SN54ABT125,SN74ABT125QUADRUPLEBUSBUFFERGATESWITH3-STATEOUTPUTSSCBS182E–FEBRUARY1997–REVISEDMAY19971POSTOFFICEBOX655303DALLAS,TEXAS75265DState-of-the-ArtEPIC-ΙΙBBiCMOSDesignSignificantlyReducesPowerDissipationDESDProtectionExceeds2000VPerMIL-STD-883,Method3015;Exceeds200VUsingMachineModel(C=200pF,R=0)DLatch-UpPerformanceExceeds500mAPerJEDECStandardJESD-17DTypicalVOLP(OutputGroundBounce)<1VatVCC=5V,TA=25°CDHigh-ImpedanceStateDuringPowerUpandPowerDownDHigh-DriveOutputs(–32-mAIOH,64-mAIOL)DPackageOptionsIncludePlasticSmall-Outline(D),ShrinkSmall-Outline(DB),andThinShrinkSmall-Outline(PW)Packages,CeramicChipCarriers(FK),CeramicFlat(W)Package,andPlastic(N)andCeramic(J)DIPsdescriptionThe'ABT125quadruplebusbuffergatesfeatureindependentlinedriverswith3-stateoutputs.
Eachoutputisdisabledwhentheassociatedoutput-enable(OE)inputishigh.
WhenVCCisbetween0and2.
1V,thedeviceisinthehigh-impedancestateduringpoweruporpowerdown.
However,toensurethehigh-impedancestateabove2.
1V,OEshouldbetiedtoVCCthroughapullupresistor;theminimumvalueoftheresistorisdeterminedbythecurrent-sinkingcapabilityofthedriver.
TheSN54ABT125ischaracterizedforoperationoverthefullmilitarytemperaturerangeof–55°Cto125°C.
TheSN74ABT125ischaracterizedforoperationfrom–40°Cto85°C.
FUNCTIONTABLE(eachbuffer)INPUTSOUTPUTOEAOUTPUTYLHHLLLHXZCopyright1997,TexasInstrumentsIncorporatedPRODUCTIONDATAinformationiscurrentasofpublicationdate.
ProductsconformtospecificationsperthetermsofTexasInstrumentsstandardwarranty.
Productionprocessingdoesnotnecessarilyincludetestingofallparameters.
Pleasebeawarethatanimportantnoticeconcerningavailability,standardwarranty,anduseincriticalapplicationsofTexasInstrumentssemiconductorproductsanddisclaimerstheretoappearsattheendofthisdatasheet.
EPIC-ΙΙBisatrademarkofTexasInstrumentsIncorporated.
SN54ABT125.
.
.
JORWPACKAGESN74ABT125.
.
.
D,DB,N,ORPWPACKAGE(TOPVIEW)12345671413121110981OE1A1Y2OE2A2YGNDVCC4OE4A4Y3OE3A3Y32120199101112134567818171615144ANC4YNC3OE1YNC2OENC2A1A1OENC3Y3AV4OE2YGNDNCSN54ABT125.
.
.
FKPACKAGE(TOPVIEW)CCNC–NointernalconnectionSN54ABT125,SN74ABT125QUADRUPLEBUSBUFFERGATESWITH3-STATEOUTPUTSSCBS182E–FEBRUARY1997–REVISEDMAY19972POSTOFFICEBOX655303DALLAS,TEXAS75265logicsymbolEN11OE21A1Y3452A1093A13124A2Y63Y84Y112OE3OE4OEThissymbolisinaccordancewithANSI/IEEEStd91-1984andIECPublication617-12.
PinnumbersshownarefortheD,DB,J,N,PW,andWpackages.
1logicdiagram(positivelogic)11OE21A1Y342OE52A2Y6103OE93A3Y8134OE124A4Y11PinnumbersshownarefortheD,DB,J,N,PW,andWpackages.
absolutemaximumratingsoveroperatingfree-airtemperaturerange(unlessotherwisenoted)Supplyvoltagerange,VCC–0.
5Vto7VInputvoltagerange,VI(seeNote1)–0.
5Vto7VVoltagerangeappliedtoanyoutputinthehighorpower-offstate,VO–0.
5Vto5.
5VCurrentintoanyoutputinthelowstate,IO:SN54ABT12596mASN74ABT125128mAInputclampcurrent,IIK(VI<0)–18mAOutputclampcurrent,IOK(VO<0)–50mAPackagethermalimpedance,θJA(seeNote2):Dpackage127°C/WDBpackage158°C/WNpackage78°C/WPWpackage170°C/WStoragetemperaturerange,Tstg–65°Cto150°CStressesbeyondthoselistedunder"absolutemaximumratings"maycausepermanentdamagetothedevice.
Thesearestressratingsonly,andfunctionaloperationofthedeviceattheseoranyotherconditionsbeyondthoseindicatedunder"recommendedoperatingconditions"isnotimplied.
Exposuretoabsolute-maximum-ratedconditionsforextendedperiodsmayaffectdevicereliability.
NOTES:1.
Theinputandoutputnegative-voltageratingsmaybeexceedediftheinputandoutputclamp-currentratingsareobserved.
2.
ThepackagethermalimpedanceiscalculatedinaccordancewithEIA/JEDECStdJESD51,exceptforthrough-holepackages,whichuseatracelengthofzero.
SN54ABT125,SN74ABT125QUADRUPLEBUSBUFFERGATESWITH3-STATEOUTPUTSSCBS182E–FEBRUARY1997–REVISEDMAY19973POSTOFFICEBOX655303DALLAS,TEXAS75265recommendedoperatingconditions(seeNote3)SN54ABT125SN74ABT125UNITMINMAXMINMAXUNITVCCSupplyvoltage4.
55.
54.
55.
5VVIHHigh-levelinputvoltage22VVILLow-levelinputvoltage0.
80.
8VVIInputvoltage0VCC0VCCVIOHHigh-leveloutputcurrent–24–32mAIOLLow-leveloutputcurrent4864mAt/vInputtransitionriseorfallrate1010ns/Vt/VCCPower-upramprate200200s/VTAOperatingfree-airtemperature–55125–4085°CNOTE3:Unusedinputsmustbeheldhighorlowtopreventthemfromfloating.
SN54ABT125,SN74ABT125QUADRUPLEBUSBUFFERGATESWITH3-STATEOUTPUTSSCBS182E–FEBRUARY1997–REVISEDMAY19974POSTOFFICEBOX655303DALLAS,TEXAS75265electricalcharacteristicsoverrecommendedoperatingfree-airtemperaturerange(unlessotherwisenoted)PARAMETERTESTCONDITIONSTA=25°CSN54ABT125SN74ABT125UNITPARAMETERTESTCONDITIONSMINTYPMAXMINMAXMINMAXUNITVIKVCC=4.
5V,II=–18mA–1.
2–1.
2–1.
2VVVCC=4.
5V,IOH=–3mA2.
52.
52.
5VVOHVCC=5V,IOH=–3mA333VVOHVCC=45VIOH=–24mA22VVCC=4.
5VIOH=–32mA2*2VOLVCC=45VIOL=48mA0.
550.
55VVOLVCC=4.
5VIOL=64mA0.
55*0.
55VVhys100mVIIVCC=0to5.
5V,VI=VCCorGND±1±1±1AIOZPUVCC=0to2.
1V,VO=0.
5Vto2.
7V,OE=X±50±50±50AIOZPDVCC=2.
1Vto0,VO=0.
5Vto2.
7V,OE=X±50±50±50AIOZHVCC=2.
1Vto5.
5V,VO=2.
7V,OE≥2V101010AIOZLVCC=2.
1Vto5.
5V,VO=0.
5V,OE≥2V–10–10–10AIoffVCC=0,VIorVO≤4.
5V±100±100AICEXVCC=5.
5V,VO=5.
5VOutputshigh505050AIO§VCC=5.
5V,VO=2.
5V–50–100–200–50–200–50–200mAIVCC=5.
5V,Outputshigh1250250250AICCVCC=5.
5V,IO=0,VVGNDOutputslow24303030mACCOVI=VCCorGNDOutputsdisabled0.
5250250250AI#DataVCC=5.
5V,Oneinputat3.
4V,Outputsenabled1.
51.
51.
5AICC#DatainputsOneinputat3.
4V,OtherinputsatVCCorGNDOutputsdisabled0.
050.
050.
05mAControlinputsVCC=5.
5V,Oneinputat3.
4V,OtherinputsatVCCorGND1.
51.
51.
5CiVI=2.
5Vor0.
5V3pFCoVO=2.
5Vor0.
5V7pF*OnproductscomplianttoMIL-PRF-38535,thisparameterdoesnotapply.
AlltypicalvaluesareatVCC=5V.
Thisparameterischaracterized,butnotproductiontested.
§Notmorethanoneoutputshouldbetestedatatime,andthedurationofthetestshouldnotexceedonesecond.
Thislimitmayvaryamongsuppliers.
#ThisistheincreaseinsupplycurrentforeachinputthatisatthespecifiedTTLvoltagelevelratherthanVCCorGND.
SN54ABT125,SN74ABT125QUADRUPLEBUSBUFFERGATESWITH3-STATEOUTPUTSSCBS182E–FEBRUARY1997–REVISEDMAY19975POSTOFFICEBOX655303DALLAS,TEXAS75265switchingcharacteristicsoverrecommendedrangesofsupplyvoltageandoperatingfree-airtemperature(unlessotherwisenoted)(seeFigure1)PARAMETERFROM(INPUT)TO(OUTPUT)VCC=5V,TA=25°CSN54ABT125SN74ABT125UNITPARAMETER(INPUT)(OUTPUT)MINTYPMAXMINMAXMINMAXUNITtPLHAY13.
24.
61614.
9nstPHLAY12.
54.
616.
214.
9nstPZHOEY13.
651615.
9nstPZLOEY12.
56.
217.
516.
8nstPHZOEY13.
85.
416.
316.
2nstPLZOEY13.
35.
316.
516.
2nsThislimitmayvaryamongsuppliers.
SN54ABT125,SN74ABT125QUADRUPLEBUSBUFFERGATESWITH3-STATEOUTPUTSSCBS182E–FEBRUARY1997–REVISEDMAY19976POSTOFFICEBOX655303DALLAS,TEXAS75265PARAMETERMEASUREMENTINFORMATION1.
5VthtsuFromOutputUnderTestCL=50pF(seeNoteA)LOADCIRCUITS17VOpenGND500500DataInputTimingInput1.
5V3V0V1.
5V1.
5V3V0V3V0V1.
5VtwInputVOLTAGEWAVEFORMSSETUPANDHOLDTIMESVOLTAGEWAVEFORMSPROPAGATIONDELAYTIMESINVERTINGANDNONINVERTINGOUTPUTSVOLTAGEWAVEFORMSPULSEDURATIONtPLHtPHLtPHLtPLHVOHVOHVOLVOL1.
5V1.
5V3V0V1.
5V1.
5VInput1.
5VOutputControlOutputWaveform1S1at7V(seeNoteB)OutputWaveform2S1atOpen(seeNoteB)VOLVOHtPZLtPZHtPLZtPHZ1.
5V1.
5V3.
5V0V1.
5VVOL+0.
3V1.
5VVOH–0.
3V≈0V3VVOLTAGEWAVEFORMSENABLEANDDISABLETIMESLOW-ANDHIGH-LEVELENABLINGOutputOutputtPLH/tPHLtPLZ/tPZLtPHZ/tPZHOpen7VOpenTESTS1NOTES:A.
CLincludesprobeandjigcapacitance.
B.
Waveform1isforanoutputwithinternalconditionssuchthattheoutputislowexceptwhendisabledbytheoutputcontrol.
Waveform2isforanoutputwithinternalconditionssuchthattheoutputishighexceptwhendisabledbytheoutputcontrol.
C.
Allinputpulsesaresuppliedbygeneratorshavingthefollowingcharacteristics:PRR≤10MHz,ZO=50,tr≤2.
5ns,tf≤2.
5ns.
D.
Theoutputsaremeasuredoneatatimewithonetransitionpermeasurement.
1.
5VFigure1.
LoadCircuitandVoltageWaveformsIMPORTANTNOTICETexasInstruments(TI)reservestherighttomakechangestoitsproductsortodiscontinueanysemiconductorproductorservicewithoutnotice,andadvisesitscustomerstoobtainthelatestversionofrelevantinformationtoverify,beforeplacingorders,thattheinformationbeingreliedoniscurrent.
TIwarrantsperformanceofitssemiconductorproductsandrelatedsoftwaretothespecificationsapplicableatthetimeofsaleinaccordancewithTI'sstandardwarranty.
TestingandotherqualitycontroltechniquesareutilizedtotheextentTIdeemsnecessarytosupportthiswarranty.
Specifictestingofallparametersofeachdeviceisnotnecessarilyperformed,exceptthosemandatedbygovernmentrequirements.
Certainapplicationsusingsemiconductorproductsmayinvolvepotentialrisksofdeath,personalinjury,orseverepropertyorenvironmentaldamage("CriticalApplications").
TISEMICONDUCTORPRODUCTSARENOTDESIGNED,INTENDED,AUTHORIZED,ORWARRANTEDTOBESUITABLEFORUSEINLIFE-SUPPORTAPPLICATIONS,DEVICESORSYSTEMSOROTHERCRITICALAPPLICATIONS.
InclusionofTIproductsinsuchapplicationsisunderstoodtobefullyattheriskofthecustomer.
UseofTIproductsinsuchapplicationsrequiresthewrittenapprovalofanappropriateTIofficer.
QuestionsconcerningpotentialriskapplicationsshouldbedirectedtoTIthroughalocalSCsalesoffice.
Inordertominimizerisksassociatedwiththecustomer'sapplications,adequatedesignandoperatingsafeguardsshouldbeprovidedbythecustomertominimizeinherentorproceduralhazards.
TIassumesnoliabilityforapplicationsassistance,customerproductdesign,softwareperformance,orinfringementofpatentsorservicesdescribedherein.
NordoesTIwarrantorrepresentthatanylicense,eitherexpressorimplied,isgrantedunderanypatentright,copyright,maskworkright,orotherintellectualpropertyrightofTIcoveringorrelatingtoanycombination,machine,orprocessinwhichsuchsemiconductorproductsorservicesmightbeorareused.
Copyright1996,TexasInstrumentsIncorporated
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