portreadyboost

IndexAAccesstime,7,20,49,193,325ACcharacteristics,149Adaptivememory,48,49AddRoundKey,473,474Adleman,L.
,463AdvancedEncryptionStandard(AES),455,471–473,475,476AES,seeAdvancedEncryptionStandard(AES)AllBitLine(ABL),85,160–163ALU,seeArithmeticLogicUnit(ALU)Applicationclasses,222ArithmeticLogicUnit(ALU),141Asymmetriccoding,153,462,471Asynchronousinterface,6–8,139,144ATA,20,33,34,36,38,457Authentication,458,464,470BBabbage,C.
,466Backwards-compatibility,34Badblock,1,10,12,56,190,245–247,285BadBlockManagement(BBM),12BAR,seeBaseAddressRegister(BAR)BBM,seeBadBlockManagement(BBM)BCH,12,184–186,189,212–214,369,370,374–377,379–385,388–398,401,402,449–451Beliefpropagationdecoding,402,403,407,424,433,448BER,seeBitErrorRate(BER)Berlekamp,184,293,377,378,380,399–401BET,seeBlockErasingTable(BET)BGApackage,2Binary-inputAWGNchannel,411,413,417,422,424,430,445,450BinarySymmetricChannel(BSC),382,410,411,413,414,417,422,424,430,434,439,441,442BitErrorRate(BER)estimation,18,424,450Bitippingdecoding,437Bitlinecapacitance,156,158,159parasitic,156,158,160pitch,80,84,91,94precharge,158BLe,seeEvenpage(BLe)BlockErasingTable(BET),346–351BLO,seeOddpage(BLO)Blockprotection,353–355Blockwearinginformationtable,362,363Boottime,31,33Bose,R.
C.
,370Bose–Chaudhuri–Hocquenghem(BCH),245,289–291,293,302,303,305,306BSC,seeBinarySymmetricChannel(BSC)Bulk,65,75,113,167,221BWI-tablemerge,364CCachedleselectionalgorithm,50Caching,3,44,50,193,194Caesar,J.
C.
,458Capacitivecouplingmodel,64–66Carlitz-Uchiyamainequality,375,389CDM,seeCold-DataMigration(CDM)CDvariations,93Cell-to-cellvariability,93Channelcapacity,407,408,412SpringerNatureSingaporePteLtd.
2018R.
Michelonietal.
(eds.
),InsideSolidStateDrives(SSDs),SpringerSeriesinAdvancedMicroelectronics37,https://doi.
org/10.
1007/978-981-13-0599-3479Channelcodingtheorem,407,412Channelencoder,409Chargepump,171–175Chargeretention,3,64,66,76–78,87Chargetrappingcells,100ChargeTrappingLayer(CTL),94–97,99Checknodes,295,296,300,419–421,424,428–432,434,437,439,442,443,445,449Chemical-MechanicalPlanarization(CMP),92Chiang,M.
L.
,345Chien,E.
K.
,399Ciphertext,459,462–466,468,473Client,1,26,33,219,220,222,223,225–227,229CMP,seeChemical-MechanicalPlanarization(CMP)Codebreakers,458Codeensemble,421CodeRate(CR),371Co-design,196,198Colddata,52,285,288,343,346–349,351,353–357,359Cold-DataMigration(CDM),354,356Coldpool,343,346,354–357,359Cold-PoolAdjustment(CPA),356,357Collisionresistance,469Computationalsecurity,460,461Concatenation,373,404Congurationreadmessages,17ConsumerSSD,31,33ControlInterface(CI),136–139Correctioncapability,184,185,243,248,259,271,274,276,279,280,282,283,293,304,306,307,369,372,374,380,381,383,386,389,391,398,400,437,450CPA,seeCold-PoolAdjustment(CPA)CR,seeCodeRate(CR)CRC,seeCyclicRedundancyCheck(CRC)Cryptoanalysis,464Cryptosystem,455,460,461,463,464,467CTL,seeChargeTrappingLayer(CTL)Currentconsumption,157Cycliccode,370,374CyclicRedundancyCheck(CRC),18,19,32,219,220,404DDaemen,J.
,472Databuffer,190Datacenter,1,25,29–31,33,37,40,41,240,267Dataeviction,194Datafragmentation,91,94,100Dataintegrity,8,32,467,469,470Datalinklayer,17–19Datapath,137–140Datasensor,52Datastrobesignal(DQS),8,144,145DC-DCconverter,2,174,175DCO,seeDigitalControlledOscillator(DCO)Decoder,135,136,141,176,178,184–188,276,291–293,295–300,304,325,375,381,398,401–404,409,414,417,418,421,423,425,433,436–439,444,445,447,450,451Degaussian,455,456Densityevolution,423,441Detection,12,35,152,244,269,325,369,374,381,396,398,401Detectioncapability,212,371Diffusion,108,129,221,473Digest,468,469,471Digitalsignatures,458DIMM,47Discretecapacitors,220,221Distinguishingalgorithm,464Disturbs,11,74,118,128,152,167,183,184,211,283DoubleDataRate(DDR)interface,144DoubleDataRate(DDR)memory,144Doublepatterning,91,92Double-supplyvoltageregulator,175,177Downstream(DP),15–17,139,141DP,seeDownstream(DP)DQS,seeDataStrobeSignal(DQS)Drain,65,66,89,114,118,119,121,123,128,176,212,254,256,310,415DRAM,20,43,44,47,91,144,190,193–195,197,198,206,218,219,236,239,244,245,314–327Dual-pool,343,346,352–354,356–359,362–366Dualport,34,35Dynamicwearleveling,11,215EECCs,seeErrorCorrectingCodes(ECCs)ElectricalIPDthickness(EOT),70,81,83,84,87,97Electricalphysicallayer,18Elias,P.
,370Embeddedmicrocontroller,135Encoder,184,185,376,398,420Encryption,455–464,467,468,471,476EndPoints,15–17480IndexEndurance,11,31–33,39,41,52,53,79,98,105,183,184,187,188,193,206,209–211,213,215,221–227,229,230,248,250,260,275,283,288,313,343,344,346,360,365,366Endurancestress,210,223,225–227,229,230Enigma,458,459,466,467Enterprise,1,15,19–23,26,29–37,39–41,52,183,195,197,207,219–223,225,240,401,455EnterpriseSSD,31,33,34,229Entropyofrandomvariables,407Enumerationprocess,16,17EOT,seeElectricalIPDthickness(EOT)EPROM,seeErasableProgrammableReadOnlyMemory(EPROM)ErasableProgrammableReadOnlyMemory(EPROM),3Erase-historytable,363Erasesaturation,71,81,82,95,99ErrorCorrectingCodes(ECCs),184,205,344Erroroor,424,425Errorlocatorpolynomial,184,375,377–380,399ErrorpredictionLDPC,402,403Errorreductionpulse,183Evenness-aware,343,346,350–352,365Evenpage(BLe),6Extension,25,373,382,383,388,389,391,443,444ExternalNAND,45FFactorization,461,463,467FAT,seeFileAllocationTable(FAT)FeRAM,46FFR,seeFunctionalFailureRequirement(FFR)FFS,seeFlashFileSystem(FFS)FG,seeFloatingGate(FG)FiberChannel(FC)FileAllocationTable(FAT),10,360Filesystem,44FirmwareTransactionLayer(FTL),457Flashcache,22Flashchannel,13,145,146Flashcontroller,1,9,23,24,55,135,200,457,476FlashFileSystem(FFS),10Flashmanagement,24,31,33,39,345–347,352FlashTransactionLayer(FTL),10,182,183,190,196–201,215,216,219,346,360,361,457FloatingGate(FG),3,62–66,68–72,74–85,87–89,93–96,98–100,106,115,117–121,123–127,207,208,210–212,233,234,251,254,255,264,309,310FloatinggateNAND,61–64,68,76,79,81,82,88,90,94,117Floorplan,125,135,136Formfactor,20,21,37,234Fowler-Nordheimtunneling,67,68,86,95,168,415Frequencyanalysis,465,466FTL,seeFirmwareTransactionLayer(FTL)FunctionalFailureRequirement(FFR),222–224,229,230GGallager,R.
G.
,370,419,437GallagerBdecoding,441Garbagecollection,1,10–12,44,56,190,196,197,241–243,249,250,285,289,344,346–349,352,353,355,356,359–361,365Generatormatrix,290,295,300,371Globaldeduction,464GlobalWordlines(GWLs),176GWLs,seeGlobalwordlines(GWLs)HHamming,R.
,369Hammingdistance,252,290,371,402,414Hard-decisiondecoding,213,417,450,451HardDiskDrive(HDD),38,43–45,47,48,50,51,196,205,206,223,455–457,476Hashfunction,467–471HDD,seeHardDiskDrive(HDD)HDDreliability,206Highspeed,144,150Highvoltagemanagement,135,171HighvoltagePMOS,176Hocquengheim,A.
,370Hostdatatransfer,31Hot-coldswapping,345Hotdata,52,53,284,343,346,347,350,351,353,356Hotplug,35,36Hotpool,343,346,354–357,359,363HotPoolAdjustment(HPA),356,357HPA,seeHotPoolAdjustment(HPA)HPC,seeHighPerformanceComputing(HPC)HybridSSD,51,53,55Index481II/O,13,21,23,25,45,50,68,95–97,137,139,141,144–147,150,152,153,155,192,194,197–200,234,238–240,242I/Ooperationspersecond(IOPS),3,6,8,11–13,19,21,23,25,32,38,39,45,50,72,92,94,108,125,137,139,141,144–147,150,152–155,159,163,171,174,176,183,184,186,188–194,197–200,206,207,210–213,217,220,343,344,346–348,350–352,356,359–361,365,369,371–374,376–383,385,386,389,407,409–411,413,415–420,422,424–429,432,434,435,438,439,442,443,451,462,464,466,472,473IncrementalStepPulseProgramming(ISPP)algorithm,67–70,72,74,81,84,95,99,165,166,170,255Indicator,466,467Informationdeduction,464Instancededuction,464Integrity,32,144,151,153,470Interleavedarchitecture,6,14,160Interleaving,6,13,52,158–160,255IPDlayer,68,69,81ISPP,seeIncrementalsteppulseprogramming(ISPP)algorithmKKang,D.
,62Kasiskimethod,466Key,34,41,47,65,120,124,151,183,199,243,268,272,273,275,277,280,284,303,318,326,345,365,374,398,401,458,459,461–466,470–473,476Keygenerator,472,473,476Kim,H.
J.
,345Krawtchoukpolynomial,386LLane,15,16,18,21LBF,seeLine-by-ll(LBF)LBS,seeLine-by-spacer(LBS)LDPC,seeLow-densityParity-check(LDPC)codesLeakagecurrent,77,78,85,129,256LeastSignicantBit(LSB),6,169,170,252Legacyashmemory,23LegacyNAND,144LikelihoodRatio(LR),425–428,430–432Line-by-ll(LBF),92–94Line-by-spacer(LBS),92–94Logicalblock,6,10,194,344,360,361,364Logicalpage,6,302Logicalphysicallayer,18Logicalsegment,360,362Low-DensityParity-Check(LDPC)codes,13,184–187,212–214,289,293,369,370,401–404,407,414,419–426,429,430,433,437,439–446,448–451LR,seeLikelihoodRatio(LR)LRU,51,53,193,194LSB,seeLeastSignicantBit(LSB)MMacWilliamsequality,372MacWilliams,F.
J.
,372Matrixip-well,167,168Mechanicalreliability,39,66Memorycontroller,8,9,11–13,16,47,143,183,233,321,325MessageAuthenticationCode(MAC),458,470Miscorrectionprobability,381,404MixColumns,473MLC,seeMulti-levelcells(MLC)MLCchannelmodel,415,418,445Most-Recently-Used(MRU)algorithm,355MostSignicantBit(MSB),6,170,252MRAM,43,197,326MSB,seeMostSignicantBit(MSB)Multi-channel,13,21,369,398,401Multi-coresystem,25Multi-LevelCells(MLC),4,6,11,43,51–53,71,72,75,84,85,90,95–97,129,156,169,170,183,208,210,215,217,220,233,234,251,253,295,343,344,350–352,415,418,419,445Multi-thread,32Mutualinformation,304,407,408,410,417,419NNANDchannel,2,3,5,7,13,72,74,89,112,121,144,167,198,424NANDash,3,4,6–8,12,21,39,41,43,47,48,51,52,55,61,62,71,75,76,79,83,85,87,88,90,91,96,98,100,105,106,111,113,117–122,125,126,129,135,136,166,177,178,181–188,190–193,195–201,205–221,233–237,239,241,245,251,252,254,255,257–261,263,264,266,267,270,272,275,278,280,283,286,288,291,297,300,308–315,319,327,328,344,360,363,369,415,424,430,437,456,475,476NANDinterface,6,144482IndexNANDonmotherboard,47NMOStransistors,152,172Non-repudiation,470Non-transparentbridging(NTB),17,18NonVolatileMemory(NVM),3,24Non-volatileRAM,2,197NORmemories,3,61,95NTB,seeNon-TransparentBridging(NTB)NVM,seeNonVolatileMemory(NVM)OOCD,seeOffChipDriver(OCD)Oddpage(BLO),6OffChipDriver(OCD),146,150,150–152One-timepad,461,462One-wayfunction,463ONFI,seeOpenNANDashinterface(ONFI)ONFIinterface,47,144ONOlayer,68,70Open-drain,151OpenNANDFlashInterface(ONFI),7,8,144,145OperatingSystem(OS),24,48,55,196,199–201Opticallithogap,91OS,seeOperatingsystem(OS)Over-programming,208Overprovisioning,248,250,285–288PPairedstoragecomputer,47ParallelBCH,15,34,155,184,369,398Parity,13,184,212,217–220,237,244–247,250,290–292,294–296,300,302–305,370,371,373–375,404,419,420,427,431,443Parity-checkmatrix,419,423,428,433,442–444,446,449Passdisturb,73–76,86,167Passtransistor(PT),176,177,371Passwindow,75Pattern-basedPDC(PB-PDC),50p-BICS,seePipe-shapedbitcostscalable(p-BICS)PB-PDC,seePattern-basedPDC(PB-PDC)PCB,2,152PCI,1,2,14–16,183,187,188,198,199,201,398PCIexpress(PCIe),1,9,15,16,18,21,23,25,26,195switch,16PCI-PCIBridges,16PDC,seePopularDataConcentration(PDC)Petersonestimation,383,396,397Physicaldestruction,456Physicalsegment,360–362,364Pinheiro,E.
,50Plaintext,459,461–466,468,473PopularDataConcentration(PDC),50Powerconsumption,14,19,31,43,49,106,115,145,159,167,174,183,184,196,317,344Powerfailure,220Powerfailureprotection,220Preconditioning,39Preimageresistance,469Programcounter,141Programdisturb,48,73,115,128,129,167,170,211Programenablesignal,6,147,177Programinhibit,72,74,86,167Programpulse,67,68,72,115,170,175Programsaturation,69–71,94–96,100Provablesecurity,461Public-keycryptosystem,462,463Pushpull,147PVG,seeProgramVoltageGenerator(PVG)QQuadruplePatterning(QP),94Quasi-CyclicLDPC(QCLDPC),420Queue-Headtable(QHtable),363RRandomAccessMemories(RAM),3,16,24,141,142,327,345,347,348,360,362–366,476RandomTelegraphNoise(RTN),88–90,100,105,210RawBitErrorRate(RBER),183,186–188,206,209–213,215,216,228,245,287,305Ray-Chaudhuri,D.
K.
,472Rconoperation,472Readdisturb,48,76,170,190,193,209,211,215,257,261,266,267,274,275,277,282,283,288,289,307,308,313,314,319–321,326,327ReadOnlyMemories(ROM),3,141,142Readyboost,45Ready/busysignal,7,84,144,200,355,364Readydrive,49Recenterase-cyclecount,354,356–359,362,363Redundancy,33,136,137Index483RedundantArrayofIndependentDisks(RAID),23,206,207,217,218Reed,I.
S.
,12,370Replacementalgorithm,50ReRAM,43Resettinginterval,347–352Retention,8,48,52,72,77,79,96,97,105,110,115,121,183,206,209,210,221,225,227–229stress,223time,223Rijmen,V.
,472Rijndael,472Rivest,R.
L.
,463Rootcomplex,15–17Rotateoperation,472Rotationallatency,20,38RSA,461,463,467SSampleSize(SS),223,224Sanitation,456SAS,9,20–24,29,33–41,52,183,195SASexpander,34SATA,9,20–24,29,33–41,52,182,183,195,398,456S-box,472,473SCSI,20,34,36,38SCSIexpress,33,34,38,457Secondpreimageresistance,469Sectorsize,47,75,206,217,218,225,361,456Secureerase,456,457,475Seeklatency,38Self-AlignedDoublePatterning(SADP),91–94Self-AlignedSTI(SASTI),93Selfboost,167Self-BoostedProgramInhibit(SBPI),72–74Senseamplier,84,85,156,160,161,254,311Sequentialread,20SerialATATunneledProtocol(SATP),36Shannon,C.
,408Shannon,E.
C.
,369Shannonlimit,13,293,407,413,414,419,421,441,450,451ShiftRows,473Shortening,373SILC,seeStressInducedLeakageCurrent(SILC)SimultaneousSwitchingNoise(SSN),147,149,150SingleDataRate(SDR),145,150Single-LevelCells(SLC),4,6,11,43,51–53,71,72,76,156,169,182,184,208,234,251,344,410,415–418,445,449–451SLCchannelmodel,410,415,418Slewrate,148,150–152Softdecoding,185,205,282,295,300,303–306,402Solomon,G.
,12,370Source,4,61,64–66,74,75,90,106,108,110,112,114,118,119,121,123,125,153,155,158,159,220,236,251,256,263,267,270,281,289,310,313,314,408,470Sourceline,4,61,75,106,110,125,159capacitance,65,74,83,119,145,146,172,221program,75,113SRAM,47,91,144SSDformfactor,1,20,33,37SSDinterface,20SSDperformance(s),21,39,43,194,195,198SSDpowerconsumption,14Staticwearleveling,11,215,345,346,348–352StorageClassMemories(SCM),43Storagemanagement,47,51StressInducedLeakageCurrent(SILC),77,78,210,211,264,265Stressmethods,223SubBytes,473,474Supercapacitors,197,221SWL-BETUpdate,348–350SWLeveler,346–348SWL-Procedure,348–351Symmetricencryption,462,470,471Syndrome,184,291–293,376–378,399,400,442,443Systematiccode,371Sze,S.
M.
,62TTannergraph,295,296,419–422,424,429,431,441,443,446TANOS,95–98Tempsensor,3TerabitCellArrayTransistor(TCAT)technology,112Testing,12,31,137,141,206,221–223,225,226,246,258,282,324,381TestInterface(TI),137–139Testmode,136,138–140Testofprimality,464484IndexTheNVMexpress(NVMe),1,24–26,33Thesenseamplier,153,157,254,3113Dmemorycellintegration,125Thresholdvoltage,3,63,66–71,74,76,78,83,84,86–88,90,153,156,157,164,165,177,184,185,207–211,217,234,251–262,264–267,272,273,275,276,278,279,281,282,285,288,297,298,304,307–310,313,415–419ThroughSiliconVias(TSV),146Togglemode,144Totalbreak,464TOXeld,66,68,100TransactionLayerPackage(TLP),17–19TrapAssistedTunneling(TAT),210,211,264,265Trappingset,424,425TSOPpackage,7TSV-integratedSSD,205Tunneldielectric,66,67,95TunnelOxide(TOX),64–70,77–79,81,83,84,87–89,95,98–100UUnconditionalsecurity,461,463UncorrectableBitErrorRate(UBER),206,207,212,222–225,229,230,305Unevennesslevel,348,349,351Upstream(UP),15–17,139,141Usermode,138,139Usertestmode,138,139Utilizationlimiter,52VVertical-stacked-array-transistor(VSAT),112Video-on-demand(VOD),171–174Voltagedoubler,171–174Voltageregulator(s),135,136,164,174,175VTHwindow,79,170WWear-leveling,39,56,345,354,364,366Weightdistribution,372,373,382,383,385,388Weightedprobability,381Wordline,105,113,115,129,135,136,158,159,166–168,176,178,220,252,254,255,261–263,266,271–273,275,276,288,325Wordlinedecoder,176WriteAmplicationFactor(WAF),43,56,190XXLC,85,87,169,170XTS-AES,471,476Index485