParticulateSamplerflux0236V.
R.
ofTotalSuspendedParticulateSamplerJJG943-1998(80~120)L/min(0.
8~1.
2)m3/minUrel=1.
6%44Opacimetersratiooflightabsorption0236V.
R.
ofOpacimetersJJG976-2010(0~100)%Urel=0.
6%45FormaldehydeGasAnalyzerconcentrationofformaldehydeGas0236V.
R.
ofFormaldehydeGasAnalyzerJJG1022-2007(0.
01~0.
10)μmol/molUrel=3.
8%(0.
10~2.
0)μmol/mol46ElectrofieldprobeProbefactor0424ProceduretomeasuretheSpecificAbsorptionRate(SAR)inthefrequencyrangeof300MHzto3GHzPart1:hand-heldmobilewirelesscommunicationdevicesIEC62209-1:2005800MHz~3GHzU=1.
0dB47E-fieldDipoleReflectanceProceduretomeasuretheSpecificAbsorptionRate(SAR)inthefrequencyrangeof300MHzto3GHzPart1:hand-heldmobilewirelesscommunicationdevicesIEC62209-1:2005+3dB~-15dB(800MHz~3GHz)U=0.
8dB-15dB~-25dB(800MHz~3GHz)U=1.
2dB47E-fieldDipoleReflectanceIEEERecommendedPracticeforDeterminingthePeakSpatial-AverageSpecificAbsorptionRate(SAR)intheHumanHeadfromWirelessCommunicationsDevices:MeasurementTechniquesIEEE1528:2003C.
S.
forCalibrationprocedureforSARDipoleAntennaJCJ/J101002.
1/0-2007-25dB~-35dB(800MHz~3GHz)U=3.
1dB48centrifugerevolutionspeed1324V.
R.
ofStandardEquipmentforRevolutionSpeedJJG326-2006(20~30000)r/minUrel=0.
5%49AmbulatoryElectrocardiographsMaximuminputvoltage0433V.
R.
ofAmbulatoryElectrocardiographsJJG1042-2008Amplitude8.
0μV~30V;Frequency(1~100)HzUrel=2.
4%ErrorofhardcopyrecordingspeedUrel=2.
4%50UltrasonicSourceofUltrasonicDopplerFoetalMetersOutputwavevelocitysoundintensity0433V.
R.
ofUltrasonicSourceofUltrasonicDopplerFoetalMetersJJG893-2007Ultrasonicpower:2mW~20WU=0.
4mW/cm251UltrasonicsourceforultrasonicdopplerfetalmonitorSpaceaveragetimeaveragesoundintensity0433V.
R.
ofUltrasonicSourceforUltrasonicDopplerFetalMonitorJJG394-1997Ultrasonicpower:2mW~20WU=0.
2mW/cm2中国合格评定国家认可委员会认可证书(注册号:CNASL0134)名称:上海市计量测试技术研究院(华东国家计量测试中心/中国上海测试中心)地址:上海市宜山路716号签发日期:2009年08月21日有效期至:2012年08月20日更新日期:2012年02月10日3-2认可的授权签字人及领域序号姓名授权签字领域备注1谢启耀贵金属、宝玉石检测项目2傅友俊贵金属、宝玉石检测项目3陈丁滢贵金属、宝玉石检测项目4丁臻敏环保指标性能检测和环境监测设备校准与检测项目5刘悦环保指标性能检测和环境监测设备校准与检测项目6胡西虹信息系统及信息产品、视频安防监控系统、广播扩声系统检测项目7廉云信息系统及信息产品、视频安防监控系统、广播扩声系统检测项目8龚增电磁兼容校准,电磁兼容、电子产品、防静电、安全性能及环境试验检测项目9王晖电磁兼容校准,电磁兼容、电子产品、防静电、安全性能及环境试验检测项目10钱大鼎砝码、衡器、转速、医疗设备、眼镜及光学设备、机动车检测设备、定量包装商品检测与校准项目11华林虎砝码、衡器、转速、医疗设备、眼镜及光学设备、机动车检测设备、定量包装商品检测与校准项目12瞿潮庆几何量计量与检测、力学计量与检测、声学计量与检测、医疗设备、眼镜及光学设备、机动车检测设备、定量包装商品检测与校准项目13王小敏砝码、衡器、转速、医疗设备、眼镜及光学设备、机动车检测设备、定量包装商品检测与校准项目14彭潞砝码、衡器、转速、医疗设备、眼镜及光学设备、机动车检测设备、定量包装商品检测与校准项目15朱俊砝码、衡器检测与校准项目16刘庆华砝码、衡器检测与校准项目17金念章血压计校准项目18关昕眼镜及光学设备检测与校准项目19江文彪医疗设备检测与校准项目20屠海文机动车检测设备校准项目CHINANATIONALACCREDITATIONSERVICEFORCONFORMITYASSESSMENTAPPENDIXOFACCREDITATIONCERTIFICATE(RegistrationNo.
CNASL0134)NAME:ShanghaiInstituteofMeasurementandTestingTechnology(NationalCenterofMeasruementandTestingforEastChina/NationalCenterofTestingTechnology,Shanghai)ADDRESS:No.
716,YishanRoad,Shanghai,ChinaDateofIssue:2009-08-21DateofExpiry:2012-08-20DateofUpdate:2012-02-10APPENDIX3-2ACCREDITEDSIGNATORIESANDSCOPE№NameAuthorizedScopeofSignatureNote1XieQiyaoTestofthepreciousmetals,jewellery2FuYoujunTestofthepreciousmetals,jewellery3ChenDingyingTestofthepreciousmetals,jewellery4DingZhenminCalibrationandTestItemsforenvironmentalinspectequipmentsandenvironmentalprotection5LiuYueCalibrationandTestItemsforenvironmentalinspectequipmentsandenvironmentalprotection6HuXihongInformationsystemandinformationproducts,Videomonitoringsecuresystem,TestofBroadcastingsoundreinforcementSystem7LianyunInformationsystemandinformationproducts,Videomonitoringsecuresystem,TestofBroadcastingsoundreinforcementSystem8GongZengElectromagneticCompatibilityCalibration,ElectromagneticCompatibilityTest,ElectricProductsPerformanceTest,Antistatic,Electro-SafetyTestandEnvironmentalTest9WangHuiElectromagneticCompatibilityCalibration,ElectromagneticCompatibilityTest,ElectricProductsPerformanceTest,Antistatic,Electro-SafetyTestandEnvironmentalTest10QianDadingCalibrationandTestItemsforweight、weighingInstruments、rotaryspeed、medicalequipment、glassesandopticalequipment、vehicletestingequipment、productsinprepackageswithfixedcontent11HuaLinhuCalibrationandTestItemsforweight、weighingInstruments、rotaryspeed、medicalequipment、glassesandopticalequipment、vehicletestingequipment、productsinprepackageswithfixedcontent12QuChaoqingCalibrationandTestItemsforgeometricquantities、mechanics、acoustics、medicalequipment、glassesandopticalequipment、vehicletestingequipment、productsinprepackageswithfixedcontent13WangXiaominCalibrationandTestItemsforweight、weighingInstruments、rotaryspeed、medicalequipment、glassesandopticalequipment、vehicletestingequipment、productsinprepackageswithfixedcontent14PengLuCalibrationandTestItemsforweight、weighingInstruments、rotaryspeed、medicalequipment、glassesandopticalequipment、vehicletestingequipment、productsinprepackageswithfixedcontent15ZhuJunCalibrationandTestItemsforweight、weighingInstruments16LiuQinghuaCalibrationandTestItemsforweight、weighingInstruments17JinNianzhangCalibrationItemsforsphygmomanometer18GuanXinCalibrationandTestItemsforglassesandopticalequipment19JiangWenbiaoCalibrationandTestItemsformedicalequipment20TuHaiwenCalibrationItemsforvehicletestingequipment中国合格评定国家认可委员会认可证书(注册号:CNASL0134)名称:上海市计量测试技术研究院(华东国家计量测试中心/中国上海测试中心)地址:上海市曹安路1926号签发日期:2009年08月21日有效期至:2012年08月20日更新日期:2012年02月10日1-3认可的检测能力范围序号检测对象项目/参数领域代码检测标准(方法)名称及编号(含年号)限制范围说明序号名称1.
1涡轮流量计1部分项目1316涡轮流量传感器JB/T9246-1999只测液体DN5~DN3001.
2电磁流量计1部分项目1316电磁流量计JB/T9248-1999只测液体DN5~DN3001.
3涡街流量计1部分项目1316涡街流量传感器JB/T9249-1999只测液体DN5~DN3002浮子流量计1部分项目1316玻璃转子流量计JB/T9255-1999金属管浮子流量计JB/T6844-1993只测液体DN5~DN1003燃油加油机1全部项目1312机动车燃油加油机GB/T9081-2008CHINANATIONALACCREDITATIONSERVICEFORCONFORMITYASSESSMENTAPPENDIXOFACCREDITATIONCERTIFICATE(RegistrationNo.
CNASL0134)NAME:ShanghaiInstituteofMeasurementandTestingTechnology(NationalCenterofMeasruementandTestingforEastChina/NationalCenterofTestingTechnology,Shanghai)ADDRESS:No.
1926,CaoanRoad,ShanghaiDateofIssue:2009-08-21DateofExpiry:2012-08-20DateofUpdate:2012-02-10APPENDIX1-3SCOPEOFACCREDITEDTESTING№TestObjectItem/ParameterCodeofFieldTitle,CodeofStandardorMethodLimitationNote№Item/Parameter1.
1Turbineflowmeters1Partialitems1316TurbineflowtransducerJB/T9246-1999AccreditedonlyforliquidDN5~DN3001.
2Electromagneticflowmeters1Partialitems1316ElectromagneticflowmetersJB/T9248-1999AccreditedonlyforliquidDN5~DN3001.
3Vortexsheddingflowmeters1Partialitems1316VortexsheddingflowtransducerJB/T9249-1999AccreditedonlyforliquidDN5~DN3002Rotameter1Partialitems1316GlassRotameterJB/T9255-1999MetaltubRotameterJB/T6844-1993AccreditedonlyforliquidDN5~DN1003Fueldispensers1AllItems1312VehiclefueldispensersGB/T9081-2008中国合格评定国家认可委员会认可证书(注册号:CNASL0134)名称:上海市计量测试技术研究院(华东国家计量测试中心/中国上海测试中心)地址:上海市曹安路1926号签发日期:2009年08月21日有效期至:2012年08月20日更新日期:2012年02月10日2-3认可的校准能力范围序号测量仪器名称校准参量领域代码测量仪器类别规范代号(含年号)名称测量范围扩展不确定度(校准和测量能力,k=2)限制说明备注1.
1质量流量计流量1316CMFJJG897-1995质量流量计检定规程(20~600000)kg/hUrel=0.
05%只做液体DN5~DN2001.
2科里奥利质量流量计流量1316CMFJJG1038-2008科里奥利质量流量计检定规程(20~600000)kg/hUrel=0.
05%只做液体DN5~DN2002.
1速度式流量计流量1316AXFJJG198-1994速度式流量计检定规程静态质量法:(20~600000)kg/hUrel=0.
05%只做液体DN5~DN300标准表法:(0.
2~800)m3/hUrel=0.
2%2.
2电磁流量计流量1316IFM4080JJG1033-2007电磁流量计检定规程静态质量法:(20~600000)kg/hUrel=0.
05%只做液体DN5~DN300标准表法:(0.
2~800)m3/hUrel=0.
2%2.
3超声流量计流量1316AXFJJG1030-2007超声流量计检定规程静态质量法:(20~600000)kg/hUrel=0.
05%只做液体DN5~DN300标准表法:(0.
2~800)m3/hUrel=0.
2%2.
4涡街流量计流量1316AXFJJG1029-2007涡街流量计检定规程静态质量法:(20~600000)kg/hUrel=0.
05%只做液体DN5~DN300标准表法:(0.
2~800)m3/hUrel=0.
2%2.
5涡轮流量计流量1316LWGYJJG1037-2008涡轮流量计检定规程静态质量法:(20~600000)kg/hUrel=0.
05%只做液体DN5~DN300标准表法:(0.
2~800)m3/hUrel=0.
2%3靶式流量计流量1316SBLJJG461-2010靶式流量计检定规程(0.
2~800)m3/hUrel=0.
2%只做DN5~DN3004浮子流量计流量1316LZBJJG257-2007浮子流量计检定规程静态质量法:(20~50000)kg/hUrel=0.
1%只做液体DN5~DN100标准表法:(0.
2~50)m3/hUrel=0.
2%5燃油加油机流量1312LSHJ60-99HJJG443-2006燃油加油机检定规程(5~100)L/minUrel=0.
15%6液化石油气加气机流量1312C11DCEJJG997-2005液化石油气加气机(1~50)L/minUrel=0.
28%CHINANATIONALACCREDITATIONSERVICEFORCONFORMITYASSESSMENTAPPENDIXOFACCREDITATIONCERTIFICATE(RegistrationNo.
CNASL0134)NAME:ShanghaiInstituteofMeasurementandTestingTechnology(NationalCenterofMeasruementandTestingforEastChina/NationalCenterofTestingTechnology,Shanghai)ADDRESS:No.
1926,CaoanRoad,ShanghaiDateofIssue:2009-08-21DateofExpiry:2012-08-20DateofUpdate:2012-02-10APPENDIX2-3SCOPEOFACCREDITEDCALIBRATION№InstrumentParameterCodeofFieldCategoryTitle,CodeofCalibrationMethodRangeUncertainty(CMC,k=2)LimitationNote1.
1MassFlowMetersFlowrate1316CMFV.
R.
ofMassFlowMetersJJG897-1995(20~600000)kg/hUrel=0.
05%AccreditedonlyforFluidDN5~DN2001.
2CoriolisMassFlowMetersFlowrate1316CMFV.
R.
ofCoriolisMassFlowMetersJJG1038-2008(20~600000)kg/hUrel=0.
05%AccreditedonlyforFluidDN5~DN2002.
1VelocityFlowMetersFlowrate1316AXFV.
R.
ofVelocityFlowMetersJJG198-1994StaticWeightmethod:(20~600000)kg/hUrel=0.
05%AccreditedonlyforDN5~DN300Mastermetermethod:(0.
2~800)m3/hUrel=0.
2%2.
2ElectromagneticFlowmetersFlowrate1316IFM4080V.
R.
ofElectromagneticFlowmetersJJG1033-2007StaticWeightmethod:(20~600000)kg/hUrel=0.
05%AccreditedonlyforDN5~DN300Mastermetermethod:(0.
2~800)m3/hUrel=0.
2%2.
3UltrasonicFlowmetersFlowrate1316AXFV.
R.
ofUltrasonicFlowmetersJJG1030-2007StaticWeightmethod:(20~600000)kg/hUrel=0.
05%AccreditedonlyforDN5~DN300Mastermetermethod:(0.
2~800)m3/hUrel=0.
2%2.
4Vortex-sheddingFlowmetersFlowrate1316AXFV.
R.
ofVortex-sheddingFlowmetersJJG1029-2007StaticWeightmethod:(20~600000)kg/hUrel=0.
05%AccreditedonlyforDN5~DN300Mastermetermethod:(0.
2~800)m3/hUrel=0.
2%2.
5TurbineFlowmetersFlowrate1316LWGYV.
R.
ofTurbineFlowmeterJJG1037-2008StaticWeightmethod:(20~600000)kg/hUrel=0.
05%AccreditedonlyforDN5~DN300Mastermetermethod:(0.
2~800)m3/hUrel=0.
2%3TargetFlowmetersFlowrate1316SBLV.
R.
oftargetflowmeterJJG461-2010(0.
2~800)m3/hUrel=0.
2%OnlyforDN5~DN3004FloatmetersFlowrate1316LZBV.
R.
ofFloatmetersJJG257-2007StaticWeightmethod(20~50000)kg/hUrel=0.
1%AccreditedonlyforFluidDN5~DN100Mastermetermethod(0.
2~50)m3/hUrel=0.
2%5FueldispensersFlowrate1312LSHJ60-99HV.
R.
offueldispensersJJG443-2006(5~100)L/minUrel=0.
15%6LiquefiedPetroleumGasDispensersFlowrate1312C11DCEV.
R.
ofLiquefiedPetroleumGasDispensersJJG997-2005(1~50)L/minUrel=0.
28%中国合格评定国家认可委员会认可证书(注册号:CNASL0134)名称:上海市计量测试技术研究院(华东国家计量测试中心/中国上海测试中心)地址:上海市曹安路1926号签发日期:2009年08月21日有效期至:2012年08月20日更新日期:2012年02月10日3-3认可的授权签字人及领域序号姓名授权签字领域备注1张进明流量检测与校准项目2张翊流量检测与校准项目3任学弟流量检测与校准项目4史国豪流量检测与校准项目5陈超流量检测与校准项目6王灿流量检测与校准项目CHINANATIONALACCREDITATIONSERVICEFORCONFORMITYASSESSMENTAPPENDIXOFACCREDITATIONCERTIFICATE(RegistrationNo.
CNASL0134)NAME:ShanghaiInstituteofMeasurementandTestingTechnology(NationalCenterofMeasruementandTestingforEastChina/NationalCenterofTestingTechnology,Shanghai)ADDRESS:No.
1926,CaoanRoad,ShanghaiDateofIssue:2009-08-21DateofExpiry:2012-08-20DateofUpdate:2012-02-10APPENDIX3-3ACCREDITEDSIGNATORIESANDSCOPE№NameAuthorizedScopeofSignatureNote1ZhangJinmingCalibrationandTestItemsforflow2ZhangYiCalibrationandTestItemsforflow3RenXuediCalibrationandTestItemsforflow4ShiGuohaoCalibrationandTestItemsforflow5ChenchaoCalibrationandTestItemsforflow6WangCanCalibrationandTestItemsforflow中国合格评定国家认可委员会认可证书(注册号:CNASL0134)名称:上海市计量测试技术研究院(华东国家计量测试中心/中国上海测试中心)地址:上海市田林路487号23号楼签发日期:2009年08月21日有效期至:2012年08月20日更新日期:2011年06月01日1-4认可的检测能力范围序号检测对象项目/参数领域代码检测标准(方法)名称及编号(含年号)限制范围说明序号名称1对绞电缆1部分项目0424数字通信用实心聚烯烃绝缘水平对绞电缆YD/T1019-2001平衡双绞线通信电缆和组件标准ANSI/TIA-568-C.
2-2009不测绝缘外径,绝缘颜色及色迁移,编织的填充系数,电缆低温冲击,电缆反复弯曲,绝缘热老化后的卷绕,安全性能,抗张强度,转移阻抗2网络系统1网络拓扑结构0420信息技术系统间的通信和信息交换局域网和城域网特殊要求第3部分:载波检测多址存取采用冲突检测(CSMA/CD)的存取方法和物理层规范IEEE802.
3-2008信息处理系统局域网第三部分:带碰撞检测的载波侦听多址访问(CSMA/CD)的访问方法和物理层规范GB/T15629.
3-1995基于以太网技术的用户驻地网及其与公众网互联的技术规范DB31/T285-20022业务类型3传输速率4广播率5错误率6利用率7冲突率3网络设备1吞吐率0419网络互连设备的基本测试方法RFC2544-1999交换机的基本测试方法RFC2889-20002背靠背3延时4丢包率5队头阻塞6差错控制7广播8地址容量4建筑设备监控及电源接地系统1电源电压波动0419智能建筑设计标准GB/T50314-2006智能建筑工程质量验收规范GB50339-2003信息技术设备用不间断电源通用技术条件GB/T14715-1993防静电活动地板通用规范SJ/T10796-20012电源频率变化3接地电阻4静电电压5温度6湿度7噪音8直流电压9直流电流10报警/响应时间11阀门行程12UPS供电时间13UPS输出电压14UPS输出频率15UPS电池再充电时间16系统电阻5综合布线系统1电缆系统电气性能0419综合布线系统工程验收规范GB50312-2007信息技术用户建筑群的通用布线ISO/IEC11801-2002商业建筑电信布线标准ANSI/TIA-568-C.
1-2009平衡双绞线通信电缆和组件标准ANSI/TIA-568-C.
2-20092光缆衰减3光缆长度6住宅信息配线箱1全部项目0419住宅信息配线箱通用技术条件DB31/T289-20037电子信息系统机房1温度0403电子计算机场地通用规范GB/T2887-2000电子信息系统机房设计规范GB50174-2008电子信息系统机房施工及验收规范GB50462-20082湿度3尘埃4照明5噪声6接地7稳态电压偏移范围8稳态频率偏移范围9电压波形畸变率10允许断电持续时间11无线电干扰环境场强12磁场干扰场强13系统电阻、表面电阻14正压0403电子信息系统机房设计规范GB50174-2008电子信息系统机房施工及验收规范GB50462-200815风量与风速16机房布线17机房监控与安全防范18振动电子信息系统机房设计规范GB50174-200819静电20活动地板高度21送回风温度差22零地电压23不间断电源系统输入端的THDI3~39次谐波24公用电网谐波电能质量公用电网谐波GB/T14549-199325电压波动和闪变电能质量电压波动和闪变GB/T12326-20087电子信息系统机房26三相电压不平衡0403电能质量三相电压不平衡GB/T15543-200827电力系统频率偏差电能质量电力系统频率偏差GB/T15945-200828供电电压偏差电能质量供电电压偏差GB/T12325-200829蓄电池浮充电压通信用阀控式密封铅酸蓄电池YD/T799-2002IEEE推荐用于站用阀控铅酸(VRLA)蓄电池的维护测试和更换方法IEEEStd1188-200530蓄电池内阻31蓄电池连接电阻8综合布线用连接硬件1插入衰减0419平衡双绞线通信电缆和组件标准ANSI/TIA-568-C.
2-2009大楼通信综合布线系统第3部分:连接硬件和接插软线技术要求YD/T926.
3-20092近端串音3回波损耗9视频安防监控系统1施工质量0419民用闭路监视电视系统工程技术规范GB50198-19942图象质量的主观评价民用闭路监视电视系统工程技术规范GB50198-1994安全防范系统验收规则GA308-20013清晰度民用闭路监视电视系统工程技术规范GB50198-1994安全防范系统验收规则GA308-20014灰度民用闭路监视电视系统工程技术规范GB50198-1994安全防范系统验收规则GA308-20015系统功能测试安全防范工程技术规范GB50348-2004民用闭路监视电视系统工程技术规范GB50198-1994安全防范系统验收规则GA308-20016输出电平民用闭路监视电视系统工程技术规范GB50198-1994电视视频通道测试方法GB/T3659-19837不平坦度测试10防静电地面1全部项目0434防静电地面施工及验收规范SJ/T31469-200211防静电活动地板1部分项目0434防静电活动地板通用规范SJ/T10796-2001不测集中荷载、极限集中荷载、均布荷载12地板覆盖层和装配地板1全部项目0434地板覆盖层和装配地板静电性能的试验方法SJ/T11159-199813电子产品制造与应用系统防静电1全部项目0434电子产品制造与应用系统防静电检测通用规范SJ/T10694-200614固体绝缘材料电阻1全部项目0434固体绝缘材料体积电阻率和表面电阻率试验方法GB/T1410-200615PVC热塑性防静电贴面板的技术/三聚氰胺热固性防静电贴面板1部分项目0434防静电贴面板通用规范SJ/T11236-2001不测表面耐干热性能测定、凹陷度、残余凹陷度、抗冲击性能、耐老化16防静电鞋、导电鞋1部分项目434电子产品制造与应用系统防静电检测通用规范SJ/T10694-2006只测体积电阻17防静电工作服1部分项目0434防静电工作服GB12014-2009不测理化性能18通信机房1全部项目0434通信机房静电防护通则YD/T754-199519EPA内防静电装备1部分项目0434防静电工作区技术要求GJB3007A-2009不测防雷击接地系统、EPA环境电磁场强度、接地系统的电磁兼容要求20防静电操作系统1部分项目0434防静电操作系统通用规范QJ2846-1996不测静电泄放21ESDS元器件、组件和设备1静电放电敏感度分级试验0434电子产品防静电放电控制大纲GJB1649-199322厂界噪声1噪声0434工业企业厂界环境噪声排放标准GB12348-200823电子计算机场地1全部项目0434电子计算机场地通用规范GB/T2887-200024电子计算机机房1部分项目0434电子信息系统机房设计规范GB50174-2008只测静电25家用和类似用途电器1部分项目0437家用和类似用途电器的安全第一部分:通用要求GB4706.
1-1998不测:22.
16自动卷线测试装置、22.
31氧弹测试、22.
47水压测试仪、23.
3弯曲测试、24元件、27.
4镀层测定仪、32辐射、毒性和类似危险家用和类似用途电器的安全第1部分:通用要求GB4706.
1-2005不测:14瞬间过电压、21.
2钢针、22.
16自动卷线测试装置、22.
31-22.
32品红、氧弹测试、22.
47水压测试仪、23.
3弯曲测试、24元件、27.
4镀层测定仪32辐射、毒性和类似危险、附录J印刷电路板试验、附录R软件评估2部分项目0437家用和类似用途电器的安全微波炉,包括组合型微波炉的特殊要求GB4706.
21-2008不测:组合型微波炉、19非正常工作、21机械强度、22结构家用微波炉性能测试方法GB/T18800-2008IEC60705:2006不测加热性能、烹调性能、解冻性能25家用和类似用途电器3部分项目0437家用和类似用途电器的安全便携式电磁灶的特殊要求GB4706.
29-2008不测:11发热全部项目电磁灶QB/T1236-20084部分项目0437家用和类似用途电器的安全皮肤及毛发护理器具的特殊要求GB4706.
15-2008不测元件,辐射、毒性和类似危险、附录R软件评估5部分项目0437家用和类似用途电器的安全第2部分:风扇的特殊要求GB4706.
27-2008不测元件,辐射、毒性和类似危险、风扇摇摆寿命试验、附录R软件评估6部分项目0437家用和类似用途电器的安全挥发器的特殊要求GB4706.
81-2006不测元件,辐射、毒性和类似危险、附录R软件评估26医用电器设备的安全试验1部分项目0437医用电气设备第1部分:安全通用要求GB9706.
1-2007只测输入功率和电流;环境条件;电压和(或)能量的限制;外壳和防护罩;隔离;保护接地;连续漏电流;电介质强度;机械强度;端子和连接的保护接地;结构和布线27信息技术设备的安全试验1部分项目0437信息技术设备的安全GB4943-2001IEC60950-1-1999不测:可燃液体、限流电流、受限制电源、元器件划痕试验、模拟异常条件、防火28音频、视频及类似电子设备的安全试验1部分项目0437音频、视频及类似电子设备安全要求GB8898-2001只测发热(监视器/电视机)、防触电的结构要求、机械强度、保护接地措施、外接软线、电气连接和机械固定29不间断电源系统(UPS)1全部项目1207不间断电源系统(UPS)在操作人员接触区内使用的UPS的通用和安全要求SJ11237-2001不间断电源设备(UPS)第3部分:确定性能的方法和试验要求GB/T7260.
3-2003信息技术设备用不间断电源通用技术条件GB/T14715-19932部分项目不间断电源设备第1-1部分:操作人员触及区使用的UPS的一般规定和安全要求GB7260.
1-2008不测限流电路、受限制电源、气体浓度、防火、模拟故障3部分项目不间断电源设备第1-2部分:限制触及区使用的UPS的一般规定和安全要求GB7260.
4-2008不测限流电路、受限制电源、气体浓度、防火、模拟故障30交流稳压器1全部项目0415补偿式交流稳压器JB/T7620-199431低压直流电源1全部项目0415低压直流电源设备的性能特性GB/T17478-200432人民币伪钞鉴别仪1全部项目0438人民币伪钞鉴别仪GB16999-199733电工电子产品的环境试验1外壳防护0431外壳防护等级(IP代码)GB4208-20082阳光辐射电工电子产品环境试验第2部分:试验方法试验Sa:模拟地面上的太阳辐射GB/T2423.
24-199534广播扩声系统检测1系统功能0419智能建筑工程质量验收规范GB50339-20032音响效果的主观评价3声压级检测4最高输出电平5输出信噪比6接地电阻35电工电子产品着火危险试验1全部项目1700电工电子产品着火危险试验第15部分:试验火焰500W火焰装置和确认试验方法GB/T5169.
15-20082全部项目1700电工电子产品着火危险试验第16部分:试验火焰50W水平与垂直火焰试验方法GB/T5169.
16-20083全部项目1700电工电子产品着火危险试验第17部分:试验火焰500W火焰试验方法GB/T5169.
17-20084全部项目1700电工电子产品着火危险试验第22部分:试验火焰50W火焰装置和确认试验方法GB/T5169.
22-20085全部项目1700电工电子产品着火危险试验第10部分:灼热丝/热丝基本试验方法灼热丝装置和通用试验方法GB/T5169.
10-20066全部项目1700电工电子产品着火危险试验第11部分:灼热丝/热丝基本试验方法成品的灼热丝可燃性试验方法GB/T5169.
11-20067全部项目1700电工电子产品着火危险试验第12部分:灼热丝/热丝基本试验方法材料的灼热丝可燃性试验方法GB/T5169.
12-20068全部项目1700电工电子产品着火危险试验第13部分:灼热丝/热丝基本试验方法成品的灼热丝起燃性试验方法GB/T5169.
13-200636接触式IC卡1部分项目0418识别卡带触点的集成电路卡第3部分:电信号和传输协议GB/T16649.
3-2006ISO/IEC7816-3-2006只测电特性2部分项目识别卡物理特性GB/T14916-2006ISO/IEC7810-2003识别卡测试方法GB/T17554.
1-2006只测卡尺寸、翘曲、弯曲韧性、温度、湿度条件下卡尺寸的稳定性和翘曲、动态弯曲应力、动态扭曲应力、可燃性、耐化学性、剥离强度、粘连和并块36接触式IC卡3触电的尺寸与位置0418识别卡带触点的集成电路卡第2部分:触点的尺寸和位置GB/T16649.
2-20064部分项目识别卡带触点的集成电路卡第1部分:物理特性GB/T16649.
1-2006ISO/IEC7816-1-1998只测触点的电阻、电磁场、静电、紫外线、X射线、触点的表面轮廓、机械强度37非接触式IC卡1部分项目0418识别卡-非接触式集成电路卡-临近卡-第一部分:物理特性ISO/IEC14443-1-2008识别卡物理特性GB/T14916-2006城市轨道交通单程票非接触集成电路IC卡通用技术规范DGJ08-1102-2005J10511-2005城市公共交通非接触集成电路IC卡通用技术规范DGJ08-1103-2005J10512-2005只测卡尺寸、动态弯曲应力、动态扭曲应力、紫外线、静磁场、静电、抗交变电磁场、抗X射线、温度、湿度条件下卡尺寸的稳定性和翘曲、翘曲、弯曲韧性、耐化学性、可燃性测粘连和并块、剥离强度、振动2部分项目识别卡-非接触式集成电路卡-临近卡-第二部分:无线电传输频率和信号接口ISO/IEC14443-2-2001城市公共交通非接触式集成电路(IC卡)第一部分卡的特性DB31/239.
1-2000城市轨道交通单程票非接触集成电路IC卡通用技术规范DGJ08-1102-2005J10511-2005城市公共交通非接触集成电路IC卡通用技术规范DGJ08-1103-2005J10512-2005只测初始化功能和电性能、13.
56MHz时的应答振幅、谐振频率、频率特性、完成一次交易时间、调制深度、波形失真、动态刷卡时间3部分项目SHC1101系列非接触式集成电路卡Q/OAKC001-2001只做可靠性试验38税控IC卡1全部项目0418税控收款机第2部分:税控IC卡规范GB18240.
2-2003只测电特性、物理特性、化学+功能性测试CHINANATIONALACCREDITATIONSERVICEFORCONFORMITYASSESSMENTAPPENDIXOFACCREDITATIONCERTIFICATE(RegistrationNo.
CNASL0134)NAME:ShanghaiInstituteofMeasurementandTestingTechnology(NationalCenterofMeasruementandTestingforEastChina/NationalCenterofTestingTechnology,Shanghai)ADDRESS:23#,No.
487,TianlinRoad,ShanghaiDateofIssue:2009-08-21DateofExpiry:2012-08-20DateofUpdate:2011-06-01APPENDIX1-4SCOPEOFACCREDITEDTESTING№TestObjectItem/ParameterCodeofFieldTitle,CodeofStandardorMethodLimitationNote№Item/Parameter1MulticoreandSymmetricalPair/QuadCable1Partialitems0424MulticoreandSymmetricalPair/QuadCableforDigitalCommunicationsHorizontalfloorWiring-SolidPolyolefinInsulateYD/T1019-2001BalancedTwistedPairTelecommunicationsCablingandComponentsStandardsANSI/TIA-568-C.
2-2009ExceptforMaximumoutsidediameterofinsulatingmaterials,colorandColormigrationofinsulatingmaterials,Wovenfillingfactor,Coldimpact,continuousbending,wrappingtestofinsulatingmaterialsafterthermalageing,wrappingtestofinsulatingmaterialsatlowtemperature,securityperformance,tensilestrength,TransferImpedance2EthernetNetworkSystem1Networktopology0420StandardforInformationtechnologyTelecommunicationsandinformationexchangebetweensystemsLocalandmetropolitanareanetworksSpecificrequirementsPart3:Carriersensemultipleaccesswithcollisiondetection(CSMA/CD)accessmethodandphysicallayerspecificationsIEEE802.
3-2008Informationprocessingsystems-Localareanetworks-parts3:Carriersensemultipleaccesswithcollisiondetetion(CSMA/CD)acessmethodandphysicalGB/T15629.
3-1995TechnicalSpecificationforCPNbasedonEthernetTechnologyanditsInternetworkingwithPublicNetworkDB31/T285-20022ServiceType3Transferrate4Broadcastrate5Errorrate6Utilizationrate7Conflictrate3EthernetNetworkEquipment1Throughput0419BenchingmarkingMethodologyforNetworkInterconnectDevicesRFC2544-1999BenchingmarkingMethodologyforLANSwitchingDevicesRFC2889-20002Back-to-Back3Latency4FrameLoss5HeadCongest6ErrorControl7Broadcast8MACaddresscapability4BuildingAutomationSystemandPowerGroundsystem1Powervoltagefluctuation0419StandardfordesignofintelligentbuildingGB/T50314-2006CodeforacceptanceofqualityofintelligentbuildingsystemsGB50339-2003GenericspecificationofuninterruptiblepowersupplyforinformationtechnicalequipmentGB/T14715-1993GeneralspecificationforraisedaccessfloorsforelectronstaticprotectionSJ/T10796-20012Powerfrequencydiversification3Groundingresistance4Electrostaticvoltage5Temperature6Humidity7Noise8DCvoltage9DCcurrent10Alarm/Responseinterval11Valvemovement12UPSbatterysupplytime13UPSpowersupplyvoltage14UPSpowersupplycurrent15UPSbatteryrechargetime16Systemresistance5GenericcablingSystemTesting1Electricalperformanceofcablesystems0419CodeforengineeringacceptanceofgenericcablingsystemforbuildingandcampusGB50312-2007InformationtechnologyGenericcablingForcustomerpremisesISO/IEC11801-2002CommercialBuildingTelecommunicationsCablingStandardANSI/TIA-568-C.
1-2009BalancedTwistedPairTelecommunicationsCablingandComponentsStandardsANSI/TIA-568-C.
2-20092FiberLoss3Fiberlength6TelecomJunctionBoxforHouse1Allitems0419GeneralTechnicalRequirementofTelecomJunctionBoxforHouseDB31/T289-20037ElectronicInformationSystemRoom1temperature0403SpecificationforelectroniccomputerfieldGB/T2887-2000CodefordesignofelectronicinformationsysternroomGB50174-2008CodeforconstructionandacceptanceofelectronicinformationsystemroomGB50462-20082Indoorhumidity3dust4ligehting5Noise6Groundingresistance7Rangeofsteady-statevoltageoffset8Steady-statefrequencyoffsetrange9Voltagedistortion10Allowpower-offduration11RadioInterferencefieldstrength12Magneticinterference13Systemresistance,surfaceresistance7ElectronicInformationSystemRoom14Pressure0403CodefordesignofelectronicinformationsysternroomGB50174-2008CodeforconstructionandacceptanceofelectronicinformationsystemroomGB50462-200815Airflowandwindspeed16cablingSystem17Monitoringandsafetyprecautions18VibrationCodefordesignofelectronicinformationsysternroomGB50174-200819Staticelectricity20Raisedfloorheight21Returnairtemperaturedifference22Zerogroundvoltage23UPSinputharmonicsTHDI3~3924Harmonicsinpublicsupplynetwork0403Qualityofelectricenergysupply-HarmonicsinpublicsupplynetworkGB/T14549-199325VoltagefluctuationandflickerPowerquality—VoltagefluctuationandflickerGB/T12326-200826Three-phasevoltageunbalancePowerquality—Three-phasevoltageunbalanceGB/T15543-200827FrequencydeviationforpowersystemPowerquality—FrequencydeviationforpowersystemGB/T15945-200828DeviationofsupplyvoltagePowerquality—DeviationofsupplyvoltageGB/T12325-20087ElectronicInformationSystemRoom29BatteryfloatvoltageValve-RegulatedLeadAcidBatteryforTelecommunicationsYD/T799-2002RecommendedPracticeforMaintenance,Testing,andReplacementofValve-RegulatedLead-Acid(VRLA)BatteriesforStationaryApplicationsIEEEStd1188-200530Batteryinternalresistance31Batteryconnectionresistance8ConnectinghardwareforPDS1InsertionAttenuation0419BalancedTwistedPairTelecommunicationsCablingandComponentsStandardsANSI/TIA-568-C.
2-2009BuildingCommunicationCablingSystemsPart3:ConnectthehardwareandtechnicalrequirementsforpatchcordsYD/T926.
3-20092NEXT3ReturnLoss9Videomonitoringsecuresystem1ConstructionQualityofSystem0419TechnicalcodeforregunationofcivilclosedcircuitmonitoringTVsystemGB50198-19942TheobjectivetestofImagequalityTechnicalcodeforregunationofcivilclosedcircuitmonitoringTVsystemGB50198-1994AcceptancecheckcritertionofsecurityandalarmsystemsGA308-20013definitionTechnicalcodeforregunationofcivilclosedcircuitmonitoringTVsystemGB50198-1994AcceptancecheckcritertionofsecurityandalarmsystemsGA308-20019Videomonitoringsecuresystem4Gray0419TechnicalcodeforregunationofcivilclosedcircuitmonitoringTVsystemGB50198-1994AcceptancecheckcritertionofsecurityandalarmsystemsGA308-20015TestofsystemfunctionTechnicalcodeforengineeringofsecurityandprotectionsystemGB50348-2004TechnicalcodeforregunationofcivilclosedcircuitmonitoringTVsystemGB50198-1994AcceptancecheckcritertionofsecurityandalarmsystemsGA308-20016OutputLevelTechnicalcodeforregunationofcivilclosedcircuitmonitoringTVsystemGB50198-1994MethodsofmeasurementoftelevisionvideochannelGB/T3659-19837Flatness10Antistaticfloor1Allitems0434ConstmcitonandacceptancecodeforantistaticfloorSJ/T31469-200211Raisedaccessfloorsforelectrostaticprotection1Partialitems0434GeneralspecificationforraisedaccessfloorsforelectrostaticprotectionSJ/T10796-2001ExceptforConcentratedLoad,UltimateConcentratedLoad,Uniformload12Electrostaticbehaviouroffloorcoveringsandinstalledfloors1Allitems0434TestmethodsforelectrostaticbehaviouroffloorcoveringsandinstalledfloorsSJ/T11159-199813Electrostaticprotectionforelectronicproductionmanufacturingandusingsystem1Allitems0434GeneralspecificationoftestingmethodforelectrostaticprotectioninelectronicproductionmanufacturingandusingsystemSJ/T10694-200614Resistanceofsolidelectricalinsulatingmaterials1Allitems0434MethodsoftestforvolumeresistivityandsurfaceresistivityofsolidelectricalinsulatingmaterialsGB/T1410-200615PVCanti-staticthermoplastic/MelaminethermosettingElectrostaticprotectioncovers1Partialitems0434GeneralspecificationforelectrostaticprotectioncoversSJ/T11236-2001ExceptforPerformanceofsurfaceresistancetodryheat,Concavity,Residualconcavity,Impactresistance,Aging-resistant16Antistaticfootwearandconductivefootwear1Partialitems0434GeneralspecificationoftestingmethodforelectrostaticprotectioninelectronicproductionmanufacturingandusingsystemSJ/T10694-2006Onlyforvolumeresistance17Workingclothingofanti-electrostatic1Partialitems0434Workingclothingofanti-electrostaticGB12014-2009ExceptforPhysicsandchemistryperformances18Telecommunicationsroom1Allitems0434TelecommunicationsroomelectrostaticprotectiveGeneralClausesYD/T754-199519ElectrostaticdischargeprotectedequipmentsinsideEPA1Partialitems0434RequirementsforelectrostaticdischargeprotectedareaGJB3007A-2009Exceptforearthsystemfordefendingthelightning,EPAenvironmentalelectromagneticfieldstrength、EMCrequirementofearthsystem20Operatingsystemforelectrostaticprotection1Partialitems0434GeneralspecificationofoperatingsystemforelectrostaticprotectionQJ2846-1996ExceptforElectrostaticdischarge21ESDSparts,ComponentsandEquipment1ESDSensitivityTest0434ElectrostaticdischargecontrolprogramforprotectionofelectronicproductsGJB1649-199322Industrialenterprisesnoise1Noise0434EmissionstandardforindustrialenterprisesnoiseatboundaryGB12348-200823Electroniccomputerfield1Allitems0434SpecificationforelectroniccomputerfieldGB/T2887-200024ElectronicComputerRoom1Partialitems0434DesingCodeforElectronicComputerRoomGB50174-2008AccreditedonlyforElectrostatictest25SafetyTestingforHouseholdandsimilarelectricalappliances1Partialitems0437SafetyofhouseholdandsimilarelectricalappliancesPart1:GeneralrequirementGB4706.
1-1998Exceptfor22.
16cords,22.
31Oxygenbomb,22.
47Waterpressuretestapparatus,23.
3Flexingtestapparatus,24Components,27.
4thethicknessofthecoating,32Radiation,toxicityandsimilarhazardsHouseholdandsimilarelectricalappliances–Safety–Part1:GeneralrequirementsGB4706.
1-2005Exceptfor14Transientovervoltage,21.
2Hardenedsteelpin,22.
16cords,22.
31-22.
32Oxygenbomb,22.
47Waterpressuretestapparatus,23.
3Flexingtestapparatus,24Components,27.
4thethicknessofthecoating,32Radiation,toxicityandsimilarhazards,AnnexJCoatedprintedcircuitboards,AnnexRSoftwareevaluation2Partialitems0437Householdandsimilarelectricalappliances–Safety-Particularrequirementsformicrowaveovens,includingcombinationmicrowaveovensGB4706.
21-2008Exceptforcombinationmicrowaveovens,19Abnormaloperation,21Mechanicalstrength22ConstructionPartialitemsHouseholdmicrowaveoven—MethodsformeasuringperformanceGB/T18800-2008IEC60705:2006ExceptforHeatingperformance,Cookingperformance,Defrostingperformance25SafetyTestingforHouseholdandsimilarelectricalappliances3Partialitems0437Householdandsimilarelectricalappliances–Safety-ParticularrequirementsforportableinductioncookersGB4706.
29-2008Exceptfor11HeatingAllitemsInductioncookerQB/T1236-20084Partialitems0437Householdandsimilarelectricalappliances-safety-ParticularrequirementsforappliancesforskinorhaircareGB4706.
15-2008ExceptforComponents,Radiation,toxicityandsimilarhazards,AnnexRSoftwareevaluation5Partialitems0437Householdandsimilarelectricalappliances-safety-Part2:ParticularrequirementsforfansGB4706.
27-2008ExceptforComponents,Radiation,toxicityandsimilarhazards,AnnexRSoftwareevaluation6Partialitems0437Householdandsimilarelectricalappliances–Safety–ParticularrequirementsforvaporizersGB4706.
81-2006ExceptforComponents,Radiation,toxicityandsimilarhazards,AnnexRSoftwareevaluation26SafetyTestingforMedicalelectricalequipment1Partialitems0437Medicalelectricalequipment—Part1:GeneralrequirementsforsafetyGB9706.
1-2007AccreditedonlyforInputpower¤t;Environmentalcondition;Limittovoltage&(or)energy;Enclose&Protectivecover;Isolating;Protectivegrounded;Continuousleakagecurrent;Electricstrength;Mechanical1Partialitems0437Medicalelectricalequipment—Part1:GeneralrequirementsforsafetyGB9706.
1-2007strength;Protectivegrounded(connecting&terminal);Structure&layline27SafetyTestingforInformationtechnologyequipment1Partialitems0437SafetyofinformationtechnologyequipmentGB4943-2001IEC60950-1-1999ExceptforLimitedcurrentcircuits,Limitedpowersources,Scratchtest,Faultsimulation,Resistancetofire,Flammableliquids28SafetyTestingforAudio,videoandsimilarelectronicapparatus1Partialitems0437Audio,videoandsimilarelectronicapparatus-SafetyrequirementsGB8898-2001AccreditedOnlyforHeating(monitor/TV),Constructionalrequirementswithregardtotheprotectionagainstelectricshock,Mechanicalstrength,Provisionsforprotectiveearthing,Externalflexiblecords,Electricalconnectionsandmechanicalfixings29UninterruptiblePowerSystems(UPS)1Allitems1207UninterruptiblePowerSystems(UPS)–GeneralandsafetyrequirementsforUPSusedinoperatoraccessareasSJ11237-2001UninterruptiblePowerSystems(UPS)–Part3:MethodofspecifyingtheperformanceandtestrequirementsGB/T7260.
3-2003GenericspecificationofuninterruptiblepowersupplyforinformationtechnicalequipmentGB/T14715-19932PartialitemsUninterruptiblepowersystems(UPS)-Part1-1:GeneralandsafetyrequirementsforUPSusedinoperatoraccessareasGB7260.
1-2008ExceptforLimitedcurrentcircuits,Limitedpowersources,Gasconcentrations,Faultsimulation,Resistancetofire29UninterruptiblePowerSystems(UPS)3PartialitemsUninterruptiblePowerSystems(UPS)-Part1-2:GeneralandsafetyrequirementsforUPSusedinrestrictedaccesslocationsGB7260.
4-2008ExceptforLimitedcurrentcircuits,Limitedpowersources,Gasconcentrations,Faultsimulation,Resistancetofire30ACVoltageStabilizer1Allitems0415CompensationTypeACVoltageStabilizerJB/T7620-199431Low-voltagepowersupplydevices1Allitems0415Low-voltagepowersupplydevices,d.
c.
output—PerformancecharacteristicsGB/T17478-200432CounterfeitRMB-BanknoteDiscriminatingDevice1Allitems0438CounterfeitRMB-BanknotediscriminatingdeviceGB16999-199733EnviromentaltestingforElectricandelectronicproducts1Protectionprovidedbyenclosure0431Degreesofprotectionprovidedbyenclosure(IPcode)GB4208-20082SolarradiationEnvironmentaltestingforelectricandelectronicproductsPart2:TestmethodsTestSa:SimulatedsolarradiationatgroundlevelGB/T2423.
24-199534TestofBroadcastingsoundreinforcementSystem1systemfunction0419CodeforacceptanceofqualityofintelligentbuildingsystemsGB50339-20032Subjectiveevaluationofthesoundeffects3Testofsoundpressurelevel4Maximumoutputofvoltagelevel5OutputSNR6Groundingresistance35Firehazardtestingforelectricandelectronicproducts1Allitems1700Firehazardtestingforelectricandelectronicproducts-Part15:Testflames-500Wflames-ApparatusandconfirmationaltestmethodsGB/T5169.
15-20082Allitems1700Firehazardtestingforelectricandelectronicproducts-Part16:Testflames-50WhorizontalandverticalflametestmethodsGB/T5169.
16-20083Allitems1700Firehazardtestingforelectricandelectronicproducts-Part17:Testflames-500WflametestmethodsGB/T5169.
17-20084Allitems1700Firehazardtestingforelectricandelectronicproducts-Part22:Testflames-50Wflames-ApparatusandconfirmationaltestmethodsGB/T5169.
22-20085Allitems1700Firehazardtestingforelectricandelectronicproducts-Part10:Glow/hot-wirebasedtestmethods-Glow-wireapparatusandcommontestprocedureGB/T5169.
10-200635Firehazardtestingforelectricandelectronicproducts6Allitems1700FirehazardtestingforelectricandelectronicproductsPart11:Glowing/hot-wirebasedtestmethods-Glow-wireflammabilitytestmethodforend-productsGB/T5169.
11-20067Allitems1700Firehazardtestingforelectricandelectronicproducts-Part12:Glowing/hot-wirebasedtestmethods-Glow-wireflammabilitytestmethodformaterialsGB/T5169.
12-20068Allitems1700Firehazardtestingforelectricandelectronicproducts-Part13:Glowing/hot-wirebasedtestmethods-Glow-wireignitabilitytestmethodformaterialsGB/T5169.
13-200636Integratedcircuit(s)cardswithcontactes1Partialitems0418Identificationcards-Integratedcircuit(s)cardswithcontacts-Parts3:ElectronicsignalsandtransmissionprotocolsGB/T16649.
3-2006ISO/IEC7816-3-2006AccreditedonlyforElectricalcharacteristics2PartialitemsIdentificationcards-PhysicalcharacteristicsGB/T14916-2006ISO/IEC7810-2003Identificationcards-TestmethodsGB/T17554.
1-2006AccreditedonlyDimensionofcards、Overallcardwarpage,Bendingstiffness,Carddimensionalstabilityandwarpagewithtemperatureandhumidity,Bendingproperties,Torsionproperties,Flammability,Resistancetochemical,Peelstrength,Adhensionorblocking36Integratedcircuit(s)cardswithcontactes3DimensionandLocationofthecontacts0418Identificationcards-Integratedcircuit(s)withcontacts-Part2DimensionandLocationofthecontactsGB/T16649.
2-20064PartialitemsIdentificationcards-Integratedcircuit(s)withcontacts-Integratedcircuit(s)cardswithconcacts-Parts1:PhysicalcharacteristicsGB/T16649.
1-2006ISO/IEC7816-1-1998AccreditedonlyforElectricalresistance,Staticelectromagneticfield,Electricalresistance(ofcontacts),Ultravioletlight,X-rays,Surfaceprofileofcontacts,Mechanicalstrength(ofcardsandcontacts)37ContactlessIntegratedcircuit(s)cards1Partialitems0418Identificationcards-Contactlessintegratedcircuit(s)cards-Proximitycards-part1:PhysicalcharacteristicsISO/IEC14443-1-2008Identificationcards-PhysicalcharacteristicsGB/T14916-2006Identificationcards-TestmethodsGB/T17554.
1-2006Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofsinglejourneyticketforurbanrailtransitDGJ08-1102-2005J10511-2005Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofurbanpublictransportDGJ08-1103-2005J10512-2005AccreditedonlyforDimensionofcards,Bendingproperties,Torsionproperties,Ultravioletlight,Staticelectromagneticfield,Electricalresistance,Alternatingelectromagneticfield,X-rays,Carddimensionalstabilityandwarpagewithtemperatureandhumidity,Overallcardwarpage,Bendingstiffness,Resistancetochemical,Flammability,Adhensionorblocking,Peelstrength,Vibrations37ContactlessIntegratedcircuit(s)cards2Partialitems0418Identificationcards-Contactlessintegratedcircuit(s)cards-Proximitycards-part2:RadiofrequencypowerandsignalinterfaceISO/IEC14443-2-2001ContactlessIntegratedCircuit(s)(IC)CardforCityPublicTrafficPart1:TechnicalSpecificationofICCardDB31/239.
1-2000Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofsinglejourneyticketforurbanrailtransitDGJ08-1102-2005J10511-2005Generaltechnicalspecificationforcontactlessintegratedcircuit(IC)cardofurbanpublictransportDGJ08-1103-2005J10512-2005AccreditedonlyforElectricalcharacteristicsAnsweringswingat13.
56MHzSyntonicfrequency,Syntonicfrequency,Frequencyspecialty,OnetradetimeModulationnindex,ModulationSignalreality,Chargetime3PartialitemsSHC1101Seriescontactlessintegratedcircuit(IC)cardQ/OAKC001-2001Accreditedonlyforthereliabilityofthecard38FiscalICcard1Partialitems0418Fiscalcashregister-Part2:SpecificationforfiscalICcardGB18240.
2-2003AccreditedonlyforElectricalcharacteristic,Physicalcharacteristic,chemistry+functiontest中国合格评定国家认可委员会认可证书(注册号:CNASL0134)名称:上海市计量测试技术研究院(华东国家计量测试中心/中国上海测试中心)地址:上海市田林路487号23号楼签发日期:2009年08月21日有效期至:2012年08月20日更新日期:2012年02月10日3-4认可的授权签字人及领域序号姓名授权签字领域备注1龚增电子产品、防静电、安全性能及环境试验检测项目2王晖电子产品、防静电、安全性能及环境试验检测项目3胡西虹信息系统及信息产品、视频安防监控系统、广播扩声系统检测项目4廉云信息系统及信息产品、视频安防监控系统、广播扩声系统检测项目CHINANATIONALACCREDITATIONSERVICEFORCONFORMITYASSESSMENTAPPENDIXOFACCREDITATIONCERTIFICATE(RegistrationNo.
CNASL0134)NAME:ShanghaiInstituteofMeasurementandTestingTechnology(NationalCenterofMeasruementandTestingforEastChina/NationalCenterofTestingTechnology,Shanghai)ADDRESS:23#,No.
487,TianlinRoad,ShanghaiDateofIssue:2009-08-21DateofExpiry:2012-08-20DateofUpdate:2012-02-10APPENDIX3-4ACCREDITEDSIGNATORIESANDSCOPE№NameAuthorizedScopeofSignatureNote1GongZengElectricProductsPerformanceTest,Antistatic,Electro-SafetyTestandEnvironmentalTest2WangHuiElectricProductsPerformanceTest,Antistatic,Electro-SafetyTestandEnvironmentalTest3HuXihongInformationsystemandinformationproducts,Videomonitoringsecuresystem,TestofBroadcastingsoundreinforcementSystem4LianyunInformationsystemandinformationproducts,Videomonitoringsecuresystem,TestofBroadcastingsoundreinforcementSystem